Characterization of Components
Characterization of Components
Characterization of Components
DOCTORAL THESIS
Characterization of Components
and Materials for EMC Barriers
Urban Lundgren
Urban Lundgren
EISLAB
Dept. of Computer Science and Electrical Engineering
Lule University of Technology
a
Lule Sweden
a,
Supervisors:
Professor Jerker Delsing and Professor Dag Bjrklf
o o
ii
iv
Abstract
This thesis presents contributions to work for better methodologies for addressing Electromagnetic Compatibility (EMC) issues. In particular measurement methods are reviewed and devised for acquiring data on barriers used for EMC. Such data is used for
characterization, modeling and model verication of barriers.
The concept of EMC barriers is introduced as a general view of lter components,
separation of conductors (crosstalk problems), electromagnetic shielding etc. The aim
is to nd methodologies to help engineers to identify EMC problems and to include the
management of EMC in the design of a electrical circuit in a practical and eective
manner.
Methodologies for generation of EMC barrier modeling techniques have been developed. This work have resulted in design tools for electronic design engineers to include
EMC considerations at an early design stage of a new product.
Problems with existing barrier characterizing measurement methods have been identied. By comparison of far eld and near eld shielding eectiveness measurement methods, data for shielding thermoplastic materials was acquired. Considering the purpose
of studied shielding materials in an application the usefulness of the far eld shielding
eectiveness measurement method is questioned.
EMC barrier measurement methodologies of interest in this thesis includes shielding eectiveness measurements, transfer impedance measurements, scattering parameter
measurements, measurements of material permittivity and permeability and near eld
scanning techniques for analysis of current distributions.
vi
Contents
Chapter 1 - Thesis Introduction
1.1 The Need for Electromagnetic Compatibility in the Information Technology Society . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.2 EMC - a real and a legal requirement on electronics . . . . . . . . . . . .
1.3 A Motivation to Work on EMC Barriers . . . . . . . . . . . . . . . . . .
Chapter 2 - EMC Barriers
2.1 Interpretation . . . . . .
2.2 Types of EMC Barriers .
2.3 Characterization of EMC
2.4 EMC Barrier Modeling .
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References
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Paper A
43
Paper B
51
Paper C
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Paper D
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Paper E
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Paper F
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Paper G
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Barriers
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viii
Preface
This thesis is a summary of the research I have been participating in at Lule University
a
of Technology since 1996, when a professorship in EMC Technology was inaugurated at
the University and the present EMC Laboratory was built.
It was not a coincidence that the EMC directive became mandatory in Sweden in
1996, making EMC a hot topic for all manufacturers of electronic products. Today Lule
a
EMC Center is a competence center for education, R&D and a support center for SMEs
in the region.
In 1996 I started on my master thesis project studying possible EMC problems related
to the use of high speed modems (VDSL) connected to overhead telecommunication lines.
That was my rst encounter with the concept of EMC and I really found a lot of new
interesting experiences. The new knowledge I acquired during the master thesis project
gave me a desire to nd out more. This experience was making me start thinking that
EM compatibility is something I want to work with.
After receiving the master of science degree in 1997 I came to a decision based on
many circumstances at that time, to consider staying at the university as a PhD student.
The occupation of people near me and discussions with friends doing PhD studies, made
me take the step towards a PhD degree.
I want to thank my supervisors, Professor Jerker Delsing and Professor Dag Bjrklf
o o
for their guidance and kind support. I want to thank all my friends and colleagues at
Lule University of Technology and especially ke and Jonas for assisting me and sharing
a
A
their experiences.
I also want to thank my wife, Karin Lundgren for helping me nding out what really
counts and my family for their support.
ix
Part I
xii
Chapter 1
Thesis Introduction
1.1
In later years embedded systems and smart sensors have been of increasing interest for
machine to machine (sometimes abbreviated M2M) communication and automation of
services. In such devices it is sometimes desired to use wireless communication for transfer
of control and data.
People are experiencing that banking services and a variety of E-commerce opportunities exists through the use of modern information technology. Embedded systems also
increases the standard of living by oering a higher level of functionality to the home,
workplace and to the environment we live in.
In literature the future of digital services and media is expected to have a great
impact on the society [65, 2]. As a consequence this will make it hard or even fatal
for companies in many business areas to neglect the changing situation. When digital
information becomes more important, and more and more of products and services of
today becomes digitalized, digital communication between machines is essential.
For the access to digital services networked computers are used. To reduce the eort
made and improve the availability to gain access to digital services, mobile terminals such
as mobile phones and handheld computers (PDAs) can be used. Such mobile terminals
typically use wireless communication to maintain mobility while communication can take
place.
The use of robust wireless communication can give an advantage in electromagnetic
compatibility (EMC) issues if this implicate a reduction of cabling and galvanic interconnections in a system. For a system consisting of many parts with a substantial amount
of interconnections, electrical currents in ground conductors and cable shields can cause
electromagnetic interference problems.
However when the density of devices equipped with wireless communication capabilities increases, it is also important to realize that EMC considerations becomes central. A
device with wireless communication capabilities is a transceiver of electromagnetic energy
but may at the same time aect other radio receivers and be subject to electromagnetic
1
Introduction
1.2
The necessity of electromagnetic compatibility (EMC) is not that obvious for people
with no experience from electronic design. It is however necessary for modern electronic
devices to be designed with electromagnetic compatibility issues in mind to fulll
all safety and protection requirements and oer the functionality and quality expected
from the device. An apparatus both emits and receives electromagnetic energy conducted
on attached cables or radiated from enclosures and cables. That is just a side eect when
a electronic device is oering some functionality and can not be completely avoided.
Because of this undesired side eect there are legislated demands on the device regarding
its electromagnetic properties.
The European EMC directive (directive 89/336/EEC [21]) states under article 4 that
an electrical apparatus (covered by the directive) should be constructed so that:
the electromagnetic disturbance it generates does not exceed a level allowing radio
and telecommunications equipment and other apparatus to operate as intended
the apparatus has an adequate level of intrinsic immunity of electromagnetic disturbance to enable it to operate as intended.
Which means that a manufacturer of a apparatus covered by the directive must design
the apparatus and specify how it should be used so that it does not cause electromagnetic disturbance harming other devices that do comply with the directive. Also, the
apparatus must be designed to be immune to a normal level of electromagnetic energy
in the environment it is intended to be used.
These statements must be respected by all manufacturers of electric and electronic
equipment to be placed on the internal European market or they may experience legal
actions from market surveillance authorities. The way the directive is written (called
the new approach) gives the manufacturer responsibility of all products placed on the
market even if a product is approved by a third party, e.g. an accredited test lab or a
competent/notied body. The European EMC directive which was introduced in 1992
makes it necessary for manufacturers with intent to put their products on the European
market to address EMC issues.
In the United States the FCC regulations (FCC part 15 [24]) states limits on the
maximum acceptable levels (section 15.109) of emitted electromagnetic disturbance from
an apparatus working with signals in radio frequency (RF) range. However there are
no general regulations addressing a required level of a immunity against electromagnetic
disturbance as the case is in Europe. This issue is in the United States left for the market
itself to take care of, except for certain medical technical devices which are regulated by
FDA.
The EMC regulations are an important step since they are helping people to realize
that it is necessary to address electromagnetic compatibility problems. The problems
have to be solved before products involving electronic circuits can be put on the market
[9, 10].
Because of the increasing frequencies for the electromagnetic energy due to the use
of high clock frequencies and fast digital logic circuits in modern electronic designs, the
EMC requirements gets even harder to meet. It is necessary for the electronic designer
to incorporate EMC into the device at an early stage of the design process. If the EMC
issues are neglected until a working prototype is ready, the cost for xing eventual EMC
problems and non-complience may be severe. It is sometimes necessary to start over,
designing the device from scratch again. A good approach to reach EMC is usually to
use dierent kinds of electromagnetic barriers such as lters and shielding enclosures with
Introduction
conductive gaskets, or just a well planned layout of the circuit. It is much easier and
much less expensive to meet the regulations if the apparatus is well designed regarding
EMC aspects to start with, than trying to x an insucient design.
1.3
Chapter 2
EMC Barriers
2.1
Interpretation
2.2
Electromagnetic barriers used in EMC problem solutions may take many dierent forms.
A short overview will be given with examples on barriers and how they are used. The
5
EMC Barriers
H(f)
I(f)
Figure 2.1: As an example a shielding box of high conductivity material can oer good shielding
even for time varying magnetic elds H(f ) if induced currents I(f ) are free to ow all over
the surface. An aperture forces currents to a longer path around the aperture which causes a
voltage potential dierence across the aperture that can couple into the shielding box
H are orthogonal and related by a wave impedance Z depending on the medium where
the wave is propagating.
E
Z=
H
In free space the wave impedance is constant and equal to 377. This is the case when
far eld shielding is referred to and then the shielding eects can be described by the
following losses:
Absorption losses due to ohmic losses in shielding material.
Reection losses due to impedance change for propagating EM wave crossing medium
boundary.
For near eld shielding (distance from source less than 2 ) the electric eld and
the magnetic eld components must be considered separately and can be treated using
dierent shielding approaches. The eld type and frequency decides which materials and
techniques to use to achieve desired shielding performance:
Faradays cage shielding, high conductivity material, eective for electric elds
Low-reluctance path shielding, high permeability material, eective for magnetic
elds
Induced eddy current shielding, high conductivity material, eective for high frequency magnetic elds
For an enclosure where a high level of electromagnetic shielding is desired, a metallic
material is the best choice since metals oers the best conductivity. The enclosure will
thereby oer good shielding eectiveness for both electric and magnetic eld at reasonable
high frequencies.
