M2MS BP209Manual
M2MS BP209Manual
M2MS BP209Manual
BP209
M2MS-BP209
Operation Manual
2018
Version: 7.0
Date: 09-Jul-2018
Thorlabs GmbH
Warning
Sections marked by this symbol explain dangers that might result in
personal injury or death. Always read the associated information
carefully, before performing the indicated procedure.
Attention
Paragraphs preceded by this symbol explain hazards that could
damage the instrument and the connected equipment or may cause
loss of data.
Note
This manual also contains "NOTES" and "HINTS" written in this form.
© 2018 Thorlabs 5
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1 General Information
Thorlabs makes every effort to keep this manual as up to date as possible. For the latest ver-
sion of the manual please visit www.thorlabs.com.
This section contains general information about the Beam Profiler's safety.
1.1 Safety
Attention
The safety of any system incorporating the equipment is the responsibility of the assem-
bler of the system.
All statements regarding safety of operation and technical data in this instruction manual
will only apply when the unit is operated correctly as it was designed for.
The Beam Profiler must not be operated in explosion endangered environments! To pre-
vent the Beam Profiler from overheating, do not cover the instrument.
This precision device is only serviceable if properly packed into the complete original
packaging including the plastic foam sleeves. If necessary, ask for replacement pack-
aging. Refer servicing to qualified personnel!
Before applying power to the PC system used to operate the Beam Profiler, make sure
that the protective conductor of the 3 conductor mains power cord is correctly connec-
ted to the protective earth contact of the socket outlet! Improper grounding can cause
electric shock with damages to your health or even death!
The instrument must only be operated with a duly shielded and low resistance USB
cable delivered by Thorlabs.
Only with written consent from Thorlabs may changes to single components be carried
out or components not supplied by Thorlabs be used. Do not stick anything into the
aperture in the middle of the Beam Profiler front! You may damage the thin-skinned slits,
spoil the bearings of the motor and/or blockade the rotating drum because there is no
covering glass in front of it.
Warning
The M2MS M² Measurement System comes with an alignment laser that is powered by a
M2MS internal driver. Be careful when using this laser!
6 © 2018 Thorlabs
2 Getting Started
2 Getting Started
2.1 Ordering Codes and Accessories
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2.2 Unpacking
Inspect the packaging for damage. If the shipping container seems to be damaged, keep it until
you have inspected the contents and you have inspected the instrument mechanically and elec-
trically.
Verify that you have received the following items:
· 1 BP209 Beam Profiler Instrument as an External Measurement Head with Dust Cover
· 1 USB 2.0 Cable A to Mini B, Length 3.0 m
· Quick Reference
If you have purchased a M² Meter Set M2MS-BP209:
1. M2MS-BP209VIS-AL (/M)
· M2MS-BP209VIS-AL (/M) Measurement System with mounted BP209-VIS (/M) Slit Beam
Profiler
· Power supply 100 to 240 V AC / 15 V 3 A DC
· Cable USB 2.0 A to Mini B, 3 m length
· Cable USB 2.0 A to Mini B, angled, 0.5 m length
· 1 pcs. 0.05" Hex Key
· M2MS Accessory Box UV, that includes:
· 1 pcs. LA4158-UV Plano Convex Lens, f = 250 mm, UV AR coating
· 1 pcs. LA1461-A Plano Convex Lens, f = 250 mm, AR coating 350 - 700 nm
· 4 pcs. CL6 Rail clamps
· 1 pcs. M2MS Adjustment laser
· 1 pcs. Ball Driver 3 mm
· 1 pcs. spare screw M4x10
2. M2MS-BP209VIS (/M)
· M2MS-BP209VIS (/M) Measurement System with mounted BP209-VIS (/M) Slit Beam
Profiler
· Power supply 100 to 240 V AC / 15 V 3 A DC
· Cable USB 2.0 A to Mini B, 3 m length
· Cable USB 2.0 A to Mini B, angled, 0.5 m length
· 1 pcs. 0.05" Hex Key
· M2MS Accessory Box VIS, that includes:
· 1 pcs. LA1461-A Plano Convex Lens, f = 250 mm, AR coating 350 - 700 nm
· 1 pcs. LA1461-B Plano Convex Lens, f = 250 mm, AR coating 650 - 1050 nm
· 1 pcs. LA1461-C Plano Convex Lens, f = 250 mm, AR coating 1050 - 1700 nm
· 1 pcs. LA5255-D Plano Convex Lens, f = 250 mm, AR coating 1650 - 3000 nm
· 4 pcs. CL6 Rail clamps
· 1 pcs. M2MS Adjustment laser
· 1 pcs. Ball Driver 3 mm
· 1 pcs. spare screw M4x10
8 © 2018 Thorlabs
2 Getting Started
3. M2MS-BP209IR (/M)
· M2MS-BP209IR (/M) Measurement System with mounted BP209-IR (/M) Slit Beam Pro-
filer
· Power supply 100 to 240 V AC / 15 V 3 A DC
· Cable USB 2.0 A to Mini B, 3 m length
· Cable USB 2.0 A to Mini B, angled, 0.5 m length
· 1 pcs. 0.05" Hex Key
· M2MS Accessory Box VIS, that includes:
· 1 pcs. LA1461-A Plano Convex Lens, f = 250 mm, AR coating 350 - 700 nm
· 1 pcs. LA1461-B Plano Convex Lens, f = 250 mm, AR coating 650 - 1050 nm
· 1 pcs. LA1461-C Plano Convex Lens, f = 250 mm, AR coating 1050 - 1700 nm
· 1 pcs. LA5255-D Plano Convex Lens, f = 250 mm, AR coating 1650 - 3000 nm
· 4 pcs. CL6 Rail clamps
· 1 pcs. M2MS Adjustment laser
· 1 pcs. Ball Driver 3 mm
· 1 pcs. spare screw M4x10
4. M2MS-BP209IR2 (/M)
· M2MS-BP209IR2(/M) Measurement System with mounted BP209-IR2(/M) Slit Beam Pro-
filer
· Power supply 100 to 240 V AC / 15 V 3 A DC
· Cable USB 2.0 A to Mini B, 3 m length
· Cable USB 2.0 A to Mini B, angled, 0.5 m length
· 1 pcs. 0.05" Hex Key
· M2MS Accessory Box VIS, that includes:
· 1 pcs. LA1461-A Plano Convex Lens, f = 250 mm, AR coating 350 - 700 nm
· 1 pcs. LA1461-B Plano Convex Lens, f = 250 mm, AR coating 650 - 1050 nm
· 1 pcs. LA1461-C Plano Convex Lens, f = 250 mm, AR coating 1050 - 1700 nm
· 1 pcs. LA5255-D Plano Convex Lens, f = 250 mm, AR coating 1650 - 3000 nm
· 4 pcs. CL6 Rail clamps
· 1 pcs. M2MS Adjustment laser
· 1 pcs. Ball Driver 3 mm
· 1 pcs. spare screw M4x10
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2.3 Preparation
1. Install the Thorlabs Beam software on your computer as described in Software Installa-
tion 11 .
