Core I7 6xxx Lga2011 v3 Datasheet Vol 1 PDF
Core I7 6xxx Lga2011 v3 Datasheet Vol 1 PDF
Core I7 6xxx Lga2011 v3 Datasheet Vol 1 PDF
LGA2011-v3 Socket
Datasheet – Volume 1 of 2
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2 Datasheet, Volume 1 of 2
Table of Contents
1 Introduction .............................................................................................................. 9
1.1 Processor Feature Details ................................................................................... 10
1.2 Supported Technologies ..................................................................................... 11
1.3 Interfaces ........................................................................................................ 11
1.3.1 System Memory Support ......................................................................... 11
1.3.2 PCI Express* ......................................................................................... 12
1.3.3 Direct Media Interface Gen 2 (DMI2)......................................................... 13
1.3.4 Platform Environment Control Interface (PECI) ........................................... 14
1.4 Power Management Support ............................................................................... 14
1.4.1 Processor Package and Core States........................................................... 14
1.4.2 System States Support ........................................................................... 14
1.4.3 Memory Controller.................................................................................. 14
1.4.4 PCI Express* ......................................................................................... 14
1.5 Thermal Management Support ............................................................................ 14
1.6 Package Summary............................................................................................. 15
1.7 Terminology ..................................................................................................... 15
1.8 Related Documents ........................................................................................... 18
2 Interfaces................................................................................................................ 19
2.1 System Memory Interface .................................................................................. 19
2.1.1 System Memory Technology Support ........................................................ 19
2.1.2 System Memory Timing Support............................................................... 19
2.2 PCI Express* Interface....................................................................................... 20
2.2.1 PCI Express* Architecture ....................................................................... 20
2.2.1.1 Transaction Layer ..................................................................... 21
2.2.1.2 Data Link Layer ........................................................................ 21
2.2.1.3 Physical Layer .......................................................................... 21
2.2.2 PCI Express* Configuration Mechanism ..................................................... 21
2.3 Direct Media Interface 2 (DMI2) / PCI Express* Interface ....................................... 22
2.3.1 DMI2 Error Flow ..................................................................................... 22
2.3.2 Processor / PCH Compatibility Assumptions................................................ 22
2.3.3 DMI2 Link Down..................................................................................... 22
2.4 Platform Environment Control Interface (PECI) ...................................................... 22
3 Technologies ........................................................................................................... 23
3.1 Intel® Virtualization Technology (Intel® VT) ......................................................... 23
3.1.1 Intel® VT-x Objectives ............................................................................ 23
3.1.2 Intel® VT-x Features .............................................................................. 24
3.1.3 Intel® VT-d Objectives ............................................................................ 24
3.1.3.1 Intel® VT-d Features Supported.................................................. 25
3.1.4 Intel® Virtualization Technology Processor Extensions ................................. 25
3.2 Security Technologies ........................................................................................ 26
3.2.1 Intel® Advanced Encryption Standard New Instructions
(Intel® AES-NI) Instructions .................................................................... 26
3.2.2 Execute Disable Bit................................................................................. 26
3.3 Intel® Hyper-Threading Technology (Intel® HT Technology).................................... 26
3.4 Intel® Turbo Boost Max Technology 3.0 ............................................................... 27
3.4.1 Intel® Turbo Boost Operating Frequency ................................................... 27
3.5 Enhanced Intel® SpeedStep® Technology............................................................. 27
3.6 Intel® Advanced Vector Extensions (Intel® AVX) ................................................... 28
4 Signal Descriptions .................................................................................................. 31
4.1 System Memory Interface .................................................................................. 31
4.2 PCI Express* Based Interface Signals................................................................... 32
Datasheet, Volume 1 of 2 3
4.3 Direct Media Interface 2 (DMI2) Signals................................................................33
4.4 Intel® QuickPath Interconnect (Intel® QPI) Signals ................................................34
4.5 Platform Environment Control Interface (PECI) Signal .............................................34
4.6 System Reference Clock Signals ..........................................................................34
4.7 JTAG and TAP Signals.........................................................................................34
4.8 Serial VID Interface (SVID) Signals ......................................................................35
4.9 Processor Asynchronous Sideband and Miscellaneous Signals...................................35
4.10 Processor Power and Ground Supplies ..................................................................38
5 Electrical Specifications ...........................................................................................39
5.1 Integrated Voltage Regulation .............................................................................39
5.2 Processor Signaling ............................................................................................39
5.2.1 System Memory Interface Signal Groups....................................................39
5.2.2 PCI Express* Signals...............................................................................39
5.2.3 Direct Media Interface 2 (DMI2) / PCI Express* Signals ...............................39
5.2.4 Platform Environmental Control Interface (PECI) .........................................40
5.2.4.1 Input Device Hysteresis .............................................................40
5.2.5 System Reference Clocks (BCLK{0/1}_DP, BCLK{0/1}_DN) .........................40
5.2.6 JTAG and Test Access Port (TAP) Signals....................................................41
5.2.7 Processor Sideband Signals ......................................................................41
5.2.8 Power, Ground and Sense Signals .............................................................41
5.2.8.1 Power and Ground Lands............................................................41
5.2.8.2 Decoupling Guidelines ................................................................42
5.2.8.3 Voltage Identification (VID) ........................................................42
5.2.8.4 SVID Commands .......................................................................42
5.2.8.5 SetVID Fast Command ...............................................................43
5.2.8.6 SetVID Slow .............................................................................43
5.2.8.7 SetVID Decay ...........................................................................43
5.2.8.8 SVID Power State Functions: SetPS .............................................43
5.2.8.9 SVID Voltage Rail Addressing......................................................44
5.2.8.10 Reserved or Unused Signals........................................................46
5.2.9 Reserved or Unused Signals .....................................................................46
5.3 Signal Group Summary.......................................................................................47