The desired lifecycle of shielding enclosure is a main factor when the designer is
choosing the materials to be used. If metallic materials are used to make an enclosure
EMC Barriers
oering a high level of shielding it may be necessary to include bolts, rivets and gaskets
in the enclosure design to ensure high conductivity between the parts. High conductivity
paths between the parts are necessary for the shielding performance, see Figure 2.1,
but is also a problem when considering the life cycle of the shielding enclosure. High
conductivity paths between dierent metals can accelerate corrosion and can also cause
noise in sensitive circuits [54].
Filters are used for separating zones in electronics with dierent electromagnetic environment (EME). On a printed circuit board ground planning is necessary when dierent
parts of the circuit have dierent signal quality for instance analog ground and digital
ground. When a signal trace is crossing a boundary between electromagnetic zones surface mounted lters can be used to keep the integrity of the boundary and the signal
in the more sensitive circuit. It is also wise to make sure that the board is routed to
give adequate separation between traces especially for traces with analog signals with
low signal levels and traces that is crossing zone boarders.
2.3
2.3.1
Scattering parameters
Scattering parameters is a commonly used tool in RF and microwave design. The scattering parameters (s-parameters) represents the reection coecients and transmission
coecients for a two port circuit. The two involved reection coecients are denoted S11
and S22 . The two transmission coecients are denoted S12 and S21 .
S21
a2
S12
S11
Port 1
S22
b1
S 11=
b1
a1
Port 2
b2
a 2= 0
S 21=
b2
a1
a2= 0
S 12=
b1
a2
a1= 0
S 22=
b2
a2
a1= 0
S11 S12
S21 S22
a1
a2
(2.1)
If a complete four s-parameter description is available it is often presented in matrix form, equation (2.1). By transformation of the s-parameter matrix into the what
is called the chain-matrix the eect of cascading networks can easily be calculated by
matrix multiplication. Generalizations of the s-parameter description can be made for
characterization of networks with three ports or more [41, 50].
2.3.2
Shielding Eectiveness
10
2.3.3
EMC Barriers
Circuit Elements
Barriers characteristics can also be described by a circuit schematic. The circuit elements
and their values describing the barrier is sometimes easily obtained from datasheets,
sometimes they are possible to extract from the geometry or by measurements. It is
sometimes a great advantage to use the circuit description because of the possibility
to include the barrier in a circuit simulation of the entire system. The eect of the
barrier then can be studied under correct drive and load conditions in time domain or in
frequency domain [14, 46].
Shielding performance is sometimes given in form of the transfer impedance. This is
typically the case for shielded cables, shielded connectors and conductive gaskets but it
can also be used for shielded enclosures in general. To completely describe the shielding
eect on electromagnetic elds the transfer impedance description is not enough, there is
also a transfer admittance that can be causing leakage through an electromagnetic shield.
The transfer impedance Zt represents two coupling mechanisms namely the diusion
through the thickness of the shield and the magnetic eld coupling through imperfections
in the shield [49], see left part of gure 2.3. It can be obtained from measurements as the
ratio of a potential dierence across an electric eld Eout on the secondary side of a shield
due to a current density Jin on the primary side, see equation (2.2). The current density
used in this context is the current per unit length of a gasketed seam or per width of a
shielding surface rather than the current per area commonly used in other contexts. The
current density is therefore given the dimension of [A/m] rather than [A/m2 ].
Zt =
Eout
Jin
(2.2)
Yt =
Jout
Ein
(2.3)
11
Transfer impedance
Transfer admittance
Primary side
Primary side
Figure 2.3: To the left the two coupling mechanisms represented by transfer impedance is shown.
To the right the coupling mechanism represented by transfer admittance is shown.
2.3.4
Material electromagnetic properties such as complex permittivity and complex permittivity are another description from which an EMC barrier can be characterized. Using
traditional absorbtion loss and reection loss calculations the shielding eectiveness of a
material can be estimated under certain assumptions [48].
For dielectric materials included in EMC barriers, the knowledge of the material
complex permittivity and complex permittivity may be necessary for accurate modeling
of those barriers. Barrier models can then by computer simulation give an estimation on
shielding eectiveness etc.
For some EMC barriers an approach for characterization is to study the current
distribution that results from some excitation. It may for instance be of interest to
study the current distribution over a gasketed seam in a shielding enclosure application
to understand the eect of dierent conductive gaskets.
In the layout of printed circuit boards (PCBs) the eect of separated ground segments
can be analyzed by studying the ground layer current distribution and can adjustments
can be made to solve signal integrity issues. In addition electromagnetic radiation from
a conductive surface can be estimated if the surface current distribution is known.
On approach to investigate a current distribution by measurement is by near eld
scanning of magnetic eld component over a conductive surface and then estimate the
corresponding surface currents.
2.4
The need to address EMC issues at an early stage of product development is driving
research on computer modeling techniques to analyze design solutions. Replacing EMC
measurements on product prototypes with computer simulations also makes it possible
to try varied designs at a lower cost. For development of numerical modeling techniques
for use in computer simulations, comparisons with measured data and analytical models
12
EMC Barriers
Chapter 3
Measurement Methods Essential to
Work on Barriers
3.1
The concept of EMC barriers is a general view of techniques to reduce interference between electronic devices or interference within a device (signal integrity). Since a barrier
can be in the form of an electromagnetic shielding enclosure as well as a lter component, dierent measurement methods must be used for characterization of dierent
barrier types.
Shielding eectiveness (SE) measurements are typically used for characterization
of shielding materials and components of a shield such as conductive gaskets.
Scattering parameters (s-parameters) measurements are used for characterization
of lters and can also be used to study signal integrity and crosstalk problems.
Transfer impedance (Zt ) measurements are typically used for characterization of
shielded cables, shielded conductors and conductive gaskets.
Permittivity and permeability measurements are used for characterization of materials used in barriers. This data can then be used in barrier modeling.
Near eld scanning measurements may be used for analysis of current distribution
in a conductive surface. For instance divided ground planes can be analyzed.
Development of computer simulation techniques needs verication and validation to
prove the technique to be accurate when solving real design problems. This is usually
accomplished by comparisons of simulation results with analytical models and with measurements on prototypes. Dierent measurements methods are used for this purpose to
compare an observable parameter with the corresponding parameter from a simulation.
13
14
3.2
Measurement Methods
3.2.1
The foundation of shielding eectiveness measurements has earlier been the American
military standard MIL-STD-285 from 1956 [51]. The standard is now withdrawn but
improved methods of this type have made new standards evolve. The method uses two
screened rooms with one common wall as shown in gure 3.1. This wall has an aperture
where test objects are mounted.
In one room is the transmitter antenna located and the receiver antenna is located
in the other room, the antennas are directed towards each other and at a x distance
from each other. The transmitter is transmitting at constant power and the receiver
measure the transferred power with and without test object mounted in the aperture.
The dierence between these measurements is the insertion loss (IL) for the test object.
Measurements according to MIL-STD-285 have been used to examine new shielding materials as conductive composites and performance of conductive gaskets. Drawbacks with
the method are that measured insertion loss is dependent on the antenna placement and
the reections of the electromagnetic wave inside the screened rooms. This makes the
repeatability poor.
Improved versions of the method in MIL-STD-285 have developed were the problems
with reections have been minimized by the use of absorbing material in the chambers
15
Test object
Transmit antenna
Receive antenna
[11]. New improved version of the method in MIL-STD-285 can also be found in the
standard IEEE-STD-299 from 1997 [33]. Frequency range a few MHz to 18 GHz [58].
3.2.2
A measurement method called the dual mode stirred chamber or dual reverberation
chamber method is being developed by FOI, the Swedish Defence Research Agency in
Linkping, Sweden, National Institute of Standards and Technology (NIST) in the USA
o
and others [58, 56, 28, 26, 67, 57]. It uses two mode stirred chambers next to each other
with a common wall having an aperture for mounting of test objects.
A mode stirred chamber is a shielded room with a mode stirring arrangement to
create electromagnetic elds with a large number of modes within the chamber, see
gure 3.2. The mode stirring arrangement can be a mechanical paddle wheel or some
other highly conductive structure that can be rotated stepwise or continuously. It can
also be implemented by modulating the signal source and create frequency mode stirring
[63], also referred to as electronic mode stirring.
The multimode electromagnetic eld in the chambers can be of high amplitude using
a small not to expensive power amplier. A 1 Watt amplier can be used to create a
eld in the chamber with electric components of 100 Volts per meter or more, depending
on the quality factor (Q) of the chamber [63].
The facility can be used for mode tuning when the stirring mechanism is stepped between measurements so that several measurements are obtained in dierent electromagnetic environments. A mode stirring action can also be used when the stirring mechanism
is causing a continuously changing electromagnetic environment in the chamber.
This makes the measurements considerably easier, the placement of antennas is for
instance not critical here. Drawbacks are that the needed equipment to control the mode
stirring can be expensive and the method does not show if the test object is particularly
sensitive to a certain eld polarity from a certain direction. The lower frequency limit for
the method is about 500 MHz and it is dependent on the smallest size of the mode stirred
chambers (the smallest distance inside a chamber should be seven times the wavelength of
16
Measurement Methods
Stirring paddle
Transmit
antenna
Stirring paddle
Test object
Receive antenna
Figure 3.2: Shielding eectiveness measurement using a dual mode stirred chamber facility
the lowest frequency [56], i.e. 500 MHz gives a distance of more than four meters). Other
ways to derive the lowest useful frequency [31, 15, 17] gives dierent lower frequency limit
and to really know the lower frequency limit, measurement of the eld uniformity [31] in
the completed chamber is the best way to get an exact realistic value [29].
