2 PD Flow
2 PD Flow
2 PD Flow
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Outline
• ASIC Design Flow
• Physical Design
— Introduction to Physical Design
— Physical Design Inputs
— Physical Design Flow
▫ Import Design & Partitioning
▫ Floorplanning & Power planning
▫ Placement & Placement Optimizations
▫ CTS & CTS Optimizations
▫ Routing & Routing Optimizations
▫ Physical Verification (DRC, LVS, ERC)
▫ DFM Checks
▫ Formal Verification (LEC)
▫ Parasitic Extraction (RC Extraction)
▫ Timing Analysis (STA), Power Analysis & IR Drop Analysis
▫ Tapeout 3
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ASIC Physical Design
ASIC Design Flow
Partitioning
System Specification
Floor Planning
ENTITY test is Architectural Design
port a: in bit;
end ENTITY test; RTL Design Placement
and Verification
F F F F F F
F F F F F F
Synthesize the F F F F F F CTS
Design F
F
F
F
F
F
F
F
F
F
F
F
Fabrication
Formal Verification
Packaging and
Testing Static Timing Analysis
• Possible Issues
Static Timing
— Timing Violations Analysis Signoff
— Congestion Issues Power, IR-Drop
Analysis
— Design Rule Violations
Tape-out
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ASIC Physical Design
Physical Design Inputs
• Netlist (.v or .vhd)
— Netlist contains — Netlist also consists of
Std. Cell instance – Name & Drive Ports of Standard Cells and Macros
Strength Interconnection details
Macros & Memories instances
• Constraints
— Types of Constraints — Synopsys Design Constraints
Design Rule Constraints (SDC)
Optimization Constraints — Timing Constraints
— Design Rules from the Fab. Clock Definition (Time Period, Duty
Max. Cap./ Transition/Fanout Cycle)
Clock Uncertainties Timing Exceptions (False Paths,
Asynchronous Paths)
— Optimization Constraints from the
designer — Non-Timing Constraints
Timing Constraints/ Exceptions Operating conditions
Delay Constraints (Latency, Input Delay, Wire load models
Input Transition, Output Load and System interface, Design rule constraints
Output Transition) (DRVs - Max. Cap./ Transition/Fanout)
Power and Area Constraints Area constraints, Multi-voltage and
System interface Power optimization constraints
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Logic assignments 6
ASIC Physical Design
Physical Design Inputs
• Liberty Timing File
(.lib or .db) — LIB contains
Cell Type and Functionality
— Cell Logical View/ The Timing
Delay Models (WLD/ NLDM/ CCS)
Library
Pin/ Cell Timings and design rules
— Std. Cell lib, Macro lib, IO lib PVT Conditions
— Gate Delay = function of input Power Details (Leakage and
transition time and output Dynamic)
capacitance
• Library Exchange Format
(LEF)
— LEF contains
— Cell Abstract View/ The Physical Cell Name, Shape, Size, Orientation
Library & Class
— Std. Cell LEF Port/Pin Name, Direction and Layout
Geometries
— Macro LEF Obstruction/ Blockages
— IO LEF Antenna Diff. Area
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ASIC Physical Design
Physical Design Inputs
• Technology Related files
— Technology file — Interconnect Parasitic file
Defines Units and Design Rules for Used for layer parasitic extraction
Layers and Vias as per the Technology Contains Layer/ Via capacitance and
Name and Number conventions of resistance values in a Lookup Table
Layers and Vias (LUT) format
Physical and Electrical parameters of Also used to generate parasitic formats
Layers and Vias for the extraction tools (e.g. nxtgrd,
E.g. captbl)
Direction/Type/Pitch/Width/Offset/ Extraction tool formats are more
Thickness/Resistance/Capacitance/ accurate than interconnect parasitic
Max. Metal Density/Antenna Rule/ formats
Blockages/Design Rules .ict - Interconnect Technology Format
Manufacturing Grid definition (Cadence Format)
Site/Unit Tile definition .itf - Interconnect Technology Format
Technology file has to load before (Synopsys Format)
loading other LEF files since it holds .ptf - Process Technology File (Mentor
the layer information for that Graphics Format)
particular technology
.tech.lef (Cadence Format) — Map file
.tf - technology file (Synopsys Format) Useful if is there is 2 different naming
convections in Technology file, LEF or
Interconnect Parasitic file
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ASIC Physical Design
Physical Design Inputs
• Power Specification File • Clock Tree Constraints/
— Power Modes & Power Domains Specification
— Tie Up supply & Tie Low supply — Root Pin Definition
— Power Nets & GND Nets — Insertion Delay (ID) and Skew Target
— Maximum Capacitance/ Transition/
• Optimization Directives Fanout (DRVs)
— Don’t use — Transition can be classified into Leaf
• Cells that are not supposed to Transition and Buffer Transition
optimize — No. of Buffer Levels (Tree depth)
— Size only/ use only — List of Buffers/ Inverters for CTS
• Upsizing/ Downsizing only with — List of Through pin, Preserved Pin,
this list of cells Exclude Pin
— NDRs can be defined in CTS Spec. for
• Design Exchange Formats the Clock Tree Routing
— List & locations of Components, Vias, — Macro Models
Pins, Nets, Special nets
— Die dimensions, Row definitions, • IO Information File
Placement and Bounding Box Data, — Pin/ Pad locations
Routing Grids, Power Grids, Pre-routes — Edge and order for IO Placement
— .def, .fp are the common formats — .tdf, .io are common formats 9
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ASIC Physical Design
Physical Design Flow
Clock Tree
Routing Post-CTS Opt. Pre-CTS Opt.
