Capacimeter
Capacimeter
Capacimeter
Converters
Mashhour M. Bani Amer, Assistant Professor
Department of Biomedical Engineering, Faculty of Engineering, Jordan University of Science and
Technology, P.O.Box 3030, Irbid 22110, Jordan.
Abstract
Precise capacitance- to - voltage (C/V) converters research is reviewed. A
comparison of direct and indirect C/V converters is briefly presented. The design
techniques of C/V converter circuits are discussed. The practical investigations of
designed C/V converters are explained with examples to illustrate the achievable
characteristics.
1. Introduction
Capacitance is a valuable parameter in electronics and therefore many devices
have been developed to convert it to measurable electrical signal [1]-[5]. The
conversion of a capacitance - to - voltage plays an important role in capacitive
transducers as well as for characterizing RC active circuits. Capacitive transducers are
widely used especially in biomedical engineering, for example, for measurement of
blood pressure, acceleration, displacement, moisture of material and component
concentration in multi component fluids [6], [7]. The operation of capacitance sensors
is based on conversion of measured physical parameter (pressure, acceleration, and
displacement) into capacitance.
Therefore, to measure the capacitance, which is proportional to the desired
physical parameter by electrical method, this capacitance must be converted into
electrical signal (usually voltage). The electronic circuit used for this purpose is called
capacitance - to - voltage converter (C/V). The C/V converters are usually integrated
within the sensor in one package to form a capacitance - to - voltage transducer [8],
[9].
The C/V circuits can be divided into direct or indirect converters. The direct C/V
converters convert the capacitance - to - voltage directly while the indirect ones
convert first the capacitance into frequency or time and then this frequency or time is
converted into voltage.
Of course, before designing the direct or indirect C/V converters, a lot of
requirements that decide about the quality of designed C/V converter must be
established. These requirements are:
1. Nonlinearity
2. Resolution
3. Sensitivity
4. Accuracy
5. Stability
6. Reliability
7. Generated total output noise
8. Cost
Unfortunately, a lot of recent researches in this field do not take into
consideration all of the above requirements which may lead to erroneous C/V
conversion, caused by poor reliability, short - term stability, bad linearity or low
accuracy [10]-[14]. The present paper deals with experimental analysis and practical
design of C/V converters taking into accounts all of the above requirements.
1
The diode quad circuit is a modification of the conventional C/F converter shown in
Fig.1(b). It is based on using commercially available matched diode quads which
simplifies the circuit and improves its stability. Although, the diode quad circuit is an
improved derivation of the circuit in Fig.1(b), it has the following disadvantages:
(i)
The full - scale output range is limited due to non-linearity and
gain roll-off.
(ii)
The sensitivity and resolution of this circuit is reduced due to
effects of diodes stray capacitances and elements interconnection.
(iii)
The electronic circuit, which recovers the measured capacitance
Cx from the voltage Vo is not simple. This decreases the accuracy
of Cx measurements (caused by error propagation) and reliability
of the designed system.
(iv)
It needs two square signal sources which increases the cost of the
C/V converter.
The previously discussed two methods were published in literature for directly
conversion of capacitance to voltage. These methods have many drawbacks. This is
why a decision was taken to design a simple, precise and reliable C/V converter free
from previously discussed disadvantages. This simple C/V converter is shown in
Fig.3. If a sinusoidal signal Vin is applied to the input terminals of the capacitive
voltage divider as shown in Fig.2, then the output voltage Vout can be given by:
Vout(rms) = Vin(rms) * Cx / (C1+Cx ) .............................. (2)
where Cx is the measured capacitance while C1 is a fixed capacitance .
Figure 2. Circuit diagram of the proposed C/V converter (capacitive voltage divider).
Of course, the linearity of this circuit is depending directly upon the ratio
Cx/(C1+ Cx). Thus, in order to achieve good linearity, the fixed capacitance C1 must
be at least ten times bigger than the measured Cx. If this condition is achieved then
equation 3 is reduced to:
Vout(rms) = Vin(rms) * Cx / C1 ...........................(3)
Therefore, the measured capacitance Cx, can be expressed as :
Cx = Vout(rms) * C1 / Vin(rms) ..........................(4)
Of course, C1 and Vin are known and have fixed values. Thus, if we assume that
C1 / Vin(rms)= a, then:
Cx = a Vout(rms)
.............................................(5)
Equation (5) implies that the proposed C/V converter has a linear characteristic
between the measured capacitance Cx and its output voltage (Vout). Moreover, in
comparison with the previously discussed conventional C/V converter, this circuit is
cheaper, more reliable and has better stability.
The output signal (Vout) of the capacitive voltage divider is sinusoidal signal. The
measured capacitance is proportional to the root mean square (rms) value of the
output voltage (Eq.5). Thus, to simplify the electronic recovering of the capacitance
using Eq.5, this AC voltage must be converted into DC voltage that will represent the
Vout(rms). Of course, the designed AC/DC converter must be precise and accurate.
Thus, the classical bridge rectifier circuit cannot be used because a voltage drop of
1.4V occurs across the diodes. Moreover, the output voltage of any rectifier circuit is
directly proportional to the average value but not to the rms value of its input
voltage. So, these problems must be taken into consideration during the design of
3
400
Vout (mV)
300
200
100
0
0
100
200
300
400
500
600
700
800
900
1000
Measured Capacitance
16
14
F out [KHz]
12
10
8
6
4
2
0
0
200
400
600
800
1000
C ext [pF]
14
12
Vout (V)
10
8
6
4
2
0
0
100
200
300
400
500
600
700
800
900
1000
C 1 (pF)
converter. The spectral density of the output noise voltage of the proposed and
conventional converters was experimentally measured with a spectrum analyzer
HP35670A. The obtained total output noise voltage was 38 nV/ Hz for the
capacitive-voltage divider C/V converter, 54 nV/ Hz for the indirect C/V converter
shown in Fig. 8 and 58 nV/ Hz for the diode quad C/V converter.