2. Connect the Beam Profiler using the supplied USB cable to the PC as described in Con-
nection to the PC 17 .
3. Remove the dust cover.
4. Mount the Beam Profiler instrument so that its optical aperture is exposed to the optical
beam.
5. Switch on your light source but be sure to not exceed the maximum allowed optical power
to the instrument. See Power Ranges 155 for details.
Attention
Please install the software prior to connecting the instrument to a PC via USB interface.
Use only the supplied high speed (USB 2.0) cable, not full speed (USB 1.1) cables or thin
profile cables with increased resistance, as this can cause transmission errors and im-
proper instrument operation!
2.4 Requirements
10 © 2018 Thorlabs
2 Getting Started
2.5 Installation
2.5.1 Software Installation
The "Thorlabs Beam" software V7.0 (or higher) can be downloaded from the Thorlabs website:
http://www.thorlabs.com/software_pages/ViewSoftwarePage.cfm?Code=Beam
Save the ZIP file to your computer and unpack this archive. The Install Shield Wizards starts by
double-clicking the setup.exe, see below.
The installation contains 2 main parts - the NI-VISA™ Runtime V17.0 and the Beam Software
itself, including also drivers and the manual. The following procedure describes the installation
on a Windows 7® 64 bit operating system.
Click the "setup.exe". The installer will perform a check for installed NI-VISA™ Runtime Ver-
sion. If NI-VISA™ is not installed to the target PC or the installed version is before 15.0, the in-
staller recognizes that and requests the installation of NI software:
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Mark the tick box "Search for important messages..." Click "Next". The following window opens,
agaian click "Next".
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2 Getting Started
Click "Next" in both following screens and click "Finish" to finalize the installation.
Please reboot the PC when this message appears. After restarting the PC, the installer contin-
ues to install the software. If not, please execute the "setup.exe" again.
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Please read this license agreements carefully, choose "I agree" and click 'Next'.
It is recommended to follow the recommended path, click "Next" and then "Install" to proceed.
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2 Getting Started
A new window appears, click "Next" to continue. Windows Security will ask your confirmation to
install the Thorlabs USB driver.
You may check the box "Always trust software from "Thorlabs GmbH", this will shorten the in-
stallation. However, if you do not want to do that, please click the "Install" button. You will be
asked then to confirm the installation of further Thorlabs software components. Please proceed
as described above.
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Now, all drivers are installed and the "Read Me" comes up:
16 © 2018 Thorlabs
2 Getting Started
If you want to verify the correct driver installation, check the presence of the instrument in the
Device Manager: From the Start button select Control Panel to Device Manager.
The following entry under the NI-VISA USB Devices group indicates that the Thorlabs Beam
Profiler device is properly installed.
If you cannot see such an entry please check the troubleshooting 143 section.
Usually the Beam software connects automatically to the instrument that has been connected
first. If you have connected more than one Beam Profiler and want to use another than the con-
nected device, click to the icon "Device Connection" and click the desired instrument:
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Click on 'Refresh Device List' for an update in the case that you have very recently connected
to or removed a Beam Profiler instrument from your PC. If an expected instrument is still miss-
ing check if the USB driver is properly installed (see chapter Troubleshooting 143 ).
After selecting a Beam Profiler it will be connected and displayed in the Beam Settings panel,
where all available settings and adjustments to the Beam Profiler can be made. See the Set-
tings Panel 32 chapter for a detailed description.
It is advisable to read the steps described in the Measurement with the Beam Profiler 69
chapter carefully in order to setup your Beam Profiler device properly.
When the Beam Profiler application is started the first time, three preselected windows are
opened and arranged automatically. Otherwise, the arrangement of the last session (selected
windows and its position) will be recovered. See the Child Windows 45 chapter for a detailed
description of each window.
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3 Operating Elements
3 Operating Elements
3.1 Rotation Mount
The BP209 Beam Profiler is an external optical beam measurement sensor that is designed for
free-space applications It comes with a rotation mount.
The rotation mount provides up to ± 60° of manual rotation for the X and Y scan axes. Release
the plug on the top and move it to the left or right while keeping the mount fixed - the Beam
Profiler rotates within its outer housing. For getting the desired angle use the markers on the
front plate. This way the beam profile at different directions can be measured.
Note
For accurate measurement results make sure the beam enters the input aperture perpendicular
to front plane and as close as possible to the to the center of the aperture.
The rotation capability of the sensor with respect to the beam is essential for correct beam el-
lipticity measurement, for instance.
Since the major and minor axes of an elliptical beam may have arbitrary position in space, the
scan axes of the Beam Profiler need to be oriented to these axes in order to measure the real
ellipticity. For the most accurate alignment, it is best to rotate the BP209 while observing the X
and Y profiles. Look for the point where the profile width in one axis reaches the minimum and
the maximum in the other axis.
Note
Without scan axes alignment the ellipticity measurement may become erroneous!
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Fix the Beam Profiler on the optical bench using Thorlabs post, post holder and base.
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4 Operating Principle
4 Operating Principle
The BP209 uses the principle of scanning slits mounted on the perimeter of a rotating drum.
This drum is equipped with a position encoder, which delivers exact information on the actual
drum position to the analyzing software. Two silt pairs (5 µm slit width for normal measurement
and 25 µm slit width for knife-edge measurement) are mounted to the drum.
The slit pairs are oriented orthogonally at angles +45° and -45° with respect to the rotation axis.
This scanning axis is tilted at 45° so that the scanning directions of the slits appear as 0° (hori-
zontal) and 90° (vertical), respectively. These scanning directions are marked as X and Y on
the front of the instrument.
Using the rotation mount these scanning axes can be tilted to within ± 60° in order to adapt it to
the major and minor axes of an elliptical beam.
Beside the two slit pairs, the drum has an aperture with a neutral density (ND) filter. This aper-
ture is used to take integral power measurements during every revolution, which is necessary
as reference value for Beam Profile measurement.
Note that this power measurement readout is the result of a separate integral beam power
measurement (through the ND filter), and not a result of mathematical integration across the
scanned beam profile.
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5 The Graphics User Interface (GUI)
The entries in the first block, Import and Export Configuration, are related to XML files which
contain information about the chosen Beam Profiler device and its settings, file export paramet-
ers and application settings. In order to copy the GUI appearance and Beam Profiler settings to
another PC you need to save the configuration file, copy it and load it on the target system.
The entries in the second block, Import and Export Device Data, are used to import and ex-
port data originally retrieved from the Beam Profiler in CSV format. Intensity values are saved
to a text matrix.
There are 4 columns:
Column Content
1 X position in µm
2 Intensity at X position
3 Y position in µm
4 Intensity at Y position
A sequential saving is available as well. Details please see in section Calculation Results 55 .
The third block prints the currently displayed content of the child windows.
With the Print Application Window a screenshot of the Beam Profiler application is printed.
