TLP5771H: 1. Applications

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TLP5771H

Photocouplers Infrared LED & Photo IC

TLP5771H
1. Applications
• Switching Power Supplies
• Photovoltaic (PV) Power Conditioning Systems
• AC Servos
• Compact Motor Drivers
• Industrial Sewing Machines
• Industrial Inverters

2. General
The TLP5771H consists of an infrared LED and an integrated high-gain, high-speed photodetector and is housed
in the 6-pin SO6L package.
The TLP5771H is 50 % smaller than the 8-pin DIP package and meets the reinforced insulation class requirements
of international safety standards.
Therefore the mounting area can be reduced in equipment requiring the safety standard certification.
The TLP5771H has an internal faraday shield that provides a guaranteed common-mode transient immunity of
±35 kV/µs.
In particular, this photocoupler guarantees operation with a low threshold input current. It allows bufferless
direct drive from a microcomputer. In addition, the TLP5771H has rail to rail output, and this enables stable
operation and better switching performance in system.

3. Features
(1) Buffer logic type (totem pole output)
(2) Output peak current: ±1.0 A (max)
(3) Operating temperature: -40 to 125 �
(4) Supply current: 3 mA (max)
(5) Supply voltage: 10 to 30 V
(6) Threshold input current: 2 mA (max)
(7) Propagation delay time: 150 ns (max)
(8) Common-mode transient immunity: ±35 kV/µs (min)
(9) Isolation voltage: 5000 Vrms (min)
(10) Safety standards
UL-recognized: UL 1577, File No.E67349
cUL-recognized: CSA Component Acceptance Service No.5A File No.E67349
VDE-approved: EN 60747-5-5, EN 62368-1 (Note 1)
CQC-approved: GB4943.1, GB8898 Japan Factory

Note 1: When a VDE approved type is needed, please designate the Option (D4) .

Start of commercial production


2021-03
©2021
Toshiba Electronic Devices & Storage Corporation
1 2021-04-02
Rev.1.0
TLP5771H
4. Packaging (Note)

TLP5771H TLP5771H(LF4)

11-4N1A 11-4N101A

Note: Lead-formed product: (LF4)

5. Pin Assignment

1: Anode
2: N.C.
3: Cathode
4: GND
5: VO (Output)
6: VCC

6. Internal Circuit (Note)

Note: A 1-µF bypass capacitor must be connected between pin 6 and pin 4.

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Toshiba Electronic Devices & Storage Corporation
2 2021-04-02
Rev.1.0
TLP5771H
7. Principle of Operation
7.1. Truth Table

Input LED M1 M2 Output

H ON ON OFF H
L OFF OFF ON L

7.2. Mechanical Parameters

Characteristics Size Unit

Height 2.3 (max) mm


Creepage distances 8.0 (min)
Clearance distances 8.0 (min)
Internal isolation thickness 0.4 (min)

8. Absolute Maximum Ratings (Note) (Unless otherwise specified, T a = 25 �)

Characteristics Symbol Note Rating Unit

LED Input forward current (Ta = -40 to 125 �) IF 8 mA


Peak transient input forward IFPT (Note 1) 1 A
current
Peak transient input forward (Ta ≥ 85 �) ∆IFPT/∆Ta -15.4 mA/�
current derating
Input reverse voltage VR 5 V
Input power dissipation (Ta = -40 to 125 �) PD 20 mW
Junction temperature Tj 150 �
Detector Peak high-level output current (Ta = -40 to 125 �) IOPH (Note 2) -1.0 A
Peak low-level output current (Ta = -40 to 125 �) IOPL (Note 2) +1.0
Output voltage VO 35 V
Supply voltage VCC 35
Output power dissipation PO 500 mW
Output power dissipation (Ta ≥ 100 �) ∆PO/∆Ta -10 mW/�
derating
Junction temperature Tj 150 �
Common Operating temperature Topr -40 to 125
Storage temperature Tstg -55 to 150
Lead soldering temperature (10 s) Tsol (Note 3) 260
Isolation voltage (AC, 60 s, R.H. ≤ 60 %) BVS (Note 4) 5000 Vrms

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability
Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e.
reliability test report and estimated failure rate, etc).
Note 1: Pulse width (PW) ≤ 1 µs, 300 pps
Note 2: Exponential waveform. Pulse width ≤ 2 µs, f ≤ 15 kHz (JEDEC compliant board)
Note 3: ≥ 2 mm below seating plane.
Note 4: This device is considered as a two-terminal device: Pins 1, 2 and 3 are shorted together, and pins 4, 5 and 6
are shorted together.

