Tms 320 F 2803525
Tms 320 F 2803525
Tms 320 F 2803525
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TMS320F28030, TMS320F28030-Q1, TMS320F28031, TMS320F28031-Q1, TMS320F28032
TMS320F28032-Q1, TMS320F28033, TMS320F28033-Q1, TMS320F28034, TMS320F28034-Q1
TMS320F28035, TMS320F28035-Q1
SPRS584Q – APRIL 2009 – REVISED JANUARY 2024 www.ti.com
Device Information
PART NUMBER(1) PACKAGE BODY SIZE
TMS320F28035PN LQFP (80) 12.0mm × 12.0mm
TMS320F28034PN LQFP (80) 12.0mm × 12.0mm
TMS320F28033PN LQFP (80) 12.0mm × 12.0mm
TMS320F28032PN LQFP (80) 12.0mm × 12.0mm
TMS320F28031PN LQFP (80) 12.0mm × 12.0mm
TMS320F28030PN LQFP (80) 12.0mm × 12.0mm
TMS320F28035PAG TQFP (64) 10.0mm × 10.0mm
TMS320F28034PAG TQFP (64) 10.0mm × 10.0mm
TMS320F28033PAG TQFP (64) 10.0mm × 10.0mm
TMS320F28032PAG TQFP (64) 10.0mm × 10.0mm
TMS320F28031PAG TQFP (64) 10.0mm × 10.0mm
TMS320F28030PAG TQFP (64) 10.0mm × 10.0mm
TMS320F28035RSH VQFN (56) 7.0mm × 7.0mm
TMS320F28034RSH VQFN (56) 7.0mm × 7.0mm
TMS320F28033RSH VQFN (56) 7.0mm × 7.0mm
TMS320F28032RSH VQFN (56) 7.0mm × 7.0mm
TMS320F28031RSH VQFN (56) 7.0mm × 7.0mm
TMS320F28030RSH VQFN (56) 7.0mm × 7.0mm
(1) For more information on these devices, see Mechanical, Packaging, and Orderable Information.
Memory Bus
SARAM 1K × 16 OTP 1K × 16
(0-wait) Secure
M1 SARAM
SARAM 1K × 16 4K/6K/8K × 16
(CLA Only on
(0-wait)
28033 and 28035)
(0-wait)
Secure Code FLASH
Security 16K/32K/64K × 16
Module Secure
Boot-ROM
8K × 16
(0-wait)
OTP/Flash
PSWD Wrapper
Memory Bus
CLA Bus
CLA
TRST
TCK
COMP1OUT
TDI
32-Bit Peripheral Bus
POR/
VREG
B7:0 BOR
ePWM eCAN
SCI SPI I2C
LIN eCAP eQEP (32-mail HRCAP
(4L FIFO) (4L FIFO) (4L FIFO)
HRPWM box)
EPWMSYNCO
EPWMSYNCI
SPISIMO x
SPISOMIx
EPW MxA
EPW MxB
SC IT XD x
SCIR XDx
SPIC LK x
C AN R Xx
EQ EPxA
EQ EPxB
SPISTEx
EQEPxS
CA N TXx
HRCAPx
L IN A RX
LINA T X
EQE PxI
ECA Px
SDA x
SC L x
TZx
From
COMP1OUT,
COMP2OUT,
COMP3OUT
GPIO MUX
A. Not all peripheral pins are available at the same time due to multiplexing.
Table of Contents
1 Features............................................................................1 7 Detailed Description......................................................40
2 Applications..................................................................... 2 7.1 Overview................................................................... 40
3 Description.......................................................................2 7.2 Memory Maps........................................................... 48
3.1 Functional Block Diagram........................................... 4 7.3 Register Maps...........................................................55
4 Device Comparison......................................................... 6 7.4 Device Emulation Registers......................................57
4.1 Related Products........................................................ 8 7.5 VREG/BOR/POR...................................................... 58
5 Pin Configuration and Functions...................................9 7.6 System Control......................................................... 60
5.1 Pin Diagrams.............................................................. 9 7.7 Low-power Modes Block...........................................68
5.2 Signal Descriptions................................................... 12 7.8 Interrupts...................................................................69
6 Specifications................................................................ 20 7.9 Peripherals................................................................74
6.1 Absolute Maximum Ratings...................................... 20 8 Applications, Implementation, and Layout............... 141
6.2 ESD Ratings – Automotive....................................... 20 8.1 TI Reference Design............................................... 141
6.3 ESD Ratings – Commercial...................................... 21 9 Device and Documentation Support..........................142
6.4 Recommended Operating Conditions.......................21 9.1 Device and Development Support Tool
6.5 Power Consumption Summary................................. 22 Nomenclature............................................................ 142
6.6 Electrical Characteristics...........................................26 9.2 Tools and Software................................................. 143
6.7 Thermal Resistance Characteristics......................... 27 9.3 Documentation Support.......................................... 144
6.8 Thermal Design Considerations................................29 9.4 Support Resources................................................. 145
6.9 JTAG Debug Probe Connection Without Signal 9.5 Trademarks............................................................. 145
Buffering for the MCU..................................................30 9.6 Electrostatic Discharge Caution..............................145
6.10 Parameter Information............................................ 31 9.7 Glossary..................................................................145
6.11 Test Load Circuit..................................................... 31 10 Revision History........................................................ 145
6.12 Power Sequencing..................................................32 11 Mechanical, Packaging, and Orderable
6.13 Clock Specifications................................................35 Information.................................................................. 147
6.14 Flash Timing............................................................38 11.1 Packaging Information.......................................... 147
4 Device Comparison
Table 4-1 lists the features of the TMS320F2803x devices.
Table 4-1. Device Comparison
28030 28031 28032 28033 28034 28035
TYPE
FEATURE (1) 28030-Q1 28031-Q1 28032-Q1 28033-Q1 28034-Q1 28035-Q1
(60 MHz) (60 MHz) (60 MHz) (60 MHz) (60 MHz) (60 MHz)
80- 64- 56- 80- 64- 56- 80- 64- 56- 80- 64- 56- 80- 64- 56- 80- 64- 56-
Pin Pin Pin Pin Pin Pin Pin Pin Pin Pin Pin Pin Pin Pin Pin Pin Pin Pin
Package Type
PN PAG RSH PN PAG RSH PN PAG RSH PN PAG RSH PN PAG RSH PN PAG RSH
LQFP TQFP VQFN LQFP TQFP VQFN LQFP TQFP VQFN LQFP TQFP VQFN LQFP TQFP VQFN LQFP TQFP VQFN
Instruction cycle – 16.67 ns 16.67 ns 16.67 ns 16.67 ns 16.67 ns 16.67 ns
Control Law Accelerator
0 No No No Yes No Yes
(CLA)
On-chip flash (16-bit word) – 16K 32K 32K 32K 64K 64K
On-chip SARAM (16-bit
– 6K 8K 10K 10K 10K 10K
word)
Code security for on-chip
– Yes Yes Yes Yes Yes Yes
flash/SARAM/OTP blocks
Boot ROM (8K x 16) – Yes Yes Yes Yes Yes Yes
One-time programmable
– 1K 1K 1K 1K 1K 1K
(OTP) ROM (16-bit word)
ePWM channels 1 14 12 8 14 12 8 14 12 8 14 12 8 14 12 8 14 12 8
eCAP inputs 0 1 1 1 1 1 1
eQEP modules 0 1 1 1 1 1 1
Watchdog timer – Yes Yes Yes Yes Yes Yes
MSPS 2.0 2.0 4.6 4.6 4.6 4.6
Conversion
500.00 ns 500.00 ns 216.67 ns 216.67 ns 216.67 ns 216.67 ns
Time
12-Bit Channels 16 14 13 16 14 13 16 14 13 16 14 13 16 14 13 16 14 13
3
ADC
Temperature
Yes Yes Yes Yes Yes Yes
Sensor
Dual Sample-
Yes Yes Yes Yes Yes Yes
and-Hold
32-Bit CPU timers – 3 3 3 3 3 3
High-resolution ePWM
1 – – 7 6 4 7 6 4 7 6 4 7 6 4
Channels
High-resolution Capture
0 – – 2 2 – 2 2 – 2 2 – 2 2 –
(HRCAP) Modules
Comparators with
0 3 3 3 3 3 3
Integrated DACs
Inter-integrated circuit
0 1 1 1 1 1 1
(I2C)
Enhanced Controller Area
0 1 1 1 1 1 1
Network (eCAN)
Local Interconnect
0 1 1 1 1 1 1
Network (LIN)
Serial Peripheral Interface
1 2 1 1 2 1 1 2 1 1 2 1 1 2 1 1 2 1 1
(SPI)
Serial Communications
Interface (SCI) (UART 0 1 1 1 1 1 1
Compatible)
(1) A type change represents a major functional feature difference in a peripheral module. Within a peripheral type, there may be minor
differences between devices that do not affect the basic functionality of the module. These device-specific differences are listed in the
C2000 Real-Time Control Peripherals Reference Guide and in the TMS320F2803x Real-Time Microcontrollers Technical Reference
Manual.
(2) The letter Q refers to AEC Q100 qualification for automotive applications.
GPIO6/EPWM4A/EPWMSYNCI/EPWMSYNCO
GPIO19/XCLKIN/SPISTEA/LINRXA/ECAP1
GPIO18/SPICLKA/LINTXA/XCLKOUT
GPIO7/EPWM4B/SCIRXDA
GPIO16/SPISIMOA/TZ2
GPIO17/SPISOMIA/TZ3
GPIO12/TZ1/SCITXDA
GPIO38/TCK/XCLKIN
GPIO37/TDO
GPIO35/TDI
VDD
VSS
X1
X2
42
41
40
39
38
37
36
35
34
33
32
31
30
29
GPIO36/TMS 43 28 GPIO28/SCIRXDA/SDAA/TZ2
GPIO5/EPWM3B/SPISIMOA/ECAP1 44 27 TEST2
GPIO4/EPWM3A 45 26 VDDIO
GPIO3/EPWM2B/SPISOMIA/COMP2OUT 46 25 VSS
GPIO2/EPWM2A 47 24 GPIO29/SCITXDA/SCLA/TZ3
GPIO1/EPWM1B/COMP1OUT 48 23 GPIO30/CANRXA
GPIO0/EPWM1A 49 22 GPIO31/CANTXA
VDDIO 50 21 ADCINB7
VSS 51 20 ADCINB6/COMP3B/AIO14
VDD 52 19 ADCINB4/COMP2B/AIO12
VREGENZ 53 18 ADCINB3
GPIO34/COMP2OUT/COMP3OUT 54 17 ADCINB2/COMP1B/AIO10
GPIO20/EQEP1A/COMP1OUT 55 16 ADCINB1
GPIO21/EQEP1B/COMP2OUT 56 15 VSSA/VREFLO
ADCINA7 7
XRS 5
ADCINA4/COMP2A/AIO4 9
GPIO23/EQEP1I/LINRXA 2
VDD 3
TRST 6
ADCINA1 12
ADCINA0/VREFHI 13
GPIO22/EQEP1S/LINTXA 1
ADCINA3 10
ADCINA2/COMP1A/AIO2 11
VSS 4
VDDA 14
ADCINA6/COMP3A/AIO6 8
A. This figure shows the top view of the 56-pin RSH package. Shading denotes that the terminals are actually on the bottom side of the
package. See Section 11 for the 56-pin RSH mechanical drawing.
B. Pin 13: VREFHI and ADCINA0 share the same pin on the 56-pin RSH device and their use is mutually exclusive to one another.
C. Pin 15: VREFLO is always connected to VSSA on the 56-pin RSH device.
GPIO6/EPWM4A/EPWMSYNCI/EPWMSYNCO
GPIO19/XCLKIN/SPISTEA/LINRXA/ECAP1
GPIO18/SPICLKA/LINTXA/XCLKOUT
GPIO8/EPWM5A/ADCSOCAO
GPIO7/EPWM4B/SCIRXDA
GPIO16/SPISIMOA/TZ2
GPIO17/SPISOMIA/TZ3
GPIO12/TZ1/SCITXDA
GPIO38/TCK/XCLKIN
GPIO36/TMS
GPIO37/TDO
GPIO35/TDI
VDD
VSS
X1
X2
41
42
44
40
34
48
47
46
43
39
38
37
36
33
45
35
GPIO11/EPWM6B/LINRXA/HRCAP2 49 32 GPIO28/SCIRXDA/SDAA/TZ2
GPIO5/EPWM3B/SPSIMOA/ECAP1 50 31 GPIO9/EPWM5B/LINTXA/HRCAP1
GPIO4/EPWM3A 51 30 TEST2
GPIO10/EPWM6A/ADCSOCBO 52 29 VDDIO
GPIO3/EPWM2B/SPISOMIA/COMP2OUT 53 28 VSS
GPIO2/EPWM2A 54 27 GPIO29/SCITXDA/SCLA/TZ3
GPIO1/EPWM1B/COMP1OUT 55 26 GPIO30/CANRXA
GPIO0/EPWM1A 56 25 GPIO31/CANTXA
VDDIO 57 24 ADCINB7
VSS 58 23 ADCINB6/COMP3B/AIO14
VDD 59 22 ADCINB4/COMP2B/AIO12
VREGENZ 60 21 ADCINB3
GPIO34/COMP2OUT/COMP3OUT 61 20 ADCINB2/COMP1B/AIO10
GPIO20/EQEP1A/COMP1OUT 62 19 ADCINB1
GPIO21/EQEP1B/COMP2OUT 63 18 ADCINB0
GPIO24/ECAP1 64 17 VSSA/VREFLO
10
12
13
14
15
16
11
1
2
3
4
5
6
7
8
9
TRST
ADCINA0/VREFHI
XRS
VDD
ADCINA7
GPIO22/EQEP1S/LINTXA
GPIO32/SDAA/EPWMSYNCI/ADCSOCAO
GPIO33/SCLA/EPWMSYNCO/ADCSOCBO
VSS
ADCINA2/COMP1A/AIO2
ADCINA6/COMP3A/AIO6
ADCINA4/COMP2A/AIO4
ADCINA3
VDDA
GPIO23/EQEP1I/LINRXA
ADCINA1
A. Pin 15: VREFHI and ADCINA0 share the same pin on the 64-pin PAG device and their use is mutually exclusive to one another.
