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    Design For Test/ Debug (DFT/DFD)

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    kumar
    Our team of experts can help with design for testability (DFT) and debugging (DFD) to improve IC test coverage, yields, and quality. We involve early in the design process to improve testability and reduce costs. Our services include DFT architecture design, logic and memory BIST, scan compression, ATPG, and training. We have expertise in various technologies, tools, and complex designs like processors, wireless devices, and modem chipsets. This helps customers overcome DFT challenges of shrinking process nodes and complex SoCs.

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    Design For Test/ Debug (DFT/DFD)

    Uploaded by

    kumar
    91 views2 pages
    Our team of experts can help with design for testability (DFT) and debugging (DFD) to improve IC test coverage, yields, and quality. We involve early in the design process to improve testability and reduce costs. Our services include DFT architecture design, logic and memory BIST, scan compression, ATPG, and training. We have expertise in various technologies, tools, and complex designs like processors, wireless devices, and modem chipsets. This helps customers overcome DFT challenges of shrinking process nodes and complex SoCs.

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    Our team of experts can help with design for testability (DFT) and debugging (DFD) to improve IC test coverage, yields, and quality. We involve early in the design process to improve testability and reduce costs. Our services include DFT architecture design, logic and memory BIST, scan compression, ATPG, and training. We have expertise in various technologies, tools, and complex designs like processors, wireless devices, and modem chipsets. This helps customers overcome DFT challenges of shrinking process nodes and complex SoCs.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    91 views2 pages

    Design For Test/ Debug (DFT/DFD)

    Uploaded by

    kumar
    Our team of experts can help with design for testability (DFT) and debugging (DFD) to improve IC test coverage, yields, and quality. We involve early in the design process to improve testability and reduce costs. Our services include DFT architecture design, logic and memory BIST, scan compression, ATPG, and training. We have expertise in various technologies, tools, and complex designs like processors, wireless devices, and modem chipsets. This helps customers overcome DFT challenges of shrinking process nodes and complex SoCs.

    Copyright:

    © All Rights Reserved
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    of 2

    Design for Test/

    Debug (DFT/DFD)

    Our team of Design for Testability experts can help increase IC test coverage, yields and quality.
    Design for Testing (DFT) and Debugging (DFD) are critical stages in the micro-architectural phase of a design.
    Working in tandem with a client’s design team, our experts understand the structure of the chip which enables
    them to create the complete DFT and DFD architecture.

    Involving in early stage of


    MAME TO

    QU
    T
    RKE

    ALI

    architecting
    • Improve time to market
    TI

    TY

    • Improve design testability & Coverage • Despite considering complexity


    • Scoping reduction test costs LOW COST • Address domain specific methodologies

    DFT & DFD – The Highlights

    Team Design Solutions Technical Advantage Specialist in DFT Offshore


    Architecture Development Centre
    Our team includes highly • Multiple Clock and • Adept at handling standard
    skilled and experienced Voltage Domains EDA tools for MBIST, LBIST, • Hierarchical & Compression • Build expertise in team
    professionals ranging • Mixed signal low speed and SCAN, COMPRESSIONS, ATPG, SCAN - Retain team
    from project managers, high-speed designs JTAG & iJTAG. from Mentor • iJTAG/JTAG based MBIST • Value add services
    testers, programmers, • Power sensitive designs Graphics, Synopsys, and Cadence networks • Run multiple projects
    designers, and • Embedded processor-based designs • DFX Verification frameworks for • DfX frameworks to address in parallel
    developers. • Complex Analog testing includes - SOC Verification macros (OTP, EFUSE, PLL, LDO) • Expand teams quickly
    SERDES, DDR and A/D, - And AMS Verification • High speed IO (PCIE, USB, - Cope with growth
    D/A converters MIPI, DDR, SERDES) - Can also shrink the team

    Tessolve asureDFT Services Overview


    Continuously shrinking process nodes have introduced new and complex on-chip
    variation effects creating new yield challenges. Combined with ever-increasing
    design complexity with multiple memories, mixed signal blocks and IPs from
    multiple vendors crammed into a single SoC, Design for Testability (DFT)
    implementation and signoff has become a major challenge. The Tessolve asureDFT
    services suite helps you overcome these challenges by establishing a DFT strategy
    that delivers improved DFT execution quality and reduced time-to- market.
    asureDFT Portfolio Expertise