The Print Active Window entry prints the current active child window of the Beam Profiler ap-
plication. This function gives you the opportunity to print a specific child window.
The Save Test Protocol opens a dialog window, where individual data can be entered. Click
"Save" and then "Close" to save a test report with the calculation results and the current projec-
tion image to the indicated location. If the 3D Profile window is opened, a screenshot of the 3D
Profile is also included in the test report.
See some detailed examples for data export in the Save Measurement Results 73 chapter.
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Note
In order to use this command, you need to have installed additional National Instruments® soft-
ware (Distributed System Manager, NI CVI Runtime Engine). This feature is a data interface for
handing over to an external program environment the parameters:
saturation
total power
centroid positions X and Y
4-sigma width X and Y
These entries allow changing the device (Beam Profiler) and application (GUI) specific settings
and let you choose a language.
Beam Settings
The Beam Settings panel contains all important information about the optical settings, the prop-
erties of the active Beam Profiler and a summary of the calculated beam parameters. Please
see the detailed description of this panel in the section Beam Settings 32 .
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5 The Graphics User Interface (GUI)
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5 The Graphics User Interface (GUI)
Language
The language of the application can be selected.
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5 The Graphics User Interface (GUI)
If you have trouble with the software, please submit the version of the application to Thorlabs.
This can help in resolving your problem.
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Clicking on a toolbar symbol will have the same effect as clicking on the original menu entry.
When moving the mouse over the icons, a tool tip will be displayed.
In the table below the toolbar icons are explained.
Open the online help file
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5 The Graphics User Interface (GUI)
The status bar displays important status information about the Slit Beam Profiler concerning
· Errors and warnings, see chapter Warnings and Errors 144 .
· Plot Data Point Status, see section Plots 62 .
· Instrument settings like taken samples, scan rate and target resolution.
· Current refresh rate of the application in frames per seconds (fps).
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Please read this section carefully and follow the setup instructions in order maximize the accur-
acy of your measurements.
32 © 2018 Thorlabs
5 The Graphics User Interface (GUI)
Initial Settings
When this Beam Profiler is connected for the first time, the following default values are set:
5.5.1.1 Wavelength
Enter the operating wavelength in nm as a precondition for proper measurement of the Total
Power. The power calculation is based on the entered wavelength and the typical responsivity
curve of the photo diode stored in the Beam Profiler instrument. See Typical Photodiode Re-
sponse Curve 153 . The correct wavelength is important for accurate Beam Quality (M²) results as
well.
The range of allowed wavelength values is limited to specified range of the recognized Beam
Profiler.
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The 'Current power value' is the actual power measured by the Beam Profiler. Enter the power
meter reading into the 'Power meter value' control. Click 'Apply' to enable corrections, then click
'Close' to leave the panel.
The difference between the entered power value and the actually measured by the instrument
power will be displayed as an offset, here -0.161994 dB.
This offset (in dB) is stored in the Beam Profiler and is read out and activated automatically
each time after connecting this instrument.
Note
The user calibrated power reading is correct only at the actual wavelength. If the wavelength
changes, the power correction needs to be carried out again.
After executing the Power Correction it is activated automatically, which is indicated by the
check mark.
The activation state is saved in the software. When restarting the software using the same in-
strument, the offset is recognized, read out and the same activation state (active / inactive) as
in the previous software session will be restored.
If the power correction is not active, the attempt to activate it lets the software check the Beam
Profiler for a saved offset. If no saved offset is found, the Power Correction dialog opens and
asks for a power meter value. If an offset is recognized, it will be applied immediately. For this
reason it is recommended that a power correction is to be performed if the environment of the
instrument was changed.
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5 The Graphics User Interface (GUI)
These data are read out from the BP209 instrument and cannot be changed. Beside general in-
formation (Beam Profiler model, serial number; driver, firmware and CPLD versions), other im-
portant sensor information are stated:
Resolution
is the achievable resolution for the given scan rate and aperture width 38 . It's limited by the
sampling rate of the AD converter.
If scanning the entire aperture (9mm), the resolution will be affected only for scan rates > 19 s-1.
The range of resolution for these higher scan rates is 1.20 µm to 1.24 µm.
A higher resolution can be achieved by limiting the scanned aperture to 10% of the entire width
(Ø 0.9 mm), see Miscellaneous 38 . With this option, the resolution depends strongly on the
scan rate and ranges from 0.124 µm (scan rate 2s-1) to 1.24 µm (scan rate 20s-1).
Samples
is the number of measurement values used for beam profile calculation. It is limited by the AD
converter sampling rate and varies, depending on the selected aperture width 38 and scan rate.
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5 The Graphics User Interface (GUI)
Gain and Bandwidth are the parameters of the photo current amplifier. Higher bandwidth is re-
commended to achieve high resolution when measuring small beam diameters. The bandwidth
can be set between 16 kHz and 660 kHz, if the full 9.0 mm aperture width is used, and between
16 kHz and 1000 kHz, if the 0.9 mm aperture is used for measurement.
Each time the software is started, gain is set to Auto, bandwidth to 125 kHz and the Baseline
Correction is set to Auto. This is the preferred setting for most measurements. However, in
some cases, e.g. measurement of pulsed lasers 79 , it is recommended that these settings be
changed manually.
Baseline Correction
The baseline is the ADC output signal that originates from the photo detector's dark current, the
output offset and noise of the ADC. It results in a beam profile shift away from the zero line. En-
abling the Auto Baseline Correction, this influence is compensated. It is recommended to have
it enabled.
5.5.3.2 Scan Rate
Scan Rate
Here, the actual scan rate (drum rotation speed) is displayed
Target Scan Rate
This is the rotation speed of the drum in s-1. The entered value is transformed into a control
voltage for the drum drive. Values between 2 and 20 s-1 can be entered either numerically or by
clicking to the arrows attached to the numeric box or by shifting the slider.
Scan Rate Correction
The actual rotation speed may differ from the entered target scan rate due to the drum drive
warmingof: The longer the unit operates, the faster the drive runs at the same control voltage.
Enabling Scan Rate Correction, a control loop will maintain the scan rate close to the target
value.
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5.5.3.3 Miscellaneous
Photodiode Bias
Biasing a photo diode decreases its rise time. Set Bias to On for measurement of small beam
diameters and M² measurement.
Note
Biasing is possible only for BP209-VIS and BP209-IR models.
Aperture Width
The maximum aperture diameter is 9 mm. The resolution can be improved if using only 10% of
the aperture for beam analysis, particularly in case of small beam diameters or when using the
the knife edge mode 81 .
Active Slit Pair
The BP209 Series comes with two pairs of slits, in contrast to the BP10x predecessors. The
identification of the slit pairs is given by their location on the perimeter of the drum, and only the
active slit pair is used for beam analysis.
With 5 µm slit pair, beam diameters down to 20 µm can be measured using the standard Slit
Scanning method. If the beam diameter is less than that, the Knife Edge Mode must be used
instead, in combination with the 25 µm slit pair. This is explained in detail in the Knife Edge
Mode section 81 .