B. Pin 17: VREFLO is always connected to VSSA on the 64-pin PAG device.
GPIO6/EPWM4A/EPWMSYNCI/EPWMSYNCO
GPIO19/XCLKIN/SPISTEA/LINRXA/ECAP1
GPIO18/SPICLKA/LINTXA/XCLKOUT
GPIO12/TZ1/SCITXDA/SPISIMOB
GPIO8/EPWM5A/ADCSOCAO
GPIO7/EPWM4B/SCIRXDA
GPIO16/SPISIMOA/TZ2
GPIO17/SPISOMIA/TZ3
GPIO38/TCK/XCLKIN
GPIO25/SPISOMIB
GPIO41/EPWM7B
GPIO36/TMS
GPIO37/TDO
GPIO35/TDI
GPIO39
GPIO44
VDD
VSS
X1
X2
51
41
52
42
60
54
50
44
59
58
57
56
53
49
48
47
46
43
55
45
GPIO11/EPWM6B/LINRXA/HRCAP2 61 40 GPIO28/SCIRXDA/SDAA/TZ2
GPIO5/EPWM3B/SPISIMOA/ECAP1 62 39 GPIO9/EPWM5B/LINTXA/HRCAP1
GPIO4/EPWM3A 63 38 TEST2
GPIO40/EPWM7A 64 37 GPIO26/HRCAP1/SPICLKB
GPIO10/EPWM6A/ADCSOCBO 65 36 VDDIO
GPIO3/EPWM2B/SPISOMIA/COMP2OUT 66 35 VSS
GPIO2/EPWM2A 67 34 GPIO29/SCITXDA/SCLA/TZ3
GPIO1/EPWM1B/COMP1OUT 68 33 GPIO30/CANRXA
GPIO0/EPWM1A 69 32 GPIO31/CANTXA
VDDIO 70 31 GPIO27/HRCAP2/SPISTEB
VSS 71 30 ADCINB7
VDD 72 29 ADCINB6/COMP3B/AIO14
VREGENZ 73 28 ADCINB5
GPIO34/COMP2OUT/COMP3OUT 74 27 ADCINB4/COMP2B/AIO12
GPIO15/TZ1/LINRXA/SPISTEB 75 26 ADCINB3
GPIO13/TZ2/SPISOMIB 76 25 ADCINB2/COMP1B/AIO10
GPIO14/TZ3/LINTXA/SPICLKB 77 24 ADCINB1
GPIO20/EQEP1A/COMP1OUT 78 23 ADCINB0
GPIO21/EQEP1B/COMP2OUT 79 22 VREFLO
GPIO24/ECAP1/SPISIMOB 80 21 VSSA
10
12
13
14
15
16
20
11
17
18
19
1
2
3
4
5
6
7
8
9
TRST
VDDA
XRS
VREFHI
GPIO22/EQEP1S/LINTXA
GPIO42/COMP1OUT
VDD
ADCINA7
ADCINA1
GPIO32/SDAA/EPWMSYNCI/ADCSOCAO
GPIO33/SCLA/EPWMSYNCO/ADCSOCBO
GPIO23/EQEP1I/LINRXA
VSS
ADCINA6/COMP3A/AIO6
ADCINA5
ADCINA4/COMP2A/AIO4
ADCINA3
ADCINA0
GPIO43/COMP2OUT
ADCINA2/COMP1A/AIO2
Note
When the on-chip VREG is used, the GPIO19, GPIO34, GPIO35, GPIO36, GPIO37, and GPIO38 pins
could glitch during power up. This potential glitch will finish before the boot mode pins are read and
will not affect boot behavior. If glitching is unacceptable in an application, 1.8 V could be supplied
externally. Alternatively, adding a current-limiting resistor (for example, 470 Ω) in series with these pins
and any external driver could be considered to limit the potential for degradation to the pin and/or
external circuitry. There is no power-sequencing requirement when using an external 1.8-V supply.
However, if the 3.3-V transistors in the level-shifting output buffers of the I/O pins are powered before
the 1.8-V transistors, it is possible for the output buffers to turn on, causing a glitch to occur on the pin
during power up. To avoid this behavior, power the VDD pins before or with the VDDIO pins, ensuring
that the VDD pins have reached 0.7 V before the VDDIO pins reach 0.7 V.
58 46 41 JTAG scan out, test data output (TDO). The contents of the selected register
TDO O/Z (instruction or data) are shifted out of TDO on the falling edge of TCK (8 mA
drive)
GPIO38 I/O/Z General-Purpose Input/Output 38
TCK I JTAG test clock with internal pullup
57 45 40 External Oscillator Input. The path from this pin to the clock block is not gated
XCLKIN I by the mux function of this pin. Care must be taken to not enable this path for
clocking if it is being used for the other functions.
– –
GPIO39 I/O/Z General-Purpose Input/Output 39
– –
56 – –
– –
– –
GPIO40 I/O/Z General-Purpose Input/Output 40
EPWM7A O Enhanced PWM7 output A and HRPWM channel
64 – –
– –
– –
GPIO41 I/O/Z General-Purpose Input/Output 41
EPWM7B O Enhanced PWM7 output B
48 – –
– –
– –
GPIO42 I/O/Z General-Purpose Input/Output 42
– –
5 – –
– –
COMP1OUT O Direct output of Comparator 1
GPIO43 I/O/Z General-Purpose Input/Output 43
– –
6 – –
– –
COMP2OUT O Direct output of Comparator 2
GPIO44 I/O/Z General-Purpose Input/Output 44
– –
45 – –
– –
– –
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1) (2)
MIN MAX UNIT
VDDIO (I/O and Flash) with respect to VSS –0.3 4.6
Supply voltage V
VDD with respect to VSS –0.3 2.5
Analog voltage VDDA with respect to VSSA –0.3 4.6 V
VIN (3.3 V) –0.3 4.6
Input voltage V
VIN (X1) –0.3 2.5
Output voltage VO –0.3 4.6 V
Digital/analog input (per pin), IIK
–20 20
(VIN < VSS or VIN > VDDIO)(3)
Analog input (per pin), IIKANALOG
Input clamp current –20 20 mA
(VIN < VSSA or VIN > VDDA)
Total for all inputs, IIKTOTAL
–20 20
(VIN < VSS/VSSA or VIN > VDDIO/VDDA)
Output clamp current IOK (VO < 0 or VO > VDDIO) –20 20 mA
Junction temperature(4) TJ –40 150 °C
Storage temperature(4) Tstg –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Section 6.4 is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) Continuous clamp current per pin is ±2 mA. Do not operate in this condition continuously as VDDIO/VDDA voltage may internally rise and
impact other electrical specifications.
(4) Long-term high-temperature storage or extended use at maximum temperature conditions may result in a reduction of overall device
life. For additional information, see Semiconductor and IC Package Thermal Metrics; Calculating Useful Lifetimes of Embedded
Processors; and Calculating FIT for a Mission Profile.
(1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) Group 2 pins are as follows: GPIO16, GPIO17, GPIO18, GPIO19, GPIO28, GPIO29, GPIO36, GPIO37
(1) IDDIO current is dependent on the electrical loading on the I/O pins.
(2) To realize the IDDA currents shown for IDLE, STANDBY, and HALT, clock to the ADC module must be turned off explicitly by writing to
the PCLKCR0 register.
(3) The TYP numbers are applicable over room temperature and nominal voltage.
(4) The following is done in a loop:
• Data is continuously transmitted out of SPI-A/B, SCI-A, eCAN, LIN, and I2C ports.
• The hardware multiplier is exercised.
• Watchdog is reset.
• ADC is performing continuous conversion.
• COMP1/2 are continuously switching voltages.
• GPIO17 is toggled.
(5) If a quartz crystal or ceramic resonator is used as the clock source, the HALT mode shuts down the on-chip crystal oscillator.
(6) CLA is continuously performing polynomial calculations.
(7) For F2803x devices that do not have CLA, subtract the IDD current number for CLA (see Table 6-1) from the IDD (VREG disabled)/IDDIO
(VREG enabled) current numbers shown in Section 6.5.1 for operational mode.
Note
The peripheral - I/O multiplexing implemented in the device prevents all available peripherals from
being used at the same time. This is because more than one peripheral function may share an I/O
pin. It is, however, possible to turn on the clocks to all the peripherals at the same time, although such
a configuration is not useful. If this is done, the current drawn by the device will be more than the
numbers specified in the current consumption tables.
(1) All peripheral clocks (except CPU Timer clock) are disabled upon reset. Writing to/reading from
peripheral registers is possible only after the peripheral clocks are turned on.
(2) This number represents the current drawn by the digital portion of the ADC module. Turning off the
clock to the ADC module results in the elimination of the current drawn by the analog portion of the
ADC (IDDA) as well.
(3) For peripherals with multiple instances, the current quoted is per module. For example, the 2 mA
value quoted for ePWM is for one ePWM module.
Note
IDDIO current consumption is reduced by 15 mA (typical) when XCLKOUT is turned off.
Note
The baseline IDD current (current when the core is executing a dummy loop with no peripherals
enabled) is 40 mA, typical. To arrive at the IDD current for a given application, the current-drawn by the
peripherals (enabled by that application) must be added to the baseline IDD current.
140
120
Operational Current (mA)
100
80
60
40
20
0
0 10 20 30 40 50 60 70
SYSCLKOUT (MHz)
IDDIO IDDA
500
450
Operational Power (mW)
400
350
300
250
200
0 10 20 30 40 50 60 70
SYSCLKOUT (MHz)
25
CLA operational IDDIO current (mA)
20
15
10
0
10 15 20 25 30 35 40 45 50 55 60
SYSCLKOUT (MHz)
(1) When the on-chip VREG is used, its output is monitored by the POR/BOR circuit, which will reset the device should the core voltage
(VDD) go out of range.
(1) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(2) lfm = linear feet per minute
(1) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(2) lfm = linear feet per minute
(1) These values are based on a JEDEC defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
• JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
• JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
• JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(2) lfm = linear feet per minute
6.9 JTAG Debug Probe Connection Without Signal Buffering for the MCU
Figure 6-4 shows the connection between the MCU and JTAG header for a single-processor configuration. If
the distance between the JTAG header and the MCU is greater than 6 inches, the emulation signals must be
buffered. If the distance is less than 6 inches, buffering is typically not needed. Figure 6-4 shows the simpler,
no-buffering situation. For the pullup/pulldown resistor values, see Section 5.2, Signal Descriptions.
6 inches or less
VDDIO VDDIO
13 5
EMU0 PD
14
EMU1
2 4
TRST TRST GND
1 6
TMS TMS GND
3 8
TDI TDI GND
7 10
TDO TDO GND
11 12
TCK TCK GND
9
TCK_RET
MCU
JTAG Header
Figure 6-4. JTAG Debug Probe Connection Without Signal Buffering for the MCU
Note
The 2803x devices do not have EMU0/EMU1 pins. For designs that have a JTAG Header onboard,
the EMU0/EMU1 pins on the header must be tied to VDDIO through a 4.7-kΩ (typical) resistor.
42 W 3.5 nH Output
Transmission Line Under
(A)
Test
Z0 = 50 W
(B)
Device Pin
4.0 pF 1.85 pF
A. Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the device pin.
B. The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its transmission line effects
must be taken into account. A transmission line with a delay of 2 ns or longer can be used to produce the desired transmission line
effect. The transmission line is intended as a load only. It is not necessary to add or subtract the transmission line delay (2 ns or longer)
from the data sheet timing.
VDDIO, VDDA
(3.3 V)
VDD (1.8 V)
INTOSC1
tINTOSCST
X1/X2
tOSCST (B)
(A)
XCLKOUT
User-code dependent
tw(RSL1)
(D)
XRS
Address/data valid, internal boot-ROM code execution phase
Address/Data/
Control
(Internal)
td(EX) User-code execution phase
th(boot-mode)(C) User-code dependent
Boot-Mode
GPIO pins as input
Pins
Peripheral/GPIO function
Boot-ROM execution starts
Based on boot code
(E)
User-code dependent
A. Upon power up, SYSCLKOUT is OSCCLK/4. Because the XCLKOUTDIV bits in the XCLK register come up with a reset state of 0,
SYSCLKOUT is further divided by 4 before it appears at XCLKOUT. XCLKOUT = OSCCLK/16 during this phase.
B. Boot ROM configures the DIVSEL bits for /1 operation. XCLKOUT = OSCCLK/4 during this phase. XCLKOUT will not be visible at the
pin until explicitly configured by user code.
C. After reset, the boot ROM code samples Boot Mode pins. Based on the status of the Boot Mode pin, the boot code branches to
destination memory or boot code function. If boot ROM code executes after power-on conditions (in debugger environment), the boot
code execution time is based on the current SYSCLKOUT speed. The SYSCLKOUT will be based on user environment and could be
with or without PLL enabled.
D. Using the XRS pin is optional due to the on-chip power-on reset (POR) circuitry.
E. The internal pullup/pulldown will take effect when BOR is driven high.
INTOSC1
X1/X2
XCLKOUT
User-Code Dependent
tw(RSL2)
XRS
User-Code Execution Phase
td(EX)
Address/Data/
Control User-Code Execution
(Internal)
I/O Pins User-Code Dependent GPIO Pins as Input (State Depends on Internal PU/PD)
User-Code Dependent
A. After reset, the Boot ROM code samples BOOT Mode pins. Based on the status of the Boot Mode pin, the boot code branches to
destination memory or boot code function. If Boot ROM code executes after power-on conditions (in debugger environment), the Boot
code execution time is based on the current SYSCLKOUT speed. The SYSCLKOUT will be based on user environment and could be
with or without PLL enabled.
Figure 6-8 shows an example for the effect of writing into PLLCR register. In the first phase, PLLCR = 0x0004
and SYSCLKOUT = OSCCLK x 2. The PLLCR is then written with 0x0008. Right after the PLLCR register is
written, the PLL lock-up phase begins. During this phase, SYSCLKOUT = OSCCLK/2. After the PLL lock-up is
complete, SYSCLKOUT reflects the new operating frequency, OSCCLK x 4.
OSCCLK
Write to PLLCR
SYSCLKOUT
(Current CPU (CPU frequency while PLL is stabilizing (Changed CPU frequency)
Frequency) with the desired frequency. This period
(PLL lock-up time tp) is 1 ms long.)
(1) The PLLLOCKPRD register must be updated based on the number of OSCCLK cycles. If the zero-pin internal oscillators (10 MHz) are
used as the clock source, then the PLLLOCKPRD register must be written with a value of 10,000 (minimum).
(1) Oscillator frequency will vary over temperature, see Figure 6-9. To compensate for oscillator temperature drift, see the Oscillator
Compensation Guide and C2000Ware.
(2) Frequency range ensured only when VREG is enabled, VREGENZ = VSS.
(3) Output frequency of the internal oscillators follows the direction of both the temperature gradient and voltage (VDD) gradient. For
example:
• Increase in temperature will cause the output frequency to increase per the temperature coefficient.
• Decrease in voltage (VDD) will cause the output frequency to decrease per the voltage coefficient.
10.6
10.5
10.4
10.3
Output Frequency (MHz)
10.2
10.1
10
9.9
9.8
9.7
9.6
–40 –30 –20 –10 0 10 20 30 40 50 60 70 80 90 100 110 120
C10
C9
C8
XCLKIN(A)
C3 C6
C1
C4
C5
XCLKOUT(B)
A. The relationship of XCLKIN to XCLKOUT depends on the divide factor chosen. The waveform relationship shown is intended to
illustrate the timing parameters only and may differ based on actual configuration.
B. XCLKOUT configured to reflect SYSCLKOUT.
(1) Write/erase operations outside of the temperature ranges indicated are not specified and may affect the endurance numbers.
(1) Write/erase operations outside of the temperature ranges indicated are not specified and may affect the endurance numbers.
(1) Write/erase operations outside of the temperature ranges indicated are not specified and may affect the endurance numbers.
(1) Program time is at the maximum device frequency. The programming time indicated in this table is applicable only when all the
required code/data is available in the device RAM, ready for programming. Program time includes overhead of the flash state machine
but does not include the time to transfer the following into RAM:
• the code that uses flash API to program the flash
• the Flash API itself
• Flash data to be programmed
(2) Maximum flash parameter mentioned are for the first 100 program and erase cycles.