3.2.3
This is a simplied method [58, 67] that makes use of one mode stirred chamber. Inside
the chamber a transmitting antenna is located and an apertured TEM cell as receiver
[58, 40]. The location of the transmitting antenna and the TEM cell is not critical but
the antenna should not be aiming towards the TEM cell and the TEM cell should not be
close to the walls or other reecting objects [31, 15]. A TEM cell is an expanded section
of a rectangular co-axial transmission line. The sample is mounted over an aperture
in the TEM cell. An electromagnetic eld is then generated with the antenna and a
receiving instrument connected to the TEM cell is used to measure the leakage through
the sample. The usable frequency range is 200 MHz to 1 GHz and dynamic range about
100 dB [58].
3.2.4
A related and even cheaper method is the dual TEM cell method [58, 67, 53, 35]. Here
two TEM cells are connected together in a piggy-back manner, see gure 3.3. The
TEM cells are coupled trough an aperture in the common wall. An important feature
with this measurement method is that near eld SE measurements are obtained (E-eld
and H-eld shielding eectiveness).
One TEM cell is connected to a signal source and terminated in the other end. The
second TEM cell have two outputs where electric eld coupling and magnetic eld coupling can be measured respectively. The aperture is covered with the sample to be
investigated. A drawback with this method is that the polarization of the electric eld
is normal to the sample [58]. A nice feature with this method is that both electric- and
17
Termination
Signal
source
Figure 3.3: Shielding eectiveness measurement using a dual transverse electromagnetic (TEM)
cell
3.2.5
Another usage of the TEM cell is the split TEM cell [58, 35, 27], it is also called rectangular split transmission line holder. The split TEM cell is made as an ordinary TEM cell
in two halves. A sample is characterized by the insertion loss calculated from a measurement of attenuation through the empty cell with the halves joined and a measurement of
attenuation through the shorted cell with the halves joined with the sample in between.
Both the center conductor and the outer conductor must make good contact with the
sample on both sides so that the cell is shorted by the sample.
The receiving half of the TEM cell can be modied to measure the magnetic eld
shielding eciency. Then a loop antenna is combined with a box equipped with a 90degree angle reector on one wall. The loop antenna is mounted trough the reector
such that three quarters of the loop is inside the box and one quarter outside. When
performing a measurement the wall with the reector and quarter loop antenna is joined
with the half TEM cell and the sample in between. The frequency range for this method
is 1MHz to 1 GHz (1 MHz to 400 MHz for H-eld) and the dynamic range about 70-80dB
[58].
3.2.6
There are two quite dierent versions of this kind of test xture [27, 58]. The continuous
conductor (cc) version is an expanded 50 coaxial transmission line with tapered ends to
t standard 50 coaxial connector. The sample has to have an annular washer shape to
t between the inner and outer conductor and thereby short the transmission line. The
continuous conductor test xture has an operating frequency range of dc to 1 GHz and
a dynamic range of 90 - 100 dB [58].
18
Measurement Methods
The other version called split conductor (sc) is described in the standard ASTMD4935 and has a similar design but is split in two halves. This simplies mounting of
test samples. Test samples are needed both for the reference measurement and for the
actual measurement of the material.
For the reference measurement a small disc shaped piece is tted between center
conductors and a large washer shaped piece is tted between outer conductors. In the
actual measurement a large disc shaped piece is tted between the two halves of the
xture. This method keeps distance and material between the two parts of the xture
constant except for the region between center and outer conductor. The outer conductor
is equipped with anges to oer good capacitive coupling between the two halves of the
xture.
The insertion loss is calculated as the dierence between the measurement of the large
disc sample and the reference measurement. The split conductor xture has a frequency
range of 1 MHz to 1.8 GHz and a dynamic range of 90 - 100 dB [58].
3.2.7
A box split into two sections. Each section has an antenna xed on the inside. A sheet of
the sample material is sandwiched between the two sections and the transmission through
the material is measured. As a reference the transmission between the antennas are
measured without the sample present. From these measurements the shielding eciency
is calculated as the insertion loss. The test method has been used for frequencies from
100 kHz to 1 Ghz and gives a dynamic range of 80 dB.
3.3
The transfer impedance or surface transfer impedance is a way to describe the high
frequency characteristics of an electromagnetic shield in terms of lumped or distributed
circuit elements. Properties inuencing the performance of an electromagnetic shield
are the skin depth, geometrical shape among others. By determination of the transfer
impedance these properties are modelled by a circuit element giving the corresponding
electric eld on the secondary shield surface for a certain current on the primary shield
surface. This model are then very suitable for generation of a SPICE model making it
possible to simulate the penetration of an electromagnetic shield in a circuit simulator
[46].
3.3.1
For measuring the eciency of a coaxial cable shield a method is commonly used were
transfer impedance is measured. The standard IEC 96-1A [32] describes this procedure
and the design of the test xture. The triaxial xture setup used in this standard can for
a characterization of a 50 schematically be shown as in gure 3.4. The xture is usually
used with a network analyzer and transmission through the xture (S21 ) is recorded. The
transfer impedance of the cable shield can then be calculated be a formula (3.1) given in
19
50
U ~
50
50
Figure 3.4: Schematic measurement setup example for the triaxial transfer impedance xture
used in standard IEC 96-1A
the standard.
60
))
d
where d is the outer diameter of the cable screen under test.
Zt = abs(S21 2 1.4 60 ln(
(3.1)
Other standards exists for transfer impedance measurements on shielded cables. The
useful frequency range for the IEC 96-1A xture is DC to 30 MHz. More advanced
xtures using quadraxial and quintaxial setups are useful up to 1 GHz [30].
3.3.2
The standard SAE ARP 1705 [61] (from 1981) and the revised version SAE ARP 1705A
[62] (from 1997) describes how transfer impedance measurements is used to determine
the performance of EMC gaskets. Transfer impedance is dened as the voltage Uout on
the secondary side of the shield divided by the current density Jin (in Ampere per meter)
on the primary side of the shield, see gure 3.5 . The current density Jin may for instance
be induced by an incident electromagnetic eld. The higher the transfer impedance for
a gasket is the lower is the performance of the gasket since an electromagnetic eld on
the front side of the shield easier can give raise to electromagnetic elds on the backside
of the shield.
The measurement procedure is straightforward and to be able to determine the transfer impedance from the measured entities a simplied low frequency model of the test
xture is used, by improvements of this model more exact results would be obtained
[56, 13]. The test xture in the standard SAE ARP 1705 is stated to be useful for absolute measurements up to 700MHz. There are improved versions of transfer impedance
test xtures for use at higher frequencies [36, 37].
The contact pressure between the gasket and the mating surface is an important
parameter that has to be controlled when a gasket is examined. In the SAE ARP 1705
xture this is accomplished by pneumatic pressure behind a membrane involving the
cover that rests on the gasket. This method has its drawbacks, especially when testing
20
Measurement Methods
Jin
+
Uout
ngerstock gaskets that needs a small contact pressure and long compression height [64].
The newer SAE ARP 1705A the membrane is removed and the new construction is using
pneumatic cylinders to set the contact pressure.
3.3.3
For shielded connectors the transfer impedance characterization is also commonly used.
Dierent xtures are used in published studies [22, 66].
3.3.4
3.4
Several methods exists for the measurement of permeability and permittivity. The most
common measurement methods can be categorized as:
21
22
3.5
Measurement Methods
Near eld scanning is a useful tool in EMC for nding radiating sources on a printed
circuit board (PCB). A broken component or a poorly routed conductor trace can thereby
be identied and xed.
In particular near eld scanning of magnetic eld over a conductive surface gives a
hint of the surface current distribution. In this case a magnetic eld probe is stepwise
positioned over the conductive surface and connected to one port of a vector network
analyser. The other port of the vector network analyser is connected to the conductive
surface for excitation of surface currents. The coupling between the surface and the eld
probe is measured to magnitude and phase. From this magnetic eld distribution the
surface current distribution can be estimated [34].
An investigation on near eld radiation from traces on a printed circuit board shows
good agreements between measured and simulated elds [16]. Both E-eld and H-eld
probes was used and the magnitude of the eld was studied. The near eld scan were
collected using a computer controlled three dimensional positioning mechanism. A similar
study were done using two probes scanning simultaneously at dierent height to obtain
a phase dierence and a amplitude dierence [42]. The measured values compares well
with simulated results using a thin-wire structure analysis program (NEC). The method
of near eld scanning used in the study is suggested to be accurate enough for far eld
predictions of the radiation from a printed circuit board.
For antenna design work near eld scanning is also used. The current distribution in
a printed antenna can be analyzed and the far eld radiation pattern can be estimated
[34]. By scanning of magnetic eld over a ground plane on a printed circuit board the
current distribution can be analyzed and it can be decided if the ground planning design
stage have been done properly. This type of analysis usually better suited to be run in a
computer simulation. However it is of great value to able to verify computer simulation
results with measured data.