Synthesis (CTS)
Static Timing
Tape-out IR-Drop Analysis Power Analysis
Analysis
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ASIC Physical Design
Import Design
• Import Design
— The following input files information are loaded to the PnR tool
• Netlist (.v/ .vhd/ .edif)
• Physical Libraries (.lef)
• Timing Libraries (.lib)
• Technology Files
• Constraints (.sdc)
• IO Info. File (optional)
• Power Spec. File (optional)
• Optimization Directives (optional)
• Clock Tree Spec. File (optional at floorplan stage)
• DEF/ FP (optional if floorplan is not done)
— Core area is approximately calculated by the tool from the Netlist
— While Importing, first we have to load the LEF files and then LIB files
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ASIC Physical Design
Import Design
• Sanity Checks
— Sanity Checks mainly checks the quality of netlist in terms of timing
— It also consists of checking the issues related to Library files, Timing
Constraints, IOs and Optimization Directives
— Some of the Netlist Sanity Checks:
Floating Pins
Unconstrained Pins
Un-driven i/p Ports
Unloaded o/p Ports
Pin direction mismatches
Multiple drivers etc.
— Other possible issues include Unconnected/ Wrongly Connected Tie-
high/ Tie-low Pins and Power Pins (since Tie-up or Tie-down
connectivity always through Tie-Cells)
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ASIC Physical Design
Partitioning
• Physical Design Netlist
— All Ports must be defined and should be present
— No Assignment Statements (1’b0 or 1’b1 statements): Assignment
statements causes feed-through (i/p directly to o/p) and can be
avoided by adding buffers
— No Unmapped Cells
— No Combinational Timing Loops
• Styles of Implementation
— Flat
Small to Medium ASIC
Better Area Usage Since no reserve space around each sub-design for power/ground
— Hierarchical
For very large design
When sub-systems are design individually
Possible only if a design hierarchy exist
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ASIC Physical Design
Partitioning
• The Hierarchical Partitioning is done prior to Floorplan
• Partition can be done based on
— Design Hierarchy
— Timing Criticality
— Functionality
— Clock Domain
— Design Files
— Block Size
• Partitioning Inputs and
Outputs by Registers
• Minimize Cross-Partition-
Boundary IO
• For Sub-block designs, the Partitioning is not required
• For Full Chip only we need to design with Partitioning
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ASIC Physical Design
Floorplanning
• Terminologies and Definitions
— Utilization
Area of the core that is used by placed Standard Cells and Macros expressed in
percentage
— Manufacturing Grid
The smallest geometry that semiconductor foundry can process or smallest
resolution of your technology process (e.g. 0.005)
All drawn geometries during Physical Design must snap to this grid
While Masking fab. use this as reference lines
— Standard Cell Site/ Standard Cell Placement Tile/ Unit Tile
The minimum Width and Height a Cell that can occupy in the design
The Standard Cell Site will have the same height as Standard Cells, but the width
will be as small as your smallest Filler Cell
It’s one Vertical Routing Track and the Standard Cell Height
All Standard Cells must be multiple of Unit Tile
— Standard Cell Rows
Rows are actually the Standard Cell Sites abut side by side and then Standard Cells
are placed on these Rows
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Cells with the equal no. of Track definition will have same height 15
ASIC Physical Design
Floorplanning
• Terminologies and Definitions
— Placement Grid
Placement Grid is made up of Standard Cell Site
Its always a multiple of Manufacturing Grid
Placement Grid is made up of the Rows which are composed of Sites
— Routing Grid and Routing Track
Horizontal and Vertical line drawn on the layout area which will guide for making
interconnections
The Routing Grid is made up of the Routing Tracks
Routing Tracks can be Grid-based, Gridless based or Subgrid-based
— Flight-line/ Fly-line
Virtual connection between Macros and Macro or Macros and IOs
— Macro
Any instances other than Standard Cell and is as loaded as black box to the
design is Macro
Intellectual Property (IP) e.g. RAM, ROM, PLL, Analog Designs etc.
