N-Channel 100 V, 0.0036 Typ., 110 A, Stripfet™ F7 Power Mosfet in A To-220 Package
N-Channel 100 V, 0.0036 Typ., 110 A, Stripfet™ F7 Power Mosfet in A To-220 Package
N-Channel 100 V, 0.0036 Typ., 110 A, Stripfet™ F7 Power Mosfet in A To-220 Package
Features
Order code VDS RDS(on)max ID PTOT
TAB
STP15810 100 V 0.0042 Ω 110 A 250 W
TO-220 Applications
• Switching applications
Description
Figure 1. Internal schematic diagram This N-channel Power MOSFETs utilizes
STripFET™ F7 technology with an enhanced
'7$%
trench gate structure that results in very low on-
state resistance, while also reducing internal
capacitance and gate charge for faster and more
efficient switching.
*
6
$0Y
Contents
1 Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2.1 Electrical characteristics (curves) ............................ 6
5 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
1 Electrical ratings
2 Electrical characteristics
Drain-source
V(BR)DSS VGS = 0, ID = 250 µA 100 V
breakdown voltage
VGS = 0, VDS = 100 V 1 µA
Zero gate voltage
IDSS VGS = 0,
drain current 100 µA
VDS = 100 V, TC=125 °C
Gate-body leakage
IGSS VDS = 0, VGS = +20 V 100 nA
current
VGS(th) Gate threshold voltage VDS = VGS, ID = 250 µA 2.5 4.5 V
Static drain-source on-
RDS(on) VGS = 10 V, ID = 55 A 0.0036 0.0042 Ω
resistance
Table 5. Dynamic
Symbol Parameter Test conditions Min. Typ. Max. Unit
100 0.2
ea
is 0.1
a r (on)
th
is
RD
S
0.05
in ax
10 n
tio by m
10 -1
ra 100µs
pe ited
O m 0.02
Li c
0.01
1 1ms
Single pulse
Tj=175°C
Tc=25°C
10ms
Single pulse
0.1 10 -2
0.1 1 10 VDS(V) 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 tp(s)
250 200
200 150
6V
150
100
100
50 50
5V
0 0
0 2 4 6 8 VDS(V) 0 2 4 6 8 VGS(V)
6 3.59
3.58
4
3.57
2 3.56
0 3.55
0 40 80 120 Qg(nC) 0 20 40 60 80 100 ID(A)
5000 0.8
4000 0.7
3000
0.6
2000
0.5
1000
Coss
0 Crss 0.4
0 20 40 60 80 100 VDS(V) -75 -25 25 75 125 TJ(°C)
1 0.99
0.8 0.98
0.6 0.97
0.4 0.96
-75 -25 25 75 125 TJ(°C) -75 -25 25 75 125 TJ(°C)
1 TJ=-55°C
0.9
TJ=25°C
0.8
0.7
TJ=175°C
0.6
0.5
0.4
0.3
0 20 40 60 80 100 ISD(A)
3 Test circuits
Figure 13. Switching times test circuit for Figure 14. Gate charge test circuit
resistive load
VDD
12V 47kΩ
1kΩ
100nF
RL 2200 3.3
μF μF
VDD IG=CONST
VD Vi=20V=VGMAX 100Ω D.U.T.
VGS 2200
RG D.U.T. μF 2.7kΩ VG
PW
47kΩ
PW 1kΩ
AM01468v1 AM01469v1
Figure 15. Test circuit for inductive load Figure 16. Unclamped inductive load test circuit
switching and diode recovery times
L
A A A
D
FAST L=100μH VD
G D.U.T. DIODE 2200 3.3
μF μF VDD
S B 3.3 1000
B B μF μF
25 Ω VDD ID
D
RG S
Vi D.U.T.
Pw
AM01470v1 AM01471v1
Figure 17. Unclamped inductive waveform Figure 18. Switching time waveform
V(BR)DSS ton toff
tr tdoff tf
VD tdon
90% 90%
IDM
10%
ID 10% VDS
0
BW\SH$B5HYB7
A 4.40 4.60
b 0.61 0.88
b1 1.14 1.70
c 0.48 0.70
D 15.25 15.75
D1 1.27
E 10 10.40
e 2.40 2.70
e1 4.95 5.15
F 1.23 1.32
H1 6.20 6.60
J1 2.40 2.72
L 13 14
L1 3.50 3.93
L20 16.40
L30 28.90
∅P 3.75 3.85
Q 2.65 2.95
5 Revision history
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