Scanning Mode
Select Slit Scanning for beam diameters > 20 µm (with 5 µm active slit pair) and Knife Edge
for beam diameters < 20 µm (with 25 µm active slit pair).
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5 The Graphics User Interface (GUI)
Auto Rectangle: The software will analyze every image from the BP209 automatically
and determine the area in which a measurable amount of power is
present. Areas with a lower power level than the clip level 40 with will
be excluded from further calculations.
Full ROI: The entire image area defined by the ROI is involved in beam calcula-
tions.
User Rectangle: A rectangular area, set by user input is defined as Calculation Area.
Enter pixel values which describe the Calculation Area position and
size or simply drag a rectangle into the 2D Projection window.
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Note The Clip Level of Calculation Area is different from the Clip Level 41 used for beam pro-
file calculations!
Attention
The calculation area must not cut off lower intensity parts of the beam profile. This may
cause inaccurate calculation results!
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5 The Graphics User Interface (GUI)
Three modes are available - floating, block and rolling. The number of frames can be set
between 1 and 100.
In Floating mode, the average is calculated from the weighted previous average and the re-
cent frame. Example: Floating average is made for 10 frames. The previous average value is
multiplied by 9, then the recent frame value is added and the sum is divided by 10, which gives
the new average value.
In Block mode, the indicated number of frames is accumulated, after finishing the average is
calculated and displayed. This is the slowest mode.
In Rolling mode, the averaging is done over the indicated most recent number of frames.
Example: Rolling average is made for 10 frames. The most recent 10 frames are averaged and
displayed, the value is updated with each new frame.
Setting the frames to numbers higher than 1 to enables noise reduction.
This option is helpful for unstable light sources with fluctuating intensity or beam shape, or if the
update rate on the screen is too high for easy data readout. Also use this option to suppress
Beam Profiler noise in case of low intensity.
for details.
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The Reference Position can be set to predefined positions (see above) or to a user defined po-
sition. The X and Y coordinates of a user defined position are to be entered numerically or set
in the 2D Reconstruction 47 (Reference Position Editor):
5.5.4.8 Unit
The measurement units that are displayed in the Beam Software can be selected in the Unit
topic.
Position units: µm.
Total Power units: mW or dBm.
Temperature: °C, °F or K.
(Temperature is measured by an external Thorlabs TSP01 Envir-
onmental Sensor, connected via USB (not included).)
The following table gives an overview on all available units:
Unit Description
µm Location, width or distance in µm. The origin of the coordinate system (X=0, Y=0) is
the sensor center, not the image center!
Positive X values go to the right, positive Y values to the top of the image.
Value range: - 4500 to + 4500 µm.
mW The Total Power of the beam is calculated from measurement of the total photo di-
ode current, using its typical wavelength dependent responsivity and the power cor-
rection value.
dBm The Total Power translated from mW into dBm: 10 * log (P[mW]). 0 dBm = 1 mW
% Relative level between 0 and 100%
deg Angle in degree with respect to the X axis, range -90 to +90 deg
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5 The Graphics User Interface (GUI)
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This panel allows the user to manually control the translation stage. This is useful for a coarse
setup of the M² or Divergence Measurement.
Actual Position displays the present stage position.
Target Position
Enter a value between 0 and 200 mm, press 'Enter' on your keyboard, and the stage will travel
with the set Velocity to the new position.
Note
The total displacement reaches from 0 to 200 mm, although the stage translation path is only
100 mm. This results from the mechanical design of the M2MS 87 M² Meter Set.
Increment
Enter the increment for moving the stage stepwise.
Velocity
This is the speed of the stage when traveling between two positions (e.g., between the actual
and the target position).
Pressing these buttons moves the stage backward / forward for one step, equal to the Incre-
ment.
Pressing this button interrupts the continuous stage travel to a target position.
The slider bar on the bottom of the panel has two functions - it shows the stage position, and
the slider can be moved with the mouse in order to start a stage travel.
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5 The Graphics User Interface (GUI)
To close a child window deselect the menu entry or the appropriate toolbar symbol or click the
close button "X" in the upper right corner of the child window.
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Each child window can be moved and resized. If a child window is closed its settings are stored
so that it will have the same position and size when it is reopened.
When the GUI application is closed and reopened, the main panel will have the same child
panels open in their former positions. To arrange the windows automatically use the function
"Tile View" from the "View" 28 menu.
5.6.1 2D Reconstruction
The 2D Reconstruction graph shows the image from the Beam Profiler indicating the power in-
tensity distribution. This window can be opened and closed via the menu item "2D Reconstruc-
tion" in the window menu or via the toggle button in the toolbar.
The 2D image is based on a reconstruction since a slit Beam Profiler delivers measurement
results of two real cross sections only, the X and the Y profile. The remaining pixel values are
calculated by multiplying the normalized cross section values of the respective row and column.
An additional bottom clipping is done to limit amplified noise.
Note
Remember, this is only a reconstruction of an assumed Gaussian-like profile, it does not show
a completely measured 2D cross section.
On the left side of the 2D Reconstruction window a toolbar is located with the following toggle
buttons:
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5 The Graphics User Interface (GUI)
If the window height is smaller than the full toolbar, the lower symbols are packed into a context
menu which is accessible via a arrow button on the bottom of the toolbar.
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5.6.2 3D Profile
The 3D Profile illustrates the power density distribution of the measured optical beam. Whereas
the beam's cross-section is parallel with the X-Y-plane, the relative power intensity is shown in
the Z direction (Pseudo 3D). This window can be opened and closed via the menu item "3D
Profile" in the window menu or via the toggle button in the toolbar. It can be closed via the
X button in the upper right corner of the child window.
The 3D profile can be moved, rotated and zoomed with the mouse:
Rotate: Press right mouse button and move mouse
Move: Press left mouse button and move mouse
Zoom: Scroll mouse wheel
The following table summarizes the toolbar symbols available within the 3D Profile window and
its appropriate action.
Toolbar
Associated Action
Icon
Opens a dialog box to specify the properties of the saved screenshots / dia-
grams.
Resets the manipulations of translation, rotation and zoom to the default view.
Position, size and rotation angle are also displayed within the 3D Profile Settings dialog box.
Here you can input numerical values to define the 3D Profile appearance:
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5 The Graphics User Interface (GUI)
Note
· If the slider "Speed - Quality" is in the far right position, the 3D image is displayed with
highest quality.
· The higher the 3D image quality is set, the more system resources are used. Depending
on the system capabilities, the software may slow down.
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X and Y profiles display the intensity along the appropriate axes as marked on the front panel
of the Beam Profiler.
The yellow curve shows the measured profile, while the red curve shows the approximated
Gaussian 148 fit function and the blue - the approximated Bessel 149 fit. The curves can be shown
/ hidden by toggling the appropriate button above the diagram.