Hard Macro: IP with Layout implemented
Soft Macro: IP without Layout implemented (HDL)
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ASIC Physical Design
Floorplanning
• Steps in Floorplan
— Initialize with Chip & Core Aspect Ratio (AR)
— Initialize with Core Utilization
— Initialize Row Configuration & Cell Orientation
— Provide the Core to Pad/ IO spacing (Core to IO clearance)
— Pins/ Pads Placement
— Macro Placement by Fly-line Analysis
— Macro Placement requirements are also need to consider
— Blockage Management (Placement/ Routing)
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ASIC Physical Design
Floorplanning
• Initialization
— Row Configuration
Slanting lines in the side of the cell rows denote the Cell Orientation
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ASIC Physical Design
Floorplanning
• Initialization
𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓 𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒 𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂 𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀+𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌 𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀
— Utilization = x 100 %
𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓 𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂 𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀
𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇𝐇 𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑 𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑
— Aspect Ratio = =
𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕 𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑 𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑
— or simply Height/Width
— Aspect Ratio decides the shape
— Full chip Aspect Ratio can have a maximum value of 1.25
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ASIC Physical Design
Floorplanning
• IO Placement
— Chip Level its IO Pads and Block Level its IO Pins
— Pin is a logical entity and is a property of a Port
— Port is a physical entity and a Port have only 1 Pin associated with it
— Netlist will have Pins and Layout will have Ports
— Unplaced Port is not
represented in the Layout
— Different types of IOs
Signal Pads/Pins
Core Power Pads/Pins
IO Power Pads/Pins
Corner Pads (Doesn’t hold
any logic, provides IO Pad
Ring connectivity)
Filler Pads (Fill the gaps between IO pads to get the Ring Connectivity)
— Physical-only pads that are not part of the input Gate level Netlist need
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to be inserted prior to reading IO constraints 20
ASIC Physical Design
Floorplanning
• IO Placement
— IO Pads enables the design to operate at different voltages with the
help of Level Shifters, Pre-Drivers (at Core Voltage) Post-Drivers (at IO
Voltage)
— No of Core Power Pads needed:
𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓 𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃 𝐏𝐏𝐏𝐏𝐏𝐏𝐏𝐏𝐏𝐏
𝐍𝐍𝐍𝐍.𝐨𝐨𝐨𝐨 𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒𝐒 x 𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂 𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕 x 𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌𝐌 𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚𝐚 𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂 𝐨𝐨𝐨𝐨 𝐈𝐈𝐈𝐈 𝐏𝐏𝐏𝐏𝐏𝐏
— There will be 1 Core GND Pad along with every Core Power Pad
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ASIC Physical Design
Floorplanning
• Macro Placement
— Fly-line Analysis (For Connectivity information)
— Macro keep-out (For Uniform Standard Cell Region)
— Channel Calculation (Critical for Congestion and Timing)
— Avoid odd shaped area for Standard Cells
— Funnel shaped Macro Placements are preferred
— Fix the Macro locations, so that tool wont alter during Optimization
— Spacing between Macro:
𝐏𝐏𝐏𝐏𝐏𝐏𝐏𝐏𝐏𝐏 𝐨𝐨𝐨𝐨 𝐭𝐭𝐭𝐭𝐭𝐭 𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑 𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋 x 𝐍𝐍𝐍𝐍.𝐨𝐨𝐨𝐨 𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩 𝐭𝐭𝐭𝐭 𝐛𝐛𝐛𝐛 𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑 𝐁𝐁𝐁𝐁𝐁𝐁𝐁𝐁𝐁𝐁𝐁𝐁
+ S𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩
𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀𝐀 𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑𝐑 𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋𝐋 𝐢𝐢𝐢𝐢 𝐭𝐭𝐭𝐭𝐭𝐭 𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩𝐩 𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝𝐝
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ASIC Physical Design
Floorplanning
• Macro Placement Tips
— Place macros around chip periphery, so that core area will be clustered
— Consider connections to fixed cells when placing Macros
— In advanced Technology Nodes Macro Orientation is fixed since the Poly