Chapter 4
Thesis Summary
4.1
Summary of Contributions
24
Thesis Summary
Paper F:
Lundgren U., Ekman J. and Delsing J., Shielding Eectiveness Data on Commercial
Thermoplastic Materials, Submitted to Electromagnetic Compatibility, IEEE Transactions on
Paper G:
Lundgren U. and Delsing J., Electromagnetic properties of thermoplastic material for
varying temperatures, Submitted to Microwave Theory and Techniques, IEEE Transactions on
4.1.1
4.1.2
25
Paper B: A comparison of measured and simulated current distribution on a printed log-periodic antenna
The current distribution on a log periodic dipole antenna (LPDA) have been studied using
near eld measurements and simulations based on method of moments. The antenna was
constructed on a printed circuit board.
Detailed measurements of the magnetic eld was obtained with 5 mm stepping two
dimensional scanning just above the surface of the antenna. The eld was sampled
using a loop probe connected to a vector network analyzer. The probe was positioned
by a computer controlled scanning mechanism. Two polarizations of the magnetic eld
was acquired with magnitude and phase. The current distribution on the antenna were
studied by examining the magnetic elds obtained by the scanning procedure.
The use of the printed circuit board to support the radiating elements and the parallel
wire transmission feeder line led to a mixed dielectric environment. This aected the
current distributions on the feeder and the radiating elements and hence the radiation
patterns and the impedance characteristics of the antenna.
Measured current distributions were compared with predicted distributions obtained
from Method of Moments (MOM) analysis of the LPDA structure. Comparison results
show that magnetic eld scanning of a printed antenna is a useful tool for getting a better
understanding of the real performance of the antenna. Measured and predicted far eld
radiation patterns are also compared.
4.1.3
In this paper, the partial element equivalent circuit (PEEC) method is illustrated and
applied to printed antenna structures where measurements are compared to simulations
and analytical solutions. The possibility to use simplied PEEC models to decrease
computation time is discussed with illustrative examples. The PEEC method is a full
wave technique for the solution of mixed circuit and eld problems in both the time and
frequency domain.
The international interest for the method has been gaining rapidly for the past years
but in the Nordic countries the research eort has been low. This paper can be considered
as an fundamental introduction to this electromagnetic computation technique.
By using a specialized discretization, the original structure is converted into a network of discrete inductances, capacitances and resistances, called the partial elements.
The partial elements are calculated either by using numerical integration techniques or
simplied closed form equations. The resulting equivalent circuits are solved by using a
commercial circuit simulation program like SPICE. The use of SPICE-like circuit solvers
facilitates the inclusion of discrete components, transmission lines, current/voltage source
etc in the resulting PEEC model.
The PEEC method has been shown to be a very powerful simulation technique for
combined circuit and electromagnetic eld problems. The rst example displays the
possibility to make PEEC models by using closed form equations to calculate the partial
elements and a free version of SPICE as the solver. This feature makes the method
26
Thesis Summary
possible to use in education and for simple design tasks. However, the method require a
retarded circuit solver to be considered a full wave method comparable with a method
of moments solution.
The application of PEECs to antennas is a valuable tool in many areas where antenna
resonance frequencies are of importance. The paper shows that antennas are modelled
with good agreement compared to analytical solutions and measurements.
4.1.4
SPICE models of electromagnetic zone barrier are devised. The models are based on
data from 2D and 3D Maxwell equation solvers. A transfer impedance approach modelled incident electromagnetic waves in SPICE. Test systems using D-sub connectors,
passive surface mounted lters and encapsulation was designed. Test system verication
measurements were made in a fully anechoic chamber. The coupling through the zone
barriers was measured. Good agreement was found between simulated and measured
data. The focus for electronic system designers is on product functionality. Here EMC
aspects are hard to approach using for the electronic engineer well known tools such as
SPICE.
This work thus focuses on building SPICE models for electromagnetic zone barriers enabling SPICE simulations of incident radiated power and immunity to incoming
disturbances.
SPICE models has been developed for commercially available components that can
be regarded as EMC barriers. Surface mounted lters and shielded connectors and cables
are examples of such components. Models have also been developed for EMC barriers
that appear in a circuit due to the layout of circuit.
The measurement results obtained in the unechoic chamber shows a poor agreement
with the SPICE simulations in the frequency range 30 MHz to 60 MHz where overlapping
data is available. Dierences between 10 and 40 dB in the two congurations is found.
However when comparing with other measurements or by extrapolation of the simulation
results a better agreement is found in the higher frequency range towards 100 MHz.
With the EM clamp injection method a much better agreement is obtained between
the measured system transfer impedance and the SPICE simulation. By combining
measurements for the parts of the system into a complete system transfer impedance
good agreement is obtained with SPICE simulation, in some instances a remaining oset
is found.
The measurements for the desired verication are hard to do with one single approach.
The frequency range for the SPICE simulation was limited by the transfer impedance data
obtained for the coaxial cable shield. It is reasonable to believe that better agreement
would be found if the SPICE simulation could be done at 100 MHz. The deviation
between the obtained results seems to decrease when frequency increases in the frequency
range of this study.
4.1.5
27
28
Thesis Summary
terials with high imaginary part of the permittivity seem to give an improved shielding
eectiveness compared to materials with small imaginary part of permittivity. The real
part of the permittivity does not correlate well with shielding eectiveness.
4.1.6
Ten dierent commercially available conductive thermoplastic materials have been tested
for near- and far-eld shielding eectiveness. Far eld shielding eectiveness was tested
using a modied standard measurement technique to provide results comparable with
company provided data. Further, housings of the dierent thermoplastic materials was
constructed and equipped with a EMI source to model a realistic near eld shielding eectiveness situation. Shielding eectiveness data up to 1GHz is presented. The conductive
thermoplastic material Faradex XP211 (with lling of stainless steel bre) and RTP EMI
283 (with lling of nickel coated carbon bre) were the two materials oering the best far
eld shielding performance. For near eld shielding, Faradex XX711 and Bekaert BekiShield (both with lling of stainless steel bre) were the two best performing. Faradex
XX711 showed the best combined far eld and near eld shielding results.
One problem that arises for the EMC engineer is to select an encapsulation technique
that oers a desired degree of electromagnetic shielding for a new electronic device. The
manufacturers of dierent conductive ller materials sometimes species the shielding
performance of their material in an application according to standardized measurement
method but deviations from the exact standard often occurs. This makes comparisons
between dierent manufacturers hard. Further the standardized method just give a hint
of what the shielding performance can be for the same material in an electronic device
encapsulation application.
Thus it was decided to evaluate electromagnetic shielding eectiveness for commercially available thermoplastic materials. Ten materials were chosen and samples manufactured for analysis using two measurement methods. This paper describes the composition of the chosen materials, the measurement techniques are discussed, the recorded
results are presented and conclusions from the comparisons are drawn. In some instances
manufacturer data were available for comparison.
This paper describes the composition of the chosen materials, the measurement techniques are discussed, the recorded results are presented and conclusions from the comparisons are drawn. In some instances manufacturer data were available for comparison.
When comparing the near- and far- eld shielding eectiveness for the thermoplastic
materials the following is noted.
Faradex XP211 oer the best far eld shielding eectiveness.
Faradex XX711 and Beki-Shield oer the best near eld shielding eectiveness
knocking the signal from the EMI source (transmitter) down below the noise oor.
Faradex XA611 is the material with the lowest level of shielding eectiveness for
both near- and far- eld.
29
Faradex XX711 is the best material for the combined shielding eectiveness.
Considering that the near eld shielding measurement imitates the use of material in
an application it is disappointing to se how poor guide the far eld shielding eectiveness
results are when a material selection for an enclosure must be made. In cases where
manufacturer data were available, agreement was quite good with the near eld method
in one instance while the dierence was close to 30 dB in the other three instances.
4.1.7
A thermoplastic material is examined. The complex permittivity and complex permeability are obtained while the temperature is varied from 20 to 60 Celsius. It was
necessary to perform instrument calibration at each temperature to cancel temperature
eects on cables and connectors. The thermoplastic material is used in a laminate with
metallic foil for encapsulation of electronic circuits. The laminated technique oers a
good barrier against moisture and good shielding for electromagnetic energy. To be able
to design stripline transmission lines in the laminate it is necessary to know the electromagnetic behavior of the isolating plastic material. Real part of the relative permittivity
was found to be 2.0 0.1 in the frequency range 100 MHz to 2.5 GHz. This value shows
a very small dependence of temperature changes in the range 20 Celsius to 60 Celsius.
It is of interest to explore the usage of a particular laminated encapsulation material
with integrated antennas in environments with changing temperature. The major problem is to establish a test methodology where temperature eects other than these of the
material under test are suciently suppressed. Thus series of experiments have been conducted to obtain complex permittivity and complex permeability for the thermoplastic
over temperature 20 60 C and frequencies from 100 MHz to 2.5 GHz.
It was found that the material under test have a real relative permittivity of 2.0 at
room temperature (20 C) and it is independent of temperature in the range 20 C to 60 C.
Imaginary relative permittivity was slightly smaller for the material under test than for
polyethylene. The results for the permeability was as expected for the material under
test. The real part of the relative permeability is close to 1 and imaginary part close to
0.
The measurement setup was very sensitive to temperature variations. The rst attempt to cover the temperature range 0 Celsius to 80 C with a single calibration was
insucient. Measurements were then done at three temperature points, 20 , 40 and
60 C, with careful calibration at each temperature to cancel the temperature eects on
the cables and connectors.
The good results from this work led to a patent application for an encapsulation
technique with integrated patch antenna and antenna feed transmission line [44].
30
Thesis Summary
Chapter 5
Conclusions - Suggested Further
Work
This thesis concludes with some reections on achieved results and interesting angles to
be aimed at for further work.