If "Autoscale to Peak" is enabled, the measured curve shows relative intensities from 0 to 100%
, where 100% denotes the maximum value of intensity on X and Y axis.
If the "Autoscale to Peak" function is disabled, the X and Y profiles will show a peak amplitude
equal to the AD converter saturation of the appropriate slit pair.
The amplitude of the Gaussian fit curve may be lower or even higher than the peak intensity of
the measured curve.
The selected clip level (default 13.5%) is displayed if the "Auto Scale to Peak" function is en-
abled (button ).
The horizontal scale is displayed in µm.
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Cursor Mode
Move the the mouse pointer close to the vertical cursor line. The mouse
pointer changes to . The cursor line can be moved with the left mouse but-
ton pressed to a position inside the diagram. The current values at the cursor
position are shown in a rectangle next to the cursor in the colors of the plotted
curve.
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The width of the columns is predefined but can be resized. With the first start of the Beam Soft-
ware, the parameters as shown above are displayed in this table. Click the marked green
icon in the table in order to select or deselect parameters to be calculated and displayed. The
fewer calculation results are enabled, the higher the speed performance of the software.
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5 The Graphics User Interface (GUI)
Note
· Even if the Gaussian and / or Bessel Fit calculations are disabled from display in the Cal-
culation results panel, the appropriate fitted curves are still shown in the X and Y Profile
windows, if enabled there.
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5 The Graphics User Interface (GUI)
Sequential Saving
This feature is used to save sequentially sets of the selected calculation results 52 , e.g for a
long term analysis.
· Select the destination folder (see the preview pane).
· Define the file name.
· Select the export format.
· Add date and/or time stamp (optional)
· Save Data... Select either
® the time interval between two records (1 to 106 sec.)
or
® the n-th measurement to be recorded ( n = 1 to 105)
· Stop Saving after... Define when the sequential saving
shall be terminated:
® after reaching a certain file size (1 to 100 MB)
® after reaching a certain recording time (1 to 106 sec.)
® after reaching a certain number of data sets (1 to 105)
· Click "Start Sequential Saving"
The data sets are recorded to one single file, with each
new record appended to the previously recorded data
sets.
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Vergence refers to the divergence or convergence angle of a light beam. The manual vergence
measurement allows this angle to be measured using a simple mechanical setup. The Beam
Profiler is mounted so that it can slide along the beam propagation trace. This can be done us-
ing, for example, a Thorlabs M2 translation stage or a Thorlabs dovetail optical rail (RLA series)
in combination with a rail carrier (RC series) and a post.
Open the Manual Vergence Measurement Window either by selecting the appropriate item
from the Menu bar (Windows g Manual Vergence Measurement) or simply by clicking the
icon:
1. Click the icon in the left upper corner to open "Settings for the Manual Vergence Meas-
urements". Select the beam diameter calculation method. Measure the distance between
the light source and the front plane of the Beam Profiler and enter this value to the box "Pos-
ition 1" in millimeters and click the icon.
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5 The Graphics User Interface (GUI)
3. Move the Beam Profiler, measure the distance again, enter the new distance into the box
"Position 2" and press the 2nd icon.
4. The beam width at position 2 is calculated and based on the entered distance change, the
vergence angle in X and Y axes is displayed.
Note
The accuracy of the entered distance between the two positions (shift) of the Beam Profiler is
significant for vergence measurement accuracy.
Hint
If you are using the Beam Profiler together with a M2MS Extension Set, i.e. within a M2MS-
BP209x measurement system, the Manual Vergence measurement is even more simple:
· Remove the focusing lens from the system.
· Feed the laser beam into the M2MS-BP209x input aperture and align it.
· Open in the Beam Settings panel the Translation Stage Control 44 topic.
· Use the stage slider to set 0 and 200 mm positions and proceed as described above.
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5 The Graphics User Interface (GUI)
On the scales, the observed minimum and maximum values are shown as blue triangles. They
can be reset using the buttons marked above.
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Take a snapshot of the reference position by clicking to the button "Save Shot 1" or "Save Shot
2". The software instantly starts to overlay the live 2D reconstruction from the Beam Profiler
with the captured snapshot. The overlay method can be selected in the box "Composite Mode":
Overlay "Plus"
In "Plus" mode the intensities of the snap shot and the live image are added. This eases the
adjustment particularly of regions with lower intensity.
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5 The Graphics User Interface (GUI)
Overlay "Lighten"
In "Lighten" mode, within the overlapping region only the "pixel" with higher intensity will be dis-
played; the intensities of the snapshot and the current beam are not added.
Overlay "Difference"
Finally, in the "Difference" mode, the intensities are subtracted. The more regions appear black
within the overlay, the better the live image fits to the snapshot.
The centroid shift between snapshot and live image is displayed in X and Y axis direction, R is
the resulting absolute distance between these centroids.
For improved visualization of the overlay, the intensities of the snapshot and the live image can
be weighted in 25% steps (slider).
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5.6.9 Plots
Thorlabs Beam software offers several additional plot windows to show the beam behavior:
Plot Positions 63
Plot Power 64
Plot Gaussian Fit 65
Plot Environment Data 66
Beam Stability 67
All plot windows are accessible via the "Windows" menu, while Plot Positions, Plot Power
and Beam Stability also have buttons in the toolbar. The diagrams can be cleared using the
"Clear Windows" command (Menu Bar -> Control or button).
Convenient view functions allow a detailed analysis of the parameter's behavior over time.
· Display / Hide a certain parameter: Appropriate buttons are located above the diagrams.
· Zoom Out: Press and hold left mouse button and mark the desired diagram area.
· Undo Zoom: Right click on the diagram to reproduce the previous zoom status.
· Zooming Diagram Axes
Move the mouse cursor over an edge of the vertical or horizontal scroll bar
ô ó
slider. The cursor changes to or . Press and hold left mouse button and
move the mouse. This will zoom in on the appropriate part of the diagram
axis. Return to default view by right clicking to the diagram.
· Panning the Diagram Axes
Move the mouse pointer over the center of the vertical or horizontal scroll bar
slider and press left mouse button. Now the slider can be moved to pan
(shift) across the diagram. Return to default view using the Zoom Home but-
ton.
· Autoscale: This button in the left toolbar returns the diagram to default view (auto scaled)
· Cursor Mode: If the mouse position is near to the vertical cursor line, the mouse cursor
changes to . The cursor line can be moved with the left mouse button pressed to a posi-
tion inside the diagram. The current values at the cursor position are shown in a rectangle
next to the cursor in the colors of the plotted curve.
The individual plot windows are explained in detail in the next sections.
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The positions of X and Y peak and of X and Y centroid positions can be displayed vs. time.
Toolbar Icon Associated Action
Save Diagram or Image: Opens a dialog box to specify the properties of the
saved diagram or image.
Save Data: Opens a dialog box to specify the properties of the saved calcu-
lation data
Clear all plots
Autoscale ON/OFF
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The total power measured by the Beam Profiler vs. time can be displayed.