Orientation can’t vary, so there will be restrictions in Macro Orientation
— Reserve enough room around Macros for IO Routing
— Reduce open fields as much as possible
— Provide necessary Blockages around the Macro
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ASIC Physical Design
Floorplanning
• Blockages
— Placement Blockage & Routing Blockage Rectilinear
Macro
— Both of the Blockages can again be classified as- Without
• Hard, Soft and Partial Blockages Blockage
— Hard Blockage
• Complete Standard Cell Blockage
— Soft Blockage With
• Non-Buffering Blockage Blockage
— Partial Blockage
• Partial Standard Cell Blockage and is used to
avoid congestion
• We can Block Standard Cells as per the required
percentage value
— Keep-out/ Halo Macro
• Halo is similar to Soft Blockage (Terminology in Cadence EDI)
• Its basically a keep-out Macro margin
• Halo respects Macro while other Blockages respect location Halo around Macro
i.e., even if Macro is moved Halo also moves along with it 24
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ASIC Physical Design
Floorplanning
• Issues arises due to bad Floorplan
— Congestion near Macro Pins/ Corners due to insufficient Placement
Blockage
— Std. Cell placement in narrow channels led to Congestion
— Macros of same partition which are placed far apart can cause Timing
Violation
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ASIC Physical Design
Power planning
• Power Plan: Calculations
Total Dynamic Core Current =
𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓𝐓 𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃𝐃 𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂 𝐏𝐏𝐏𝐏𝐏𝐏𝐏𝐏𝐏𝐏
𝐂𝐂𝐂𝐂𝐂𝐂𝐂𝐂 𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕𝐕
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ASIC Physical Design
Power planning
• Sub-block Configuration
Grid Offset
Grid Steps
Core Boundary
Grid Spacing
Chip Boundary
Ring Width
Core Area
Ring Spacing
Rails
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ASIC Physical Design
Power planning
• Full Chip Configuration
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ASIC Physical Design
Placement
• Placement Stages
— Global Placement
— Detail Placement
— Placement Legalization
— In-Place Optimizations
• Global/ Coarse Placement
— To get the approximate initial location Global/ Coarse Placement
— Cells are not legally placed and there
can be overlapping
• Detail/ Legal Placement
— To avoid cell overlapping
— Cells have legalized locations
— Legalize placement will place the cells
in their legal position with no overlap
Detail/ Legal Placement
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ASIC Physical Design
Placement
• Placement Legalization
— Placed Macros are legally oriented with Standard Cell Rows
• In-Place Optimizations
— Scan Chain Reordering
• After Placement, report Congestion, Utilization and Timing
• Tie off cell instances provide connectivity between the Tie-
high and Tie-low logical inputs pins of the Netlist instances to
Power and Ground
• Tie off cells are placed after the placement of Standard Cells
• After placement check the Cell Density
• Global Route (GR)
— Whole region is divided into an array of rectangular sub-regions each of which
may accommodate tens of routing tracks in each dimension called Global Cells
— Global Route is performed to estimate the inter-connect parasitics and
Routing Congestion Map 36
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ASIC Physical Design
Pre CTS Optimization/ Placement Opt.
• Cell Sizing
— Sized up/ down to meet optimizing for timing and area
— Up sizing will give timing advantage and Down sizing will give area advantage
• VT Swapping
— To optimize for leakage power (HVT, RVT/SVT, LVT)
• Cloning
— To reduce fanout
• Buffering
— Long nets are buffered or remove buffers to bring the timing advantage
• Re-Buffering
— To improve slews, reduce net capacitance and reduce fanout
• Logical Restructuring
— To optimize timing and area without changing the functionality of the design
— Breaking complex cells into simpler cells or vice versa
• Pin Swapping 37
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ASIC Physical Design
Pre CTS Optimization/ Placement Opt.
• Optimization Techniques
- Resizing - Cloning - Buffering
d 0.2 d 0.2
a d 0.2 e 0.2 e 0.2
? e 0.2 a a f
b f 0.2 ? 0.2
f 0.3 b ? b g 0.2
g 0.2
h 0.2 h 0.2
a a d
b A b C A d 0.2
0.035 0.026 e
f e 0.2
a a
B g B f 0.2
b h b B g 0.2
0.1
h 0.2
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ASIC Physical Design
Pre CTS Optimization
• Set the Optimization Directives
— don’t_use, size_only
• Perform High Fanout Nets Synthesize (HFNS)
— High Fanout Nets are Synthesized before Clock Tree Synthesis
— HFNS is the Buffering of High Fanout Nets
— Usually High Fanout Nets may have Fanout of more than 1000
Eg., Reset, Clear etc.