(3) The on-chip flash memory is in an erased state when the device is shipped from TI. As such, erasing the flash memory is not required
prior to programming, when programming the device for the first time. However, the erase operation is needed on all subsequent
programming operations.
(4) Typical parameters as seen at room temperature including function call overhead, with all peripherals off. It is important to maintain
a stable power supply during the entire flash programming process. It is conceivable that device current consumption during flash
programming could be higher than normal operating conditions. The power supply used should ensure VMIN on the supply rails at
all times, as specified in the Recommended Operating Conditions of the data sheet. Any brown-out or interruption to power during
erasing/programming could potentially corrupt the password locations and lock the device permanently. Powering a target board
(during flash programming) through the USB port is not recommended, as the port may be unable to respond to the power demands
placed during the programming process.
The equations to compute the Flash page wait state and random wait state in Table 6-2 are as follows:
éæ t a( f · p ) ö ù
Flash Page Wait State = êç ÷ - 1ú round up to the next highest integer
êëçè t c (SCO ) ÷ø úû
éæ t a(f ×r) ö ù
Flash Random Wait State = êç ÷ - 1ú round up to the next highest integer, or 1, whichever is larger
êëçè t c(SCO) ÷ø úû
The equation to compute the OTP wait state in Table 6-2 is as follows:
éæ t a(OTP) ö ù
OTP Wait State = êç ÷ - 1ú round up to the next highest integer, or 1, whichever is larger
ç ÷
ëêè t c(SCO) ø ûú
7 Detailed Description
7.1 Overview
7.1.1 CPU
The 2803x (C28x) family is a member of the TMS320C2000™ microcontroller (MCU) platform. The C28x-based
controllers have the same 32-bit fixed-point architecture as existing C28x MCUs. It is a very efficient C/C++
engine, enabling users to develop not only their system control software in a high-level language, but also
enabling development of math algorithms using C/C++. The device is as efficient at MCU math tasks as it is at
system control tasks that typically are handled by microcontroller devices. This efficiency removes the need for
a second processor in many systems. The 32 × 32-bit MAC 64-bit processing capabilities enable the controller
to handle higher numerical resolution problems efficiently. Add to this the fast interrupt response with automatic
context save of critical registers, resulting in a device that is capable of servicing many asynchronous events
with minimal latency. The device has an 8-level-deep protected pipeline with pipelined memory accesses. This
pipelining enables it to execute at high speeds without resorting to expensive high-speed memories. Special
branch-look-ahead hardware minimizes the latency for conditional discontinuities. Special store conditional
operations further improve performance.
7.1.2 Control Law Accelerator (CLA)
The C28x control law accelerator is a single-precision (32-bit) floating-point unit that extends the capabilities of
the C28x CPU by adding parallel processing. The CLA is an independent processor with its own bus structure,
fetch mechanism, and pipeline. Eight individual CLA tasks, or routines, can be specified. Each task is started
by software or a peripheral such as the ADC, an ePWM, or CPU Timer 0. The CLA executes one task at
a time to completion. When a task completes the main CPU is notified by an interrupt to the PIE and the
CLA automatically begins the next highest-priority pending task. The CLA can directly access the ADC Result
registers and the ePWM+HRPWM registers. Dedicated message RAMs provide a method to pass additional
data between the main CPU and the CLA.
7.1.3 Memory Bus (Harvard Bus Architecture)
As with many MCU-type devices, multiple buses are used to move data between the memories and peripherals
and the CPU. The memory bus architecture contains a program read bus, data read bus, and data write bus.
The program read bus consists of 22 address lines and 32 data lines. The data read and write buses consist
of 32 address lines and 32 data lines each. The 32-bit-wide data buses enable single cycle 32-bit operations.
The multiple bus architecture, commonly termed Harvard Bus, enables the C28x to fetch an instruction, read a
data value and write a data value in a single cycle. All peripherals and memories attached to the memory bus
prioritize memory accesses. Generally, the priority of memory bus accesses can be summarized as follows:
Highest: Data Writes (Simultaneous data and program writes cannot occur on the memory bus.)
Program Writes (Simultaneous data and program writes cannot occur on the memory bus.)
Data Reads
Program Reads (Simultaneous program reads and fetches cannot occur on the
memory bus.)
Lowest: Fetches (Simultaneous program reads and fetches cannot occur on the
memory bus.)
Note
The Flash and OTP wait states can be configured by the application. This allows applications running
at slower frequencies to configure the flash to use fewer wait states.
Flash effective performance can be improved by enabling the flash pipeline mode in the Flash options
register. With this mode enabled, effective performance of linear code execution will be much faster
than the raw performance indicated by the wait-state configuration alone. The exact performance gain
when using the Flash pipeline mode is application-dependent.
For more information on the Flash options, Flash wait state, and OTP wait-state registers, see
the System Control chapter in the TMS320F2803x Real-Time Microcontrollers Technical Reference
Manual.
7.1.10 Security
The devices support high levels of security to protect the user firmware from being reverse engineered. The
security features a 128-bit password (hardcoded for 16 wait states), which the user programs into the flash.
One code security module (CSM) is used to protect the flash/OTP and the L0/L1 SARAM blocks. The security
feature prevents unauthorized users from examining the memory contents through the JTAG port or trying to
boot-load some undesirable software that would export the secure memory contents. To enable access to the
secure blocks, the user must write the correct 128-bit KEY value that matches the value stored in the password
locations within the Flash.
In addition to the CSM, the emulation code security logic (ECSL) has been implemented to prevent unauthorized
users from stepping through secure code. Any code or data access to flash, user OTP, or Lx memory while
the JTAG debug probe is connected will trip the ECSL and break the debug probe connection. To allow debug
of secure code, while maintaining the CSM protection against secure memory reads, the user must write the
correct value into the lower 64 bits of the KEY register (KEY0–KEY3), which matches the value stored in
the lower 64 bits of the password locations (PWL0–PWL3) within the flash. Dummy reads of all 128 bits of
the password in the flash must still be performed. If the lower 64 bits of the password locations are all ones
(unprogrammed), then the KEY value does not need to match. During debug of secure code, operations like
single-stepping is possible. However, the actual contents of the secure memory cannot be seen in the CCS
window.
When power is applied to a secure device that is connected to a JTAG debug probe, the CPU will start executing
and may execute an instruction that performs an access to a protected area. If this happens, the ECSL will trip
and cause the JTAG circuitry to be deactivated. Under this condition, a host (such as a computer running CCS or
flash programing software) would not be able to establish connection with the device.
The solution is to use the Wait boot option. In this mode, code loops around a software breakpoint to allow a
JTAG debug probe to be connected without tripping security. The user can then exit this mode once the JTAG
debug probe is connected by using one of the emulation boot options as described in the Boot ROM chapter
in the TMS320F2803x Real-Time Microcontrollers Technical Reference Manual. These devices do not support a
hardware wait-in-reset mode.
If reprogramming of a secure device via JTAG is desired, it is important to put in the needed hooks in the board
design to be able to put the device in Wait boot mode upon power-up. Otherwise, ECSL may deactivate the
JTAG circuitry and prevent connection to the device, as mentioned earlier.
Note
• When the code-security passwords are programmed, all addresses from 0x3F7F80 to 0x3F7FF5
cannot be used as program code or data. These locations must be programmed to 0x0000.
• If reprogramming of a secure device via JTAG may be needed in future, it is important to design
the board in such a way that the device could be put in Wait boot mode upon power-up (when
reprogramming is warranted). Otherwise, ECSL may deactivate the JTAG circuitry and prevent
connection to the device, as mentioned earlier. If reconfiguring the device for Wait boot mode in
the field is not practical, some mechanism must be implemented in the firmware to detect when a
firmware update is warranted. Code could then branch to the desired bootloader in the bootROM. It
could also branch to the Wait bootmode, at which point the JTAG debug probe could be connected,
device unsecured and programming accomplished through JTAG itself.
• If the code security feature is not used, addresses 0x3F7F80 to 0x3F7FEF may be used for code
or data. Addresses 0x3F7FF0 to 0x3F7FF5 are reserved for data and should not contain program
code.
The 128-bit password (at 0x3F 7FF8 to 0x3F 7FFF) must not be programmed to zeros. Doing so
would permanently lock the device.
IDLE: Place CPU in low-power mode. Peripheral clocks may be turned off selectively and only
those peripherals that must function during IDLE are left operating. An enabled interrupt
from an active peripheral or the watchdog timer will wake the processor from IDLE mode.
STANDBY: Turns off clock to CPU and peripherals. This mode leaves the oscillator and PLL functional.
An external interrupt event will wake the processor and the peripherals. Execution begins
on the next valid cycle after detection of the interrupt event
HALT: This mode basically shuts down the device and places it in the lowest possible power
consumption mode. If the internal zero-pin oscillators are used as the clock source, the
HALT mode turns them off, by default. To keep these oscillators from shutting down, the
INTOSCnHALTI bits in CLKCTL register may be used. The zero-pin oscillators may thus
be used to clock the CPU watchdog in this mode. If the on-chip crystal oscillator is used
as the clock source, it is shut down in this mode. A reset or an external signal (through a
GPIO pin) or the CPU watchdog can wake the device from this mode.
The CPU clock (OSCCLK) and watchdog clock source should be from the same clock source before attempting
to put the device into HALT or STANDBY.
PF0: PIE: PIE Interrupt Enable and Control Registers Plus PIE Vector Table
Flash: Flash Wait-State Registers
Timers: CPU-Timers 0, 1, 2 Registers
CSM: Code Security Module KEY Registers
ADC: ADC Result Registers
CLA Control Law Accelerator Registers and Message RAMs
PF1: GPIO: GPIO MUX Configuration and Control Registers
eCAN: Enhanced Control Area Network Configuration and Control Registers
LIN: Local Interconnect Network Configuration and Control Registers
eCAP: Enhanced Capture Module and Registers
eQEP: Enhanced Quadrature Encoder Pulse Module and Registers
HRCAP: High-Resolution Capture Module and Registers
PF2: SYS: System Control Registers
SCI: Serial Communications Interface (SCI) Control and RX/TX Registers
SPI: Serial Port Interface (SPI) Control and RX/TX Registers
ADC: ADC Status, Control, and Configuration Registers
I2C: Inter-Integrated Circuit Module and Registers
XINT: External Interrupt Registers
PF3: ePWM: Enhanced Pulse Width Modulator Module and Registers
HRPWM: High-Resolution Pulse-Width Modulator Registers
Comparators: Comparator Modules
SPI: The SPI is a high-speed, synchronous serial I/O port that allows a serial bit stream
of programmed length (1 to 16 bits) to be shifted into and out of the device at a
programmable bit-transfer rate. Normally, the SPI is used for communications between
the MCU and external peripherals or another processor. Typical applications include
external I/O or peripheral expansion through devices such as shift registers, display
drivers, and ADCs. Multidevice communications are supported by the master/slave
operation of the SPI. The SPI contains a 4-level receive and transmit FIFO for reducing
interrupt servicing overhead.
SCI: The serial communications interface is a two-wire asynchronous serial port, commonly
known as UART. The SCI contains a 4-level receive and transmit FIFO for reducing
interrupt servicing overhead.
I2C: The inter-integrated circuit (I2C) module provides an interface between an MCU
and other devices compliant with Philips Semiconductors Inter-IC bus ( I2C-bus®)
specification version 2.1 and connected by way of an I2C-bus. External components
attached to this 2-wire serial bus can transmit/receive up to 8-bit data to/from the MCU
through the I2C module. The I2C contains a 4-level receive and transmit FIFO for
reducing interrupt servicing overhead.
eCAN: This is the enhanced version of the CAN peripheral. It supports 32 mailboxes, time
stamping of messages, and is compliant with ISO11898-1 (CAN 2.0B).
LIN: LIN 1.3 or 2.0 compatible peripheral. Can also be configured as additional SCI port
Calibration Data
0x3D 7EB0
Reserved
0x3E 8000
FLASH
(64K ´ 16, 8 Sectors, Secure Zone + ECSL)
0x3F 7FF8 128-Bit Password
0x3F 8000
L0 SARAM (2K ´ 16)
(0-Wait, Secure Zone + ECSL, Dual-Mapped)
0x3F 8800 Reserved
0x3F E000 Boot ROM (8K ´ 16, 0-Wait)
0x3F FFC0
Vector (32 Vectors, Enabled if VMAP = 1)
Calibration Data
0x3D 7EB0
Reserved
0x3F 0000
FLASH
(32K ´ 16, 8 Sectors, Secure Zone + ECSL)
0x3F 7FF8 128-Bit Password
0x3F 8000
L0 SARAM (2K ´ 16)
(0-Wait, Secure Zone + ECSL, Dual-Mapped)
0x3F 8800 Reserved
0x3F E000 Boot ROM (8K ´ 16, 0-Wait)
0x3F FFC0 Vector (32 Vectors, Enabled if VMAP = 1)
Calibration Data
0x3D 7EB0
Reserved
0x3F 0000
FLASH
(32K ´ 16, 8 Sectors, Secure Zone + ECSL)
0x3F 7FF8 128-Bit Password
0x3F 8000
L0 SARAM (2K ´ 16)
(0-Wait, Secure Zone + ECSL, Dual-Mapped)
0x3F 8800 Reserved
0x3F E000 Boot ROM (8K ´ 16, 0-Wait)
0x3F FFC0
Vector (32 Vectors, Enabled if VMAP = 1)
Calibration Data
0x3D 7EB0
Reserved
0x3F 4000
FLASH
(16K ´ 16, 4 Sectors, Secure Zone + ECSL)
0x3F 7FF8 128-Bit Password
0x3F 8000
L0 SARAM (2K ´ 16)
(0-Wait, Secure Zone + ECSL, Dual-Mapped)
0x3F 8800 Reserved
0x3F E000 Boot ROM (8K ´ 16, 0-Wait)
0x3F FFC0
Vector (32 Vectors, Enabled if VMAP = 1)
Note
• When the code-security passwords are programmed, all addresses from 0x3F 7F80 to 0x3F 7FF5
cannot be used as program code or data. These locations must be programmed to 0x0000.
• If the code security feature is not used, addresses 0x3F 7F80 to 0x3F 7FEF may be used for code
or data. Addresses 0x3F 7FF0 to 0x3F 7FF5 are reserved for data and should not contain program
code.
Table 7-6 shows how to handle these memory locations.
Peripheral Frame 1, Peripheral Frame 2, and Peripheral Frame 3 are grouped together to enable these blocks
to be write/read peripheral block protected. The protected mode makes sure that all accesses to these blocks
happen as written. Because of the pipeline, a write immediately followed by a read to different memory locations,
will appear in reverse order on the memory bus of the CPU. This can cause problems in certain peripheral
applications where the user expected the write to occur first (as written). The CPU supports a block protection
mode where a region of memory can be protected so that operations occur as written (the penalty is extra cycles
are added to align the operations). This mode is programmable and by default, it protects the selected zones.
The wait states for the various spaces in the memory map area are listed in Table 7-7.