5. Conclusions
From the experimental investigations discussed previously, it can be concluded
that the designed C/V converters have many advantages over the conventional C/V
converters such as long-term stability, simplicity, good sensitivity, high linearity and
reliability and low cost (Tab.1).
Table 1. Summary results of a comparison between the conventional and proposed
C/V converters
Conventional C/V
Proposed C/V converters
converter
C/V converter
Diode quad
Capacitive-Voltage
Indirect C/V
Divider (Fig.4)
Converter (Fig.8)
Parameter
Nonlinearity
137 ppm
100 ppm
215 ppm
Resolution
60 aF
62 aF
83 aF
Sensitivity
0.27 mV/ F
0.40 mV/ F
3.23 mV/ F
Accuracy
170 ppm
100 ppm
120 ppm
Stability
Stable
Long-term stability
Stable
Generated Output
Noise
Reliability
58 nV/ Hz
38 nV/ Hz
54 nV/ Hz
High
The highest
High
Cost
Low
The lowest
Low
The suggested in this paper C/V converters are universal. This means that they
can be used to convert the capacitance change of a capacitive transducer into voltage
or a capacitance of discrete capacitors into voltage with better accuracy and linearity
than the conventional C/V converters. Moreover, the designed direct or indirect C/V
converters do not require other circuits to convert capacitance to voltage. But, the
published C/V converters such as impedance bridge or diode quad circuit require
additional electronic circuits such as square-wave oscillators and a complex system
for recovering the capacitance from the output voltage of these C/V converters which
increases the cost and decreases the reliability of these C/V converters in comparison
with the proposed converters. Furthermore, the suggested converters can be easily
adapted for different applications because the selection of components that appear in
these converters is simpler than the conventional converters.
References
[1] Daniele, M., Sardini, E., and Taroni, A., Measurement of Small Capacitance
Variations: IEEE Transactions on Instrumentation and Measurement, 40 (4):
426-428 (1991).
[2] Li, X., and Meijer, C. M., A Novel Smart Resistive-Capacitive Position Sensor:
IEEE Transactions on Instrumentation and Measurement, 44 (3): 768-7 (1995).
[3] Toth, F.N., and Meijer,G.C.M., A Low-Cost Smart Capacitive Position Sensor:
IEEE Transactions on Instrumentation and Measurement: 41 (6): 1041-1044
(1992).
[4] Goes, F.M.L. van der, and Meijer, G.C.M., A Novel Low-Cost Capacitive
Sensor Interface: IEEE Transactions on Instrumentation and Measurement: 45
(2): 536-540 (1996).
[5] Meyer, H.V., An Integrated Capacitive Position Sensor: IEEE Transactions on
Instrumentation and Measurement: 45 (2): 521-525, (1996).
[6] Unbehauen, R., and Cichock, A., A Switched-Capacitor and Continuous-Time
Integrated Circuit and Systems-Analysis and Design: Communication and
Control Engineering Series, Springer, New York, (1989).
[7] Hamg, S. R. G., Green, A. P., and Beck M. S., High Frequency Stray- Immune
Capacitance Transducer Based on the Charge Transfer Principle: IEEE
Transactions on Instrumentation and Measurement, IM-37: 368-373 (1996).
[8] Ko, W. H, Solid-state Capacitive Pressure Transducers: Sensors and
Actuators, 10: 303-319 (1992).
[9] Samaun, B., Wise, K. D., and Angell, Y. B., An IC Piezoresistive
Pressure Sensor for biomedical Instrumentation: IEEE Transactions on
Biomedical Engineering, BME-20: 101-106 (1983).
[10] Fleming, D. G., and Neuman, M. R., Indwelling and Implantable
Pressure Transducers: CRC Press, Cleveland (1977).
[11] Kung, J., Lee, H. S., and Howe, R. T., A Digital Readout Technique for
Capacitive applications: IEEE Journal of Solid-State Circuits, SC- 23:
(1988).
[12] Taha, S.M.R., A Novel Digital Capacitance Meter: International Journal
of Electronics, 66: 317-320 (1989).
[13] Nizamani, A.S., Duty Cycle Based Digital Capacitance Meter:
International Journal of Electronics, 74: 411-421 (1993).
[14] Nizamani, A.S., Measurement of Capacitance Using Identical
Oscillators: International Journal of Electronics, 75: 979-983 (1993).
[15]
Krummenacher,
F.,
A
High-Resolution
Capacitance-to-Frequency
Converter: IEEE Journal of Solid State Circuits, SC-20: 666-670, (1985).
[16] Matsumoto, H., Shimizu, H., and Watanabe, K., A Switched Capacitor
Charge-Balancing Analog-to-Digital Converter and its Application to
Capacitance measurement: IEEE Transactions on Instrumentation and
Measurement, IM-36: 472-476 (1987).
[17] Konodo, K., and Watanabe K., A Switched-Capacitor Interface for
capacitive Sensors With Wide Dynamic Range: IEEE Transactions on
Instrumentation and Measurement, IM-38: 736-739 (1989).
[18] Schilling, D. L., and Belove, C., Electronic Circuits, Discrete and Integrated,
McGraw-Hill, 757-759, 1989.
[19] National Semiconductors Company, Data Sheet of F/V LM2917 converter.
http://www.national.com/pf/LM/LM2917.html.
10