Catalyst Characterization 2
Catalyst Characterization 2
Catalyst Characterization 2
Electron
Microscopy
Electron Microscopy
Electron Microscopy
• Electron microscopy is a rather straight
forward technique to determine the size
and shape of supported particles.
• Electrons have characteristic wavelengths
of less than 1 A˚, and come close to
monitoring atomic detail.
• Thus, the interaction of the primary beam
with the sample provides a wealth of
information on morphology,
crystallography and chemical
composition. Using transmission electron
microscopy to make a projection of the
sample density is a routine way to study
particle sizes in catalysts.
Electron
microscopy
Figure 7. Interaction
between the primary
electron beam and the
sample in an electron
microscope leads to a
number of detectable
signals.
Electron Microscopy
2- Scanning Electron
Microscopy (SEM).
Schematic set up of an electron microscope in the transmission
Electron (TEM) and the scanning (SEM) mode. The SEM instrument also
contains an X-ray detector for composition analysis.
Microscopy
06
Mossbauer Spectroscopy
Mossbauer spectroscopy provides the oxidation
Mossbauer state,
Spectroscopy the internal magnetic field, and the lattice
symmetry of a limited number of elements such
as iron, cobalt, tin, iridium, ruthenium, antimony,
platinum and gold,
The Mssbauer effect, discovered by Rudolf L. Mssbauer in 1957, can in short be
andascan
described the be applied
recoil-free in situ.
emission and resonant absorption of gamma radiation
by nuclei.
Instrumentation
Doppler Effect
Mossbauer
Spectroscopy
Application
1- conjugation
3- size of ring
IR spectroscopy Types of IR vibration
By acquiring
subsequent
pictures it is
possible to
make movies of
dynamical
processes on
the surface,
such as
diffusion or
chemical
reaction.
• Unfortunately, STM only
works on well defined, planar,
and conducting surfaces such
as metals and
semiconductors, and not on
oxide-supported catalysts.
• For the latter surfaces,
atomic force microscopy
offers better perspectives.
2- Atomic force microscopy (AFM):