Table 7-7. Wait States
AREA WAIT STATES (CPU) COMMENTS
M0 and M1 SARAMs 0-wait Fixed
Peripheral Frame 0 0-wait
Peripheral Frame 1 0-wait (writes) Cycles can be extended by peripheral generated ready.
2-wait (reads) Back-to-back write operations to Peripheral Frame 1 registers will incur
a 1-cycle stall (1-cycle delay).
Peripheral Frame 2 0-wait (writes) Fixed. Cycles cannot be extended by the peripheral.
2-wait (reads)
Peripheral Frame 3 0-wait (writes) Assumes no conflict between CPU and CLA.
2-wait (reads) Cycles can be extended by peripheral-generated ready.
L0 SARAM 0-wait data and program Assumes no CPU conflicts
L1 SARAM 0-wait data and program Assumes no CPU conflicts
L2 SARAM 0-wait data and program Assumes no CPU conflicts
L3 SARAM 0-wait data and program Assumes no CPU conflicts
OTP Programmable Programmed through the Flash registers.
1-wait minimum 1-wait is minimum number of wait states allowed.
FLASH Programmable Programmed through the Flash registers.
0-wait Paged min
1-wait Random min
Random ≥ Paged
FLASH Password 16-wait fixed Wait states of password locations are fixed.
Boot-ROM 0-wait
(1) Some registers are EALLOW protected. For more information, see the TMS320F2803x Real-Time Microcontrollers Technical
Reference Manual.
(1) Some registers are EALLOW protected. For more information, see the TMS320F2803x Real-Time Microcontrollers Technical
Reference Manual.
(1) Some registers are EALLOW protected. For more information, see the TMS320F2803x Real-Time Microcontrollers Technical
Reference Manual.
(1) For TMS320F2803x devices, the PARTID register location differs from the TMS320F2802x devices' location of 0x3D7FFF.
7.5 VREG/BOR/POR
Although the core and I/O circuitry operate on two different voltages, these devices have an on-chip voltage
regulator (VREG) to generate the VDD voltage from the VDDIO supply. This eliminates the cost and space of a
second external regulator on an application board. Additionally, internal power-on reset (POR) and brown-out
reset (BOR) circuits monitor both the VDD and VDDIO rails during power-up and run mode.
7.5.1 On-chip Voltage Regulator (VREG)
A linear regulator generates the core voltage (VDD) from the VDDIO supply. Therefore, although capacitors are
required on each V DD pin to stabilize the generated voltage, power need not be supplied to these pins to operate
the device. Conversely, the VREG can be disabled, should power or redundancy be the primary concern of the
application.
7.5.1.1 Using the On-chip VREG
To use the on-chip VREG, the VREGENZ pin should be tied low and the appropriate recommended operating
voltage should be supplied to the VDDIO and VDDA pins. In this case, the VDD voltage needed by the core logic
will be generated by the VREG. Each VDD pin requires on the order of 1.2 μF (minimum) capacitance for proper
regulation of the VREG. These capacitors should be located as close as possible to the VDD pins. Driving an
external load with the internal VREG is not supported.
7.5.1.2 Disabling the On-chip VREG
To conserve power, it is also possible to disable the on-chip VREG and supply the core logic voltage to the VDD
pins with a more efficient external regulator. To enable this option, the VREGENZ pin must be tied high.
7.5.2 On-chip Power-On Reset (POR) and Brown-Out Reset (BOR) Circuit
Two on-chip supervisory circuits, the power-on reset (POR) and the brown-out reset (BOR) remove the burden
of monitoring the VDD and VDDIO supply rails from the application board. The purpose of the POR is to create
a clean reset throughout the device during the entire power-up procedure. The trip point is a looser, lower trip
point than the BOR, which watches for dips in the VDD or VDDIO rail during device operation. The POR function
is present on both VDD and VDDIO rails at all times. After initial device power-up, the BOR function is present on
VDDIO at all times, and on VDD when the internal VREG is enabled ( VREGENZ pin is tied low). Both functions
tie the XRS pin low when one of the voltages is below their respective trip point. VDD BOR and overvoltage
trip points are outside of the recommended operating voltages. Proper device operation cannot be ensured. If
overvoltage or undervoltage conditions affecting the system is a concern for an application, an external voltage
supervisor should be added. Figure 7-5 shows the VREG, POR, and BOR. To disable both the VDD and VDDIO
BOR functions, a bit is provided in the BORCFG register. For details, see the System Control chapter in the
TMS320F2803x Real-Time Microcontrollers Technical Reference Manual.
In
I/O Pin
Out
Internal SYSRS
Weak PU
Deglitch SYSCLKOUT
Filter
WDRST Sync RS
C28
Core
MCLKRS
JTAG
TCK
PLL Detect
XRS
+ Logic
Pin
Clocking
Logic
VREGHALT
(A)
WDRST
PBRS
(B) POR/BOR On-Chip
Generating Voltage
Module VREGENZ
Regulator
(VREG)
Figure 7-6 shows the various clock domains that are discussed. Figure 7-7 shows the various clock sources
(both internal and external) that can provide a clock for device operation.
Peripheral
I/O SPI-A, SPI-B, SCI-A
Registers PF2
Clock Enables /2
Peripheral
I/O eCAN-A, LIN-A
Registers PF1
Clock Enables
GPIO Peripheral
I/O eCAP1, eQEP1, HRCAP1/2
Mux Registers PF1
Clock Enables
Peripheral
I/O ePWM1/.../7, HRPWM1/.../7
Registers PF3
Clock Enables
Peripheral
I/O I2C-A
Registers PF2
Clock Enables
ADC PF2
16 Ch 12-Bit ADC Registers
Analog PF0
GPIO
Mux Clock Enables
COMP
6 COMP1/2/3 Registers PF3
A. CLKIN is the clock into the CPU. It is passed out of the CPU as SYSCLKOUT (that is, CLKIN is the same frequency as SYSCLKOUT).
XCLKIN/GPIO19/38 X1 X2
Turn off Rd
XCLKIN path
in CLKCTL
register
CL1 Crystal CL2
Note
1. CL1 and CL2 are the total capacitance of the circuit board and components excluding the IC and
crystal. The value is usually approximately twice the value of the crystal's load capacitance.
2. The load capacitance of the crystal is described in the crystal specifications of the manufacturers.
3. TI recommends that customers have the resonator/crystal vendor characterize the operation of
their device with the MCU chip. The resonator/crystal vendor has the equipment and expertise
to tune the tank circuit. The vendor can also advise the customer regarding the proper tank
component values that will produce proper start-up and stability over the entire operating range.
XCLKIN/GPIO19/38 X1 X2
(1) By default, PLLSTS[DIVSEL] is configured for /4. (The boot ROM changes this to /1.) PLLSTS[DIVSEL] must be 0 before writing to the
PLLCR and should be changed only after PLLSTS[PLLLOCKS] = 1.
(2) The PLL control register (PLLCR) and PLL Status Register (PLLSTS) are reset to their default state by the XRS signal or a watchdog
reset only. A reset issued by the debugger or the missing clock detect logic has no effect.
(3) This register is EALLOW protected. See the System Control chapter in the TMS320F2803x Real-Time Microcontrollers Technical
Reference Manual for more information.
NMIFLG[NMINT]
NMIFLGCLR[NMINT] Clear
Latch
Set Clear
XRS
Generate NMIFLG[CLOCKFAIL]
Interrupt 1 0
Clear NMIFLGCLR[CLOCKFAIL]
NMINT Pulse
When 0 Latch CLOCKFAIL
SYNC?
Input = 1
Clear Set SYSCLKOUT
NMICFG[CLOCKFAIL]
NMIFLGFRC[CLOCKFAIL]
XRS
SYSCLKOUT
SYSRS
NMIWDPRD[15:0]
NMI Watchdog NMIRS See System
NMIWDCNT[15:0] Control Section
Note
The CPU watchdog is different from the NMI watchdog. It is the legacy watchdog that is present in all
28x devices.
Note
Applications in which the correct CPU operating frequency is absolutely critical should implement a
mechanism by which the MCU will be held in reset, should the input clocks ever fail. For example,
an R-C circuit may be used to trigger the XRS pin of the MCU, should the capacitor ever get fully
charged. An I/O pin may be used to discharge the capacitor on a periodic basis to prevent it from
getting fully charged. Such a circuit would also help in detecting failure of the flash memory.
The WDINT signal enables the watchdog to be used as a wakeup from IDLE/STANDBY mode.
In STANDBY mode, all peripherals are turned off on the device. The only peripheral that remains functional is
the CPU watchdog. This module will run off OSCCLK. The WDINT signal is fed to the LPM block so that it can
wake the device from STANDBY (if enabled). See Section 7.7, Low-power Modes Block, for more details.
In IDLE mode, the WDINT signal can generate an interrupt to the CPU, through the PIE, to take the CPU out of
IDLE mode.
In HALT mode, the CPU watchdog can be used to wake up the device through a device reset.
(1) The EXIT column lists which signals or under what conditions the low-power mode is exited. A low signal, on any of the signals, exits
the low-power condition. This signal must be kept low long enough for an interrupt to be recognized by the device. Otherwise, the
low-power mode will not be exited and the device will go back into the indicated low-power mode.
(2) The JTAG port can still function even if the CPU clock (CLKIN) is turned off.
(3) The WDCLK must be active for the device to go into HALT mode.
Note
The low-power modes do not affect the state of the output pins (PWM pins included). They will be
in whatever state the code left them in when the IDLE instruction was executed. See the System
Control chapter in the TMS320F2803x Real-Time Microcontrollers Technical Reference Manual for
more details.
7.8 Interrupts
Figure 7-12 shows how the various interrupt sources are multiplexed.
Peripherals
2
(SPI, SCI, ePWM, I C, HRPWM, HRCAP,
eCAP, ADC, eQEP, CLA, LIN, eCAN)
WDINT
WAKEINT Watchdog
Sync LPMINT
Low Power Modes
SYSCLKOUT
XINT1
MUX
XINT1
Interrupt Control
XINT1CR(15:0)
Up to 96 Interrupts XINT1CTR(15:0)
GPIOXINT1SEL(4:0)
INT1 XINT2SOC
PIE
to ADC
INT12 XINT2
MUX
Interrupt Control XINT2
XINT2CR(15:0)
C28
Core XINT2CTR(15:0)
GPIOXINT2SEL(4:0)
GPIO0.int
XINT3
MUX
XINT3 GPIO
Interrupt Control
MUX
XINT3CR(15:0)
GPIO31.int
XINT3CTR(15:0)
GPIOXINT3SEL(4:0)
TINT0
CPU TIMER 0
INT13 TINT1
CPU TIMER 1
INT14 TINT2
CPU TIMER 2
CPUTMR2CLK
Eight PIE block interrupts are grouped into one CPU interrupt. In total, 12 CPU interrupt groups, with 8 interrupts
per group equals 96 possible interrupts. Table 7-19 shows the interrupts used by 2803x devices.
The TRAP #VectorNumber instruction transfers program control to the interrupt service routine corresponding
to the vector specified. The TRAP #0 instruction attempts to transfer program control to the address pointed to
by the reset vector. The PIE vector table does not, however, include a reset vector. Therefore, the TRAP #0
instruction should not be used when the PIE is enabled. Doing so will result in undefined behavior.
When the PIE is enabled, the TRAP #1 to TRAP #12 instructions will transfer program control to the interrupt
service routine corresponding to the first vector within the PIE group. For example: the TRAP #1 instruction
fetches the vector from INT1.1, the TRAP #2 instruction fetches the vector from INT2.1, and so forth.
IFR[12:1] IER[12:1] INTM
INT1
INT2
1
MUX CPU
0
INT11
INT12 Global
(Flag) (Enable) Enable
INTx.1
INTx.2
INTx.3 From
INTx INTx.4 Peripherals
MUX INTx.5 or
External
INTx.6
Interrupts
INTx.7
PIEACKx INTx.8
(Enable) (Flag)
(Enable/Flag)
PIEIERx[8:1] PIEIFRx[8:1]
In Table 7-19, out of 96 possible interrupts, some interrupts are not used. These interrupts are reserved for
future devices. These interrupts can be used as software interrupts if they are enabled at the PIEIFRx level,
provided none of the interrupts within the group is being used by a peripheral. Otherwise, interrupts coming in
from peripherals may be lost by accidentally clearing their flag while modifying the PIEIFR. To summarize, there
are two safe cases when the reserved interrupts could be used as software interrupts:
1. No peripheral within the group is asserting interrupts.
2. No peripheral interrupts are assigned to the group (for example, PIE group 7).
Table 7-19. PIE MUXed Peripheral Interrupt Vector Table
INTx.8 INTx.7 INTx.6 INTx.5 INTx.4 INTx.3 INTx.2 INTx.1
INT1.y WAKEINT TINT0 ADCINT9 XINT2 XINT1 Reserved ADCINT2 ADCINT1
(LPM/WD) (TIMER 0) (ADC) Ext. int. 2 Ext. int. 1 – (ADC) (ADC)
0xD4E 0xD4C 0xD4A 0xD48 0xD46 0xD44 0xD42 0xD40
INT2.y Reserved EPWM7_TZINT EPWM6_TZINT EPWM5_TZINT EPWM4_TZINT EPWM3_TZINT EPWM2_TZINT EPWM1_TZINT
– (ePWM7) (ePWM6) (ePWM5) (ePWM4) (ePWM3) (ePWM2) (ePWM1)
0xD5E 0xD5C 0xD5A 0xD58 0xD56 0xD54 0xD52 0xD50
INT3.y Reserved EPWM7_INT EPWM6_INT EPWM5_INT EPWM4_INT EPWM3_INT EPWM2_INT EPWM1_INT
– (ePWM7) (ePWM6) (ePWM5) (ePWM4) (ePWM3) (ePWM2) (ePWM1)
0xD6E 0xD6C 0xD6A 0xD68 0xD66 0xD64 0xD62 0xD60
INT4.y HRCAP2_INT HRCAP1_INT Reserved Reserved Reserved Reserved Reserved ECAP1_INT
(HRCAP2) (HRCAP1) – – – – – (eCAP1)
0xD7E 0xD7C 0xD7A 0xD78 0xD76 0xD74 0xD72 0xD70
INT5.y Reserved Reserved Reserved Reserved Reserved Reserved Reserved EQEP1_INT
– – – – – – – (eQEP1)
0xD8E 0xD8C 0xD8A 0xD88 0xD86 0xD84 0xD82 0xD80
INT6.y Reserved Reserved Reserved Reserved SPITXINTB SPIRXINTB SPITXINTA SPIRXINTA
– – – – (SPI-B) (SPI-B) (SPI-A) (SPI-A)
0xD9E 0xD9C 0xD9A 0xD98 0xD96 0xD94 0xD92 0xD90
INT7.y Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved
– – – – – – – –
0xDAE 0xDAC 0xDAA 0xDA8 0xDA6 0xDA4 0xDA2 0xDA0
INT8.y Reserved Reserved Reserved Reserved Reserved Reserved I2CINT2A I2CINT1A
– – – – – – (I2C-A) (I2C-A)
0xDBE 0xDBC 0xDBA 0xDB8 0xDB6 0xDB4 0xDB2 0xDB0
INT9.y Reserved Reserved ECAN1_INTA ECAN0_INTA LIN1_INTA LIN0_INTA SCITXINTA SCIRXINTA
– – (CAN-A) (CAN-A) (LIN-A) (LIN-A) (SCI-A) (SCI-A)
0xDCE 0xDCC 0xDCA 0xDC8 0xDC6 0xDC4 0xDC2 0xDC0
INT10.y ADCINT8 ADCINT7 ADCINT6 ADCINT5 ADCINT4 ADCINT3 ADCINT2 ADCINT1
(ADC) (ADC) (ADC) (ADC) (ADC) (ADC) (ADC) (ADC)
0xDDE 0xDDC 0xDDA 0xDD8 0xDD6 0xDD4 0xDD2 0xDD0
INT11.y CLA1_INT8 CLA1_INT7 CLA1_INT6 CLA1_INT5 CLA1_INT4 CLA1_INT3 CLA1_INT2 CLA1_INT1
(CLA) (CLA) (CLA) (CLA) (CLA) (CLA) (CLA) (CLA)
0xDEE 0xDEC 0xDEA 0xDE8 0xDE6 0xDE4 0xDE2 0xDE0
INT12.y LUF LVF Reserved Reserved Reserved Reserved Reserved XINT3
(CLA) (CLA) – – – – – Ext. Int. 3
0xDFE 0xDFC 0xDFA 0xDF8 0xDF6 0xDF4 0xDF2 0xDF0
(1) The PIE configuration and control registers are not protected by EALLOW mode. The PIE vector
table is protected.