    • Scan (Compression/ non compression based on structure of the device and test time requirements)
    Services • ATPG (stuck at, at speed or new faults based on the technology and strategy)
    • Memory BIST with industry standard EDA tools • Logic BIST

    • DFT Strategy/Structural Testing


    Training • Exclusive trainings on JTAG, BSCAN, SCAN, MBIST
    • Customized contents for customer requirements

    • JTAG TAP based test controllers and verification frame works (JTAG, IEEE 1149, TAP and its customized Instructions)
    Off the shelf • Test suites for Verifying BSCAN • Generating Tester compatible vectors for Post Si validation (ATE)
    Components • Format conversions with ATE logs for diagnosis

    Development
    • Support to develop your own DFT Strategy/Structural Testing
    of DFT
    • Experts in developing pyhton, perl based user interactive GUI based DfT flow applications and utilities.
    Methodology

    • Reduced overhead no need to hire costly DFT resources • End to end support from design to silicon
    Benefits • Off the shelf components reduce DFT turnaround times • Training support • Flexible business models ODC,
    Re source augmentation, Managed services, Turnkey services

    Recent Projects Delivered

    Automotive grade Processors. Wireless Infrastructure XG modem chipsets


    micro controllers Multiple devices Devices (client project)
    • Technology: • 10 - 15 billion transistors • Multiple devices Technology: 7nm/14nm
    130nm/180nm running, 32 cores at 5GHz, Multicore ARM CPU and DSP Tools: SPYGLASS, Synopsys,
    • Tools: DC, DFTMAX, 64MB L3 Cache, > 1TB/s I/O device ~80 Sq mm , ~300K DC, Mentor ATPG
    BW flops --> 600K FF
    Custom memory solution Metrics, Design Details : RTL
    •
    Technology: Multiple nodes Technology: 90nm / 65nm
    Metrics, Design Details: DFT analysis, DRC checks and
    •

    90nm up to 10nm FinFET


    Responsible for DFT team Tools: fixes, Defining JTAG constraints
    process
    implementing run time Logic DC, DFTMAX, for scan modes and DFT
    Bist, Memory Bist, Boundary Tools: Mentor ATPG, MBIST Tetramax ATPG, constraints for scan implemen-
    Scan, analog and functional Metrics, Design Details: Custom memory bist tation with pre and post DRC
    test modes. Defined the new test analysis, scan chain balancing
    Metrics, Design Details:
    and scan compression EDT
    Architecture, Implementation, methodologies to reduce test Complete DFT Architecture,
    hook up. Scan coverage analysis
    validation and production time and estimate test power SCAN, MBIST, JTAG, Analog
    and improvement, fault
    ramp, FA support to optimize the test flow to Test, concurrent testing, pre and
    accounting and fault grading.
    manage test economics. DFX, post layout pattern generation
    debug and bring up. and validation. ATE pattern
    generation,debug and bring up.
    Production, FA support.

    Tessolve is the market leader in providing engineering solutions for silicon and systems development. We offer a unique combination of both
    pre-silicon and post-silicon expertise to provide an efficient turnkey solution for silicon bring up, spec to a product. With 2100+ employees
    worldwide, Tessolve enables customers a faster time-to-market through deep domain expertise in Analog, Digital, Mixed Signal, and RF, broad
    ATE platform experience, diverse embedded software services and built-in infrastructure including a test floor, characterization, reliability lab,
    system lab, and PCB FAB. Tessolve delivers ASIC design services including advanced process nodes with a strong eco-system relationship with
    EDA, IP, and foundries. Tessolve’s post-silicon solution takes silicon from the foundry to high volume manufacturing. Our front-end design
    strengths integrated with the knowledge from the backend flow, allows Tessolve to catch design flaws ahead in the cycle, thus reducing
    expensive re-design costs, and risks.

    Contact For more details https://www.tessolve.com/vlsi-design | www.tessolve.com

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