Techniques to generate lumped circuit models for electromagnetic barriers have been
developed and methods have been devised for generating models for transmission like
barriers as well as for barriers with unknown geometrical shape (Papers A and D).
The developed methods have been veried successfully for frequencies up to 1 GHz,
for some barrier models up to 4 GHz. It is desired to nd methodologies that increases
the useful frequency range of the generated models further and that would enable barrier
modeling for addressing electromagnetic shielding for instance in shielding enclosures.
Modeling of printed antenna structures have been done using the Partial Element
Equivalent Circuit (PEEC) method (Paper C). From SPICE computer simulations with
the generated antenna models good agreement is found when comparing with analytical solutions and s-parameter measurements. It would also be of interest to compare
PEEC model simulations of current distributions with measured current distributions
since this is an important step towards barrier modeling including coupling to radiated
elds. A comparison of current distributions on a printed antenna attained by Method
of Moment (MoM) simulations and scanning measurements of magnetic eld distribution
demonstrates this technique (Paper B).
A near eld shielding eectiveness (SE) measurement method has been developed
imitating the use of shielding material in an application (Paper E and F). Measured near
eld SE for conductive thermoplastic materials are compared with results from a far eld
SE measurement method. The measured near eld SE results deviates substantially from
measured far eld SE. Thus it is questioned how useful far eld (plane wave) SE data is
when a material selection for an enclosure must be made.
In a study for characterization of a thermoplastic material in terms of permittivity
and permeability measurements, the temperature dependence of the material parameters
was of interest (Paper G) . It was noted that the measurement cables were very sensitive
to temperature variations. To acquire reliable data instrument calibration were necessary
at each temperature point to cancel the temperature eects on the cables and connectors.
31
32
Conclusions
Further work is desired in the area of EMC barrier characterization and modeling and
could be summarized:
Development of improved lumped circuit model generation techniques to increase
the useful frequency range for generated barrier models.
Work to establish barrier modeling techniques for electromagnetic shielding where
radiating sources are considered. This would enable circuit simulation using SPICE
software to estimate shielding eectiveness of shielding enclosures. Here the transfer
impedance and transfer admittance description of an electromagnetic shield may
be an important approach. PEEC modeling is also an interesting and powerful
technique for this purpose.
Work on PEEC modeling for analysis of current distribution in conductive surfaces
such as patch antennas and PCB ground planes. This is an important step towards the ability to include barriers for electromagnetic eld shielding in circuit
simulation. Near eld scanning measurements of magnetic elds could be used for
verication in such work.
Better methods are desired for specication of electromagnetic shielding materials
since far eld SE measurements may fail to reect the application of a shielding
material in an electronic device enclosure. This may require better understanding
of impedance of radiated eld from a device and electric eld SE and magnetic eld
SE given separately for a shielding material.
References
33
34
References
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Part II
42
Paper A
An Approach to the Generation of
SPICE Models Feasible for EMC
Problems
Authors:
Jan Carlsson and Urban Lundgren
43
44
Paper A
Urban Lundgren
[C ] =
1k
c13
c 21
2k
c 23
k =1
c 31
c 32
c
k =1
3k
l11
l12
l13
l 31
l 32
l 33
c22dz
c33dz
, [L] = l 21 l 22 l 23
l33dz
3
l23dz
l13dz
2
l12dz
1
ref.
z
c12
k =1
Since the approach that we have used is based on multiconductor transmission line theory we have to determine the
per-unit length parameters in order to arrive at the wanted
circuit representation. Looking at the circuit representation of
a short section of a multi-conductor transmission with three
wires (reference not counted), Figure 1, the following relations
between the entries in the per-unit length capacitance and
inductance matrices and the values of the circuit elements can
be found.
Introduction
l22dz
l11dz
c23dz
c12dz
c11dz
c13dz
z+dz
Qi
Vj
Vm = 0, m j
. Thus, in order to
Conductor 2
Conductor 1
Vi,j+1
Vi-1,j
Vi,j
Vi+1,j
B
A
Vi,j-1
li
Vi +1, j ( A + B )
2( A + B + C + D )
Vi , j +1 ( B + C )
2( A + B + C + D )
Vi 1, j ( C + D )
2( A + B + C + D )
Vi, j 1 ( A + D )
2( A + B + C + D )
(1)
Figure 4 Printed circuit board for measurements of
crosstalk between adjacent conductors.
Figure 5 User interface of the finite difference program for determination of per-unit length parameters. In the
example a D-sub connector is analysed.
By defining the length of the analyzed barrier the code is
0
capable of generating a representative SPICE circuit file or
Measured
-10
Computed
computing the scattering parameters (S-parameters) for a
-20
given frequency range. The S-parameters are determined by
-30
first setting up the chain matrix for the analyzed device [7] and
-40
then using relations between the chain matrix and the
Near end
scattering matrix. These relations can easily be found by
-50
Far end
expressing the total voltages and currents in terms of the
-60
scattering voltages and currents, see (2).
Validation against measurements
In order to validate the computed response of a barrier by
using the FD2D program for generating circuit files and then
using them in SPICE a number of measurements have been
conducted. As an example the crosstalk between conductors
on a printed circuit board was analyzed. For the measurement
of near end and far end crosstalk a vector network analyzer
was used to get the scattering parameters from the four-port
made of two adjacent conductors with the length 100 mm
across the circuit board. All four ports were connected to 50
during all measurements. Configurations with different
spacing between the conductors were measured and compared
with simulations on the corresponding circuit models. Also
conductors with a non-uniform cross section along the length
were considered, see Figure 4.
-70
-80
-90
300k
1M
10M
100M
1G
Frequency, Hz
computed
S-parameters,
i ( f ) .
function Q =
the
-10
-20
-30
i(f)
-40
-50
Com puted
Measured
-70
-80
1M
10M
100M
1G
Frequency [Hz]
1
[B] (Z 0 [C ] + [D])1 [1]
Z0
(Z 0 [C ] + [D])1 (Z 0 [C ] [D])
1
[B]
Z0
1
[B]
Z0
1
[B ] [A] + 1
Z0
Z0
minimize
[ A] +
1
[B ] (Z 0 [C ] + [D ])1
Z0
we
-60
i.e.
| S 21 | [dB]
(Z 0 [C ] + [D])1
(Z 0 [C ] + [D])1
(2)
where [A], [B], [C] and [D] are the usual sub-matrices in the
general chain matrix.
When the S-parameters have been determined for all
frequencies of interest we have to compare the values with
measured S-parameters. Figure 7 shows an example of such a
comparison.
In order to find component values in the network that will
make the network representing the measured device we
minimize the average difference between measured and
R6
2000
C2
R1
1.15pF
R3
R4
50
L2
50
50
2.9uH
R2
5M
V2
L4
R5
50
1V
V1
280PH
1V
C1
220nF
-10
-20
| S21 | [dB]
-30
-40
-20
-40
-80
100k
-60
Computed
Measured
-70
-80
1M
-50
10M
100M
1G
M C3resultD.opj
3G
Frequency [Hz]
1M
10M
100M
1G
5G
Frequency [Hz]
Conclusions
The developed methods for generating lumped circuit models
for transmission like barriers as well as for barriers with
unknown geometrical shape have been verified against
measurements on prototype printed circuit boards. Good
agreement between SPICE simulation and measurement was
found for frequencies up to 1 GHz. For models of transmission
like barriers the upper frequency limit for good agreement is
depending on the number of cascaded sections in the circuit
model. For the 100 mm parallel conductor crosstalk, an
agreement within a few dB:s up to 1 GHz was achieved with
16 cascaded sections. The method of adapting an assumed
network to measured S-parameters gave an good agreement up
to 1 to 4 GHz when simple networks were assumed. Better
agreement in the high frequency range can of course be
reached by assuming a more complex network.
Acknowledgements
Thanks to Lennart Hasselgren at IVF (The Swedish Institute
of Production Engineering Research) for running SPICE
simulations with the generated lumped circuit models.
References
[1] L. W. Nagel, SPICE2: A Computer Program to Simulate
Semiconductor Circuits, Memorandum No. M520, May
1975.
[2] R.F. Harrington, Field computation by moment methods",
Macmillan New York 1968.
[3] P.P. Silvester and R.L. Ferrari, Finite elements for
electrical engineers", 2nd ed., Cambridge University Press,
1990.
[4] Pei-bai Zhou, Numerical Analysis of Electromagnetic
Fields, Springer-Verlag 1993.
[5] R. Laroussi and G. I. Costache, Finite-Element Method
Applied to EMC Problems, IEEE Transactions on
Electromagnetic Compatibility, Vol. 35, No. 2, pp. 178-184,
May 1993.
[6] C. Wei, R. F. Harrington, J. R. Mautz and T. K. Sarkar.,
Multiconductor Transmission Lines in Multilayered
Dielectric Media, IEEE Transactions on Microwave Theory
and Techniques, Vol. 32, No. 4, pp. 439-450, April 1984.
[7] F. M. Tesche, M. V. Ianoz and T. Karlsson, EMC
analysis methods and computational models, John Wiley &
Sons, inc., 1997.