Each external interrupt can be enabled/disabled or qualified using positive, negative, or both positive and
negative edge. For more information, see the System Control chapter in the TMS320F2803x Real-Time
Microcontrollers Technical Reference Manual.
7.8.1.1 External Interrupt Electrical Data/Timing
7.8.1.1.1 External Interrupt Timing Requirements
(1) For an explanation of the input qualifier parameters, see Section 7.9.15.1.2.1.
(2) This timing is applicable to any GPIO pin configured for ADCSOC functionality.
(1) For an explanation of the input qualifier parameters, see Section 7.9.15.1.2.1.
tw(INT)
td(INT)
Address bus
Interrupt Vector
(internal)
7.9 Peripherals
7.9.1 Control Law Accelerator (CLA) Overview
The control law accelerator extends the capabilities of the C28x CPU by adding parallel processing. Time-critical
control loops serviced by the CLA can achieve low ADC sample to output delay. Thus, the CLA enables faster
system response and higher frequency control loops. Utilizing the CLA for time-critical tasks frees up the main
CPU to perform other system and communication functions concurrently. The following is a list of major features
of the CLA.
• Clocked at the same rate as the main CPU (SYSCLKOUT).
• An independent architecture allowing CLA algorithm execution independent of the main C28x CPU.
– Complete bus architecture:
• Program address bus and program data bus
• Data address bus, data read bus, and data write bus
– Independent eight-stage pipeline.
– 12-bit program counter (MPC)
– Four 32-bit result registers (MR0–MR3)
– Two 16-bit auxiliary registers (MAR0, MAR1)
– Status register (MSTF)
• Instruction set includes:
– IEEE single-precision (32-bit) floating-point math operations
– Floating-point math with parallel load or store
– Floating-point multiply with parallel add or subtract
– 1/X and 1/sqrt(X) estimations
– Data type conversions.
– Conditional branch and call
– Data load/store operations
• The CLA program code can consist of up to eight tasks or interrupt service routines.
– The start address of each task is specified by the MVECT registers.
– No limit on task size as long as the tasks fit within the CLA program memory space.
– One task is serviced at a time through to completion. There is no nesting of tasks.
– Upon task completion, a task-specific interrupt is flagged within the PIE.
– When a task finishes, the next highest-priority pending task is automatically started.
• Task trigger mechanisms:
– C28x CPU through the IACK instruction
– Task1 to Task7: the corresponding ADC or ePWM module interrupt. For example:
• Task1: ADCINT1 or EPWM1_INT
• Task2: ADCINT2 or EPWM2_INT
• Task7: ADCINT7 or EPWM7_INT
– Task8: ADCINT8 or by CPU Timer 0.
• Memory and Shared Peripherals:
– Two dedicated message RAMs for communication between the CLA and the main CPU.
– The C28x CPU can map CLA program and data memory to the main CPU space or CLA space.
– The CLA has direct access to the ADC Result registers, comparator registers, and the ePWM+HRPWM
registers.
For more information on the CLA, see the Control Law Accelerator (CLA) chapter in the TMS320F2803x
Real-Time Microcontrollers Technical Reference Manual.
IACK
Peripheral Interrupts
CLA Control
ADCINT1 to Registers
ADCINT8
MCTL
SYSCLKOUT CLA
CLAENCLK Shared
SYSRS Message
RAMs
A6 A6
A7 A7 A3 ADC
B3
B0 B0
B1 B1 A4 COMP2OUT
AIO4 10-Bit Comp2
B2 B2 AIO12 DAC
B3 B3 B4
B4 B4
B5 B5
B6 B6 Temperature Sensor
B7 B7 A5
A7
B7
– External Reference (VREFHI/VREFLO connected to external references. VREFHI must not exceed VDDA when
using either internal or external reference modes.)
Digital Value = 0, when input £ 0 V
0-Wait
Result PF0 (CPU)
Registers
PF2 (CPU)
SYSCLKOUT
ADCENCLK
ADCINT 1
PIE
ADCINT 9
TINT 0
ADCTRIG 1 CPUTIMER 0
TINT 1
ADCTRIG 2 CPUTIMER 1
ADC TINT 2
AIO ADC ADCTRIG 3 CPUTIMER 2
Core
MUX Channels XINT 2SOC
12-Bit ADCTRIG 4 XINT 2
SOCA 1
ADCTRIG 5
SOCB 1 EPWM 1
ADCTRIG 6
SOCA 2
ADCTRIG 7
SOCB 2 EPWM 2
ADCTRIG 8
SOCA 3
ADCTRIG 9
SOCB 3 EPWM 3
ADCTRIG 10
SOCA 4
ADCTRIG 11
SOCB 4 EPWM 4
ADCTRIG 12
SOCA 5
ADCTRIG 13
SOCB 5 EPWM 5
ADCTRIG 14
SOCA 6
ADCTRIG 15
SOCB 6 EPWM 6
ADCTRIG 16
SOCA 7
ADCTRIG 17
SOCB 7 EPWM 7
ADCTRIG 18
Note
Unused ADCIN pins that are multiplexed with AIO function should not be directly connected to analog
ground. They should be grounded through a 1-kΩ resistor. This is to prevent an errant code from
configuring these pins as AIO outputs and driving grounded pins to a logic-high state.
When the ADC is not used, be sure that the clock to the ADC module is not turned on to realize power savings.
tw(ADCSOCL)
ADCSOCAO
or
ADCSOCBO
ACCURACY
INL (Integral nonlinearity) at ADC Clock ≤ 30 MHz(1) –4 4 LSB
DNL (Differential nonlinearity) at ADC Clock ≤ 30 MHz,
–1 1 LSB
no missing codes
Offset error (2) Executing a single self-
–20 0 20
recalibration(3)
LSB
Executing periodic self-
–4 0 4
recalibration(4)
Overall gain error with internal reference –60 60 LSB
Overall gain error with external reference –40 40 LSB
Channel-to-channel offset variation –4 4 LSB
Channel-to-channel gain variation –4 4 LSB
ADC temperature coefficient with internal reference –50 ppm/°C
ADC temperature coefficient with external reference –20 ppm/°C
VREFLO –100 µA
VREFHI 100 µA
ANALOG INPUT
Analog input voltage with internal reference 0 3.3 V
Analog input voltage with external reference VREFLO VREFHI V
VREFLO input voltage(5) VSSA 0.66 V
VREFHI input voltage(6) 2.64 VDDA
V
with VREFLO = VSSA 1.98 VDDA
Input capacitance 5 pF
Input leakage current ±2 μA
(1) INL will degrade when the ADC input voltage goes above VDDA.
(2) 1 LSB has the weighted value of full-scale range (FSR)/4096. FSR is 3.3 V with internal reference and VREFHI - VREFLO for external
reference.
(3) For more details, see the TMS320F2803x Real-Time MCUs Silicon Errata.
(4) Periodic self-recalibration will remove system-level and temperature dependencies on the ADC zero offset error. This can be
performed as needed in the application without sacrificing an ADC channel by using the procedure listed in the "ADC Zero Offset
Calibration" section of the Analog-to-Digital Converter and Comparator chapter in the TMS320F2803x Real-Time Microcontrollers
Technical Reference Manual.
(5) VREFLO is always connected to VSSA on the 64-pin PAG device.
(6) VREFHI must not exceed VDDA when using either internal or external reference modes. Because VREFHI is tied to ADCINA0 on the
64-pin PAG device, the input signal on ADCINA0 must not exceed VDDA.
(1) The temperature sensor slope and offset are given in terms of ADC LSBs using the internal reference of the ADC. Values must be
adjusted accordingly in external reference mode to the external reference voltage.
(2) Output of the temperature sensor (in terms of LSBs) is sign-consistent with the direction of the temperature movement. Increasing
temperatures will give increasing ADC values relative to an initial value; decreasing temperatures will give decreasing ADC values
relative to an initial value.
(3) ADC temperature coefficient is accounted for in this specification
(1) Timings maintain compatibility to the ADC module. The 2803x ADC supports driving all 3 bits at the same time td(PWD) ms before first
conversion.
ADCPWDN/
ADCBGPWD/
ADCREFPWD/
ADCENABLE td(PWD)
Request for ADC
Conversion
Ron Switch
Rs ADCIN 3.4 kW
Source Cp Ch
ac
Signal 5 pF 1.6 pF
28x DSP
Analog Input
SOC0 Sample SOC1 Sample SOC2 Sample
Window Window Window
0 2 9 15 22 24 37
ADCCLK
ADCCTL 1.INTPULSEPOS
ADCSOCFLG 1.SOC0
ADCSOCFLG 1.SOC1
ADCSOCFLG 1.SOC2
ADCRESULT 1
EOC0 Pulse
EOC1 Pulse
ADCINTFLG .ADCINTx
Minimum Conversion 0
1 ADCCLK
7 ADCCLKs 13 ADC Clocks
6 Minimum Conversion 1
ADCCLKs 7 ADCCLKs 13 ADC Clocks
Figure 7-21. Timing Example for Sequential Mode / Late Interrupt Pulse
Analog Input
SOC0 Sample SOC1 Sample SOC2 Sample
Window Window Window
0 2 9 15 22 24 37
ADCCLK
ADCCTL1.INTPULSEPOS
ADCSOCFLG 1.SOC0
ADCSOCFLG 1.SOC1
ADCSOCFLG 1.SOC2
ADCRESULT 1
EOC0 Pulse
EOC1 Pulse
EOC2 Pulse
ADCINTFLG .ADCINTx
Minimum Conversion 0
2 ADCCLKs
7 ADCCLKs 13 ADC Clocks
6 Minimum Conversion 1
ADCCLKs 7 ADCCLKs 13 ADC Clocks
Figure 7-22. Timing Example for Sequential Mode / Early Interrupt Pulse
Analog Input A
SOC0 Sample SOC2 Sample
A Window A Window
Analog Input B
SOC0 Sample SOC2 Sample
B Window B Window
0 2 9 22 24 37 50
ADCCLK
ADCCTL1.INTPULSEPOS
ADCSOCFLG 1.SOC0
ADCSOCFLG 1.SOC1
ADCSOCFLG 1.SOC2
ADCRESULT 2
EOC0 Pulse
EOC2 Pulse
ADCINTFLG .ADCINTx
Figure 7-23. Timing Example for Simultaneous Mode / Late Interrupt Pulse
Analog Input A
SOC0 Sample SOC2 Sample
A Window A Window
Analog Input B
SOC0 Sample SOC2 Sample
B Window B Window
0 2 9 22 24 37 50
ADCCLK
ADCCTL1.INTPULSEPOS
ADCSOCFLG1.SOC0
ADCSOCFLG1.SOC1
ADCSOCFLG1.SOC2
ADCRESULT 2
EOC0 Pulse
EOC1 Pulse
EOC2 Pulse
ADCINTFLG.ADCINTx
Figure 7-24. Timing Example for Simultaneous Mode / Early Interrupt Pulse
To COMPy A or B input
To ADC Channel X
AIODAT Reg
(Latch)
AIOMUX 1 Reg
AIOSET,
0 = Output)
AIOCLEAR,
(1 = Input,
AIOxDIR
AIOTOGGLE
Regs
AIODIR Reg
1 (Latch)
(0 = Input, 1 = Output)
0 0
The ADC channel and Comparator functions are always available. The digital I/O function is available only when
the respective bit in the AIOMUX1 register is 0. In this mode, reading the AIODAT register reflects the actual pin
state.
The digital I/O function is disabled when the respective bit in the AIOMUX1 register is 1. In this mode, reading
the AIODAT register reflects the output latch of the AIODAT register and the input digital I/O buffer is disabled to
prevent analog signals from generating noise.
On reset, the digital function is disabled. If the pin is used as an analog input, users should keep the AIO function
disabled for that pin.
COMP x A
+
COMP x B COMP
- GPIO TZ1/2/3
MUX
COMP x
+
DAC x ePWM
AIO Wrapper
MUX
COMPxOUT
DAC
Core
10-Bit
(1) Hysteresis on the comparator inputs is achieved with a Schmidt trigger configuration. This results in an effective 100-kΩ feedback
resistance between the output of the comparator and the noninverting input of the comparator. There is an option to disable the
hysteresis and, with it, the feedback resistance; see the Analog-to-Digital Converter and Comparator chapter in the TMS320F2803x
Real-Time Microcontrollers Technical Reference Manual for more information on this option if needed in your system.
1100
1000
900
800
700
Settling Time (ns)
600
500
400
300
200
100
0
0 50 100 150 200 250 300 350 400 450 500
DAC Step Size (Codes)
Note
All four pins can be used as GPIO if the SPI module is not used.
LSPCLK
Baud rate = when SPIBRR = 0, 1, 2
4
• Data word length: 1 to 16 data bits
• Four clocking schemes (controlled by clock polarity and clock phase bits) include:
– Falling edge without phase delay: SPICLK active-high. SPI transmits data on the falling edge of the
SPICLK signal and receives data on the rising edge of the SPICLK signal.
– Falling edge with phase delay: SPICLK active-high. SPI transmits data one half-cycle ahead of the falling
edge of the SPICLK signal and receives data on the falling edge of the SPICLK signal.
– Rising edge without phase delay: SPICLK inactive-low. SPI transmits data on the rising edge of the
SPICLK signal and receives data on the falling edge of the SPICLK signal.
– Rising edge with phase delay: SPICLK inactive-low. SPI transmits data one half-cycle ahead of the rising
edge of the SPICLK signal and receives data on the rising edge of the SPICLK signal.
• Simultaneous receive and transmit operation (transmit function can be disabled in software)
• Transmitter and receiver operations are accomplished through either interrupt-driven or polled algorithms.
• Nine SPI module control registers: In control register frame beginning at address 7040h.