• Set CTS Routing Rules
— Shielding
— Non Default Rules (NDR)
• Set RC Delay Models
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ASIC Physical Design
Pre CTS Optimization
• Non-Default Rule (NDR)
— The user-defined Routing rules apart from the default Routing Rule
— Often used to “harden” the sensitive nets like Clock Nets
— NDRs make the Clock Routes less sensitive to CrossTalk or EM effects
— Double/ Triple Width for avoiding Electromigration
— Double/ Triple Spacing for avoiding Crosstalk
— NDRs will improve Insertion Delay
Sig1
Default Clk
Routing Rule Sig2
Sig1
Double Spacing
Gnd
FF FF FF FF FF FF FF FF FF FF
FF FF FF FF FF FF FF FF FF FF
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• Main concerns for Clock Design
— Skew
Most important concern for clock networks
For increased clock frequency, skew may contribute over 10% of the system cycle
time
Due to variations in trace length, metal width and height, coupling caps
It can also be due to variations in local clock load, local power supply, local gate
length and threshold, local temperature
— Power
Very important, as clock is a major
power consumer Clock
It switches at every clock cycle
— Noise
Clock is often a very strong aggressor
May need shielding
— Delay
Not really important
But Slew Rate is important
(sharp transition)
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• Clock Skew: Spatial Clock Variation
Clock Skew
Difference in clock
arrival time at two
spatially distinct points
A A
Compressed timing
path
B
Skew
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• Clock Jitter: Temporal Clock Variation
Compressed timing
path
Period A ≠ Period B
Clock Jitter
Difference in clock
period over time
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• CTS Pre-requisites
— Legally Placed and Optimized with acceptable Congestion
— Timing should be good
— No Design Rule Violations
— Power/Ground nets are pre-routed
— HFNS done
— Logical/Physical Library should have special Clock Cells
• CTS Objects
— The timer starts from every Clock Source and traces forward over Combinational Arcs
until it reaches the Clock Pin of a flop or another Clock Source
— All Pins/ Timing Arcs in the forward trace before a valid Leaf are considered to be in
the clock network
— Pin or Combinational Timing Arcs that trace to a non-clock pin are not part of Clock
Tree network (e.g. D pin of FF)
— Sequential elements are traced through if it is a source of the Generated Clock
— Clock tracing after the propagation of Case Analysis
— Clock tracing should be Mode aware
— Inverters are added in Clock Tree for better Duty Cycle
— Limit the buffer/inverter list to just 3 or 4 buf/inv sizes
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• CTS Flow
— Check and fix Macro locations
— Read CTS SDC: Clock Tree begins at SDC defined clock pin and
ends at stop pin of the flop
— Generate CTS Specification file Example of CTS spec file
Max. Skew AutoCTSRootPin SH1/I23/Z
ExcludePin + XPU/CAM/C
Max. and Min. Insertion Delay MaxDelay 5ns
Max. Transition, Capacitance, Fanout MinDelay 0ns
Buffer buf1 buf2 inv1 inv2 del1
No. Buffer levels (Tree depth) MaxSkew 500ps
Buffer/ Inverter list MaxDepth 20
Clock Tree Routing Metal Layers LeafPin + FPU/CORE/A rising
END
Clock Tree Leaf Pin, Root Pin, Preserve
Pin, Through Pin and Exclude Pin
— Compile CTS using CTS Spec. file
— Place Clock Tree Cells
— Route Clock Tree (Optional and can be done during Signal net
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• CTS Algorithms
— RC Tree Based CTS Clock
Source
— H Tree based Algorithm
— X Tree based Algorithm
— Method of Mean and Median (MMM)
RC-Tree
— Geometric Matching Algorithm (GMA)
— Pi Configuration Clock
Source
H-Tree
Clock
Clock Source
Source
GMA
Pi Configuration 49
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• Before CTS all Clock Pins are driven by a single Clock Source
F F F F F F
F F F F F F
F F F F F F
F F F F F F
Source clock pin
Clock
sink pins
F F F F F F
Clock F F F F F F
F F F F F F
F F F F F F
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• After CTS the buffer tree is built to balance the loads and
minimize the skew
F F F F F F
F F F F F F
F F F F F F
F F F F F F
Clock
sink pins
Source clock pin Buffer Tree
F F F F F F
Clock F F F F F F
F F F F F F
F F F F F F
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• After CTS a “delay line” is added to meet the minimum Insertion
Delay (ID)
F F F F F F
F F F F F F
Extra buffers
added for F F F F F F
F F F F F F
balancing the
Minimum
Insertion Delay
F F F F F F
F F F F F F
Clock
F F F F F F
F F F F F F
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ASIC Physical Design
Clock Tree Synthesis (CTS)
• Analyze the Clock Tree
— Report Timing (both Setup and Hold)
— If timing not met then check clocks be grouped (balanced together)
— Report Insertion Delay & Skew and verify that the targets are achieved
— Report DRV targets (Fanout, Capacitance and Transition)
— Check the intended Leaf Cell (Clock Sinks) is reached
— Check the Clock Tree Exceptions are not in the Clock Tree
— Report the pre-existing cells, such as Clock Gating Cells
— Do Quality-of-Report (QoR)
— Check Clock Tree converges either with itself or with another Clock Tree
— Clock Tree has timing relationship with other Clock Trees for inter Clock
Skew balancing
— Check Design Rule Constraints
— Check Routing Constraints
— Report Power and Area
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ASIC Physical Design
Post CTS Optimization
• Post CTS Optimization
— Optimization with Useful Skew
— Optimization with Total Negative Slack (TNS)
— Fine Grid Spacing
— Post CTS Optimization Techniques
Shielding
Sizing
Buffer re-location
Level adjustment
— Optimize the design for Hold Time
Hold Violations should be fixed first in Best Corner and then in Worst Corner
— Area Optimizations