Note
The power indication of Thorlabs Beam Profiler instruments is not calibrated vs. wavelength, it
is based on a typical responsivity curve of the used photo diode and the manually entered
wavelength (see Optical Setup / Wavelength 33 )
Toolbar Icon Associated Action
Save Diagram or Image: Opens a dialog box to specify the properties of the
saved diagram or image.
Save Data: Opens a dialog box to specify the properties of the saved calcu-
lation data
Clear all plots
Autoscale ON/OFF
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5 The Graphics User Interface (GUI)
This window plots the Gaussian Intensity value (see Calculation Results 52 ) which shows the
coefficient of determination of the fit.
Toolbar Icon Associated Action
Save Diagram or Image: Opens a dialog box to specify the properties of the
saved diagram or image.
Save Data: Opens a dialog box to specify the properties of the saved calcu-
lation data
Clear all plots
Autoscale ON/OFF
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The temperature axis is located to the left (yellow curve), the centroid position axis (blue and
green curves) is shown to the right.
Autoscale ON/OFF
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This feature allows the beam stability vs. time to be recorded in a very versatile way. Accumu-
lated data can be retrieved in graphic display by enabling several plots:
Plots the trace of the centroid positions as blue line
Plots the most recent centroid position as yellow dot
Plots the trace of the rolling centroid positions 41 as a dark green
line
Plots the most recent rolling centroid position as a bright green
dot
Plots the trace of the reference positions 68 as dark red line
Plots the reference position as a bright red dot
Plots the Gauss / Bessel fitted centroid positions
Plots the smallest enclosing circle around centroid position cloud
Plot disabled
Plot enabled
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Stops and restarts the measurements, clears all accumulated plot data
Sets the zoom factor so that all data points are located within the diagram area
Settings Dialog
Note
The maximum number of data points to be displayed, the handling of data points after reaching
the maximum and the time interval between two displayed data points is set in the menu Beam
Settings / Plot over Time Parameter 43 .
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1. Provide stable mounting of the Beam Profiler using the appropriate threads on its base
plate.
2. Be sure to operate the instrument within its allowed Power Range 155 .
3. Align the beam to be measured so that it is perpendicular to the front face of the Beam
Profiler.
4. Minimize ambient light entering the Beam Profiler aperture.
Attention
Do not stick anything into the Beam Profiler aperture! There is no glass or other protect-
ive barrier to protect the thin slit foils, the bearings of the motor, and/or the rotating
drum.
Prevent dust or other contamination from entering the aperture!
Keep beam power below the allowed limit to avoid damage to the instrument!
Performance Optimization
As soon as a BP209 device is selected within the 'Device Selection' panel, the measurement
starts in the continuous mode. It may be advantageous to stop the continuous measurement for
a detailed analysis of a beam profile captured with the last image. Also, user interactions with
the GUI will work more fluently when the continuous flow of image data is stopped.
Measurement speed of the Beam Profiler depends on various device settings like the scan rate
(rotation speed of the scanning drum), target resolution, gain and bandwidth of the amplifier.
Also the number of open child windows used to visualize the measured results and the number
of activated numerical parameters to be calculated may reduce the available display update
rate, depending on the performance of your PC.
Note
1. For accurate measurement results (power values, M² results) the correct wavelength must
be entered. Thorlabs Beam Profiler instruments are not calibrated for power with respect to
the wavelength. The power calculation is based on a typical responsivity curve of the used
sensor and manually entered wavelength (see Beam Settings / Optical Setup 33 )
2. Ensure that the beam power is within the specifiedpower range 155 .
3. Align the laser beam so that it is perpendicular to the front panel.
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the entries in the menu "Window" or via the symbols in the toolbar of the main window. The ac-
tivated windows can be sized and arranged as desired.
The recognized Beam Profiler will be connected automatically, and the continuous image ac-
quisition starts.
If more than one device was recognized during the initial application start, the first recognized
device will be connected and started. Please see section Start the Application 18 for details on
how to select a different device.
Verify the settings in the section Optical Setup 33 if you have started the Beam software for
the 1st time. More details on the hardware settings please see the Slit Beam Profiler
Parameter 36 section
Note
The configuration of child windows is saved when the BEAM software is exited. When the
BEAM software is next opened, these windows and their last positions and appearances are re-
stored. Also, the most recent device selection will be restored when restarting the BEAM applic-
ation, together with the most recent settings that were made in the settings panel.
The child window 2D Reconstruction 46 shows the measured intensity distribution across the
sensor area in gray or color scale whereas the 3D Profile 48 is plots the beam intensity with re-
spect to the 3rd dimension (Z scale). Numerical calculation results are displayed in the appro-
priate Calculation Results 52 window. The parameters to be calculated can be selected by click-
ing the icon in left upper corner the Calculation Results 52 window.
All contents of the child windows including available options are explained in chapter Child Win-
dows 45 .
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Note
Please note the following explanations of the parameters.
As per definition, the beam ellipse has a major and a minor axis. For a pass / fail test, for the
minor and major ellipse diameter a minimum and maximum value can be entered. In the ex-
ample given above, the "pass" ranges are:
- Minor axis diameter must be between Min. = 2500 and Max. = 2700 µm
- Major axis diameter must be between Min. = 2500 and Max. = 2700 µm
The test is passed only if both conditions are fulfilled.
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Save Calculations opens a dialog box to enter file properties (name, format, comments). For
details please see the Calculation Results 54 section.
Lock By default, pass/fail test parameters are unlocked. They can be locked in order to prevent
manipulation of margins and parameters included in pass/fail test. Optionally, the lock can be
secured by entering a password.
Note
A password can be entered only once and cannot be changed! In case of troubles, please con-
tact Thorlabs for a solution.
Load / Save Test Parameter Configuration.
The Load and Save buttons in the Calculation Results toolbar allow you to load and save the
configuration of the pass/fail test.
In order to reconstruct a pass/fail test configuration automatically with the next session, save
the parameter to a test parameter configuration file. This file will be loaded with the next start of
the application. If more than one configuration file is saved, the most recently saved file will be
loaded automatically.
To load test parameter from a file click to the "Load Test Parameter" button and select the test
parameter configuration file.
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A dialog opens and asks for the type of file and the path where to save the file.
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6 Measurement with the Beam Profiler
Sequential Saving
The export of measurement data, described above, can be repeated sequentially, using the
Sequential Saving feature on the bottom of the Export Device Data panel. This feature gener-
ates one single file per data set, with appending the file name created by appending an incre-
mented index. The start index number can be freely selected between 1 and 10000. With each
saved measurement, the index is incremented by 1.
· Select the destination folder (see the preview pane).
· Enter the base file name.
· Select the export format.
· Add date and/or time stamp (optional)
· Check the box Index and define start index.
· Check the box "Sequential Saving"
· Save Data... Select either
® the time interval between two records (1 to 106 sec.)
or
® the n-th measurement to be recorded ( n = 1 to 105)
· Stop Saving after... Define when the sequential saving
shall be terminated:
® after reaching a certain file size (1 to 100 MB)
® after reaching a certain recording time (1 to 106 sec.)