Paper B
A comparison of measured and
simulated current distributions on
a printed log-periodic antenna
Authors:
Stewart Jenvey and Urban Lundgren
51
52
Paper B
SUMMARY
This paper describes the use of a position scanned magnetic field probe to investigate the
current distributions on the surface of a log periodic dipole antenna (LPDA) which was
constructed on printed circuit board. Measurements of the magnetic field magnitude and
phase at each point of the scan were used to derive the time variant instantaneous values of
the magnetic field and the instantaneous currents on the LPDA. These were used in the
analysis of the antenna design. The wave nature of the current distribution can be readily
observed and problems with the design such as standing waves on the feeder lines are
highlighted for attention in a revised design. Measured current distributions are compared
with predicted distributions obtained from Method of Moments (MOM) analysis of the LPDA
structure. Measured and predicted far field radiation patterns are also compared.
1. INTRODUCTION
Log periodic dipoles are a common, linearly polarised, broadband type of antenna. The
design, construction and testing of a printed LPDA and the use of magnetic scanning to aid in
optimising the design are discussed in this report.
The antenna examined was made using printed circuit technology so that a prototype could be
quickly created and that subsequent modifications to the design based on the investigations
described herein could be quickly and easily incorporated in the antenna design. New versions
of the prototype antenna could then be quickly and cheaply produced. The basic design
parameters and construction of the printed of the antenna are addressed Section 2.
The use of the printed circuit board to support the radiating elements and to separate the two
strips forming the parallel wire transmission feeder line created a mixed dielectric
environment. Consequently the current distribution on the antenna, and the LPDA impedance
and radiation patterns, are different from those that would exist for a wire LPDA operating at
the same frequencies in a free space environment. These current distributions on the printed
antenna were studied experimentally by examining the magnetic field of the antenna as
described in Section 3. The measurement results are presented in Section 4.
Section 5 discusses the MOM modelling of the LPDA and Section 6 then compares the
measured currents with those predicted by the MOM analysis. The computed and predicted
radiation patterns resulting are also compared.
Feed
Ln
dn
Xn+1
Xn
The transmission line from the feed must alternate which side of the line connects to which
side of the dipole in order to get the correct phasing to create an antenna that radiates in the
direction of the array apex. By using double-sided printed circuit board to construct the LPDA
the transmission line could consist of two strip conductors, one on either side of the board. By
putting one half of each dipole on either side of the board and connecting it to the
transmission line strip, and alternating which half dipole went on which side of the board, the
alternating feed connection was obtained (see Figure 2).
Fibreglass board (r = 4.5) 1/16 inch thick was used to construct the LPDA. The required
frequency range of the LPDA was 900 MHz to 3GHz which meant that the dipole elements,
based on a free space wavelength, were of a length that could easily be accommodated on the
200 mm by 300 mm printed circuit board used. The exact resonant length of the individual
dipoles was initially unknown due to the mixed dielectric environment in which the dipole
standing waves exist. The effective dielectric constant for the LPDA transmission line could
be calculated from the formula for the effective wavelength [3] in microstrip of the same track
width and half the dielectric thickness of the board used for the LPDA.
Y
X
Figure 2 The LPDA studied
polarisation were necessary to obtain both magnitude and phase information (due to
limitations in the control software). The procedure was repeated for each of the X and Y
polarisations of the magnetic field and at each measurement frequency.
Figure 4 X directed magnetic field at 1132 MHz, close to the LPDA surface
Figure 5 shows a two dimensional contour plot of the X and Y directed components of the
surface magnetic field at 1132 MHz. Dark areas surround the strongest fields. This
corresponds to the current distributions on the dipoles and the feed line respectively.
Az-meas
Az-calc
-5
dB
dB
-10
-10
-15
-15
-20
-20
-25
-25
-30
-200
-100
Figure 6
El-meas
El-calc
-5
0
Degrees
-30
100
200 -200
-100
0
Degrees
100
200
The computed and measured E plane and H plane radiation patterns of the LPDA are shown
in Figure 6. There is good agreement between them for the main lobe of the pattern but some
variance is seen between the back lobes. Differences between the actual current distribution
and that derived from the MOM analysis must be resolved to improve this back lobe match.
6.2
The currents on the individual dipoles are shown in Figure 6. The currents are plotted
normalised and in dB as the surface magnetic fields were measured in relative levels
expressed in dB.
dB
-5
-5
-10
-10
-15
-15
-20
-20
-25
-25
-0.1
-0.05
dB
0
metres
0.05
0.1
-0.08
-0.03
0.02
0.07
metres
Figure 7
Current distributions on two of the dipole elements (Solid-measured, broken-predicted)
The shapes of the current distributions match except for an asymmetry in them which is
assumed to be due to the presence of the co-ordinate table (see Figure 3).
Some of the absolute levels of the individual dipole currents do not correspond well. This may
be due to a non-proportional relationship between the magnetic field strength (measured with
a finite sized loop antenna just above conductors of varying width) and the total current on
that conductor. It is expected that investigations with a smaller loop antenna passed closer to
the surface of the antenna and analysis with other numerical methods (eg Finite Difference
Time Domain) will reveal the reason for this mismatch.
7. CONCLUSIONS
Magnetic scanning of the LPDA has been used in order to get an understanding of the LPDA
operation from its current distributions. The current distributions observed on the prototype
antenna were used to see where problems existed with the design (such as the standing waves
seen on the feed line in Figure 5(b)). They were also used to determine information on the
effective relative dielectric constant to be used in MOM analysis of the antenna and its
radiation characteristics. That the patterns predicted matched reasonably well gives
confidence in this approach.
Observed differences in the magnitude of the measured and computed currents on the dipoles
require further investigation.
8. REFERENCES
1. R. C. Johnson and H. Jasik, Antenna Engineering Handbook, McGraw-Hill, 2nd Ed.,1984.
2. W. L. Stutzman and G. A. Thiele, Antenna Theory and Design, John Wiley and Sons, 2nd
Ed.
3. S. Y. Liao, Microwave Circuit Analysis and Amplifier Design, Prentice-Hall, New Jersey,
1987.
Paper C
Analysis of Printed Antenna
Structures using the Partial
Element Equivalent Circuit
(PEEC) Method
Authors:
Jonas Ekman and Urban Lundgren
59
60
Paper C
Lp
i(t)
Rm
Cp12
Cp11
Cp22
i1
Lp11
i2 _ 1
Lp1 2
Lp2 2
Lp11
i1
i2 _ 1
Lp2 2
Dipole
Place nodes
Inductive partition
Capacitive partition
Paper D
SPICE models of barrier compared
to measured data
Authors:
Urban Lundgren, Jan Carlsson and Jerker Delsing
67
68
Paper D
Jan Carlsson
Jerker Delsing
l33dz
3
l23dz
l13dz
2
Introduction
The focus for electronic system designers is on product
functionality. Here EMC aspects are hard to approach using
for the electronic engineer well known tools such as SPICE.
This work thus focuses on building SPICE models for
electromagnetic zone barriers enabling SPICE simulations of
radiated power and immunity to incoming disturbances. The
datasheets from the manufacturer seldom gives a complete
description of the electrical characteristics of a component.
For instance for a filter the insertion loss is often the only
given performance parameter. To be able to make accurate
SPICE models for a component it is necessary to know the
entire scattering parameter matrix. It is then desired to find a
lumped component circuit with the behavior described by the
S-parameters.
SPICE models has been developed for commercially available
components that can be regarded as EMC barriers. Surface
mounted filters and shielded connectors and cables are
examples of such components. Models have also been
developed for EMC barriers that appear in a circuit due to the
layout of circuit. This includes separation of traces on a
printed circuit.
The modeling approach for the different kinds of barriers have
to by chosen with care to obtain useful data with a limited
amount of effort put in. Here some a priori knowledge is
necessary. A skilled RF designer can from the geometry of a
barrier judge if it can be regarded as a multi-conductor
transmission line (MTL), cascaded MTLs or if a more general
approach has to be chosen.
SPICE model generation techniques
For barriers that can be viewed as multi-conductor
transmission lines the cross-section is divided into small
elements and the Laplace equation is solved [1]. An
assumption is made that the cross-section is uniform. From the
l12dz
1
ref.
l22dz
c23dz
l11dz
c12dz
c11dz
c13dz
c22dz
c33dz
z+dz
DSUB1
R7
R8
in1
R10
100MEG in2
R20
R21
100MEGin3
100MEG in4
R11
100MEGin5 DSUB9
100MEG in6
100MEG in7
in8
in9
0
R15
50
V1
R14
1V
Filter
0 Track1
in1
in2
in3
inref
R13
100MEG 100MEG
inref
R1
R2
R3
100MEG
R4
R5
100MEG
100MEG
R6
100MEG
100MEG
50
out1
out2
out3
out4
out5
out6
out7
out8
out9
out1
out2
out3
outref
0
0
in1
inref
R16
DPAT3P16
outref
SMA1
Track2
out1
outref
DPAT4P16
R18
R19
50
5m
L1
50
0
0.28n
SMA2
Track3
in1
inref
out1
outref
DPAT4P16
R17
C2
50
220n
Figure 2 SPICE simulation model of the system (the models for the cable and connector shield is not included in this
figure).
Measurements
Two measurement ports on the PCB utilizing SMA connectors
makes it possible to monitor both transmitted signals in a
microstrip and signals in an adjacent microstrip due to
crosstalk on the PCB. Moreover the unused measurement port
can be left open or terminated with matched impedance which
renders 16 different test configurations that has been used in
the comparison.
Using the generated SPICE models of the EMC barriers to
describe the essential electromagnetic behavior of the test
system in a circuit simulation, the different configurations
were analyzed in the frequency domain.