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ASIC Physical Design
Routing
• Importance of Routing as Technology shrinks
— Device (Gate) delay decreases
— Interconnect resistance increases
— Vertical heights of interconnect
layers increase, in an attempt to
offset increasing interconnect
resistance
— Area component of interconnect
capacitance no longer dominates
— Lateral (sidewall) and fringing
components of capacitance start to
dominate the total capacitance of
the interconnect
— Interconnect capacitance dominates Multi-level Interconnection (MLI)
total Gate loading Technology Layer stacks
• Routing Objectives
— Skew requirements
— Open/Short circuit clean
— Routed paths must meet setup and hold timing margin
— DRVs max. Capacitance/ Transition must be under the limit
— Metal traces must meet foundry physical DRC requirements
— Layout geometries should meet Current Density specification 55
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ASIC Physical Design
Routing
• Routing Stages
— Trial/Global Routing
Identifying routable path for the nets driving/
driven pins in a shortest distance
Does not consider DRC rules, which gives an
overall view of routing and congested nets
Assign layers to the nets
Identify and assign net segments over
the specific routable window called Global
Route Cell (GRC)
Avoid congested areas and also long detours
Avoid routing over blockages
Avoid routing for pre-route nets such as Rings/Stripes/Rails
Uses Steiner Tree and Maze algorithm
— Track Assignment
Takes the Global Routed Layout and assigns each nets to the specific Tracks and
layer geometry
It does not follow the physical DRC rules
It will do the timing aware Track Assignment
It helps in Via Minimization
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ASIC Physical Design
Routing
• Routing Stages
— Detail/Nano Routing
Detailed routing follows up with the track
routed net segments and performs the
complete DRC aware and timing driven routing
It is the final routing for the design built after
the CTS and the timing is freeze
Filler Cells are adding before Detailed Routing
Detail Routing is done after analyze the cause
for congestion in the design, add density screen
or change flooplan etc. Trace Grid
Critical
net
Critical net
Non-critical
nets
Non-critical nets Ground net
Ground net in Metal 4
Metal 3 Layer Metal 4 Layer Metal 5 Layer
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ASIC Physical Design
Post Routing Optimization
• Filler Cell insertion
— Filler Cells can be inserted before or after Detailed Routing
— If Fillers contain metal routing other than Pre-Routing then Fillers
should be inserted before Routing
— Width of the smallest Filler Cell is the Placement Grid Width
— Once Fillers are inserted then the placement is fixed and tool can’t
move Cells for further optimization
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ASIC Physical Design
Post Routing Optimization
• Metal Fill
— Filling up the empty metal tracks with metal shapes to met metal
density rules
— 2 types of Metal Fill
Floating Metal Fill: Doesn’t completely shield the aggressor nets, so SI will be
prominent
Grounded Metal Fill: Completely shields the aggressor nets, so less SI impact
Grounded Metal Fill is complex as compared to Floating Metal Fill
— Metal Density Rule helps to avoid Over Etching/ Metal Erosion
• Spare Cells Tie-up/ Tie-down
— Tie Cells connects the Gate of Cells to VDD/ VSS so reduces ESD
— Tie-up Cells help in avoid Power Bounce
— Tie-down Cells help in avoid Ground Bounce
— Tie Cells are basically MOS in Diode-Connected configuration
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ASIC Physical Design
Physical Verification (DRC)
• Design Rule Check (DRC) is the process of checking physical layout data
against fabrication-specific rules specified by the foundry to ensure
successful fabrication
• Process specific design rules must be followed when drawing layouts to
avoid any manufacturing defects during the fabrication of an IC
• Process design rules are the minimum allowable drawing dimensions which
affects the X and Y dimensions of layout and not the depth/vertical
dimensions DRC Rule
Width-based
130nm 90nm 65nm 45nm
1-2 2-3 3-5 7
• As Technology Shrinks Spacing
Min-Area Rule
1 pitch 2 pitch 3 pitch 5 pitch
— Number of Design Rules are increasing
— Complexity of Routing Rules is increasing Cut Number
(Via)
N/A 1-2 4-5 5-6
— Increasing the number of objects involved Dense EoL
N/A N/A M1/M2 All Layers
— More Design Rules depending on Width, (OPC)
Min-step
Halo, Parallel Length (OPC)
N/A 1 5 5
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ASIC Physical Design
Physical Verification (LVS)
• Layout Versus Schematic (LVS) verifies the connectivity of a
Verilog Netlist and Layout Netlist (Extracted Netlist from GDS)
• Tool extracts circuit devices and interconnects from the layout
and saved as Layout Netlist (SPICE format)
• As LVS performs comparison between 2 Netlist, it does not
compare the functionalities of both the Netlist
• Input Requirements
— LVS Rule deck
— Verilog Netlist
— Physical layout database (GDS)
— Spice Netlist (Extracted by the tool from GDS)
• LVS checks examples
— Short Net Error, Open Net Error, Extract errors, Compare errors
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ASIC Physical Design
Physical Verification (LVS)
• Open Net Error
Same net is routed in two different metal layers but not connected
Same net with different pin names Two different nets shorting together
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ASIC Physical Design
Physical Verification (LVS)
• Extract Errors
— Parameter Mismatch
— Device parameters on schematic and layout are compared
— Example: Let us consider a transistor here, LVS checks are necessary
parameters like width, length, multiplication factor etc.
