AVR040: EMC Design Considerations
AVR040: EMC Design Considerations
AVR040: EMC Design Considerations
APPLICATION NOTE
Scope
This application note covers the most common EMC problems designers
encounter when using microcontrollers. It will briefly discuss the various
phenomena. The reference literature covers EMC design in more detail, and
for designers who are going to build products that need to be EMC
compliant, further study is highly recommended. A good EMC design
requires more knowledge than what can be put into a short application note.
Unlike many other design issues, EMC is not an area where it is possible to
list a set of rules. EMC compliance cannot be guaranteed by design; it has to
be tested.
It is recommended that readers unfamiliar with EMC design read this
document more than once, as some of the subjects described early in this
document are more easily understood if the reader has already read the rest
of the document.
Atmel-1619E-EMC-Design-Considerations_AVR040_Application Note-11/2016
Table of Contents
Scope.............................................................................................................................. 1
1. Introduction................................................................................................................ 3
4. Design Rules........................................................................................................... 10
4.1. Identify the Noise Sources..........................................................................................................10
4.1.1. Transmitted Noise........................................................................................................10
4.1.2. Received Noise............................................................................................................10
4.2. The Path to Ground....................................................................................................................10
4.3. System Zones.............................................................................................................................10
4.4. RF Immunity............................................................................................................................... 11
4.5. ESD and Transients....................................................................................................................11
4.6. Power Supply, Power Routing, and Decoupling Capacitors.......................................................12
4.7. PCB Layout and Grounding....................................................................................................... 13
4.7.1. Current Loops and Signal Grounding.......................................................................... 13
4.7.2. Ground Planes.............................................................................................................14
4.7.3. Board Zoning............................................................................................................... 14
4.7.4. Single-layer Boards..................................................................................................... 14
4.7.5. Two-layer Boards.........................................................................................................14
4.7.6. Multilayer Boards......................................................................................................... 15
4.8. Shielding.....................................................................................................................................15
4.9. AVR-specific Solutions............................................................................................................... 16
4.9.1. General I/O Pin Protection...........................................................................................16
4.9.2. Reset Pin Protection.................................................................................................... 16
4.9.3. Oscillators.................................................................................................................... 17
5. References.............................................................................................................. 19
6. Useful Links............................................................................................................. 20
6.1. Vendors...................................................................................................................................... 20
6.2. Organizations............................................................................................................................. 20
7. Revision History.......................................................................................................21
Vs Cs
To Ground Re turn
A simple way of modeling this phenomenon is to use a capacitor that will hold the same charge as the
body and a series resistor that will release this charge the same way the body does.
The figure above shows a principle schematic of this setup. CS is the storage capacitor that equals the
capacitance of the human body, RD is the discharge resistance that equals the resistance of the human
body. VS is a high-voltage power supply, and RC the series resistance of this power supply. When the
switch S is connected to RC, the capacitor is charged. When the switch S is connected to RD, the
capacitor is discharged through RD and the device under test, which is connected to or placed near the
discharge tip. The value of RC is of no practical value for what amount of energy is stored in the capacitor
or for how this is transferred to the device under test.
Integrated circuits are usually tested according to MILSTD-883.
Here RC is 1 - 10MΩ, RD is 1.5kΩ, and CS is 100pF. This is the so-called Human Body Model, which tries
to emulate the ESD an integrated circuit may experience as a result of manual handling during board
production. The traditional test voltage VS a CMOS device is expected to handle is ±2kV. Newer devices
®
like AVR microcontrollers are often rated to ±4kV or more.
Another model, the Machine Model, tries to emulate the ESD an integrated circuit will experience from
automatic handlers. Here CS is twice as big, 200pF. The current limiting resistor RD is zero (!), but an
inductor up to 500nH may be inserted instead. RC is 100MΩ. In this model, the rise time of the current is
much higher, and most devices fail at voltages higher than ±500V.
t
15ms
Burs t Dura tion
V
P uls e
t
200 μs (0.25-2.0 kV) or 400 μs (4.0 kV)
Re pe tition Pe riod
The figure above, Fast Transient Burst, shows the fast transient burst pulse train used for EMC testing.
The next figure, Close-up of Burst, shows a close-up of a burst. Note that the pulse is only about 50ns
wide, this is much smaller than the figure indicates. See IEC 1000-4-4 for details of the pulses and the
test setup.
Test voltages on power supply lines are typically 1kV for protected environment and 2kV for industrial
environment. Severe industrial environments may require up to 4kV transient testing.
Test voltages on I/O lines are half the values used for power supply lines.
On an I/O line, the pulse may seem similar to an ESD pulse, but there are some very important
differences:
4.4. RF Immunity
Long I/O and power cables usually act as good antennas, picking up noise from the outside world and
conducting this into the system. For unshielded systems, long PCB tracks may also act as antennas.
Once inside the system, the noise may be coupled into other, more sensitive signal lines. It is therefore
vital that the amount of RF energy allowed into the system is kept as low as possible, even if the input
lines themselves are not connected to any sensitive circuit.
This can be done by adding one or more of the following:
• Series inductors or ferrite beads will reduce the amount of HF noise that reaches the
microcontroller pin. They will have high impedance for HF, while having low impedance for low-
frequency signals.