Note
All registers in this module are 16-bit registers that are connected to Peripheral Frame 2. When a
register is accessed, the register data is in the lower byte (7–0), and the upper byte (15–8) is read
as zeros. Writing to the upper byte has no effect.
Enhanced feature:
• 4-level transmit/receive FIFO
• Delayed transmit control
• Bidirectional 3 wire SPI mode support
• Audio data receive support through SPISTE inversion
The SPI port operation is configured and controlled by the registers listed in Table 7-27 and Table 7-28.
Table 7-27. SPI-A Registers
NAME ADDRESS SIZE (x16) EALLOW PROTECTED DESCRIPTION(1)
SPICCR 0x7040 1 No SPI-A Configuration Control Register
SPICTL 0x7041 1 No SPI-A Operation Control Register
SPISTS 0x7042 1 No SPI-A Status Register
SPIBRR 0x7044 1 No SPI-A Baud Rate Register
SPIRXEMU 0x7046 1 No SPI-A Receive Emulation Buffer Register
SPIRXBUF 0x7047 1 No SPI-A Serial Input Buffer Register
SPITXBUF 0x7048 1 No SPI-A Serial Output Buffer Register
SPIDAT 0x7049 1 No SPI-A Serial Data Register
SPIFFTX 0x704A 1 No SPI-A FIFO Transmit Register
SPIFFRX 0x704B 1 No SPI-A FIFO Receive Register
SPIFFCT 0x704C 1 No SPI-A FIFO Control Register
SPIPRI 0x704F 1 No SPI-A Priority Control Register
(1) Registers in this table are mapped to Peripheral Frame 2. This space only allows 16-bit accesses. 32-bit accesses produce undefined
results.
(1) Registers in this table are mapped to Peripheral Frame 2. This space only allows 16-bit accesses. 32-bit accesses produce undefined
results.
For more information on the SPI, see the Serial Peripheral Interface (SPI) chapter in the TMS320F2803x
Real-Time Microcontrollers Technical Reference Manual.
SPIFFENA
Receiver Overrun
SPIFFTX.14 Overrun Flag INT ENA
SPIRXBUF SPIFFOVF
Buffer Register FLAG
SPIFFRX.15 To CPU
TX FIFO Registers
SPITXBUF
TX FIFO _3 TX Interrupt
----- TX FIFO Interrupt Logic
TX FIFO _1
SPITX
TX FIFO _0
SPI INT
16 16 ENA
SPI INT FLAG
SPITXBUF SPISTS.6
Buffer Register
SPICTL.0
TRIWIRE
16 SPIPRI.0
M M
SPIDAT S TW
Data Register S SW1 SPISIMO
M TW
SPIDAT.15 - 0 M
TW
SPISOMI
S
STEINV
S SW2
Talk SPIPRI.1
SPICTL.1 STEINV
SPISTE
State Control
Master/Slave
(1) The MASTER / SLAVE bit (SPICTL.2) is set and the CLOCK PHASE bit (SPICTL.3) is cleared.
(2) tc(SPC) = SPI clock cycle time = LSPCLK/4 or LSPCLK/(SPIBRR +1)
(3) tc(LCO) = LSPCLK cycle time
(4) Internal clock prescalers must be adjusted such that the SPI clock speed is limited to the following SPI clock rate:
Master mode transmit 25-MHz MAX, master mode receive 12.5-MHz MAX
Slave mode transmit 12.5-MAX, slave mode receive 12.5-MHz MAX.
(5) The active edge of the SPICLK signal referenced is controlled by the clock polarity bit (SPICCR.6).
SPICLK
(clock polarity = 0)
SPICLK
(clock polarity = 1)
4
5
Master In Data
SPISOMI
Must Be Valid
23 24
SPISTE
(1) The MASTER/SLAVE bit (SPICTL.2) is set and the CLOCK PHASE bit (SPICTL.3) is set.
(2) tc(SPC) = SPI clock cycle time = LSPCLK/4 or LSPCLK/(SPIBRR + 1)
(3) Internal clock prescalers must be adjusted such that the SPI clock speed is limited to the following SPI clock rate:
Master mode transmit 25 MHz MAX, master mode receive 12.5 MHz MAX
Slave mode transmit 12.5 MHz MAX, slave mode receive 12.5 MHz MAX.
(4) tc(LCO) = LSPCLK cycle time
(5) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPICCR.6).
1
SPICLK
(clock polarity = 0)
2
SPICLK
(clock polarity = 1)
6
7
10
11
(1) The MASTER / SLAVE bit (SPICTL.2) is cleared and the CLOCK PHASE bit (SPICTL.3) is cleared.
(2) tc(SPC) = SPI clock cycle time = LSPCLK/4 or LSPCLK/(SPIBRR + 1)
(3) tc(LCO) = LSPCLK cycle time
(4) Internal clock prescalers must be adjusted such that the SPI clock speed is limited to the following SPI clock rate:
Master mode transmit 25-MHz MAX, master mode receive 12.5-MHz MAX
Slave mode transmit 12.5-MHz MAX, slave mode receive 12.5-MHz MAX.
(5) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPICCR.6).
12
SPICLK
(clock polarity = 0)
13
14
SPICLK
(clock polarity = 1)
15
16
19
20
SPISIMO Data
SPISIMO
Must Be Valid
25 26
SPISTE
(1) The MASTER / SLAVE bit (SPICTL.2) is cleared and the CLOCK PHASE bit (SPICTL.3) is cleared.
(2) tc(SPC) = SPI clock cycle time = LSPCLK/4 or LSPCLK/(SPIBRR + 1)
(3) Internal clock prescalers must be adjusted such that the SPI clock speed is limited to the following SPI clock rate:
Master mode transmit 25-MHz MAX, master mode receive 12.5-MHz MAX
Slave mode transmit 12.5-MHz MAX, slave mode receive 12.5-MHz MAX.
(4) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPICCR.6).
12
SPICLK
(clock polarity = 0)
13 14
SPICLK
(clock polarity = 1)
17
21 18
22
25 26
SPISTE
Note
Both pins can be used as GPIO if not used for SCI.
– Baud rate programmable to 64K different rates:
LSPCLK
Baud rate = when BRR ¹ 0
(BRR + 1) * 8
LSPCLK
Baud rate = when BRR = 0
16
• Data-word format
– One start bit
– Data-word length programmable from 1 to 8 bits
– Optional even/odd/no parity bit
– One or 2 stop bits
• Four error-detection flags: parity, overrun, framing, and break detection
• Two wake-up multiprocessor modes: idle-line and address bit
• Half- or full-duplex operation
• Double-buffered receive and transmit functions
• Transmitter and receiver operations can be accomplished through interrupt-driven or polled algorithms with
status flags.
– Transmitter: TXRDY flag (transmitter-buffer register is ready to receive another character) and TX EMPTY
flag (transmitter-shift register is empty)
– Receiver: RXRDY flag (receiver-buffer register is ready to receive another character), BRKDT flag (break
condition occurred), and RX ERROR flag (monitoring four interrupt conditions)
• Separate enable bits for transmitter and receiver interrupts (except BRKDT)
• NRZ (nonreturn-to-zero) format
Note
All registers in this module are 8-bit registers that are connected to Peripheral Frame 2. When a
register is accessed, the register data is in the lower byte (7–0), and the upper byte (15–8) is read
as zeros. Writing to the upper byte has no effect.
Enhanced features:
• Auto baud-detect hardware logic
• 4-level transmit/receive FIFO
The SCI port operation is configured and controlled by the registers listed in Table 7-29.
Table 7-29. SCI-A Registers
EALLOW
NAME(1) ADDRESS SIZE (x16) DESCRIPTION
PROTECTED
SCICCRA 0x7050 1 No SCI-A Communications Control Register
SCICTL1A 0x7051 1 No SCI-A Control Register 1
SCIHBAUDA 0x7052 1 No SCI-A Baud Register, High Bits
SCILBAUDA 0x7053 1 No SCI-A Baud Register, Low Bits
SCICTL2A 0x7054 1 No SCI-A Control Register 2
SCIRXSTA 0x7055 1 No SCI-A Receive Status Register
SCIRXEMUA 0x7056 1 No SCI-A Receive Emulation Data Buffer Register
SCIRXBUFA 0x7057 1 No SCI-A Receive Data Buffer Register
SCITXBUFA 0x7059 1 No SCI-A Transmit Data Buffer Register
SCIFFTXA(2) 0x705A 1 No SCI-A FIFO Transmit Register
SCIFFRXA(2) 0x705B 1 No SCI-A FIFO Receive Register
SCIFFCTA(2) 0x705C 1 No SCI-A FIFO Control Register
SCIPRIA 0x705F 1 No SCI-A Priority Control Register
(1) Registers in this table are mapped to Peripheral Frame 2 space. This space only allows 16-bit accesses. 32-bit accesses produce
undefined results.
(2) These registers are new registers for the FIFO mode.
For more information on the SCI, see the Serial Communications Interface (SCI) chapter in the TMS320F2803x
Real-Time Microcontrollers Technical Reference Manual.
Figure 7-33 shows the SCI module block diagram.
TXENA
SCICTL1.1
TXSHF
SCITXD
Register
Frame 8
Format and Mode
Parity
Even/Odd TXEMPTY
0 1
SCICCR.6 8 SCICTL2.6
Enable
TX FIFO_0
TXINT
SCICCR.5 To CPU
TX FIFO_1 TX FIFO Interrupts TX Interrupt
88
Logic
TX FIFO_N
TXINTENA
TXRDY SCICTL2.0
8
TXWAKE 0 1 SCICTL2.7
SCICTL1.3
WUT 8
Transmit Data
Buffer Register
SCITXBUF.7-0 Auto Baud Detect Logic
RXENA
Baud Rate
MSB/LSB SCICTL1.0
LSPCLK Registers
RXSHF
SCIRXD
Register
SCIHBAUD.15-8
RXWAKE
SCILBAUD.7-0 8
SCIRXST.1
0 1
8
SCIFFENA
SCIFFTX.14 RX FIFO_0 RXINT
8 RX FIFO_1 To CPU
RX FIFO Interrupts RX Interrupt
Logic
RX FIFO_N
RXFFOVF
8 SCIFFRX.15
0 1
RXBKINTENA
SCICTL2.1
RXRDY
SCIRXST.6
RXENA BRKDT
RXERRINTENA
SCICTL1.0
SCIRXST.5 SCICTL1.6
SCIRXST.5-2
Receive Data BRKDT FE OE PE
Buffer Register
RXERROR
SCIRXBUF.7-0
SCIRXST.7
Note
The 2803x devices have passed LIN 2.0 conformance tests (master and slave). Contact TI for details.
For more information on the LIN, see the Local Interconnect Network (LIN) Module chapter in the
TMS320F2803x Real-Time Microcontrollers Technical Reference Manual.
The registers in Table 7-30 configure and control the operation of the LIN module.
Table 7-30. LIN-A Registers
NAME(1) ADDRESS SIZE (x16) DESCRIPTION
SCIGCR0 0x6C00 2 Global Control Register 0
SCIGCR1 0x6C02 2 Global Control Register 1
SCIGCR2 0x6C04 2 Global Control Register 2
SCISETINT 0x6C06 2 Interrupt Enable Register
SCICLEARINT 0x6C08 2 Interrupt Disable Register
SCISETINTLVL 0x6C0A 2 Set Interrupt Level Register
SCICLEARINTLVL 0x6C0C 2 Clear Interrupt Level Register
SCIFLR 0x6C0E 2 Flag Register
SCIINTVECT0 0x6C10 2 Interrupt Vector Offset Register 0
SCIINTVECT1 0x6C12 2 Interrupt Vector Offset Register 1
SCIFORMAT 0x6C14 2 Length Control register
BRSR 0x6C16 2 Baud Rate Selection Register
SCIED 0x6C18 2 Emulation buffer register
SCIRD 0x6C1A 2 Receiver data buffer register
SCITD 0x6C1C 2 Transmit data buffer register
Reserved 0x6C1E 4 RSVD
SIPIO2 0x6C22 2 Pin control register 2
Reserved 0x6C24 10 RSVD
LINCOMP 0x6C30 2 Compare register
LINRD0 0x6C32 2 Receive data register 0
LINRD1 0x6C34 2 Receive data register 1
LINMASK 0x6C36 2 Acceptance mask register
Register containing ID- byte, ID-SlaveTask byte, and ID
LINID 0x6C38 2
received fields.
LINTD0 0x6C3A 2 Transmit Data Register 0
LINTD1 0x6C3C 2 Transmit Data Register 1
MBRSR 0x6C3E 2 Baud Rate Selection Register
Reserved 0x6C40 8 RSVD
IODFTCTRL 0x6C48 2 IODFT for BLIN
(1) Some registers and some bits in other registers are EALLOW-protected. For more details, see the Local Interconnect Network (LIN)
Module chapter in the TMS320F2803x Real-Time Microcontrollers Technical Reference Manual.
ADDRESS BUS
CHECKSUM
CALCULATOR INTERFACE
ID PARTY
CHECKER
BIT
MONITOR
TXRX ERROR
DETECTOR (TED)
TIMEOUT
CONTROL
COUNTER
LINRX/
SCIRX COMPARE
Note
For a SYSCLKOUT of 60 MHz, the smallest bit rate possible is 4.6875 kbps.
The F2803x CAN has passed the conformance test per ISO/DIS 16845. Contact TI for test report and
exceptions.
For information on using the CAN module with the on-chip zero-pin oscillators, see MCU CAN Module Operation
Using the On-Chip Zero-Pin Oscillator.
For more information on the CAN, see the Controller Area Network (CAN) chapter in the TMS320F2803x
Real-Time Microcontrollers Technical Reference Manual.
Message Controller
32
Transmit Buffer
Control Buffer
Status Buffer
SN65HVD23x
3.3-V CAN Transceiver
CAN Bus
Note
If the eCAN module is not used in an application, the RAM available (LAM, MOTS, MOTO, and
mailbox RAM) can be used as general-purpose RAM. The CAN module clock should be enabled for
this.
The CAN registers listed in Table 7-32 are used by the CPU to configure and control the CAN controller and
the message objects. eCAN control registers only support 32-bit read/write operations. Mailbox RAM can be
accessed as 16 bits or 32 bits. 32-bit accesses are aligned to an even boundary.