5.4 Power-On Configuration (POC) Options .................................................................50
5.5 Absolute Maximum and Minimum Ratings..............................................................51
5.5.1 Storage Conditions Specifications..............................................................51
5.6 DC Specifications ...............................................................................................52
5.6.1 Die Voltage Validation .............................................................................55
5.6.1.1 VCCIN Overshoot Specifications ....................................................55
5.6.2 Signal DC Specifications ..........................................................................56
5.6.2.1 DDR4 Signal DC Specifications ....................................................56
5.6.2.2 PECI DC Specifications ...............................................................58
5.6.2.3 System Reference Clock (BCLK{0/1}) DC Specifications .................58
5.6.2.4 SMBus DC Specifications ............................................................60
5.6.2.5 JTAG and TAP Signals DC Specifications .......................................61
5.6.2.6 Serial VID Interface (SVID) DC Specifications................................61
5.6.2.7 Processor Asynchronous Sideband DC Specifications ......................62
5.6.2.8 Miscellaneous Signals DC Specifications........................................62
6 Processor Land Listing .............................................................................................63
4 Datasheet, Volume 1 of 2
Figures
1-1 Platform Block Diagram Example ......................................................................... 10
1-2 PCI Express* Lane Partitioning and Direct Media Interface Gen 2 (DMI2) .................. 13
2-1 PCI Express* Layering Diagram........................................................................... 20
2-2 Packet Flow through the Layers........................................................................... 20
5-1 Input Device Hysteresis ..................................................................................... 40
5-2 Voltage Regulator (VR) Power State Transitions..................................................... 44
5-3 Serial VID Interface (SVID) Signals Clock Timings ................................................. 53
5-4 VCCIN Static and Transient Tolerance Loadlines ...................................................... 55
5-5 VCCIN Overshoot Example Waveform .................................................................... 56
5-6 BCLK{0/1} Differential Clock Measurement Point for Ringback ................................ 59
5-7 BCLK{0/1} Differential Clock Cross Point Specification ........................................... 59
5-8 BCLK{0/1} Single-Ended Clock Measurement Points for Absolute Cross
Point and Swing ................................................................................................ 60
5-9 BCLK{0/1} Single-Ended Clock Measure Points for Delta Cross Point ........................ 60
Tables
1-1 Terminology ..................................................................................................... 15
1-2 Related Documents ........................................................................................... 18
4-1 Memory Channel DDR0, DDR1, DDR2, DDR3......................................................... 31
4-2 Memory Channel Miscellaneous ........................................................................... 32
4-3 PCI Express Port 1 Signals.................................................................................. 32
4-4 PCI Express* Port 2 Signals ................................................................................ 32
4-5 PCI Express* Port 3 Signals ................................................................................ 33
4-6 PCI Express* Miscellaneous Signals ..................................................................... 33
4-7 Direct Media Interface 2 (DMI2) Signals ............................................................... 33
4-8 Intel QPI Port 0 and 1 Signals ............................................................................. 34
4-9 Platform Environment Control Interface (PECI) Signal ............................................ 34
4-10 System Reference Clock (BCLK{0/1}) Signals ....................................................... 34
4-11 JTAG and TAP Signals ........................................................................................ 34
4-12 SVID Signals .................................................................................................... 35
4-13 Processor Asynchronous Sideband Signals ............................................................ 35
4-14 Miscellaneous Signals ........................................................................................ 37
4-15 Power and Ground Signals .................................................................................. 38
5-1 Power and Ground Lands.................................................................................... 41
5-2 SVID Address Usage .......................................................................................... 44
5-3 VR12.5 Reference Code Voltage Identification (VID) Table ...................................... 45
5-4 Signal Description Buffer Types ........................................................................... 47
5-5 Signal Groups ................................................................................................... 47
5-6 Signals with On-Die Weak Pull-Up/Pull-Down Resistors ........................................... 50
5-7 Power-On Configuration Option Lands .................................................................. 50
5-8 Processor Absolute Minimum and Maximum Ratings ............................................... 51
5-9 Storage Condition Ratings .................................................................................. 51
5-10 Voltage Specification.......................................................................................... 52
5-11 Current (ICCIN_MAX and ICCIN_TDC) Specification ..................................................... 54
5-12 VCCIN Static and Transient Tolerance Processor...................................................... 54
5-13 VCCIN Overshoot Specifications ............................................................................ 56
5-14 DDR4 Signal DC Specifications ............................................................................ 56
5-15 PECI DC Specifications ....................................................................................... 58
Datasheet, Volume 1 of 2 5
5-16 System Reference Clock (BCLK{0/1}) DC Specifications..........................................58
5-17 SMBus DC Specifications.....................................................................................60
5-18 JTAG and TAP Signals DC Specifications ................................................................61
5-19 Serial VID Interface (SVID) DC Specifications ........................................................61
5-20 Processor Asynchronous Sideband DC Specifications...............................................62
5-21 Miscellaneous Signals DC Specifications ................................................................62
6-1 Processor Land List ............................................................................................64
6 Datasheet, Volume 1 of 2
Revision History
Revision
Description Date
Number
002 • Section 1.3.1. Updated section to remove support for 2Gb and UDIMM x16 August 2006
Datasheet, Volume 1 of 2 7
8 Datasheet, Volume 1 of 2
Introduction
1 Introduction
The Intel® Core™ i7 processor family for LGA2011-v3 Socket processors are the next
generation of 64-bit, multi-core enterprise processors built on 14-nm process
technology. Based on the low power / high performance processor microarchitecture,
the processor is designed for a platform consisting of a processor and Platform
Controller Hub (PCH).
The datasheet is distributed as a part of a two volume set. Volume 2 provides register
information. Refer to the Related Documents section for access to Volume 2.
The processor supports up to 46 bits of physical address space and 48 bits of virtual
address space. The processor features up to 40 lanes of PCI Express* 3.0 links capable
of 8.0 GT/s, and 4 lanes of DMI2/PCI Express* 2.0. It features an Integrated Memory
Controller (IMC) that supports 4 channels of DDR4 memory.
The integrated memory controller (IMC) and integrated I/O (IIO) are on a single silicon
die. This single-die solution is known as a monolithic processor.
Note: Throughout this document, the Intel® Core™ i7 processor family for LGA2011-v3
Socket processors may be referred to as “processor”.
Note: Some processor features are not available on all platform segments, processor types,
and processor SKUs.