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ASIC Physical Design
Physical Verification (LVS)
• Compare Errors
— Malformed Devices
— Pin Errors
— Device Mismatch
— Net Mismatch
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ASIC Physical Design
Physical Verification (ERC)
• Electrical Rule Check (ERC) is used to analyze or confirm the
electrical connectivity of an IC design
• ERC checks are run to identify the following errors in layout
— To locate devices connected directly between Power and Ground
— To locate floating Devices, Substrates and Wells
— To locate devices which are shorted
— To locate devices with missing connections
• Well Tap connection error: The Well Taps should bias the Wells
as specified in the schematics
69
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ASIC Physical Design
Physical Verification (ERC)
• Well Tap Density Error: If there is no enough Taps for a given
area then this error is flagged
• Taps need to be placed regularly which biases the Well to
prevent Latch-up
e.g., In typical 90nm process the Well Tap Density Rule require
Well-taps to be placed every 50 microns
• Tools: Mentor Graphics Calibre, Synopsys Hercules, Cadence
Assura, Magma Quartz
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ASIC Physical Design
DFM Checks
• Antenna Check (Gate-Oxide Integrity check)
— Maximum net length restriction connected to Gate terminal
• Redundant Contacts/ Via
— Multiple Via improves both Yield and Timing by resistance paralleling
• Metal Filling
— Narrow Metal Layer separated from other Metal Layers may get high
density of etchant than closely spaced wires
— Over etched filling up empty tracks with metal shapes to meet Metal
Density Rules
• Metal Slotting
— Wide metal lines (Power Nets) expands significantly due to the high
temperature during fabrication leads to destruction of the isolation
and passivation layer that protect the wafer
— To avoid it put slots or holes in these metal layers at regular intervals
— Slotting also prevent the stress damage during wafer dicing and
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ASIC Physical Design
Formal Verification
• Formal Verification
— Verify the two representations of circuit design exhibits same behavior
— Checks the behavior of the Combinational Logics by checking the
Compare Points
— Targets implementation errors and not the design errors
— Power checks: checks Power Switches/ Retention Cells/ Isolation Cells/
Level Shifters and all power connectivity
— If any manual editing in the design then LEC has to be done at any
point of time
• Formal Verification • Informal Verification
— Complete coverage (Simulation)
— Effectively exhaustive — Incomplete coverage
simulation — Limited amount of simulation
— Cover all possible — Spot check a limited number
sequences of inputs of input sequences
— Check all corner cases — Many corner cases not checked
— No test vectors are needed — Designer provides test vectors
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ASIC Physical Design
Formal Verification
• Types of Formal Verification
— Gate-level to Gate-level (Logical Equivalence Check after Routing)
• To ensure that some netlist post-processing did not change the functionality of the
circuit
— RTL to Gate-level (after Synthesis)
• To verify that the netlist correctly implements the original RTL code
— RTL to RTL (before Synthesis)
• To verify that two RTL descriptions are logically identical
• Logical Equivalence Check (LEC) will have two stages
— Constrains setup stage
— Logical Equivalence Check stage
• Tool will report equivalent/ non-equivalent/ abort/ not-checked
• Input Requirements
— Netlists (.v)
— Library (.lib and .lef)
— Constraints (.sdc)
• Tools: Mentor Graphics FormalPro, Cadence Conformal, Synopsys Formality,
Magma Quartz Formal
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ASIC Physical Design
Parasitic Extraction
• Parasitic Extraction: Importance
— Shrinking process geometries
— New device structures
— An increasing number of metal layers at each new process node
— Much more closer nets at each new process node
— Increasing wire aspect ratio of height to width
— Increasing operating frequency
• Parasitic Capacitance can be reduced by using higher metals,
provide spacing, shielding, Avoid parallel routing
• At higher clock frequencies, RC interconnect modeling is no
longer adequate and inductance must be included in
interconnect modeling
• Reluctance (Inductance) effect becomes more and more
prominent as the resistance (both device and interconnect)