® after reaching a certain number of data sets (1 to 105)
· Click "Start Sequential Saving"
Attention
For sequential saving, an index value is appended to the
selected file name. Make sure, the check box "Index" is
marked.
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If a PDF creating software is installed as a printer, the screenshot can be printed also as a PDF
file.
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6 Measurement with the Beam Profiler
Here, additional information can be entered in order to save it together with the test report.
The results of the measurement are saved to a compact test protocol. It contains the Beam
Profiler data and settings and selected numerical calculation results 52 . If the Reconstruction
and the 3D Profile windows were activated, these plots will also be included.
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Example:
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6 Measurement with the Beam Profiler
If set the scan rate in such way, that in X and Y profile the pulses move through the diagram
(i.e., so that the pulse rate slightly differs from an integer multiple of the scan rate), and activate
the max hold function function, the software will accumulate the peak intensities over a
number of subsequent pulses, and finally, the beam profile will be displayed - however, this is
the averaged profile over a number of subsequent pulses.
Note
The user should decide when the envelope shape smoothing can be considered to be finished.
Bandwidth Setting
It is recommended that the bandwidth be set manually. The guideline is the same as for CW
signals - the smaller the beam diameter, the higher the bandwidth is required: Small beam dia-
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meters cause short photo diode current pulses when the slit is scanning it. If the BW is set too
low, the rising edge of the photo diode current is delayed, and the falling edge overshoots. This
leads to an artificially lower peak amplitude.
The X profile of a 130 µm beam illustrates this:
At larger beam diameters, higher bandwidth results in a higher noise level - as can be seen for
a beam with of about 3 mm:
Gain Index
For pulsed lasers, it is recommended that the gain index be set manually in order to avoid sat-
uration of the amplifier.
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Since the drum position is known exactly, the original beam profile in the X and Y direction can
be reconstructed with a good resolution.
The knife edge mode requires a proper beam alignment - the beam should hit the sensor as
close to the center as possible. Further, the Beam Profiler must be set to its maximum resolu-
tion, i.e., minimum scan speed and maximum bandwidth.
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Preparation
Disable Gaussian and Bessel fits and zoom in the profiles. A proper alignment is reflected in a
maximum amplitude and a flat top of the profile. The flat top is a result of the small beam size
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and the use of the 25 µm slits (see screen shots above). Then switch in the device settings dia-
log to Knife Edge mode:
Two new child windows come up (they may overlay each other initially), showing the recon-
structed knife edge profiles for the X and Y axis (green curve) along with the measurement data
obtained in normal slit scanning method data (dimmed yellow curve):
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Diffraction Limit
Depending on the wavelength l and beam divergence angle q, the theoretical limit for the min-
imum beam waist diameter d0 is called the diffraction limit. The beam waist cannot be de-
creased beyond this value.
M2 expresses how close the diffraction limit of the analyzed beam is to the diffraction limit of an
ideal Gaussian beam. The beam parameter product d0*q describes that mathematically. For
beams of worse quality, the product d0*q is increased by the factor M2
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Note
A nearly Gaussian shape is not an indicator of high beam quality! Therefore, a single-shot
beam shape measurement from a Beam Profiler does not provide a correct information about
the beam quality.
Although a single Beam Profiler result is not a measure of beam quality, the Thorlabs Beam
Profiler Series can be used to accurately measure the beam quality. For this purpose, a beam
propagation measurement is carried out according to the ISO11146 standard. The key idea is
to measure the variation of beam diameter d(z) along the axis of beam propagation z.
The Beam Profiler is mounted on a translation stage which is controlled by the Beam Profiler
software. At several z positions the beam diameter and other parameters are measured and
stored.
Besides finding the times-diffraction-limit factor M2, the Thorlabs Beam Propagation meas-
urement determines the following parameters of an optical beam:
· beam waist width d0x, d0y
· waist asymmetry
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· divergence asymmetry
· astigmatism
Note
The Thorlabs Beam Quality measurement tool can handle CW sources and some pulsed
sources only! For more information about pulsed laser sources read chapter Pulsed Laser
Sources 79 .
Note
Systems with aluminum (AL) mirrors are dedicated for use with UV Beam Profilers, as the
standard protected silver mirrors show a significant drop of reflectance below 400nm.
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7 Beam Quality (M²) Measurement
l
Linear Translation Stage Thorlabs DDSM100
m
Lenses with different AR coatings
n
Lens centering assembly (X-Y translation mount)
2 tilted mirrors
o
Adjustment Laser (not shown below)
Integrated control electronics (translation stage controller, USB 2.0 hub and driver for
alignment laser)
The beam under test enters the the focal lens (3), hits the two tilted mirrors (5) and leaves the
enclosure towards the Beam Profiler's input aperture (1). The translation stage is moved by the
control software stepwise, this way changing the path length between the focal lens and the
Beam Profiler. The maximum travel range of the stage (100 mm) is doubled by the use of two
mirrors so that the resulting path length range is 200 mm. The focal length of the lens is selec-
ted in such a way that the beam waist will be close to the middle of the travel range.
During the M² measurement, the stage moves stepwise along the beam propagation direction
and at each position the beam geometry is measured. From the results, the software calculates
beam parameters and beam quality.
The mirrors are factory aligned; there is no need to re-align them.
For fine beam alignment, an alignment laser is supplied. Please see section Beam Align-
ment 96 for details.
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7 Beam Quality (M²) Measurement
7.7 Setting Up
The M2MS Measurement System is a complete system that is factory aligned. The mounting
adapter for the Beam Profiler provides a secure and reproducible positioning of the Beam Pro-
filer's input aperture to the M2MS. This eases the mechanical setup.
Note
It is strongly recommended to fix the M2MS properly to the optical table using the four rail
clamps that are included in the M2MS Accessory Box. To ensure a proper mounting, first re-
move the rubber feet from the M2MS base plate.
Transportation Lock and Stop Position Latch
In order to avoid transportation damages to the translation stage, it is locked when delivered.
This lock must be removed prior to powering-up the stage, and it must be re-installed for trans-
portation. Additionally, the DDSM100 stage is fixed at its initial position by a solenoid controlled
latch, which is the left stop in the photo (2).This latch fixes the stage when the power supply is
switched off and releases the stage when power is applied.
Removal of the Transportation Lock
1. Remove the 4 screws fixing the top cover using a 0.05" hex key (supplied with the M2MS)
and remove the cover.
2. Remove the M4 screw that fixes the red stopper (1), and remove the stopper using the 3
mm ball driver included with the accessory box. Keep the stopper and the fixing screw in a
safe place.
1 - Transportation Lock
2 - Electromagnetic Endpoint Latch
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4. Push the platform to the left stop, turn the lock counterclockwise and tighten the lock
screw.
5. Place back the top cover and fix it using the 4 screws. Now, the M2MS is ready for trans-
portation.