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Toshiba Electronic Devices & Storage Corporation
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TLP5771H
9. Recommended Operating Conditions (Note)

Characteristics Symbol Note Min Typ. Max Unit

Input on-state current IF(ON) (Note 1) 3 � 6 mA


Input off-state voltage VF(OFF) 0 � 0.8 V
Supply voltage VCC (Note 2) 10 � 30
Peak high-level output current IOPH (Note 2) � � -1.0 A
Peak low-level output current IOPL (Note 2) � � +1.0
Operating frequency f (Note 3) � � 150 kHz

Note: The recommended operating conditions are given as a design guide necessary to obtain the intended
performance of the device. Each parameter is an independent value. When creating a system design using
this device, the electrical characteristics specified in this data sheet should also be considered.
Note: A ceramic capacitor (1 µF) should be connected between pin 6 (VCC) and pin 4 (GND) to stabilize the operation
of a high-gain linear amplifier. Otherwise, this photocoupler may not switch properly. The bypass capacitor
should be placed within 1 cm of each pin.
Note 1: The rise and fall times of the input on-current should be less than 0.5 µs.
Note 2: Denotes the operating range, not the recommended operating condition.
Note 3: Exponential waveform. IOPH ≥ -0.75 A (≤ 130 ns), IOPL ≤ 0.75 A (≤ 130 ns), Ta = 125 � (JEDEC compliant board)

10. Electrical Characteristics (Note) (Unless otherwise specified, T a = -40 to 125 �)


Test
Characteristics Symbol Note Test Condition Min Typ. Max Unit
Circuit
Input forward voltage VF IF = 8 mA, Ta = 25 � 1.5 1.65 1.9 V
Input forward voltage ∆VF/∆Ta IF = 8 mA � -1.8 � mV/�
temperature coefficient
Input reverse current IR VR = 5 V, Ta = 25 � � � 10 µA
Input capacitance Ct V = 0 V, f = 1 MHz, Ta = 25 � � 22 � pF
Peak high-level output current IOPH (Note 1) Fig. IF = 5 mA, VCC = 30 V, � � -0.5 A
13.1.1 V6-5 = -3.5 V
IF = 5 mA, VCC = 10 V, � � -1.0
V6-5 = -7 V
Peak low-level output current IOPL (Note 1) Fig. IF = 0 mA, VCC = 30 V, 0.5 � �
13.1.2 V5-4 = 2.5 V
IF = 0 mA, VCC = 10 V, 1.0 � �
V5-4 = 7 V
High-level output voltage VOH Fig. IF = 5 mA, VCC = 10 V, 9.7 � � V
13.1.3 IO = -100 mA
Low-level output voltage VOL Fig. VF = 0.8 V, VCC = 10 V, � � 0.2
13.1.4 IO = 100 mA
High-level supply current ICCH Fig. IF = 5 mA, VCC = 30 V, � 1.8 3 mA
13.1.5 VO = Open
Low-level supply current ICCL Fig. IF = 0 mA, VCC = 30 V, � 1.7 3
13.1.6 VO = Open
Threshold input current (L/H) IFLH VCC = 10 V, VO > 1 V � � 2
Threshold input voltage (H/L) VFHL VCC = 10 V, VO < 1 V 0.8 � � V
Supply voltage VCC � 10 � 30
UVLO threshold voltage VUVLO+ IF = 5 mA, VO > 2.5 V 7.5 8.6 9.5
VUVLO- IF = 5 mA, VO < 2.5 V 7.5 8.3 9.5
UVLO hysteresis UVLOHYS � � 0.3 �

Note: All typical values are at Ta = 25 �.


Note: This device is designed for low power consumption, making it more sensitive to ESD than its predecessors.
Extra care should be taken in the design of circuitry and pc board implementation to avoid ESD problems.
Note 1: IO application time ≤ 50 µs; single pulse, non-repeating.

©2021
Toshiba Electronic Devices & Storage Corporation
4 2021-04-02
Rev.1.0
TLP5771H
11. Isolation Characteristics (Unless otherwise specified, T a = 25 �)

Characteristics Symbol Note Test Conditions Min Typ. Max Unit

Total capacitance (input to output) CS (Note 1) VS = 0 V, f = 1 MHz � 1.0 � pF


Isolation resistance RS (Note 1) VS = 500 V, R.H. ≤ 60 % 1012 1014 � Ω
Isolation voltage BVS (Note 1) AC, 60 s 5000 � � Vrms

Note 1: This device is considered as a two-terminal device: Pins 1, 2 and 3 are shorted together, and pins 4, 5 and 6
are shorted together.