• Decoupling capacitors on the input lines will short the HF noise to ground. The capacitors should
have low ESR (equivalent series resistance). This is more important than high capacitance values.
In combination with resistors or inductors, the capacitors will form low-pass filters. If the system is
shielded, the capacitors should be connected directly to the shield. This will prevent the noise from
entering the system at all. Special feed-through capacitors are designed for this purpose, but these
may be expensive.
• Special EMC filters combining inductors and capacitors in the same package are now delivered
from many manufacturers in many different shapes and component values.
GND
Ground P la ne
The figure above shows an example of insufficient decoupling. The capacitor is placed too far away from
the microcontroller, creating a large high current loop. The power and ground planes here are parts of the
high current loop. As a result of this, noise is spread more easily to other devices on the board, and
radiated emission from the board is increased even further. The whole ground plane will act as an
antenna for the noise, instead of only the high current loop.
This will be the case if the power and ground pins are connected directly to the planes (typical for hole-
mounted components) and the decoupling capacitor is connected the same way. The same is often seen
for boards with surface-mounted components if the integrated circuits are placed on one side of the board
and the decoupling capacitors are placed on the other.
GND
Ground P la ne
The figure above shows a better placement of the capacitor. The lines that are part of the high current
loop are not part of the power or ground planes. This is important, as the power and ground planes
otherwise will spread a lot of noise.
The figure below shows another improvement of the decoupling. A series inductor is inserted to reduce
the switching noise on the power plane. The series resistance of the inductor must, of course, be low
enough to ensure that there will be no significant DC voltage drop.
Generally, the AVR devices where power and ground lines are placed close together (like the
AT90S8535) will get better decoupling than devices with industry standard pinout (like the AT90S8515),
where the power and ground pins are placed in opposite corners of the DIP package. This disadvantage
can be overcome by using the TQFP package, which allows decoupling capacitors to be placed very
close to the die. For devices with multiple pairs of power and ground pins, it is essential that every pair of
pins get its own decoupling capacitor.
Figure 4-3. Decoupling with Series Inductor
Vcc
Powe r P la ne
Microcontrolle r
I= L I=
Vcc
V=
C
High Curre nt
Loop Out
GND
Ground P la ne
4.8. Shielding
In some cases it is not possible to get the noise levels of a system low enough without adding a shield. In
other applications a shield may be used because it is easier to use a shield than to achieve low noise
levels by other means.
Microcontrolle r
I/O Module
I/O P in
GND
Microcontrolle r
Re s e t Module
Re s e t
GND
To achieve the same protection on Reset as on other I/O pins, an external diode should be connected
from Reset to VCC. A normal small-signal diode will do. In addition, a pull-up resistor (10kΩ typical) and a
small filter capacitor (4.7nF) should be connected as shown in the figure below.
All this, of course, is not needed if Reset is connected directly to VCC, but then external reset and In-
System Programming (ISP) is disabled, too.
If high ESD protection of Reset is not required, or is achieved by other components, the diode may be
omitted. The resistor and capacitor are still recommended for optimum Reset behavior.
The diode must also be omitted if In-System Programming of devices like ATtiny11, which can only be
programmed using 12V, is required. Then one of the ESD protection methods described earlier may be
used instead.
Figure 4-7. Recommended Reset Pin Connection
Vcc
R Microcontrolle r
Re s e t Module
Exte rna l Re s e t
Re s e t
C
GND
4.9.3. Oscillators
As the AVR microcontroller family is running directly on the clock oscillator, the oscillator frequency for a
specific throughput is relatively low compared to devices that divide the clock by 4, 8, or 12. This reduces
the emitted noise from the oscillator, but the oscillator still will be among the noisiest parts of the chip.
High-frequency oscillators are quite delicate devices and are, therefore, sensitive to external noise.
In addition, the oscillator pins are generally more sensitive to ESD than other I/O pins.
Fortunately, it is easy to avoid these problems.
Keep the oscillator loop as tight as possible. Place the crystal/resonator as close to the pins as possible.
Connect the decoupling capacitors (or the ground terminal of the resonator) directly to the ground plane.
Even boards without ground plane should have a local plane under the oscillator. This plane must be
connected directly to the ground pin of the microcontroller.
6.1. Vendors
Murata
Home page: http://www.murata.com
Harris Suppression Products Group
(now a business unit of Littelfuse, Inc.)
Home page: http://www.littelfuse.com/products/tvs-diodes.aspx
TDK
Home page: http://www.tdk.com
EMC components:
https://product.tdk.com/info/en/products/emc/catalog.html
6.2. Organizations
IEC
The International Electrotechnical Commission
Home page: http://www.iec.ch
CENELEC
European Committee for Electrotechnical Standardization
Home page: https://www.cenelec.eu/
JEDEC
Joint Electron Device Engineering Council
Home page: http://www.jedec.org
SAE
Society of Automotive Engineers
Home page: http://www.sae.org
FCC
Federal Communications Commission
Home page: http://www.fcc.gov/
EIA
Electronic Industries Alliance
Home page: http://www.ecianow.org/
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