Datasheet, Volume 1 of 2 9
Introduction
CH A
CH B
PCI Express* 3.0 Processor
CH C System Memory
CH D
USB 3.0
LPC
SMBus 2.0
Super IO / EC
GPIOs
10 Datasheet, Volume 1 of 2
Introduction
1.3 Interfaces
1.3.1 System Memory Support
• Supports four DDR4 channels
• Unbuffered DDR4 DIMMs supported
• Independent channel mode or lockstep mode
• Data burst length of eight cycles for all memory organization modes
• Memory DDR4 data transfer rates of 1600 MT/s, 1866 MT/s, 2133 MT/s, and
2400 MT/s
• 64-bit wide channels
• DDR4 standard I/O Voltage of 1.2 V
• 4Gb, and 8Gb DDR4 DRAM technologies supported for these devices:
— UDIMM x8
• Up to 4 ranks supported per memory channel, 1, 2, or 4 ranks per DIMM
• Open with adaptive idle page close timer or closed page policy
• Per channel memory test and initialization engine can initialize DRAM to all logical
zeros or a predefined test pattern
• Minimum memory configuration: independent channel support with 1 DIMM populated
• Command launch modes of 1n/2n
• Improved Thermal Throttling
• Memory thermal monitoring support for DIMM temperature using two memory signals,
MEM_HOT_C{01/23}_N
Datasheet, Volume 1 of 2 11
Introduction
12 Datasheet, Volume 1 of 2
Introduction
Figure 1-2. PCI Express* Lane Partitioning and Direct Media Interface Gen 2 (DMI2)
0…3 0…3 4…7 0…3 4…7 8…11 12..15 0…3 4…7 8…11 12..15
X4 X4 X4 X4 X4 X4 X4 X4 X4 X4 X4
DMI Port 1a Port 1b Port 2a Port 2b Port 2c Port 2d Port 3a Port 3b Port 3c Port 3d
X8 X8 X8 X8 X8
X16 X16
Port 2a Port 3a
Datasheet, Volume 1 of 2 13
Introduction
14 Datasheet, Volume 1 of 2
Introduction
1.7 Terminology
Caching Agent (also referred to as CA). It is a term used for the internal logic
Cbo providing ring interface to LLC and Core. The Cbo is a functional unit in the
processor.
DMI2 Direct Media Interface Gen2 operating at PCI Express 2.0 speed.
DTLB Data Translation Look-aside Buffer. Part of the processor core architecture.
Enhanced Intel Allows the operating system to reduce power consumption when performance is
SpeedStep® Technology not needed.
Intel® Core™ i7 processor Intel's 22-nm process based product. The processor supports Efficient
family for LGA2011-v3 Performance High-End Desktop platforms
Socket processor
Datasheet, Volume 1 of 2 15
Introduction
Intel® Virtualization Technology (Intel® VT) for Directed I/O. Intel VT-d is a
hardware assist, under system software (Virtual Machine Manager or operating
Intel® VT-d system) control, for enabling I/O device Virtualization. Intel VT-d also brings
robust security by providing protection from errant DMAs by using DMA
remapping, a key feature of Intel VT-d.
Any timing variation of a transition edge or edges from the defined Unit Interval
Jitter
(UI).
The 2011-v3 land FC-LGA package mates with the system board through this
LGA2011-v3 Socket
surface mount, 2011-v3 contact socket.
LRU Least Recently Used. A term used in conjunction with cache allocation policy.
Platform Controller Hub. The next generation chipset with centralized platform
capabilities including the main I/O interfaces along with display connectivity,
PCH
audio features, power management, manageability, security and storage
features.
The third generation PCI Express specification that operates at twice the speed
PCI Express 3.0 of PCI Express 2.0 (8 Gb/s); PCI Express 3.0 is completely backward compatible
with PCI Express 1.0 and 2.0.
The term "processor core" refers to Si die itself which can contain multiple
Processor Core execution cores. Each execution core has an instruction cache, data cache, and
256-KB L2 cache. All execution cores share the L3 cache.
Intel QPI Agent. An internal logic block providing interface between internal Ring
R3QPI
and external Intel QPI.
16 Datasheet, Volume 1 of 2
Introduction
Request Transaction IDs are credits issued by the Cbo to track outstanding
RTID
transaction, and the RTIDs allocated to a Cbo are topology dependent.
Stock Keeping Unit (SKU) is a subset of a processor type with specific features,
SKU electrical, power and thermal specifications. Not all features are supported on all
SKUs. A SKU is based on specific use condition assumption.
STD Suspend-to-Disk
STR Suspend-to-RAM
The portion of the processor comprising the shared LLC cache, Cbo, IMC, HA,
Uncore
PCU, Ubox, IIO and Intel QPI link interface.
VCCIN Primary voltage input to the voltage regulators integrated into the processor.
Datasheet, Volume 1 of 2 17
Introduction
§§
18 Datasheet, Volume 1 of 2
Interfaces
2 Interfaces
This chapter describes the functional behaviors supported by the processor. Topics
covered include:
• System Memory Interface
• PCI Express* Interface
• Direct Media Interface 2 (DMI2) / PCI Express* Interface
• Platform Environment Control Interface (PECI)
Datasheet, Volume 1 of 2 19
Interfaces
The PCI Express* architecture is specified in three layers – Transaction Layer, Data Link
Layer, and Physical Layer. The partitioning in the component is not necessarily along
these same boundaries. Refer to the following figure for the PCI Express* Layering
Diagram.
Transaction Transaction
Physical Physical
Logical Sub-Block Logical Sub-Block
RX TX RX TX
Sequence
Framing Header Date ECRC LCRC Framing
Number
Transaction Layer
Data Link Layer
Physical Layer
20 Datasheet, Volume 1 of 2
Interfaces
The transmission side of the Data Link Layer accepts TLPs assembled by the
Transaction Layer, calculates and applies data protection code and TLP sequence
number, and submits them to Physical Layer for transmission across the Link. The
receiving Data Link Layer is responsible for checking the integrity of received TLPs and
for submitting them to the Transaction Layer for further processing. On detection of TLP
error(s), this layer is responsible for requesting retransmission of TLPs until information
is correctly received, or the Link is determined to have failed. The Data Link Layer also
generates and consumes packets that are used for Link management functions.
The PCI Express* Host Bridge is required to translate the memory-mapped PCI
Express* configuration space accesses from the host processor to PCI Express*
configuration cycles. To maintain compatibility with PCI configuration addressing
mechanisms, it is recommended that system software access the enhanced
configuration space using 32-bit operations (32-bit aligned) only.
See the PCI Express* Base Specification for details of both the PCI-compatible and PCI
Express* Enhanced configuration mechanisms and transaction rules.
Datasheet, Volume 1 of 2 21
Interfaces
Downstream transactions that had been successfully transmitted across the link prior
to the link going down may be processed as normal. No completions from downstream,
non-posted transactions are returned upstream over the DMI2 link after a link down
event.
The interface design was optimized for interfacing to Intel processor and chipset
components in both single processor and multiple processor environments. The single
wire interface provides low board routing overhead for the multiple load connections in
the congested routing area near the processor and chipset components. Bus speed,
error checking, and low protocol overhead provides adequate link bandwidth and
reliability to transfer critical device operating conditions and configuration information.