12. Switching Characteristics (Note) (Unless otherwise specified, T a = -40 to 125 �)


Test
Characteristics Symbol Note Test Condition Min Typ. Max Unit
Circuit
Propagation delay time tpLH (Note 1) Fig. IF = 0 → 5 mA, VCC = 30 V, 50 � 150 ns
(L/H) 13.1.7 Rg = 10 Ω, Cg = 25 nF
Propagation delay time tpHL IF = 5 → 0 mA, VCC = 30 V, 50 � 150
(H/L) Rg = 10 Ω, Cg = 25 nF
Rise time tr (Note 1) IF = 0 → 5 mA, VCC = 30 V, � 56 �
Rg = 10 Ω, Cg = 25 nF
Fall time tf (Note 1) IF = 5 → 0 mA, VCC = 30 V, � 25 �
Rg = 10 Ω, Cg = 25 nF
Pulse width distortion |tpHL-tpLH| (Note 1) IF = 0 ←→ 5 mA, VCC = 30 V, � � 50
Rg = 10 Ω, Cg = 25 nF
Propagation delay skew tpsk (Note 1), -80 � 80
(device to device) (Note 2)
High-level common-mode CMH (Note 3) Fig. VCM = 1000 Vp-p, IF = 5 mA, ±35 ±40 � kV/µs
transient immunity 13.1.8 VCC = 30 V, Ta = 25 �,
VO(min) = 26 V
Low-level common-mode CML (Note 4) VCM = 1000 Vp-p, IF = 0 mA, ±35 ±40 �
transient immunity VCC = 30 V, Ta = 25 �,
VO(max) = 1 V
Note: All typical values are at Ta = 25 �.
Note 1: Input signal (f = 25 kHz, duty = 50 %, tr = tf = 5 ns or less).
CL is less than 15 pF which includes probe and stray wiring capacitance.
Note 2: The propagation delay skew, tpsk, is equal to the magnitude of the worst-case difference in tpHL and/or tpLH
that will be seen between units at the same given conditions (supply voltage, input current, temperature, etc).
Note 3: CMH is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in
the logic high state (VO > 26 V).
Note 4: CML is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage
in the logic low state (VO < 1 V).

©2021
Toshiba Electronic Devices & Storage Corporation
5 2021-04-02
Rev.1.0
TLP5771H
13. Test Circuits and Characteristics Curves
13.1. Test Circuits

Fig. 13.1.1 I OPH Test Circuit Fig. 13.1.2 I OPL Test Circuit

Fig. 13.1.3 V OH Test Circuit Fig. 13.1.4 V OL Test Circuit

Fig. 13.1.5 I CCH Test Circuit Fig. 13.1.6 I CCL Test Circuit

Fig. 13.1.7 Switching Time Test Circuit and Waveform

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TLP5771H

Fig. 13.1.8 Common-Mode Transient Immunity Test Circuit and Waveform

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TLP5771H
13.2. Characteristics Curves (Note)

Fig. 13.2.1 IF - VF Fig. 13.2.2 IF - Ta

Fig. 13.2.3 PO - Ta Fig. 13.2.4 I FLH - T a

Fig. 13.2.5 I CCL - T a Fig. 13.2.6 I CCH - T a

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TLP5771H

Fig. 13.2.7 V OL - T a Fig. 13.2.8 V OH - T a

Fig. 13.2.9 V OL - I OPL Fig. 13.2.10 (V OH - V CC ) - I OPH

Fig. 13.2.11 t pLH , t pHL , |t pHL - t pLH | - T a Fig. 13.2.12 t pLH , t pHL , |t pHL - t pLH | - I F

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TLP5771H

Fig. 13.2.13 t pLH , t pHL , |t pHL - t pLH | - V CC

Note: The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.

©2021
Toshiba Electronic Devices & Storage Corporation
10 2021-04-02
Rev.1.0
TLP5771H
14. Soldering and Storage
14.1. Precautions for Soldering
The soldering temperature should be controlled as closely as possible to the conditions shown below, irrespective
of whether a soldering iron or a reflow soldering method is used.
• When using soldering reflow.
The soldering temperature profile is based on the package surface temperature.
(See the figure shown below, which is based on the package surface temperature.)
Reflow soldering must be performed once or twice.
The mounting should be completed with the interval from the first to the last mountings being 2 weeks.

An Example of a Temperature Profile When Lead(Pb)-Free Solder Is Used

• When using soldering flow


Preheat the device at a temperature of 150 � (package surface temperature) for 60 to 120 seconds.
Mounting condition of 260 � within 10 seconds is recommended.
Flow soldering must be performed once.
• When using soldering Iron
Complete soldering within 10 seconds for lead temperature not exceeding 260 � or within 3 seconds not
exceeding 350 �
Heating by soldering iron must be done only once per lead.

