"Overcoming Test Setup Limitations by Applying Model-Based Testing to ..."

Carsten Wegener, Michael Peter Kennedy (2005)

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DOI: 10.1007/S10836-005-6359-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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Carsten Wegener, Michael Peter Kennedy:
Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. J. Electron. Test. 21(3): 299-310 (2005)

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