§§
22 Datasheet, Volume 1 of 2
Technologies
3 Technologies
Datasheet, Volume 1 of 2 23
Technologies
24 Datasheet, Volume 1 of 2
Technologies
Datasheet, Volume 1 of 2 25
Technologies
The architecture consists of six instructions that offer full hardware support for Intel
AES-NI. Four instructions support the Intel AES-NI encryption and decryption, and the
other two instructions support the Intel AES-NI key expansion. Together, they offer a
significant increase in performance compared to pure software implementations.
The Intel AES-NI instructions have the flexibility to support all three standard Intel
AES-NI key lengths, all standard modes of operation, and even some nonstandard or
future variants.
26 Datasheet, Volume 1 of 2
Technologies
Processors with Intel Turbo Boost Max Technology 3.0 feature contain at least one
processor core whose maximum turbo frequency is higher than the others. To realize
the higher performance benefit of such a core, targeted applications must run on that
core. The processor core with the higher frequency may vary from one processor to
another. BIOS calls to the mailbox interface is used to identify the core with the higher
performance.
To determine the highest performance frequency amongst active cores, the processor
takes the following into consideration:
• number of cores operating in the C0 state
• estimated current consumption
• estimated power consumption
• die temperature
Any of these factors can affect the maximum frequency for a given workload. If the
power, current, or thermal limit is reached, the processor will automatically reduce the
frequency to stay with its TDP limit.
Note: Intel Turbo Boost Technology is only active if the operating system is requesting the P0
state.
Enhanced Intel SpeedStep Technology builds upon that architecture using design
strategies that include the following:
• Separation between Voltage and Frequency Changes. By stepping voltage up
and down in small increments separately from frequency changes, the processor is
able to reduce periods of system unavailability that occur during frequency change.
Thus, the system is able to transition between voltage and frequency states more
often, providing improved power/performance balance.
Datasheet, Volume 1 of 2 27
Technologies
• Clock Partitioning and Recovery. The bus clock continues running during state
transition, even when the core clock and Phase-Locked Loop are stopped, which
allows logic to remain active. The core clock can also restart more quickly under
Enhanced Intel SpeedStep Technology.
Intel AVX is a comprehensive ISA extension of the Intel 64 Architecture. The main
elements of Intel AVX are:
• Support for wider vector data (up to 256-bit) for floating-point computation
• Efficient instruction encoding scheme that supports 3 operand syntax and
headroom for future extensions
• Flexibility in programming environment, ranging from branch handling to relaxed
memory alignment requirements
• New data manipulation and arithmetic compute primitives, including broadcast,
permute, fused-multiply-add, and so on
• Floating point bit depth conversion (Float 16)
• A group of 4 instructions that accelerate data conversion between 16-bit
floating point format to 32-bit and vice versa.
• This benefits image processing and graphical applications allowing
compression of data so less memory and bandwidth is required.
28 Datasheet, Volume 1 of 2
Technologies
Datasheet, Volume 1 of 2 29
Technologies
30 Datasheet, Volume 1 of 2
Signal Descriptions
4 Signal Descriptions
This chapter describes the processor signals. They are arranged in functional groups
according to their associated interface or category.
DDR{0/1/2/3}_ALERT_N Parity Error detected by the DIMM (one for each channel).
Bank Address. Defines which bank is the destination for the current
DDR{0/1/2/3}_BA[1:0]
Activate, Read, Write, or Precharge command.
Bank Group: Defines which bank group is the destination for the current
DDR{0/1/2/3}_BG[1:0] Active, Read, Write or Precharge command. BG0 also determines which
mode register is to be accessed during a MRS cycle.
Chip ID. Used to select a single die out of the stack of a 3DS device.
DDR{0/1/2/3}_CID[4:0] CID[4:3] are multiplexed with CS_N[7:6], respectively.
CID[1:0] are multiplexed with CS_N[3:2], respectively.
DDR{0/1/2/3}_CLK_DN[3:0] Differential clocks to the DIMM. All command and control signals are valid on
DDR{0/1/2/3}_CLK_DP[3:0] the rising edge of clock.
Chip Select. Each signal selects one rank as the target of the command and
address.
DDR{0/1/2/3}_CS_N[9:0]
CS_N[7:6] are multiplexed with CID[4:3], respectively.
CS_N[3:2] are multiplexed with CID[1:0], respectively.
Check bits. An error correction code is driven along with data on these lines
DDR{0/1/2/3}_ECC[7:0]
for DIMMs that support that capability
Memory Address. Selects the Row address for Reads and writes, and the
column address for activates. Also used to set values for DRAM configuration
DDR{0/1/2/3}_MA[17:0]
registers. MA[16], MA[15], and MA[14] are multiplexed with RAS_N,
CAS_N, and WE_N, respectively.
Datasheet, Volume 1 of 2 31
Signal Descriptions
DDR_RESET_C01_N System memory reset: Reset signal from processor to DRAM devices on the
DIMMs. DDR_RESET_C01_N is used for memory channels 0 and 1 while
DDR_RESET_C23_N DDR_RESET_C23_N is used for memory channels 2 and 3.
SMBus clock for the dedicated interface to the serial presence detect (SPD)
DDR_SCL_C01 and thermal sensors (TSoD) on the DIMMs. DDR_SCL_C01 is used for
DDR_SCL_C23 memory channels 0 and 1 while DDR_SCL_C23 is used for memory channels
2 and 3.
SMBus data for the dedicated interface to the serial presence detect (SPD)
DDR_SDA_C01 and thermal sensors (TSoD) on the DIMMs. DDR_SDA_C01 is used for
DDR_SDA_C23 memory channels 0 and 1 while DDR_SDA_C23 is used for memory
channels 2 and 3.
DDR01_VREF Voltage reference for CMD/ADD to the DIMMs. DDR01_VREF is used for
memory channels 0 and 1 while DDR23_VREF is used for memory channels
DDR23_VREF 2 and 3.
DRAM_PWR_OK_C01 Power good for VCCD rail used by the DRAM. This is an input signal used to
indicate the VCCD power supply is stable for memory channels 0 & 1 and
DRAM_PWR_OK_C23 channels 2 & 3.
32 Datasheet, Volume 1 of 2
Signal Descriptions
PCI Express* Hot-Plug SMBus Data: Provides PCI Express* hot-plug support
PE_HP_SDA using a dedicated SMBus interface. Requires an external general purpose
input/output (GPIO) expansion device on the platform.
Datasheet, Volume 1 of 2 33
Signal Descriptions
Reference Clock Differential Input. These pins provide the PLL reference
QPI{0/1}_CLKRX_DN/DP
clock differential input. 100 MHz typical.