14.2. Precautions for General Storage


• Avoid storage locations where devices may be exposed to moisture or direct sunlight.
• Follow the precautions printed on the packing label of the device for transportation and storage.
• Keep the storage location temperature and humidity within a range of 5 � to 35 � and 45 % to 75 %,
respectively.
• Do not store the products in locations with poisonous gases (especially corrosive gases) or in dusty
conditions.
• Store the products in locations with minimal temperature fluctuations. Rapid temperature changes during
storage can cause condensation, resulting in lead oxidation or corrosion, which will deteriorate the
solderability of the leads.
• When restoring devices after removal from their packing, use anti-static containers.
• Do not allow loads to be applied directly to devices while they are in storage.
• If devices have been stored for more than two years under normal storage conditions, it is recommended
that you check the leads for ease of soldering prior to use.

©2021
Toshiba Electronic Devices & Storage Corporation
11 2021-04-02
Rev.1.0
TLP5771H
15. Land Pattern Dimensions (for reference only)
Unit: mm

TLP5771H TLP5771H(LF4)

Fig. 15.1 Lead Forming Option (standard) Fig. 15.2 Lead Forming Option (LF4)

16. Marking

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12 2021-04-02
Rev.1.0
TLP5771H
17. EN 60747-5-5 Option (D4) Specification
• Part number: TLP5771H (Note 1)
• The following part naming conventions are used for the devices that have been qualified according to
option (D4) of EN 60747.

Example: TLP5771H(D4-TP,E

D4: EN 60747 option


TP: Tape type
E: [[G]]/RoHS COMPATIBLE (Note 2)

Note 1: Use TOSHIBA standard type number for safety standard application.
e.g., TLP5771H(D4-TP,E → TLP5771H
Note 2: Please contact your Toshiba sales representative for details on environmental information such as the product's
RoHS compatibility.
RoHS is the Directive 2011/65/EU of the European Parliament and of the Council of 8 June 2011 on the
restriction of the use of certain hazardous substances in electrical and electronic equipment.

Fig. 17.1 EN 60747 Insulation Characteristics

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TLP5771H

Fig. 17.2 Insulation Related Specifications (Note)

Note: This photocoupler is suitable for safe electrical isolation only within the safety limit data.
Maintenance of the safety data shall be ensured by means of protective circuits.

Fig. 17.3 Marking on Packing

Fig. 17.4 Marking Example (Note)

Note: The above marking is applied to the photocouplers that have been qualified according to option (D4) of EN 60747.

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TLP5771H

Fig. 17.5 Measurement Procedure

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18. Ordering Information (Example of Item Name)

Item Name Packaging VDE Option Packing (MOQ)

TLP5771H(E Magazine (125 pcs)


TLP5771H(TP,E Tape and reel (1500 pcs)
TLP5771H(D4,E EN 60747-5-5 Magazine (125 pcs)
TLP5771H(D4-TP,E EN 60747-5-5 Tape and reel (1500 pcs)
TLP5771H(LF4,E LF4, Wide forming Magazine (125 pcs)
TLP5771H(TP4,E LF4, Wide forming Tape and reel (1500 pcs)
TLP5771H(D4-LF4,E LF4, Wide forming EN 60747-5-5 Magazine (125 pcs)
TLP5771H(D4-TP4,E LF4, Wide forming EN 60747-5-5 Tape and reel (1500 pcs)

Package Dimensions
Unit: mm

TLP5771H

Weight: 0.126 g (typ.)

Package Name(s)

TOSHIBA: 11-4N1A

©2021
Toshiba Electronic Devices & Storage Corporation
16 2021-04-02
Rev.1.0
TLP5771H
Package Dimensions
Unit: mm

TLP5771H(LF4)

Weight: 0.126 g (typ.)

Package Name(s)

TOSHIBA: 11-4N101A

©2021
Toshiba Electronic Devices & Storage Corporation
17 2021-04-02
Rev.1.0
TLP5771H

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Hardware, software and systems described in this document are collectively referred to as "Product".

• TOSHIBA reserves the right to make changes to the information in this document and related Product without notice.

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for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which
minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage
to property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate
the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA
information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the
precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application
with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications,
including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating
and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample
application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications.
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Handle with care and do not break, cut, crush, grind, dissolve chemically or otherwise expose GaAs in Product.

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• Please contact your TOSHIBA sales representative for details as to environmental matters such as the RoHS compatibility of Product.
Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances,
including without limitation, the EU RoHS Directive. TOSHIBA ASSUMES NO LIABILITY FOR DAMAGES OR LOSSES OCCURRING
AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.

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