SMA 2
SMA 1
Filter
Z T _ system =
S 21system 50
S 21sin gle
(1)
Z T _ system
U
= SMA
I probe
(2)
Impedance (dBohm)
SPICE simulation
Direct current injection
EM clamp current injection
Combined transfer functions
Incident plane wave
2.0E+07
4.0E+07
6.0E+07
8.0E+07
1.0E+08
Frequency (Hz)
Figure 7 Comparison of SPICE simulation results and measured data with input on D-sub pin 7 and
output on SMA 2, SMA 1 terminated in 50 ohm
Impedance (dBohm)
SPICE simulation
Direct current injection
EM clamp current injection
Combined transfer functions
Incident plane wave
2.0E+07
4.0E+07
6.0E+07
8.0E+07
1.0E+08
Frequency (Hz)
Figure 8 Comparison of SPICE simulation results and measured data with input on D-sub pin 8 and
output on SMA 2, SMA 1 terminated in 50 ohm
74
Paper E
Paper E
Characterization of Conductive
Thermoplastic Composite
Materials Using Multiple
Measurements Methods
Authors:
Urban Lundgren, Jonas Ekman and Jerker Delsing
75
76
Paper E
Jonas Ekman
Jerker Delsing
EISLAB
Lule University of Technology
971 87 Lule, Sweden
Abstract - In a study of conductive thermoplastic
composite materials, samples were manufactured and
measured. Samples with different base polymers, filler
materials and different amount of filler made it possible
to generate data for many combinations. The samples
were characterized in terms of their complex permittivity
and complex permeability, plane wave shielding
effectiveness and near electric field shielding
effectiveness. As can be expected materials that shows a
relatively high shielding effectiveness for a incident
plane wave also in general offers shielding in the near
field situation that was studied. A correlation between
SE and complex permittivity was also found.
I.
INTRODUCTION
SETUP
AND
80
50
70
60
40
dBV
30
20
10
-10
-20
20.0
100.0
1000.0
MHz
r =
k 1 R
k0 1 + R
(1)
r =
k 1+ R
k0 1 R
(2)
where
k 0 = 0 0
2
2
cos 1 e j 4 k0l + S12 S11
t
S
R = j 2 k0l 11 jkt
e
S12 e
k=
(3)
(4)
(5)
2.5
2
Re{e r}
1.5
0.5
0.2
0.4
0.6
0.8
1.2
1.4
1.6
1.8
GHz
SE = A + R + B dB
(6)
where
A = 0.1285 r ( r r ) dB
R = 20 log10 r dB
4
2l
B = 20 log 1 e , = j 0.021 f r dB
(7)
(8)
(9)
RESULTS
Data from the three methods were collected and are here
shown for the three sample materials in Fig. 11, 12 and
13.
In Fig. 11, 12 and 13 the stars shows near field shielding
effectiveness of an electric field source. In the figures,
the stars indicates the insertion loss at frequencies where
peaks were present in the transmitter free-space signal
spectra (Fig. 2). The repeatability for these
measurements are very good and the results presented
are from one measurement occasion but the results must
of course be regarded as unique to this test set-up. This
is because the shielding material is in close proximity of
the transmitting antenna so that the input impedance of
the transmitting antenna may change when changing
material. Also the near field impedance, that is the
relation of electric field strength to magnetic field
strength is unknown.
160
80
40
0
100
200
300
400
500
600
700
800
900
1000
Frequency /MHz
60
40
20
V.
REFERENCES
0
100
200
300
400
500
600
700
800
900
1000
Frequency /MHz
DISCUSSION
Paper F
Shielding Eectiveness Data on
Commercial Thermoplastic
Materials
Authors:
Urban Lundgren, Jonas Ekman and Jerker Delsing
83
84
Paper F
I. I NTRODUCTION
Shielding effectiveness data of commercially available conductive thermoplastic materials are seldom published other
than in product specication from the manufacturer. Also
different manufacturers uses different measurement methods
which makes comparisons hard.
For encapsulating electronic devices, boxes of metal sheets
have earlier been used. During the last two decades, plastic
materials have replaced metal in encapsulation. The last couple
of years, internal clock frequencies in electronic circuits have
increased to more than 1 GHz. This makes it important to
control emitted radio frequency electromagnetic emissions.
Also circuits must be protected from electromagnetic energy
in its environment. This is made by including lters in the
circuit design and to use encapsulation with electromagnetic
shielding capabilities.
There are a number of methods available to make encapsulations of plastic materials offering some degree of
electromagnetic shielding [7]. Those include surface treatment
of non conductive plastic such as conductive paint, vacuum
metallization etc. Another method is to mix conductive particles into the plastic before the encapsulation product is formed.
A great advantage with this method is that the number of
production steps are reduced.
One problem that arises for the EMC engineer is to select
an encapsulation technique that offers a desired degree of
electromagnetic shielding for a new electronic device. The
manufacturers of different conductive ller materials sometimes species the shielding performance of their material in
Manufacturer RTP Company [2] offer different kinds of plastic products to match specic applications demanding EMI
shielding, high temperature protection, and wear durability.
Typically, carbon bre, stainless steel ber, or nickel coated
carbon bre are used in a thermoplastic matrix to provide the
necessary shielding. The following materials were used:
EMI 2583 C FR Polycarbonate/Acrylonitrile-ButadieneStyrene (PC/ABS) with nickel coated carbon bre content
of 20%-wt, contains ame retardant.
EMI 162 Polypropylene (PP) with stainless steel bre
content of 15%-wt.
EMI 330 F FR Polycarbonate (PC) with stainless steel
bre content of 15%-wt, contains ame retardant.
EMI 283 NYLON-6,6 Polyhexamethylene-adipamide
(PA) with nickel coated carbon bre content of 20%-wt.
Manufacturer Bekaert [3] offer a stainless steel bre (BekiShield) that is used as ller for electrically conductive plastics.
The chopped bres are bound together with polymeric binders
specic for various polymer resins. For the test Beki-Shield
was mixed in Acrylonitrile-Butadiene-Styrene (ABS) with a
bre content of 15%-wt.
Fig. 2.
Fig. 1.
70
This aperture acts like a wave guide and attenuates the electromagnetic eld under a specic cut-off frequency resulting
in measurement problems and a reduced dynamic range for
lower frequencies. The upper frequency limit is set to 1000
MHz by the upper frequency limit for the transmitter power
amplier. The transmitting antenna was a Chase 6112B BiLog.
The dynamic range for the test set-up can be seen in Figure
1 and is over 50 dB for all frequencies. The main drawback
for this set-up is the small aperture size, only 90x90mm. The
dynamic range could be increased and the lower frequency
limit could be decreased if a bigger aperture could be used,
however larger material samples would then be required. Other
suggestions for improving the technique can be summarized
as follows:
better cables connecting the measurement receiver and
the receiver antenna offering a higher level of shielding
against the radiated incident eld,
improved sample holder design to simplify mounting of
test sample with repeated measurements.
B. Near eld shielding effectiveness measurements, application specic measurement
The second method used a more realistic test set-up to
characterize the shielding effectiveness for the different thermoplastic materials. A battery powered transmitter, is enclosed
in a 18 x 11 x 12 x cm box, see Figure 2, made out of the
different materials. The transmitter were placed on a table in a
anechoic room and the emitted free-space signal spectra at a 3
m distance were measured, see Figure 3. Then, the transmitter
were enclosed in a box, made of each material and the
emitted signal spectra were measured. The boxes were made
of two halves joined together with a slit. Finally, the shielding
effectiveness is calculated as the difference between these two
measurements. In this case the thermoplastic material is very
close to the signal source like in most shielding applications.
Meaning that the barrier, the thermoplastic material, is in the
near eld of the source and the nature, high or low impedance,
60
50
40
dBV
30
20
10
-10
-20
20.0
100.0
1000.0
MHz
Fig. 3.
50
40
30
20
10
0
0.2
0.3
0.4
0.5
Far field S E
Near field S E
60
0.6
0.7
Frequency (GHz)
0.8
0.9
Fig. 5.
Measured shielding effectiveness for Faradex XP211. Shielding
effectiveness data for plane wave shielding is shown with circles. The results
for near eld shielding effectiveness of an electric eld source is shown with
lled circles.
50
S hielding effectivenes s (dB)
Far field S E
Near field S E
60
40
70
30
10
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
0.8
0.9
20
0
0.2
Manufacturer data
60
50
40
30
Far field S E
Near field S E
20
Fig. 4.
Measured shielding effectiveness for Faradex XA711. Shielding
effectiveness data for plane wave shielding is shown with circles. The results
for near eld shielding effectiveness of an electric eld source is shown with
lled circles.
10
0
0.2
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
0.8
0.9
Fig. 6.
Measured shielding effectiveness for Faradex XX711. Shielding
effectiveness data for plane wave shielding is shown with circles. The results
for near eld shielding effectiveness of an electric eld source is shown with
lled circles.
Far field S E
Near field S E
60
50
S hielding effectivenes s (dB)
50
40
30
Manufacturer data
40
30
20
20
10
10
0
0.2
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
0.8
0.9
0
0.2
Fig. 7.
Measured shielding effectiveness for Faradex XC711. Shielding
effectiveness data for plane wave shielding is shown with circles. The results
for near eld shielding effectiveness of an electric eld source is shown with
lled circles.
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
0.8
0.9
Fig. 9. Measured shielding effectiveness for RTP EMI 2583 C FR. Shielding
effectiveness data for plane wave shielding is shown with circles. The results
for near eld shielding effectiveness of an electric eld source is shown with
lled circles.