Reference Clock Differential Output. These pins provide the PLL reference
QPI{0/1}_CLKTX_DN/DP
clock differential input. 100 MHz typical.
Breakpoint and Performance Monitor Signals: I/O signals from the processor
BPM_N[7:0] that indicate the status of breakpoints and programmable counters used for
monitoring processor performance. These are 100 MHz signals.
TCK (Test Clock) provides the clock input for the processor Test Bus (also
TCK
known as the Test Access Port).
TDI (Test Data In) transfers serial test data into the processor. TDI provides
TDI
the serial input needed for JTAG specification support.
34 Datasheet, Volume 1 of 2
Signal Descriptions
TDO (Test Data Out) transfers serial test data out of the processor. TDO
TDO
provides the serial output needed for JTAG specification support.
TMS (Test Mode Select) is a JTAG specification support signal used by debug
TMS
tools.
TRST_N (Test Reset) resets the Test Access Port (TAP) logic. TRST_N must
TRST_N
be driven low during power on Reset.
Indicates that the system has experienced a fatal or catastrophic error and
cannot continue to operate. The processor will assert CATERR_N for
unrecoverable machine check errors and other internal unrecoverable
errors. It is expected that every processor in the system will wire-OR
CATERR_N for all processors. Since this is an I/O land, external agents are
CATERR_N allowed to assert this land which will cause the processor to take a machine
check exception. This signal is sampled after PWRGOOD assertion. On the
processor, CATERR_N is used for signaling the following types of errors:
• Legacy MCERR’s, CATERR_N is asserted for 16 BCLKs.
• Legacy IERR’s, CATERR_N remains asserted until warm or cold reset.
Machine Check Exception (MCE) is signaled via this pin when eMCA2 is
MSMI_N
enabled.
Datasheet, Volume 1 of 2 35
Signal Descriptions
Global reset signal. Asserting the RESET_N signal resets the processor to a
known state and invalidates its internal caches without writing back any of
RESET_N their contents.
Note: Some PLL, Intel QuickPath Interconnect, and error states are not
affected by reset and only PWRGOOD forces them to a known state.
36 Datasheet, Volume 1 of 2
Signal Descriptions
BIST Enable Strap. Input which allows the platform to enable or disable
built-in self test (BIST) on the processor. This signal is pulled up on the die.
BIST_ENABLE
Refer to Table 5-6, “Signals with On-Die Weak Pull-Up/Pull-Down Resistors”
on page 50 for details.
BMC Initialization Strap. Indicates whether Service Processor Boot Mode
should be used. Used in combination with FRMAGENT and SOCKET_ID
inputs.
0 = Service Processor Boot Mode Disabled. Example boot modes: Local PCH
(this processor hosts a legacy PCH with firmware behind it), Intel QPI
Link Boot (for processors one hop away from the FW agent), or Intel
QPI Link Init (for processors more than one hop away from the
BMCINIT firmware agent).
1 = Service Processor Boot Mode Enabled. In this mode of operation the
processor performs the absolute minimum internal configuration and
then waits for the Service Processor to complete its initialization. The
socket boots after receiving a "GO" handshake signal using a firmware
scratchpad register.
This signal is pulled down on the die. Refer to Table 5-6, “Signals with On-
Die Weak Pull-Up/Pull-Down Resistors” on page 50 for details.
This pin is used to force debug to be enabled when the ITP is connected to
DEBUG_EN_N
the main board. This allows debug to occur beginning from cold boot.
External Alignment of Reset, used to bring the processor up into a
deterministic state. This signal is pulled up on the die. Refer to Table 5-6,
EAR_N
“Signals with On-Die Weak Pull-Up/Pull-Down Resistors” on page 50 for
details.
Indicates an internal error has occurred with the integrated voltage
regulator. The FIVR_FAULT signal can be sampled any time after 1.5 ms
FIVR_FAULT
after the assertion of PWRGOOD. FIVR_FAULT must be qualified by
THERMTRIP_N assertion.
Bootable Firmware Agent Strap. This input configuration strap used in
combination with SOCKET_ID to determine whether the socket is a legacy
socket, bootable firmware agent is present, and DMI links are used in PCIe*
mode (instead of DMI2 mode).
FRMAGENT
The firmware flash ROM is located behind the local PCH attached to the
processor using the DMI2 interface.This signal is pulled down on the die.
Refer to Table 5-6, “Signals with On-Die Weak Pull-Up/Pull-Down Resistors”
on page 50 for details.
Power Management Fast Wake. Enables quick package C3–C6 exits of all
sockets. Asserted if any socket detects a break from package C3–C6 state
PM_FAST_WAKE_N requiring all sockets to exit the low-power state to service a snoop, memory
access, or interrupt. Expected to be wired-OR among all processor sockets
within the platform.
This output can be used by the platform to determine if the installed
processor is an Intel® Core™ processor family for the LGA2011-v3 socket
processor or a future processor planned for the platforms. There is no
PROC_ID connection to the processor silicon for this signal. The processor package
grounds or floats the pin to set ‘0’ or ‘1’, respectively.
1 = Intel® Core™ processor family for the LGA2011-v3 socket processor
0 = Reserved for future use
RESERVED. All signals that are RSVD must be left unconnected on the
RSVD
board. Refer to Section 5.2.9, “Reserved or Unused Signals” for details.
Safe Mode Boot Strap. SAFE_MODE_BOOT allows the processor to wake up
safely by disabling all clock gating. This allows BIOS to load registers or
SAFE_MODE_BOOT patches if required. This signal is sampled after PWRGOOD assertion. The
signal is pulled down on the die. Refer to Table 5-6, “Signals with On-Die
Weak Pull-Up/Pull-Down Resistors” on page 50 for details.
SKTOCC_N (Socket Occupied) is used to indicate that a processor is present.
SKTOCC_N This is pulled to ground on the processor package. There is no connection to
the processor silicon for this signal.
Datasheet, Volume 1 of 2 37
Signal Descriptions
Input to the Integrated Voltage Regulator (IVR) for the processor cores,
lowest level caches (LLC), ring interface, PLL, IO, and home agent. It is
VCCIN provided by a VR 12.5 compliant motherboard voltage regulator (MBVR) for
each CPU socket. The output voltage of this MBVR is controlled by the
processor, using the serial voltage ID (SVID) bus.
VCCIN_SENSE and VSS_VCCIN_SENSE are remote sense signals for VCCIN
VCCIN_SENSE MBVR12.5 and are used by the voltage regulator to ensure accurate voltage
regulation. These signals must be connected to the voltage regulator
VSS_VCCIN_SENSE feedback circuit, which insures the output voltage remains within
specification.
