"Too Many Relevants: Whither Cranfield Test Collections?"

Ellen M. Voorhees, Nick Craswell, Jimmy Lin (2022)

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DOI: 10.1145/3477495.3531728

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-08

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  - conf/sigir/VoorheesCL22
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Ellen M. Voorhees, Nick Craswell, Jimmy Lin:
Too Many Relevants: Whither Cranfield Test Collections? SIGIR 2022: 2970-2980

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