Table 7-32. CAN Register Map
eCAN-A
REGISTER NAME(1) SIZE (x32) DESCRIPTION
ADDRESS
CANME 0x6000 1 Mailbox enable
CANMD 0x6002 1 Mailbox direction
CANTRS 0x6004 1 Transmit request set
CANTRR 0x6006 1 Transmit request reset
CANTA 0x6008 1 Transmission acknowledge
CANAA 0x600A 1 Abort acknowledge
CANRMP 0x600C 1 Receive message pending
CANRML 0x600E 1 Receive message lost
CANRFP 0x6010 1 Remote frame pending
CANGAM 0x6012 1 Global acceptance mask
CANMC 0x6014 1 Master control
CANBTC 0x6016 1 Bit-timing configuration
CANES 0x6018 1 Error and status
CANTEC 0x601A 1 Transmit error counter
CANREC 0x601C 1 Receive error counter
CANGIF0 0x601E 1 Global interrupt flag 0
CANGIM 0x6020 1 Global interrupt mask
CANGIF1 0x6022 1 Global interrupt flag 1
CANMIM 0x6024 1 Mailbox interrupt mask
CANMIL 0x6026 1 Mailbox interrupt level
CANOPC 0x6028 1 Overwrite protection control
CANTIOC 0x602A 1 TX I/O control
CANRIOC 0x602C 1 RX I/O control
CANTSC 0x602E 1 Time stamp counter (Reserved in SCC mode)
CANTOC 0x6030 1 Time-out control (Reserved in SCC mode)
CANTOS 0x6032 1 Time-out status (Reserved in SCC mode)
I2C Module
I2CXSR I2CDXR
TX FIFO
SDA FIFO Interrupt to
CPU/PIE
RX FIFO
Peripheral Bus
I2CRSR I2CDRR
Control/Status
Registers CPU
Clock
SCL Synchronizer
Prescaler
Noise Filters
Interrupt to
I2C INT
CPU/PIE
Arbitrator
A. The I2C registers are accessed at the SYSCLKOUT rate. The internal timing and signal waveforms of the I2C port are also at the
SYSCLKOUT rate.
B. The clock enable bit (I2CAENCLK) in the PCLKCRO register turns off the clock to the I2C port for low-power operation. Upon reset,
I2CAENCLK is clear, which indicates the peripheral internal clocks are off.
The registers in Table 7-33 configure and control the I2C port operation.
Table 7-33. I2C-A Registers
EALLOW
NAME ADDRESS DESCRIPTION
PROTECTED
I2COAR 0x7900 No I2C own address register
I2CIER 0x7901 No I2C interrupt enable register
I2CSTR 0x7902 No I2C status register
I2CCLKL 0x7903 No I2C clock low-time divider register
I2CCLKH 0x7904 No I2C clock high-time divider register
I2CCNT 0x7905 No I2C data count register
I2CDRR 0x7906 No I2C data receive register
I2CSAR 0x7907 No I2C slave address register
I2CDXR 0x7908 No I2C data transmit register
I2CMDR 0x7909 No I2C mode register
I2CISRC 0x790A No I2C interrupt source register
I2CPSC 0x790C No I2C prescaler register
I2CFFTX 0x7920 No I2C FIFO transmit register
I2CFFRX 0x7921 No I2C FIFO receive register
I2CRSR – No I2C receive shift register (not accessible to the CPU)
I2CXSR – No I2C transmit shift register (not accessible to the CPU)
EPWM1SYNCI
EPWM1TZINT EPWM1B
EPWM1 TZ1 to TZ3
EPWM1INT
Module
(A)
EPWM2TZINT EQEP1ERR
TZ4
PIE EPWM2INT
CLOCKFAIL
TZ5
EPWMxTZINT
EMUSTOP
EPWMxINT TZ6
EPWM1ENCLK
TBCLKSYNC eCAPI
EPWM1SYNCO
EPWM1SYNCO
M
SOCA1 U
ADC
SOCB1 X
SOCA2
EPWMxSYNCI EPWMxB
SOCB2
SOCAx EPWMx TZ1 to TZ3
SOCBx Module (A)
EQEP1ERR EQEP1ERR
TZ4
CLOCKFAIL
TZ5
EMUSTOP
TZ6 eQEP1
EPWMxENCLK
TBCLKSYNC
System Control
C28x CPU
SOCA1
SOCA2 Pulse Stretch ADCSOCAO
SPCAx (32 SYSCLKOUT Cycles, Active-Low Output)
SOCB1
SOCB2 Pulse Stretch ADCSOCBO
SPCBx (32 SYSCLKOUT Cycles, Active-Low Output)
Time-Base (TB)
CTR=ZERO Sync
TBPRD Shadow (24) In/Out
CTR=CMPB Select EPWMxSYNCO
TBPRDHR (8)
TBPRD Active (24) Disabled Mux
8
CTR=PRD
TBCTL[PHSEN] TBCTL[SYNCOSEL]
EPWMxSYNCI
Counter DCAEVT1.sync
Up/Down DCBEVT1.sync
TBCTL[SWFSYNC]
(16 Bit)
(Software Forced
CTR=ZERO Sync)
TCBNT
Active (16) CTR_Dir CTR=PRD
CTR=ZERO
TBPHSHR (8) CTR=PRD or ZERO EPWMxINT
16 8 CTR=CMPA Event
Trigger EPWMxSOCA
Phase CTR=CMPB
TBPHS Active (24) and
Control CTR_Dir EPWMxSOCB
Interrupt
(A) (ET)
DCAEVT1.soc EPWMxSOCA
(A) ADC
DCBEVT1.soc EPWMxSOCB
Action
Qualifier
CTR=CMPA (AQ)
CMPAHR (8)
16
High-resolution PWM (HRPWM)
CMPA Active (24)
A. These events are generated by the Type 1 ePWM digital compare (DC) submodule based on the levels of the COMPxOUT and TZ
signals.
B. This signal exists only on devices with an eQEP1 module.
(1) For an explanation of the input qualifier parameters, see Section 7.9.15.1.2.1.
(1) For an explanation of the input qualifier parameters, see Section 7.9.15.1.2.1.
SYSCLK
tw(TZ)
(A)
TZ
td(TZ-PWM)HZ
(B)
PWM
Note
The minimum SYSCLKOUT frequency allowed for HRPWM is 60 MHz.
Note
When dual-edge high-resolution is enabled (high-resolution period mode), the PWMxB output is not
available for use.
For more information on the HRPWM, see the High-Resolution Pulse Width Modulator (HRPWM) chapter in the
TMS320F2803x Real-Time Microcontrollers Technical Reference Manual.
7.9.10.1 HRPWM Electrical Data/Timing
Section 7.9.10.1.1 shows the high-resolution PWM switching characteristics.
7.9.10.1.1 High-Resolution PWM Characteristics
CTRPHS
(phase register−32 bit) APWM mode
SYNC
SYNCIn
OVF CTR_OVF
TSCTR CTR [0−31]
SYNCOut PWM
(counter−32 bit) Delta−mode PRD [0−31] compare
RST
logic
CMP [0−31]
32
eCAPx
MODE SELECT
32 CAP1 LD1 Polarity
LD
(APRD active) select
APRD 32
shadow CMP [0−31]
32
Event Event
32 ACMP
qualifier
shadow Prescale
32 Polarity
CAP3 LD3 select
LD
(APRD shadow)
32 CAP4 LD4
LD Polarity
(ACMP shadow) select
4
Capture events 4
CEVT[1:4]
Interrupt Continuous /
to PIE Trigger Oneshot
and CTR_OVF Capture Control
Flag
CTR=PRD
control
CTR=CMP
For more information on the eCAP, see the Enhanced Capture (eCAP) Module chapter in the TMS320F2803x
Real-Time Microcontrollers Technical Reference Manual.
7.9.11.1 eCAP Electrical Data/Timing
Section 7.9.11.1.1 shows the eCAP timing requirement and Section 7.9.11.1.2 shows the eCAP switching
characteristics.
7.9.11.1.1 Enhanced Capture (eCAP) Timing Requirement
(1) For an explanation of the input qualifier parameters, see Section 7.9.15.1.2.1.
SYSCLK
PIE
HRCAPxINTn
HRCAPx
For more information on the HRCAP, see the High Resolution Capture (HRCAP) chapter in the TMS320F2803x
Real-Time Microcontrollers Technical Reference Manual.
7.9.12.1 HRCAP Electrical Data/Timing
7.9.12.1.1 High-Resolution Capture (HRCAP) Timing Requirements
(1) The listed minimum pulse width does not take into account the limitation that all relevant HCCAP registers must be read and RISE/
FALL event flags cleared within the pulse width to ensure valid capture data.
(2) HRCAP step size will increase with low voltage and high temperature and decrease with high voltage and low temperature.
Applications that use the HRCAP in high-resolution mode should use the HRCAP calibration functions to dynamically calibrate for
varying operating conditions.
For more information on the eQEP, see the Enhanced QEP (eQEP) Module chapter in the TMS320F2803x
Real-Time Microcontrollers Technical Reference Manual.
Data Bus
QCPRD
QCAPCTL QCTMR
16 16
16
Quadrature
Capture
QCTMRLAT Unit
(QCAP)
QCPRDLAT
eQEP Peripheral
(1) Refer to the TMS320F2803x Real-Time MCUs Silicon Errata for limitations in the asynchronous mode.
(2) For an explanation of the input qualifier parameters, see Section 7.9.15.1.2.1.
Note
In 2803x devices, the JTAG pins may also be used as GPIO pins. Care should be taken in the board
design to ensure that the circuitry connected to these pins do not affect the emulation capabilities of
the JTAG pin function. Any circuitry connected to these pins should not prevent the JTAG debug probe
from driving (or being driven by) the JTAG pins for successful debug.
TRST
TRST
XCLKIN
GPIO38_in
TCK
TCK/GPIO38
GPIO38_out
C28x
Core
GPIO37_in
TDO
TDO/GPIO37 1
0 GPIO37_out
GPIO36_in
1
TMS
TMS/GPIO36
GPIO36_out 1 0
GPIO35_in
1
TDI
TDI/GPIO35
GPIO35_out 1 0
Note
There is a two-SYSCLKOUT cycle delay from when the write to the GPxMUXn/AIOMUXn and
GPxQSELn registers occurs to when the action is valid.
(1) The word reserved means that there is no peripheral assigned to this GPxMUX1/2 register setting. Should it be selected, the state of
the pin will be undefined and the pin may be driven. This selection is a reserved configuration for future expansion.
(2) I = Input, O = Output, OD = Open Drain
(3) These pins are not available in the 64-pin package.
Table 7-43. Analog MUX for 56-Pin RSH and 64-Pin PAG Packages
DEFAULT AT RESET
PERIPHERAL SELECTION 2 AND
AIOx AND PERIPHERAL SELECTION 1(1)
PERIPHERAL SELECTION 3(1)
AIOMUX1 REGISTER BITS AIOMUX1 BITS = 0,x AIOMUX1 BITS = 1,x
1-0 ADCINA0 (I), VREFHI (I) ADCINA0 (I), VREFHI (I)
3-2 ADCINA1 (I) ADCINA1 (I)
5-4 AIO2 (I/O) ADCINA2 (I), COMP1A (I)
7-6 ADCINA3 (I) ADCINA3 (I)
9-8 AIO4 (I/O) ADCINA4 (I), COMP2A (I)
11-10 – –
13-12 AIO6 (I/O) ADCINA6 (I), COMP3A (I)
15-14 ADCINA7 (I) ADCINA7 (I)
17-16 ADCINB0 (I) ADCINB0 (I)
19-18 ADCINB1 (I) ADCINB1 (I)
21-20 AIO10 (I/O) ADCINB2 (I), COMP1B (I)
23-22 ADCINB3 (I) ADCINB3 (I)
25-24 AIO12 (I/O) ADCINB4 (I), COMP2B (I)
27-26 – –
29-28 AIO14 (I/O) ADCINB6 (I), COMP3B (I)
31-30 ADCINB7 (I) ADCINB7 (I)
The user can select the type of input qualification for each GPIO pin through the GPxQSEL1/2 registers from
four choices:
• Synchronization To SYSCLKOUT Only (GPxQSEL1/2 = 0, 0): This is the default mode of all GPIO pins at
reset and it simply synchronizes the input signal to the system clock (SYSCLKOUT).
• Qualification Using Sampling Window (GPxQSEL1/2 = 0, 1 and 1, 0): In this mode the input signal, after
synchronization to the system clock (SYSCLKOUT), is qualified by a specified number of cycles before the
input is allowed to change.
• The sampling period is specified by the QUALPRD bits in the GPxCTRL register and is configurable in
groups of 8 signals. It specifies a multiple of SYSCLKOUT cycles for sampling the input signal. The sampling
window is either 3-samples or 6-samples wide and the output is only changed when ALL samples are the
same (all 0s or all 1s) as shown in Figure 7-47 (for 6 sample mode).
• No Synchronization (GPxQSEL1/2 = 1,1): This mode is used for peripherals where synchronization is not
required (synchronization is performed within the peripheral).
Due to the multilevel multiplexing that is required on the device, there may be cases where a peripheral input
signal can be mapped to more then one GPIO pin. Also, when an input signal is not selected, the input signal will
default to either a 0 or 1 state, depending on the peripheral.
GPIOXINT1SEL
GPIOLMPSEL GPIOXINT2SEL
LPMCR0 GPIOXINT3SEL
Asynchronous
path GPxDAT (read)
GPxQSEL1/2
GPxCTRL
GPxPUD 00 N/C
01 Peripheral 1 Input
Input
Internal
Qualification
Pullup 10 Peripheral 2 Input
11 Peripheral 3 Input
Asynchronous path GPxTOGGLE
GPIOx pin GPxCLEAR
GPxSET
00 GPxDAT (latch)
01 Peripheral 1 Output
10 Peripheral 2 Output
11 Peripheral 3 Output
High Impedance
Output Control
00 GPxDIR (latch)
0 = Input, 1 = Output 01 Peripheral 1 Output Enable
10 Peripheral 2 Output Enable
XRS
11 Peripheral 3 Output Enable
= Default at Reset
GPxMUX1/2
A. x stands for the port, either A or B. For example, GPxDIR refers to either the GPADIR and GPBDIR register depending on the particular
GPIO pin selected.
B. GPxDAT latch/read are accessed at the same memory location.
C. This is a generic GPIO MUX block diagram. Not all options may be applicable for all GPIO pins. For pin-specific variations, see the
System Control chapter in the TMS320F2803x Real-Time Microcontrollers Technical Reference Manual.
(1) Rise time and fall time vary with electrical loading on I/O pins. Values given in Section 7.9.15.1.1.1 are applicable for a 40-pF load on
I/O pins.
GPIO
t r(GPO)
t f(GPO)
(1) "n" represents the number of qualification samples as defined by GPxQSELn register.
(2) For tw(GPI), pulse width is measured from VIL to VIL for an active low signal and VIH to VIH for an active high signal.
(A)
GPIO Signal GPxQSELn = 1,0 (6 samples)
1 1 0 0 0 0 0 0 0 1 0 0 0 1 1 1 1 1 1 1 1 1
SYSCLKOUT
QUALPRD = 1
(SYSCLKOUT/2)
(D)
Output From
Qualifier
A. This glitch will be ignored by the input qualifier. The QUALPRD bit field specifies the qualification sampling period. It can vary from 00 to
0xFF. If QUALPRD = 00, then the sampling period is 1 SYSCLKOUT cycle. For any other value "n", the qualification sampling period in
2n SYSCLKOUT cycles (that is, at every 2n SYSCLKOUT cycles, the GPIO pin will be sampled).
B. The qualification period selected through the GPxCTRL register applies to groups of 8 GPIO pins.
C. The qualification block can take either three or six samples. The GPxQSELn Register selects which sample mode is used.
D. In the example shown, for the qualifier to detect the change, the input should be stable for 10 SYSCLKOUT cycles or greater. In other
words, the inputs should be stable for (5 x QUALPRD x 2) SYSCLKOUT cycles. This would ensure 5 sampling periods for detection to
occur. Because external signals are driven asynchronously, an 13-SYSCLKOUT-wide pulse ensures reliable recognition.
