Yelo Laser Diode Reliability Burn in and Lifetest For Photonic Devices Powerpoint

Yelo Laser Reliability Burn in and Lifetest for
Active Photonic Device

Company History
1983 Yelo founded
2001 Acquired by Mindready Solutions
2008 Mindready acquired by Averna
2010 Management Buyout Out and rebrand Yelo

Clients
Yelo’s clients include Telecom Network Equipment Original Equipment

Manufacturers, Photonic and opto-electronic device manufacturers,
startups and contract manufacturers
Europe: UK, Germany, Sweden, Finland, France
North America: Canada, East and West coast USA
China: Shenzen
Over 110 systems installed with 34 clients globally

Laser Reliability,Burn-in and Lifetest
Expertise
Over 100 man years of photonics experience
Ex Nortel / Bookham / Oclaro engineers
Photonic device manufacturing and QA expertise
Photonic device Qualification/Burn-in/Lifetest Equipment
Thermal Management
Device reliability-Telcordia standards
Device packaging (40Gb / 100 Gb)
Testing and fixturing (40Gb / 100 Gb)

Low Power Module Design
Low Power Module Designs
Probed Devices
• VCSEL Array
• Laser Array 10 channel
• APD
Chip-on Carrier
• Photonics Integrated Circuit (Lasers, Amplifiers, Modulator, Photodiode, Thermistor)
• SOA (Semi conductor Optical Amplifier)
• Lasers
• Laser Arrays
• APD (150V)
• PIN Photodiodes
Packaged
• VCSEL
TO Headers
• Mini DIL
• Butterfly
Why Yelo?
Device fixturing research and development and expertise

including
Tight temperature control of devices
Sufficient downward pressure on devices to ensure good thermal
contact
Accurate electrical probing to drive and measure devices
Optical analysis
Photonics Domain expertise
We have designed, manufactured and tested devices and understand
the constraints
Time to market
Modular approach using standard laser drive cards and standard
flexible software enables new systems to be delivered faster than
building your own
Laser Reliability, Burn-in, Lifetest &
Qualification System
Lifetest and burn-in at different

temperatures
Test different products and

packages in different modules
Suitable for contract manufacturers,

startups and mid volume
One control rack can test up to up to

2,048 devices per rack
Can be expanded by the addition of

up to 2 slave racks as volume
production increases
Independent Temperature Controlled Modules
A drawer can hold up to 8

modules
A module can hold up to 16

devices
This provides for up to 128

devices per drawer
Each module can operate at

different temperature and testing
cycle
Customised Module Design
Each module can hold up to 16

devices
The number of devices per

module depends upon the
complexity of the device
Devices held at temperature on

hot plate
Light detectors can be added and

cooled if required
High Power System
One control rack can test up to

up to 480 devices per rack
Can be expanded by the addition

of up to 2 slave racks as volume
production increases
High Volume Drawer Based System
This system uses the same rack and laser drive cards.
Each rack contains 4 drawers with no modules.
Each drawer contains a customised heating plate allowing

up to 256 devices to be loaded.
Suitable for packaged devices such as TO-CAN.

High Power Module
Uses a liquid-cooled baseplate

with a peltier option
Off-the-shelf fixturing includes
high accuracy pogo pins for
chip-on-carrier devices, clamps
for C-mount and W-mount
devices, connectors for
packaged devices and TO
headers
Liquid-cooled Integrating
spheres dissipate high optical
powers
Automation Software
Over 2 man years of software engineering development

Sophisticated temperature control algorithms
Clear, flexible user interface displaying the status of units under test
including module temperature
Programmable alarm conditions and notification via email
Data recording to any ODBC compliant database
Graphical displays of device performance during testing including
degradation
Laser control constant current or constant power modes
LIV sweep analysis & spot measurements
Burn-in at one temperature & characterize at another, with
programmable cycle times
All module parameters may be set independently (drive current,
temperature, burn-in time etc.)
Main User Interface
Diagnostics & Configuration
Cost Effective Benchtop System
Suitable for laboratory or for

low volume use
2 Modules – not expandable
Up to 32 devices
High Power Module Design
High Power Module Designs
Chip on Carrier
• C Mount – 20 Amp
• BA Mount – 40 Amp
Packaged
• Butterfly – 20 Amp
Probed Photonic Integrated Circuit
/ Laser Bar Test & Qualification
Burn-in and lifetest of a 12 chip

VCSEL array using a probe
card.
Burn In and Life Test – Benefits
Easy reconfiguration for new products

(wide range of modules)
Flexible use –
Burn-in, Lifetest and Qualification at the same time
Automatic in-situ measurement

(reduces handling time)
NIST standard measurement precision for every device
Ease of calibration / maintenance
Each drawer is independent of others

(virtually no single point of failure)
Individual independent temperature zones in groups of 16
Price effective at low volume

(suitable for R+D facilities)

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Yelo Laser Reliability Burn in and Lifetest for

Active Photonic Device

1983 Yelo founded

2001 Acquired by Mindready Solutions

2008 Mindready acquired by Averna

2010 Management Buyout Out and rebrand Yelo

Yelo’s clients include Telecom Network Equipment Original Equipment

Europe: UK, Germany, Sweden, Finland, France

North America: Canada, East and West coast USA

Over 110 systems installed with 34 clients globally

Over 100 man years of photonics experience

Ex Nortel / Bookham / Oclaro engineers

Photonic device manufacturing and QA expertise

Photonic device Qualification/Burn-in/Lifetest Equipment

Device reliability-Telcordia standards

Device packaging (40Gb / 100 Gb)

Testing and fixturing (40Gb / 100 Gb)

Low Power Module Designs

Device fixturing research and development and expertise

Lifetest and burn-in at different

Test different products and

Suitable for contract manufacturers,

One control rack can test up to up to

Can be expanded by the addition of

A drawer can hold up to 8

A module can hold up to 16

This provides for up to 128

Each module can operate at

Each module can hold up to 16

The number of devices per

Devices held at temperature on

Light detectors can be added and

One control rack can test up to

Can be expanded by the addition

Each rack contains 4 drawers with no modules.

Each drawer contains a customised heating plate allowing

Suitable for packaged devices such as TO-CAN.

Uses a liquid-cooled baseplate

Over 2 man years of software engineering development

Suitable for laboratory or for

2 Modules – not expandable

High Power Module Designs

Burn-in and lifetest of a 12 chip

Easy reconfiguration for new products

Automatic in-situ measurement

NIST standard measurement precision for every device

Ease of calibration / maintenance

Each drawer is independent of others

Individual independent temperature zones in groups of 16

Price effective at low volume

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