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    Short-Range Forces, Van Der Waals Forces, Electrostatic Forces, Capillary Forces

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    Zahir Rayhan Jhon
    Atomic force microscopy uses a sharp tip to probe and map sample topography. It detects short-range atomic forces, van der Waals forces, electrostatic forces, and capillary forces between the tip and sample. The microscope detects cantilever deflection from these near-field forces using a laser beam and photodiodes, allowing it to image surfaces with atomic or nanoscale resolution in various operational modes like static contact, dynamic noncontact, and tapping mode.

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    Short-Range Forces, Van Der Waals Forces, Electrostatic Forces, Capillary Forces

    Uploaded by

    Zahir Rayhan Jhon
    33 views4 pages
    Atomic force microscopy uses a sharp tip to probe and map sample topography. It detects short-range atomic forces, van der Waals forces, electrostatic forces, and capillary forces between the tip and sample. The microscope detects cantilever deflection from these near-field forces using a laser beam and photodiodes, allowing it to image surfaces with atomic or nanoscale resolution in various operational modes like static contact, dynamic noncontact, and tapping mode.

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    Lec_16_AFM

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    Atomic force microscopy uses a sharp tip to probe and map sample topography. It detects short-range atomic forces, van der Waals forces, electrostatic forces, and capillary forces between the tip and sample. The microscope detects cantilever deflection from these near-field forces using a laser beam and photodiodes, allowing it to image surfaces with atomic or nanoscale resolution in various operational modes like static contact, dynamic noncontact, and tapping mode.

    Copyright:

    © All Rights Reserved
    Download as PPTX, PDF, TXT or read online from Scribd
    Download as pptx, pdf, or txt
    33 views4 pages

    Short-Range Forces, Van Der Waals Forces, Electrostatic Forces, Capillary Forces

    Uploaded by

    Zahir Rayhan Jhon
    Atomic force microscopy uses a sharp tip to probe and map sample topography. It detects short-range atomic forces, van der Waals forces, electrostatic forces, and capillary forces between the tip and sample. The microscope detects cantilever deflection from these near-field forces using a laser beam and photodiodes, allowing it to image surfaces with atomic or nanoscale resolution in various operational modes like static contact, dynamic noncontact, and tapping mode.

    Copyright:

    © All Rights Reserved
    Download as PPTX, PDF, TXT or read online from Scribd
    Download as pptx, pdf, or txt
    of 4

    Atomic Force Microscopy

    Near-Field Forces
    • The AFM uses a very sharp tip to probe and map sample topography

    • Near-field forces that are Short-Range Forces, van der Waals Forces, Electrostatic
    Forces, Capillary Forces

    Short-Range Forces
    The short-range forces refer to atomic forces between atoms when their distance is close to atomic
    spacing.
    The attractive short-range forces are in the range of 0.5–1 nN per pair of interactive atoms between a
    typical tip and a sample.
    Van der Waals Forces
    The van der Waals forces are the interactive forces between dipoles of molecules.
    H is the Hamasker constant, d is the spacing between tip and sample, the tip
    radius is R, the van der Waals forces are around 2 nN

    Electrostatic Forces
    Electrostatic forces refer to the interactive forces between the electric charges of tip
    and sample

    Capillary Forces
    Capillary forces are forces resulting from water vapor condensation between tip and
    sample.
    Capillary force between the tip and sample
    due to water formation between them
    Force Sensors

    Detection of cantilever deflection by a


    laser beam reflected from the rear side of
    the cantilever. The reflection is measured
    by four-quadrant photodiodes. Cantilever
    deflection is converted to the change in
    beam position by photodiodes. t, l, and
    w, cantilever dimensions; h, distance
    from back of cantilever to probe tip.
    Operational Modes
    Static Contact Modes, Dynamic Operational Modes - Force Modulation, Dynamic
    Noncontact Mode, Tapping Mode, Force Modulation

    Typical Applications

    Static Mode
    The static contact mode is the simplest mode to use for obtaining basic topographic
    information of solid surfaces.

    Topography of crystalline polyethylene.


    Dynamic Noncontact Mode
    The dynamic noncontact mode can provide atomic resolution in an ultrahigh vacuum

    A noncontact mode image of a hydrogen-


    terminated silicon monohydride surface.

    Tapping Mode
    The tapping mode is becoming popular for topographic measurements.

    Tapping-mode image of multiple layers of Al


    x Ga (1 − x) N deposited on a sapphire
    substrate

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