SYSCLK
GPIOxn
tw(GPI)
VDDIO
> 1 MS
2 pF
VSS VSS
Figure 7-49. Input Resistance Model for a GPIO Pin With an Internal Pullup
(1) For an explanation of the input qualifier parameters, see Section 7.9.15.1.2.1.
(1) This is the time taken to begin execution of the instruction that immediately follows the IDLE instruction. Execution of an ISR (triggered
by the wake-up signal) involves additional latency.
(2) For an explanation of the input qualifier parameters, see Section 7.9.15.1.2.1.
td(WAKE−IDLE)
Address/Data
(internal)
XCLKOUT
tw(WAKE−INT)
(A)(B)
WAKE INT
A. WAKE INT can be any enabled interrupt, WDINT or XRS. After the IDLE instruction is executed, a delay of 5 OSCCLK cycles
(minimum) is needed before the wake-up signal could be asserted.
B. From the time the IDLE instruction is executed to place the device into low-power mode (LPM), wakeup should not be initiated until at
least 4 OSCCLK cycles have elapsed.
(1) This is the time taken to begin execution of the instruction that immediately follows the IDLE instruction. Execution of an ISR (triggered
by the wake-up signal) involves additional latency.
tw(WAKE-INT)
td(WAKE-STBY)
X1/X2 or
XCLKIN
XCLKOUT
td(IDLE−XCOL)
This delay enables the CPU pipeline and any other pending operations to flush properly.
C. Clock to the peripherals are turned off. However, the PLL and watchdog are not shut down. The device is now in STANDBY mode. After
the IDLE instruction is executed, a delay of 5 OSCCLK cycles (minimum) is needed before the wake-up signal could be asserted.
D. The external wake-up signal is driven active.
E. The wake-up signal fed to a GPIO pin to wake up the device must meet the minimum pulse width requirement. Furthermore, this signal
must be free of glitches. If a noisy signal is fed to a GPIO pin, the wake-up behavior of the device will not be deterministic and the
device may not exit low-power mode for subsequent wake-up pulses.
F. After a latency period, the STANDBY mode is exited.
G. Normal execution resumes. The device will respond to the interrupt (if enabled).
H. From the time the IDLE instruction is executed to place the device into low-power mode (LPM), wakeup should not be initiated until at
least 4 OSCCLK cycles have elapsed.
Device
HALT HALT
Status
(I)
GPIOn
td(WAKE−HALT )
tw(WAKE-GPIO)
tp
X1/X2 or
XCLKIN
XCLKOUT
td(IDLE−XCOL)
This delay enables the CPU pipeline and any other pending operations to flush properly.
C. Clocks to the peripherals are turned off and the PLL is shut down. If a quartz crystal or ceramic resonator is used as the clock source,
the internal oscillator is shut down as well. The device is now in HALT mode and consumes absolute minimum power. It is possible
to keep the zero-pin internal oscillators (INTOSC1 and INTOSC2) and the watchdog alive in HALT mode. This is done by writing to
the appropriate bits in the CLKCTL register. After the IDLE instruction is executed, a delay of 5 OSCCLK cycles (minimum) is needed
before the wake-up signal could be asserted.
D. When the GPIOn pin (used to bring the device out of HALT) is driven low, the oscillator is turned on and the oscillator wake-up
sequence is initiated. The GPIO pin should be driven high only after the oscillator has stabilized. This enables the provision of a clean
clock signal during the PLL lock sequence. Because the falling edge of the GPIO pin asynchronously begins the wake-up procedure,
care should be taken to maintain a low noise environment prior to entering and during HALT mode.
E. The wake-up signal fed to a GPIO pin to wake up the device must meet the minimum pulse width requirement. Furthermore, this signal
must be free of glitches. If a noisy signal is fed to a GPIO pin, the wake-up behavior of the device will not be deterministic and the
device may not exit low-power mode for subsequent wake-up pulses.
F. Once the oscillator has stabilized, the PLL lock sequence is initiated, which takes 1 ms.
G. When CLKIN to the core is enabled, the device will respond to the interrupt (if enabled), after a latency. The HALT mode is now exited.
H. Normal operation resumes.
I. From the time the IDLE instruction is executed to place the device into low-power mode (LPM), wakeup should not be initiated until at
least 4 OSCCLK cycles have elapsed.
TMDX Development-support product that has not yet completed Texas Instruments internal qualification testing.
TMDS Fully-qualified development-support product.
TMX and TMP devices and TMDX development-support tools are shipped against the following disclaimer:
"Developmental product is intended for internal evaluation purposes."
Production devices and TMDS development-support tools have been characterized fully, and the quality and
reliability of the device have been demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (X or P) have a greater failure rate than the standard production
devices. Texas Instruments recommends that these devices not be used in any production system because their
expected end-use failure rate still is undefined. Only qualified production devices are to be used.
TI device nomenclature also includes a suffix with the device family name. This suffix indicates the package
type (for example, PN) and temperature range (for example, T). Figure 9-1 provides a legend for reading the
complete device name for any family member.
For device part numbers and further ordering information, see the TI website (www.ti.com) or contact your TI
sales representative.
For additional description of the device nomenclature markings on the die, see the TMS320F2803x Real-Time
MCUs Silicon Errata.
A. For more information on peripheral, temperature, and package availability for a specific device, see Table 4-1.
Application Reports
Semiconductor Packing Methodology describes the packing methodologies employed to prepare semiconductor
devices for shipment to end users.
Calculating Useful Lifetimes of Embedded Processors provides a methodology for calculating the useful lifetime
of TI embedded processors (EPs) under power when used in electronic systems. It is aimed at general
engineers who wish to determine if the reliability of the TI EP meets the end system reliability requirement.
Semiconductor and IC Package Thermal Metrics describes traditional and new thermal metrics and puts their
application in perspective with respect to system-level junction temperature estimation.
Calculating FIT for a Mission Profile explains how use TI’s reliability de-rating tools to calculate a component
level FIT under power on conditions for a system mission profile.
Oscillator Compensation Guide describes a factory supplied method for compensating the internal oscillators for
frequency drift caused by temperature.
MCU CAN Module Operation Using the On-Chip Zero-Pin Oscillator.
The TMS320F2803x/TMS320F2805x/TMS320F2806x series of microcontrollers have an on-chip zero-pin
oscillator that needs no external components. This application report describes how to use the CAN module
with this oscillator to operate at the maximum bit rate and bus length without the added cost of an external clock
source.
An Introduction to IBIS (I/O Buffer Information Specification) Modeling discusses various aspects of IBIS
including its history, advantages, compatibility, model generation flow, data requirements in modeling the input/
output structures and future trends.
Serial Flash Programming of C2000™ Microcontrollers discusses using a flash kernel and ROM loaders for
serial programming a device.
9.4 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
9.5 Trademarks
TMS320C2000™, TMS320™, and TI E2E™ are trademarks of Texas Instruments.
I2C-bus® is a registered trademark of NXP B.V. Corporation.
All trademarks are the property of their respective owners.
9.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
9.7 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
10 Revision History
Changes from June 12, 2021 to January 31, 2024 (from Revision P (June 2021) to Revision Q
(January 2024)) Page
• Device Comparison table: Updated SPI and SCI rows...................................................................................... 6
• Flash Parameters at 60-MHz SYSCLKOUT table: Updated Program Time and Erase Time units..................38
• Tools and Software section: Updated Training link.........................................................................................143
www.ti.com 14-Sep-2023
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
TMS320F28030PAGQ ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28030PAGQ Samples
TMS320
TMS320F28030PAGS ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28030PAGS Samples
TMS320
TMS320F28030PAGT ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28030PAGT Samples
TMS320
TMS320F28030PNQ ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28030PNQ Samples
TMS320
TMS320F28030PNS ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28030PNS Samples
TMS320
TMS320F28030PNT ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28030PNT Samples
TMS320
TMS320F28030RSHS ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28030RSHS Samples
S320 980
TMS320F28030RSHT ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28030RSHT Samples
S320 980
TMS320F28031PAGQ ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28031PAGQ Samples
TMS320
TMS320F28031PAGS ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28031PAGS Samples
TMS320
TMS320F28031PAGT ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28031PAGT Samples
TMS320
TMS320F28031PNQ ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28031PNQ Samples
TMS320
TMS320F28031PNS ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28031PNS Samples
TMS320
TMS320F28031PNT ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28031PNT Samples
TMS320
TMS320F28031RSHS ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28031RSHS Samples
S320 980
TMS320F28032PAGQ ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28032PAGQ Samples
TMS320
TMS320F28032PAGS ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28032PAGS Samples
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 14-Sep-2023
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
TMS320
TMS320F28032PAGT ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28032PAGT Samples
TMS320
TMS320F28032PNQ ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28032PNQ Samples
TMS320
TMS320F28032PNS ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28032PNS Samples
TMS320
TMS320F28032PNT ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28032PNT Samples
TMS320
TMS320F28032PNTR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28032PNT Samples
TMS320
TMS320F28032RSHS ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28032RSHS Samples
S320 980
TMS320F28032RSHT ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28032RSHT Samples
S320 980
TMS320F28033P1PAGS ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28033PAGS Samples
TMS320
TMS320F28033PAGQ ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28033PAGQ Samples
TMS320
TMS320F28033PAGS ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28033PAGS Samples
TMS320
TMS320F28033PAGT ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28033PAGT Samples
TMS320
TMS320F28033PNQ ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28033PNQ Samples
TMS320
TMS320F28033PNS ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28033PNS Samples
TMS320
TMS320F28033PNT ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28033PNT Samples
TMS320
TMS320F28033RSHS ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28033RSHS Samples
S320 980
TMS320F28034PAGQ ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28034PAGQ Samples
TMS320
TMS320F28034PAGQR ACTIVE TQFP PAG 64 1500 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28034PAGQ Samples
TMS320
Addendum-Page 2
PACKAGE OPTION ADDENDUM
www.ti.com 14-Sep-2023
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
TMS320F28034PAGS ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28034PAGS Samples
TMS320
TMS320F28034PAGT ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28034PAGT Samples
TMS320
TMS320F28034PNQ ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28034PNQ Samples
TMS320
TMS320F28034PNS ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28034PNS Samples
TMS320
TMS320F28034PNT ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28034PNT Samples
TMS320
TMS320F28034PNTR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28034PNT Samples
TMS320
TMS320F28034RSHS ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28034RSHS Samples
S320 980
TMS320F28034RSHT ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28034RSHT Samples
S320 980
TMS320F28035PAGQ ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28035PAGQ Samples
TMS320
TMS320F28035PAGS ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28035PAGS Samples
TMS320
TMS320F28035PAGT ACTIVE TQFP PAG 64 160 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28035PAGT Samples
TMS320
TMS320F28035PAGTR ACTIVE TQFP PAG 64 1500 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28035PAGT Samples
TMS320
TMS320F28035PNQ ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28035PNQ Samples
TMS320
TMS320F28035PNQR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28035PNQ Samples
TMS320
TMS320F28035PNS ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28035PNS Samples
TMS320
TMS320F28035PNT ACTIVE LQFP PN 80 119 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28035PNT Samples
TMS320
TMS320F28035PNTR ACTIVE LQFP PN 80 1000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28035PNT Samples
TMS320
TMS320F28035RSHS ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 F28035RSHS Samples
Addendum-Page 3
PACKAGE OPTION ADDENDUM
www.ti.com 14-Sep-2023
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
S320 980
TMS320F28035RSHT ACTIVE VQFN RSH 56 260 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 105 F28035RSHT Samples
S320 980
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF TMS320F28030, TMS320F28030-Q1, TMS320F28031, TMS320F28031-Q1, TMS320F28032, TMS320F28032-Q1, TMS320F28033,
TMS320F28033-Q1, TMS320F28034, TMS320F28034-Q1, TMS320F28035, TMS320F28035-Q1 :
Addendum-Page 4
PACKAGE OPTION ADDENDUM
www.ti.com 14-Sep-2023
Addendum-Page 5
PACKAGE MATERIALS INFORMATION
www.ti.com 23-Mar-2024
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 23-Mar-2024
Width (mm)
H
W
Pack Materials-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 23-Mar-2024
TRAY
W-
Outer
tray
width
Text
Pack Materials-Page 3
PACKAGE MATERIALS INFORMATION
www.ti.com 23-Mar-2024
Pack Materials-Page 4
MECHANICAL DATA
0,27
0,50 0,08 M
0,17
48 33
49 32
64 17
0,13 NOM
1 16
7,50 TYP
Gage Plane
10,20
SQ
9,80
12,20 0,25
SQ 0,05 MIN
11,80 0°– 7°
1,05
0,95 0,75
0,45
Seating Plane
4040282 / C 11/96
12.2
PIN 1 ID B
11.8
80 61
A
1 60
12.2 14.2
TYP
11.8 13.8
20
41
21 40
1.6 MAX
C
(0.13) TYP
SEATING PLANE
0.08
SEE DETAIL A
0.25 (1.4)
GAGE PLANE
TYPICAL
4215166/A 08/2022
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Reference JEDEC registration MS-026.
www.ti.com
EXAMPLE BOARD LAYOUT
PN0080A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
80 61
80X (1.5)
1
60
80X (0.3)
(R0.05) TYP
20 41
21 40
(13.4)
0.05 MAX
EXPOSED METAL ALL AROUND EXPOSED METAL 0.05 MIN
ALL AROUND
4215166/A 08/2022
NOTES: (continued)
www.ti.com
EXAMPLE STENCIL DESIGN
PN0080A LQFP - 1.6 mm max height
PLASTIC QUAD FLATPACK
SYMM
80 61
80X (1.5)
1
60
80X (0.3)
(13.4)
(R0.05) TYP
20 41
21 40
(13.4)
4215166/A 08/2022
NOTES: (continued)
7. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
8. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
7.15 A
B
6.85
C
1 MAX
SEATING PLANE
0.05
0.00
14 29
52X 0.4
4X
5.2
1 42
0.25
56X
PIN 1 ID 56 43 0.15
(OPTIONAL) 0.1 C A B
0.6
56X 0.05 C
0.4
4218794/A 07/2013
NOTES:
1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME Y14.5M.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
(5.3)
SYMM 43
56
SEE DETAILS
56X (0.7)
56X (0.2)
1
42
52X (0.4) 6X
(1.12)
(1.28)
TYP
SYMM
(6.7)
14 29
( 0.2) TYP
VIA
15 28
(1.28) TYP 6X (1.12)
(6.7)
METAL SOLDERMASK
OPENING
SOLDERMASK METAL
OPENING
SOLDERMASK DETAILS
4218794/A 07/2013
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, refer to QFN/SON PCB application note
in literature No. SLUA271 (www.ti.com/lit/slua271).
www.ti.com
EXAMPLE STENCIL DESIGN
SYMM
METAL
TYP
(1.28) TYP
56 43
56X (0.7)
1
42
56X (0.2)
SYMM
(6.7)
14 29
15 28
16X (1.08)
(6.7)
SOLDERPASTE EXAMPLE
BASED ON 0.1mm THICK STENCIL
EXPOSED PAD
67% PRINTED SOLDER COVERAGE BY AREA
SCALE:12X
4218794/A 07/2013
NOTES: (continued)
5. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
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