Fixed 1.2V power supply for the processor system memory interface.
Provided by two MBVR 12.0 or 12.5 compliant regulators per CPU socket.
VCCD_01 and VCCD_23 are used for memory channels 0 &1 and 2 & 3,
respectively. The valid voltage of this supply (1.20V) is configured by BIOS
VCCD_01 after determining the operating voltages of the installed memory. VCCD_01
VCCD_23 and VCCD_23 will also be referred to as VCCD.
Note: The processor must be provided VCCD_01 and VCCD_23 for proper
operation, even in configurations where no memory is populated. A
MBVR 12.0 or 12.5 controller is required.
VSS Processor ground return.
VCCIO_IN IO voltage supply input.
Power supply for PECI. Refer to the PDG for specific connection options for
VCCPECI
this pin.
§§
38 Datasheet, Volume 1 of 2
Electrical Specifications
5 Electrical Specifications
Datasheet, Volume 1 of 2 39
Electrical Specifications
The processor core frequency is configured during reset by using values stored within
the device during manufacturing. The stored value sets the lowest core multiplier at
which the particular processor can operate. If higher speeds are desired, the
appropriate ratio can be configured using the IA32_PERF_CTL MSR (MSR 199h); Bits
[15:0].
Clock multiplying within the processor is provided by the internal phase locked loop
(PLL), which requires a constant frequency BCLK{0/1}_DP, BCLK{0/1}_DN input, with
exceptions for spread spectrum clocking. DC specifications for the BCLK{0/1}_DP,
40 Datasheet, Volume 1 of 2
Electrical Specifications
For clean on-chip power distribution, processors include lands for all required voltage
supplies. These are listed in the following table.
Each VCCIN land must be supplied with the voltage determined by the
SVID Bus signals. Table 5-3 defines the voltage level associated with
VCCIN 173
each core SVID pattern. Table 5-12 and Table 5-4 represent VCCIN static
and transient limits.
Datasheet, Volume 1 of 2 41
Electrical Specifications
Individual processor VID values may be calibrated during manufacturing such that two
processor units with the same core frequency may have different default VID settings.
The VRM or EVRD used must be capable of regulating its output to the value defined by
the new VID.
42 Datasheet, Volume 1 of 2
Electrical Specifications
The SetVID_Fast command is preemptive. The VR interrupts its current processes and
moves to the new VID. The SetVID_Fast command operates on 1 VR address at a time.
This command is used in the processor for package C6 fast exit.
The SetVID_Slow command is preemptive, the VR interrupts its current processes and
moves to the new VID. This is the instruction used for normal P-state voltage change.
This command is used in the processor for the Intel Enhanced Intel SpeedStep
Technology transitions.
Note: In PS2 some CPUs can have idle or leakage currents up to 20A. the MBVR must handle
high idle currents if they are present even in PS2 condition.
The VR may change its configuration to meet the processor's power needs with greater
efficiency. For example, it may reduce the number of active phases, transition from
CCM (Continuous Conduction Mode) to DCM (Discontinuous Conduction Mode) mode,
Datasheet, Volume 1 of 2 43
Electrical Specifications
The VR may reduce the number of active phases from PS(00h)-to-PS(01h) or PS(00h)-
to-PS(02h) for example. There are multiple VR design schemes that can be used to
maintain a greater efficiency in these different power states. Work with your VR
controller suppliers for optimizations.
If a power state is not supported by the controller, the slave should acknowledge the
SetPS command and enter the lowest power state that is supported.
If the VR is in a low power state and receives a SetVID command moving the VID up,
then the VR exits the low power state to normal mode (PS0) to move the voltage up as
fast as possible. The processor must re-issue the low-power state (PS1 or PS2)
command if it is in a low current condition at the new higher voltage. See the following
figure for VR power state transitions.
00 VCCIN
01 NA
02 VCCD_01
03 +1 not used
44 Datasheet, Volume 1 of 2
Electrical Specifications
04 VCCD_23
05 +1 not used
Notes:
1. Check with VR vendors for determining the physical address assignment method for their controllers.
2. VR addressing is assigned on a per voltage rail basis.
3. Dual VR controllers will have two addresses with the lowest order address, always being the higher phase
count.
4. For future platform flexibility, the VR controller should include an address offset, as shown with +1 not
used.
Table 5-3. VR12.5 Reference Code Voltage Identification (VID) Table (Sheet 1 of 2)
HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN
Datasheet, Volume 1 of 2 45
Electrical Specifications
Table 5-3. VR12.5 Reference Code Voltage Identification (VID) Table (Sheet 2 of 2)
HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN HEX VCCIN
Notes:
1. 00h = Off State
2. VID Range HEX 01-32 are not used by the processor
3. For VID Ranges supported, see Table 5-10, “Voltage Specification” on page 52
4. VCCD is a fixed voltage of 1.20V
46 Datasheet, Volume 1 of 2
Electrical Specifications
Analog Analog reference or output. May be used as a threshold voltage or for buffer
compensation
Asynchronous1 Signal has no timing relationship with any system reference clock.
DMI2 Direct Media Interface Gen 2 signals. These signals are compatible with PCI Express* 2.0
and 1.0 Signaling Environment AC Specifications.
Intel® QPI Current-mode 9.6 GT/s, 8.0 GT/s, and 6.4 GT/s, forwarded-clock Intel QuickPath
Interconnect signaling
Open Drain CMOS Open Drain CMOS (ODCMOS) buffers: 1.05V tolerant
PCI Express* PCI Express* interface signals. These signals are compatible with PCI Express 3.0
Signalling Environment AC Specifications and are AC coupled. The buffers are not 3.3-V
tolerant. Refer to the PCIe specification.
Note:
1. Qualifier for a buffer type.
Datasheet, Volume 1 of 2 47
Electrical Specifications
48 Datasheet, Volume 1 of 2
Electrical Specifications
Datasheet, Volume 1 of 2 49
Electrical Specifications
The sampled information configures the processor for subsequent operation. These
configuration options cannot be changed, except by another reset transition of the
latching signal (RESET_N or PWRGOOD).
Note:
1. BIST_ENABLE is sampled at RESET_N de-assertion
2. This signal is sampled after PWRGOOD assertion.
50 Datasheet, Volume 1 of 2
Electrical Specifications
Although the processor contains protective circuitry to resist damage from Electro-
Static Discharge (ESD), precautions should always be taken to avoid high static
voltages or electric fields.