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ASIC Physical Design
Parasitic Extraction
• Capacitance
C= εo W H/d
— Transistors
Depends on area of transistor gate, physical of materials, thickness of insulator, diffusion
to substrate
— Poly to Substrate
Parallel plate and fringing CCROSS COUPLING
— Capacitance between
conductors Metal 2
Coupling Capacitance
Area Capacitance CCROSSOVER
Fringing Capacitance Metal 1
Crossover Capacitance
Substrate
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ASIC Physical Design
Parasitic Extraction
• Coupling Capacitance/ Lateral Capacitance
— The capacitance between nets on the same Metal layer
— Dominant over interlayer capacitances with every new process
technology
• Fringing Capacitance
— Capacitance between nets
of different Metal layers and
other layers due to Sidewall
Capacitance
• Parallel/Crossover Capacitance
— Capacitance between nets area area
of 2 different Metal layers
SUBSTRATE
• Area Capacitance
— Capacitance between Metal layers and Substrate
• In modern processes, the width of interconnect wires at lower
levels of metal is so small that the Fringing Capacitance of the
wire is larger than the Area Capacitance
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ASIC Physical Design
Parasitic Extraction
• Resistance
R = ρ L/H W
— Wire Resistivity
— Complex 3D geometry around Vias
• Inductance
— Self Inductance;
— Mutual Inductance,
— At high frequency Skin effect possibility
• Models used for Parasitic Extraction
— Lumped-C, Lumped-RC, Lumped-RLC
— Pi segment
— Pin-to-pin delays are modeled by RC delays
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ASIC Physical Design
Parasitic Extraction
• Sub-femto Farad accuracy required for extraction of designs at
advanced technology nodes
• STA tool uses extraction data at fast corner while calculating
hold and slow data while calculating setup to be pessimistic as
possible, so that your chip doesn't fail after it comes back
from the fab
• Common Extraction Formats: Standard Parasitic Format (SPF),
Reduced Standard Parasitic Format (RSPF), Detailed Standard
Parasitic Format (DSPF), Standard Parasitic Extraction Format
(SPEF)
• Tools: Synopsys Star-RCXT, Cadence QRC, Mentor Graphics
Calibre xRC
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ASIC Physical Design
Timing Analysis
• Static Timing Analysis: Methodical analysis of a digital circuit to
determine if the timing constraints imposed are met and to
check the design is working properly
• Static Timing Analysis Flow
— Read the inputs required
— Setting up Constraints: IO Delay Constraints, DRVs, Timing Exceptions
(False/ Multi-Cycle paths), Recovery and Removal, Minimum Pulse
Width
— Construct Timing Graph: Partition Clock Domain, Ideal/ Propagated
Clock, Case Analysis
— Propagation
— Timing Report: End points with violations/ Paths enumeration
• Input Requirement
— Routed Netlist (.v)
— Libraries (.lib only)
— Constraints (.sdc)
— Delay Format (.sdf)
— Parasitic Values (.spef)
• Tools: Synopsys PrimeTime, Cadence ETS, Cadence Tempus
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ASIC Physical Design
Timing Analysis (SI)
• Signal Integrity (SI)
— SI refers to the quality of the signal transportation during the circuit
operation
— In deep sub-micron the delays associated with the logic elements far
outweighed delays associated with the interconnect
— SI effects like Crosstalk (both noise and timing), Voltage (IR) Drop,
Waveform Integrity and Electromigration have complex
interdependencies
— When the technology shrinks, the effect of coupling capacitance also
increases
— Crosstalk is the undesirable phenomenon, caused by the cross
coupling capacitance between metal wires in a chip
— Signal Integrity comes as an added feature of Timing Signoff tools
— Crosstalk effects can be analyzed by enabling the SI switch in tools
— If Crosstalk is enabled then the tool will by default do the timing in
On Chip Variation (OCV) mode
—
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ASIC Physical Design
Power Analysis & IR Drop Analysis
• Power Analysis
— Static/ Leakage Power Analysis
— Dynamic Power Analysis
• IR Drop Analysis
— Static IR Drop Analysis
— Dynamic IR Drop Analysis
• Tools for Power and IR Drop Analysis
— Synopsys Prime Power
— Cadence EPS and Voltus
— Apache Redhawk
• Tape-out
— Final GDSII (Graphical Data Stream Information Interchange) or CIF
(Caltech Intermediate Format) to Foundry
— GDS contains Physical Layout information
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Thank You
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