Far field S E
Near field S E
60
Far field S E
Near field S E
60
50
50
S hielding effectivenes s (dB)
Far field S E
Near field S E
60
40
30
40
30
20
20
10
10
0
0.2
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
0.8
0.9
0
0.2
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
0.8
0.9
Fig. 8.
Measured shielding effectiveness for Faradex XA611. Shielding
effectiveness data for plane wave shielding is shown with circles. The results
for near eld shielding effectiveness of an electric eld source is shown with
lled circles.
Fig. 10.
Measured shielding effectiveness for RTP EMI 162. Shielding
effectiveness data for plane wave shielding is shown with circles. The results
for near eld shielding effectiveness of an electric eld source is shown with
lled circles.
V. C ONCLUSIONS
When comparing the near- and far- eld shielding effectiveness for the thermoplastic materials the following is noted.
Faradex XP211 offer the best far eld shielding effectiveness.
Faradex XX711 and Beki-Shield offer the best near eld
shielding effectiveness knocking the signal from the EMI
source (transmitter) down below the noise oor.
Faradex XA611 is the material with the lowest level of
shielding effectiveness for both near- and far- eld.
Faradex XX711 is the best material for the combined
shielding effectiveness.
Far field S E
Near field S E
60
Manufacturer data
60
50
S hielding effectivenes s (dB)
50
40
30
40
30
Far field S E
Near field S E
20
20
10
10
0
0.2
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
0.8
0.9
Fig. 11. Measured shielding effectiveness for RTP EMI 330 F FR. Shielding
effectiveness data for plane wave shielding is shown with circles. The results
for near eld shielding effectiveness of an electric eld source is shown with
lled circles.
Far field S E
Near field S E
60
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
0.8
0.9
Fig. 13. Measured shielding effectiveness for Beki-Shield. Shielding effectiveness data for plane wave shielding is shown with circles. The results for
near eld shielding effectiveness of an electric eld source is shown with
lled circles.
50
S hielding effectivenes s (dB)
0
0.2
40
30
Manufacturer data
R EFERENCES
20
10
0
0.2
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
0.8
0.9
Fig. 12.
Measured shielding effectiveness for RTP EMI 283. Shielding
effectiveness data for plane wave shielding is shown with circles. The results
for near eld shielding effectiveness of an electric eld source is shown with
lled circles.
[1] LNP.
Faradex
and
EMI-X
Electrically
Conductive
Compounds.
Nov.
2003.
[Online].
Available:
http://www.lnp.com/LNP/Products/PShieldingEmi.html
[2] RTP
Company.
Nov.
2003.
[Online].
Available
http://www.rtpcompany.com/products/index.htm
[3] Bekaert. Nov. 2003. [Online]. Available http://www.bekaert.com
[4] Rahman H., Saha P.K., Dowling J., Curran T., Shielding effectiveness
measurement techniques for various materials used for EMI shielding,
IEE Colloquium on Screening of Connectors, Cables and Enclosures
Digest No.012, London, Page(s): 9/1-9/6 of 68, 1992
[5] Kashyap S., Shielding effectiveness measurements with a dual TEM
cell and a split TEM cell, IEEE International Symposium on Electromagnetic Compatibility - Symposium Record., Page(s): 262-264 ISSN:
0190-1494, 1986.
[6] Lundgren U., Ekman J., Delsing J., Characterization of Conductive
Thermoplastic Composite Materials using Multiple Measurement Methods, EMC Europe 2002, Sorrento 2002
[7] Mottahed B. D., Manoochehri S., A review of materials, modeling
and simulation, design factors, testing, and measurements related to
electromagnetic interference shielding, Polymer-Plastics Technology
and Engineering, Volume: 34, Issue: 2, Page(s): 271-346, Mars 1995,
ISSN: 0360-2559
[8] Ondrejka A. R., Adams J. W., Shielding effectiveness (SE) measurement techniques, IEEE EMC Society Symposia Records, Page(s): 249256, 1984
[9] Wilson P. F., Ma M. T., Factors inuencing material shielding effectiveness measurements, IEEE EMC Society Symposia Records, Page(s):
29-33, 1985
[10] Bodnar D. G., Denny H. W., Jenkins B. M., Shielding effectiveness
measurements on conductive plastics, IEEE EMC Society Symposia
Records, Page(s): 27-33, 1979
Paper G
Electromagnetic properties of
thermoplastic material for varying
temperatures
Authors:
Urban Lundgren and Jerker Delsing
91
92
Paper G
I. I NTRODUCTION
= 0 r = 0 (r jr )
and
= 0 r = 0 (r jr )
where is the complex permittivity and is the complex
permeability.
It is expected that the real relative permittivity r of the
studied thermoplastic material will be between 2.0 and 2.5
because of preliminary tests on similar materials. The temperature stability is unknown but very important to judge the
usefulness of the material.
II. M EASUREMENT METHOD
Several methods exists for the measurement of permeability
and permittivity. Some of the most common are the loaded
resonant waveguide cavity [3], [4], the open ended coaxial line
[3] and the loaded coaxial transmission line [3], [5]. Cavity
resonance measurement methods are commonly used because
of the good accuracy offered, particularly for measurement of
imaginary part of the permittivity for determining the losses in
a material [3]. However the resonance of a cavity makes the
method only covering a narrow frequency band. This can be
improved to some extend by including higher order modes.
When studying temperature stability it is desired to use a
method that measures the permittivity and the permeability,
not the effect on the transmission line that is caused by thermal
expansion and contraction of the plastic material. Due to its
useful frequency range the loaded coaxial transmission line
technique is used in this paper for the measurement of the
k0 = 0 0
complex parameters. In the transmission line xture the material under test is placed to ll the volume between the inner and
outer conductor in a section along the line. The material may
load the line and cause a change of characteristic impedance.
Both reection and transmission through the xture is used
when calculating the test material data [5], [6].
Reection coefcients and transmission coefcients are
often given as scattering parameters (S-parameters) for a
two port circuit. The two involved reection coefcients are
denoted S11 and S22 . The two transmission coefcients are
denoted S12 and S21 .
The technique [5], [6] used for the measurements in this
section utilizes the measured complex S-parameters for a
loaded 50 transmission line seen in Figure 1.
A. Model for parameter extraction
and
R=
(ej2k0 l
S11
S12 ejkt )
(5)
then
kt = ktreal + j ktimg
and
ktreal = arctan(
Im(Arg +
Arg 2 1)
Re(Arg +
Arg 2 1)
) 2n
Arg 2 1
S22 = S11
r =
and
(4)
where
The calculation of complex permittivity and complex permeability The expressions for the calculation of the complex
permittivity and complex permeability are given in this part.
For a complete theoretical derivation, see [5]. In the calculations, only two S-parameters are used since the test xture in
Figure 1 are assumed to be symmetrical and reciprocal. This
means that
S21 = S12
and
2
2
arccos(ej4k0 l + S12 S11 )
t
(3)
1.5
0.5
Fig. 2.
0.5
1.5
Frequency (Hz)
2.5
3
9
x 10
Fig. 3.
0.6
0.4
0.2
-0.2
-0.4
-0.6
-0.8
-1
0.8
0.5
1.5
Frequency (Hz)
2.5
3
9
x 10
1.6
1.8
1.4
1.2
0.8
0.6
2
P E meas ured data
P E fitted polynomial
MUT meas ured data
MUT fitted polynomial
Air reference meas ured data
Air reference fitted polynomial
1.5
0.4
0.5
0.2
0.5
1.5
Frequency (Hz)
2.5
0
20
30
35
40
45
Temperature in Celcius
50
55
60
Fig. 8. Measured temperature characteristics for polyethylene (PE), thermoplastic material (MUT) and empty xture (air) in same graph and corresponding tted polynomials, at 900 MHz
3
1
Material under tes t (MUT)
P olyethylene (P E)
Empty fixture
0.8
2.5
Real part of relative permittivity at 1800 MHz
25
x 10
0.6
0.4
0.2
-0.2
-0.4
-0.6
2
P E meas ured data
P E fitted polynomial
MUT meas ured data
MUT fitted polynomial
Air reference meas ured data
Air reference fitted polynomial
1.5
0.5
-0.8
-1
0.5
1.5
Frequency (Hz)
2.5
3
9
25
30
35
40
45
Temperature in Celcius
50
55
60
x 10
temperature.
A curve tting method have been used in a least square
error manner. A polynomial of degree 1 (a straight line) was
tted to the measured data and is plotted together with the
measured data. The measured temperature dependence for
reference material (PE), material under test and air is shown
for three frequencies in Figures 8, 9 and 10.
The corresponding straight line equations are at 900 MHz:
rP olyethylene = 2.3321 (9E 4) t
rM U T sample = 2.0985 + (1E 4) t
rAirref erence = 1.0283 (2E 4) t
The corresponding straight line equations are at 1800 MHz:
rP olyethylene = 2.2289
0
20
Fig. 9. Measured temperature characteristics for polyethylene (PE), thermoplastic material (MUT) and empty xture (air) in same graph and corresponding tted polynomials, at 1.8 GHz
R EFERENCES
2.5
2
P E meas ured data
P E fitted polynomial
MUT meas ured data
MUT fitted polynomial
Air reference meas ured data
Air reference fitted polynomial
1.5
0.5
0
20
25
30
35
40
45
Temperature in Celcius
50
55
60
Fig. 10.
Measured temperature characteristics for polyethylene (PE),
thermoplastic material (MUT) and empty xture (air) in same graph and
corresponding tted polynomials, at 2.4 GHz