VCCPECI Power supply for PECI with respect to VSS -0.3 1.35 V
Note:
1. For functional operation, all processor electrical, signal quality, mechanical, and thermal specifications
must be satisfied.
2. Excessive Overshoot or undershoot on any signal will likely result in permanent damage to the processor.
The following table specifies absolute maximum and minimum storage temperature
limits that represent the maximum or minimum device condition beyond which
damage, latent or otherwise, may occur. The table also specifies sustained storage
temperature, relative humidity, and time-duration limits. These limits specify the
maximum or minimum device storage conditions for a sustained period of time. At
conditions outside sustained limits, but within absolute maximum and minimum
ratings, quality and reliability may be affected.
Datasheet, Volume 1 of 2 51
Electrical Specifications
Notes:
1. Storage conditions are applicable to storage environments only. In this scenario, the processor must not
receive a clock, and no lands can be connected to a voltage bias. Storage within these limits will not
affect the long-term reliability of the device. For functional operation, please refer to the processor case
temperature specifications.
2. These ratings apply to the Intel component and do not include the tray or packaging.
3. Failure to adhere to this specification can affect the long-term reliability of the processor.
4. Non-operating storage limits post board attach: Storage condition limits for the component once
attached to the application board are not specified. Intel does not conduct component level certification
assessments post board attach given the multitude of attach methods, socket types and board types
used by customers. Provided as general guidance only, Intel board products are specified and certified to
meet the following temperature and humidity limits (Non-Operating Temperature Limit: -40 °C to 70 °C
and Humidity: 50% to 90%, non condensing with a maximum wet bulb of 28 °C).
5. Device storage temperature qualification methods follow JEDEC High and Low Temperature Storage Life
Standards: JESD22-A119 (low temperature) and JESD22-A103 (high temperature).
5.6 DC Specifications
DC specifications are defined at the processor pads, unless otherwise noted.
DC specifications are only valid while meeting specifications for case temperature
(TCASE specified in the Processor Thermal/Mechanical Specification and Design Guide)
(See Related Documents Section), clock frequency, and input voltages. Care should be
taken to read all notes associated with each specification.
Input to Integrated 2, 3, 4, 5,
VCCIN VCCIN 1.47 1.82 1.85 V
9, 12
Voltage Regulator
52 Datasheet, Volume 1 of 2
Electrical Specifications
Notes:
1. Unless otherwise noted, all specifications in this table apply to all processors.
2. These voltages are targets only. A variable voltage source should exist on systems in the event that a different voltage is
required.
3. The VCCIN voltage specification requirements are measured across the remote sense pin pairs (VCCIN_SENSE and
VSS_VCCIN_SENSE) on the processor package. Voltage measurement should be taken with a DC to 100 MHz bandwidth
oscilloscope limit (or DC to 20MHz for older model oscilloscopes), using a 1.5 pF maximum probe capacitance, and 1 MΩ
minimum impedance. The maximum length of the ground wire on the probe should be less than 5 mm to ensure external
noise from the system is not coupled in the scope probe.
4. Refer to Table 5-12, “VCCIN Static and Transient Tolerance Processor” on page 54 and corresponding Table 5-4, “VCCIN Static
and Transient Tolerance Loadlines” on page 55. The processor should not be subjected to any static VCCIN level that exceeds
the VCCIN_MAX associated with any particular current. Failure to adhere to this specification can shorten processor lifetime.
5. Minimum VCCIN and maximum ICCIN are specified at the maximum processor case temperature (TCASE) shown in the
Processor Thermal/Mechanical Specification and Design Guide (See Related Document Section). ICCIN_MAX is specified at
the relative VCC_MAX point on the VCCIN load line. The processor is capable of drawing ICCIN_MAX for up to 4 ms.
6. This specification represents the VCCIN reduction or VCCIN increase due to each VID transition. For Voltage Identification
(VID), see Table 5-3, “VR12.5 Reference Code Voltage Identification (VID) Table” on page 45.
7. Baseboard bandwidth is limited to 20 MHz.
8. DC + AC + Ripple = Total Tolerance
9. For SVID Power State Functions (SetPS) see Section 5.2.8.8, “SVID Power State Functions: SetPS” .
10. VCCD tolerance at processor pins. Required in order to meet ±5% tolerance at processor die.
11. The VCCD01, VCCD23 voltage specification requirements are measured across vias on the platform. Choose VCCD01 or VCCD23
vias close to the socket and measure with a DC to 100MHz bandwidth oscilloscope limit (or DC to 20 MHz for older model
oscilloscopes), using 1.5 pF maximum probe capacitance, and 1M ohm minimum impedance. The maximum length of the
ground wire on the probe should be less than 5 mm to ensure external noise from the system is not coupled in the scope
probe.
12. VCCIN has a Vboot setting of 0.0V and is not included in the PWRGOOD indication.
Datasheet, Volume 1 of 2 53
Electrical Specifications
Notes1
TDP
140W
175 0.1 0.001 1.4 1.4 82 0.02 0.001 0.8 0.8 267 270 2, 4
High End 8-Core
Desktop
(HEDT) 140W
175 0.1 0.001 1.4 1.4 82 0.02 0.001 0.8 0.8 267 270 2, 4
6-Core
Notes:
1. Unless otherwise noted, all specifications in this table apply to all processors.
2. FMB is the flexible motherboard guidelines.
3. ICCIN_TDC (Thermal Design Current) is the sustained (DC equivalent) current that the processor is capable of drawing
indefinitely and should be used for the voltage regulator thermal assessment. The voltage regulator is responsible for
monitoring its temperature and asserting the necessary signal to inform the processor of a thermal excursion.
4. Minimum VCCIN and maximum ICCIN are specified at the maximum processor case temperature (TCASE). ICCIN_MAX is specified
at the relative VCCIN_MAX point on the VCCIN load line. The processor is capable of drawing ICCIN_MAX for up to 4 ms.
54 Datasheet, Volume 1 of 2
Electrical Specifications
Notes:
1. The VCCIN_MIN and VCCIN_MAX loadlines represent static and transient limits. See Section 5.6.1, “Die
Voltage Validation” for VCCIN Overshoot specifications.
2. This table is intended to aid in reading discrete points on graph in Figure 5-4.
3. The loadlines specify voltage limits at the die measured at the VCCIN_SENSE and VSS_VCCIN_SENSE
lands. Voltage regulation feedback for voltage regulator circuits must also be taken from processor
VCCIN_SENSE and VSS_VCCIN_SENSE lands.
4. The Adaptive Loadline Positioning slope is 1.05 mΩ (mohm) with ±22mV TOB (Tolerance of Band).
5. Processor core current (ICCIN) ranges are valid up to ICCIN_MAX of the processor SKU as defined in the
previous table.
Datasheet, Volume 1 of 2 55
Electrical Specifications
Notes:
1. VOS_MAX is the measured overshoot voltage above VCCIN_MAX.
2. TOS_MAX is the measured time duration above VCCIN_MAX.
3. VCCIN_MAX = VID + TOB
Data Signals
56 Datasheet, Volume 1 of 2
Electrical Specifications
Data Signals
Command Signals
Output Low
VOL_CMOS1.2V Voltage, Signals – – 0.2*VCCD V 1, 2
DDR_RESET_ C{01/23}_N
Output High
V OH_CMOS1.2V Voltage, Signals 0.9*VCCD – – V 1, 2
DDR_RESET_ C{01/23}_N
Control Signals
On-Die Termination
ALERT_N 81 90 99 ohm
for Parity Error Signals
Notes:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. The voltage rail VCCD which will be set to 1.2V nominal depending on the voltage of all DIMMs connected to the processor.
3. VIL is the maximum voltage level at a receiving agent that will be interpreted as a logical low value.
4. VIH is the minimum voltage level at a receiving agent that will be interpreted as a logical high value.
5. VIH and VOH may experience excursions above VCCD. However, input signal drivers must comply with the signal quality
specifications.
6. This is the pull down driver resistance. Reset drive does not have a termination.
7. RVTT_TERM is the termination on the DIMM and not controlled by the processor. Refer to the applicable DIMM datasheet.
8. The minimum and maximum values for these signals are programmable by BIOS to one of the pairs.
9. Input leakage current is specified for all DDR4 signals.
10. Vol = Ron * [VCCD/(Ron + Rtt_Eff)], where Rtt_Eff is the effective pull-up resistance of all DIMMs in the system, including
ODTs and series resistors on the DIMMs.
Datasheet, Volume 1 of 2 57
Electrical Specifications
Negative-edge threshold
VN 0.275 * VCCPECI 0.500 * VCCPECI V 5-1 2
voltage
Positive-edge threshold
VP 0.550 * VCCPECI 0.725 * VCCPECI V 5-1 2
voltage
Notes:
1. VCCPECI supplies the PECI interface. PECI behavior does not affect VCCPECI min/max specification.
2. It is expected that the PECI driver will take into account, the variance in the receiver input thresholds and
consequently, be able to drive its output within safe limits (-0.150 V to 0.275*VCCPECI for the low level
and 0.725*VCCPEC to VCCPECI+0.150 V for the high level).
3. The leakage specification applies to powered devices on the PECI bus.
4. One node is counted for each client and one node for the system host. Extended trace lengths might
appear as additional nodes.
5. Excessive capacitive loading on the PECI line may slow down the signal rise/fall times and consequently
limit the maximum bit rate at which the interface can operate.
Vcross (rel) Relative Crossing Point Single Ended 0.250 + 0.5* 0.550 + 0.5* 3, 4, 5,
V 5-7
(VH avg – 0.700) (VH avg – 0.700) 9
58 Datasheet, Volume 1 of 2
Electrical Specifications
Notes:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. Crossing Voltage is defined as the instantaneous voltage value when the rising edge of BCLK{0/1}_DN is equal to the falling
edge of BCLK{0/1}_DP.
3. VHavg is the statistical average of the VH measured by the oscilloscope.
4. The crossing point must meet the absolute and relative crossing point specifications simultaneously.
5. VHavg can be measured directly using "Vtop" on Agilent* and "High" on Tektronix oscilloscopes.
6. VCROSS is defined as the total variation of all crossing voltages as defined in Note 3.
7. The rising edge of BCLK{0/1}_DN is equal to the falling edge of BCLK{0/1}_DP.
8. For Vin between 0 and Vih.
9. Specifications can be validated at the pin.
Datasheet, Volume 1 of 2 59
Electrical Specifications
Figure 5-8. BCLK{0/1} Single-Ended Clock Measurement Points for Absolute Cross
Point and Swing
Figure 5-9. BCLK{0/1} Single-Ended Clock Measure Points for Delta Cross Point
R ON Buffer On Resistance 4 14 Ω
Note:
1. Value obtained through test bench with 50Ω pull-up to VCCIO_IN.
60 Datasheet, Volume 1 of 2
Electrical Specifications
Notes:
1. These are measured between VIL and VIH.
2. The signal edge rate must be met or the signal must transition monotonically to the asserted state.
Hysteresis 0.05*VCCIO_I
VHysteresis – – V 1
N
Buffer On Resistance
RON Signals SVIDCLK, 4 – 14 Ω 2
SVIDDATA
Notes:
1. VCCIO_IN refers to instantaneous VCCIO_IN.
2. Measured at 0.31*VCCIO_IN.
3. Vin between 0V and VCCIO_IN (applies to SVIDDATA and SVIDALERT_N only).
4. These are measured between VIL and VIH.
5. Value obtained through test bench with 50Ω pull up to VCCIO_IN.
Datasheet, Volume 1 of 2 61
Electrical Specifications
CMOS1.05v Signals
Hysteresis
VHysteresis Signals: 0.1*VCCIO_IN –
MEM_HOT_C01/23_N, PROCHOT_N
Hysteresis
VHysteresis Signal: CATERR_N, MSMI_N, 0.05*VCCIO_IN –
PM_FAST_WAKE_N
Notes:
1. This table applies to the processor sideband and miscellaneous signals specified in Table 5-5, “Signal
Groups” on page 47.
2. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
3. These are measured between VIL and VIH.
SKTOCC_N Signal
§§
62 Datasheet, Volume 1 of 2
Processor Land Listing
Table 6-1 provides the processor land listing organized alphabetically by signal name.
Datasheet, Volume 1 of 2 63
Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
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Processor Land Listing
VSS V36
VSS V44
VSS V46
VSS V48
VSS V50
VSS V52
VSS W23
VSS W27
VSS W33
VSS W35
VSS W39
VSS W43
VSS W45
VSS W47
VSS W49
VSS W51
VSS W53
VSS W7
VSS Y12
VSS Y24
VSS Y26
VSS Y28
VSS Y30
VSS Y32
VSS Y34
VSS Y36
VSS Y4
VSS Y42
VSS Y56
VSS_VCCIN_SENSE BP2
§§
Datasheet, Volume 1 of 2 81
Processor Land Listing
82 Datasheet, Volume 1 of 2