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Firmly press the BC209-xxx front against the front stopper surface and secure it in place using
the supplied M6 (BP209-xxx/M) or 1/4" (BP209-xxx) hex screw.
Place the mounted Beam Profiler into the recess using the dowel pins on the M2MS base plate:
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1. Connect AC power to the power supply and its output to the DC jack (7).
2. Connect the Beam Profiler using the supplied angled USB 2.0 cable to one of the USB hub
outputs (3).
3. Switch the M2MS on (8). The green Power On indicator lights up.
4. Connect the M2MS to the PC using the supplied 3 m long USB 2.0 cable; do not start the
BEAM software yet.
5. The PC's operating system recognizes the connected new hardware and performs the driver
installation:
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7 Beam Quality (M²) Measurement
Note
The first three entries ("AMD USB2.0 MTT Hub", "USB Test and Measurement Device (IVI)"
and the "APT USB Device") are hardware components of the M2MS extension.
6. Start the Beam Software. It should automatically connect to the Beam Profiler and to the
translation stage. This can be seen in the Beam Settings Panel:
7. Upon starting the Thorlabs Beam software, the translation stage will be initialized and homed
automatically. This means that it is recognized in the tab Stage Selection and moves to the
200 mm position in the case it's not there yet. This can take a few seconds. The initialization
can be forced manually by clicking the "Refresh Stage List" button in the Device Selection
window. After the stage is identified and its serial number is read-out, double click the
DDSM100(/M) button.
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7.8 M² Measurement
Prior to starting the Beam Quality measurements, the beam of the laser under test needs to be
aligned to the M2MS Measurement System. It is important that the beam center hits the center
of the Beam Profiler's aperture at every position of the translation stage. Please read the follow-
ing section carefully and follow the instructions.
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· Remove the Beam Profiler together with its mounting adapter from the M2MS base.
· Install the adjustment laser in place of the Beam Profiler and connect its 3.5 mm plug to
the Alignment Laser output (2) 94 .
· Make sure the M2MS is switched on and connected to the control PC, the Beam software
is started and the stage has been initialized.
· Remove the focal lens from the magnetic holder.
· Switch on the alignment laser.
· Align your optical system so that the spot of the alignment laser hits the center of your
light source.
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Z [mm] This box shows the actual stage position; after initialization = 200 mm.
Position 1 (2) [mm] Here the left and right positions for the stage movement can be entered
numerically.
Markers for left and right positions. Instead of numerical entry of the
markers' positions, the markers can be move by drag-and-drop.
Clicking these capture buttons, the stage moves to the related position,
if not there yet, and captures the beam centroid position (amber
crosshair). This snapshot will remain until the stage comes back to the
appropriate position.
This button starts the stage loop movement mode and the stage moves
continuously between positions 1 and 2. A dwell time at the end positions
can be entered. During the loop mode, the software automatically cap-
tures the beam centroids (yellow cross hair) at the left and right stop.
Dwell Time Enter the desired time [sec]. The dwelling can be disabled by clicking to
the icon.
Centroid crosshair of the actual beam position.
Beam Displacement is the centroid shift in X (Y) direction between position 2 and 1 [mm]. The
box is first time filled after the 2nd capture.
Pointing Angle is the angle [°] in X (Y) direction between the beam axis and the stage
movement direction. The box is first time filled after the 2nd capture.
Alignment not successful
Alignment Success Alignment sufficient for correct Beam Quality Measurement (dis-
Indicator placement < 0.65 mm, angle < 0.35°)
Good alignment (displacement < 0.35 mm, angle < 0.15°)
AD Saturation Displays the current saturation of the Beam Profiler's AD converter. For
proper beam alignment function the value must be 40 to 95 % (BP209) /
20 to 95 % (BP10x). The green bulb to the right of the numeric field indic-
ates the "GOOD" range.
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· For a successful alignment, the optical power level must be adjusted in such way that the AD
Saturation is between 40 to 95 %. The green bulb to the right of the numeric field indicates
the "GOOD" range. During alignment this condition must not change!
· After initialization, the stage is at Position 2 (200 mm). Click the capture button of Position
2 - the centroid is captured, and its crosshair color changes to amber. As the actual beam
centroid that is marked by a blue crosshair, is located at the same position, the resulting
color is white:
· Click to the Position 1 capture button (0 mm). The stage moves to Position 1 and captures
the second centroid position:
· Now, the beam displacement and the pointing angle are displayed numerically.
· Align the beam position using the controls of your laser source. Subsequently click the cap-
ture button of position 1 and 2, observe the alignment, and improve it until all four alignment
criteria are fulfilled (bulbs must be at least yellow):
· The movement of the stage between the two stop positions can be controlled automati-
cally by the software. Just push the loop button and enter a convenient dwell time value.
The stage starts a loop move, dwelling at the stop position for the given time. During the
dwelling a realignment can be made. Please keep in mind, that the numeric alignment in-
dicators are being updated only after the next move.
· Verify that the holder of the focal lens is centered (markers on the CXY1 translator and
the lens holder should match), place the the mounted focal lens back to the magnetic
holder.
Make sure that the AD Saturation is still in green or at least yellow condition.
Observe the actual beam position and minimize the difference to the reference, using the
X-Y translators of the lens holder until the indicators are green or at least yellow.
M² Switches to M² measurement
PDF Test Protocol Saves the results of a M2 measurement into a PDF file
2. M² Diagram
The measured data are plotted in the diagram. The 4 buttons above the diagram allow the dis-
play to be configured: The buttons Beam Diameter X' (Y') enable / disable the display of the
measured data at the individual positions, while the buttons Hyperbolic Fit X' (Y') enable / dis-
able the curve fit to the measured data points.
After the measurement is finished, below the diagram the M² results for the X and Y axes are
displayed. To the left, an indicator shows if the measurement was successful and ISO compli-
ant. See also section M² Troubleshooting 118 .
The red marked button between the toolbar and the diagram expands the diagram over the
entire M² window
3. Numeric Results
In this area, the Beam Quality measurement results are displayed in detail. Please see section
M² Measurement Results 114 for more details.
4. Position Bar
The Position Bar below the M² Diagram shows the actual position of the translation stage as
seen before in the Alignment tab.
5. Selected Data Points
Select in the header of this sub-panel the Number of the desired measured data point. For this
selected point, the position of stage and the X and the Y profile of the beam are displayed. The
table Calculation Results of the Selected Point to the right contains the following information:
6. Status Bar
· Measurement progress bar
· Total number of measured data points
· Beam width setting for M² measurement
· Delay Line: Measurement range (difference between Start and Stop positions)
· Wavelength setting for beam quality calculation
7.8.3 M² Settings
For a successful and reliable measurement, the appropriate measurement settings are essen-
tial. Click to enter the M2 Measurement Settings dialog.
Beam Width
Gaussian Diameter: The beam
profile will be fit using a Gaus-
sian curve prior to the determin-
ation of the beam width. A
Gaussian fit can reduce the im-
pact of noise and/or unstable beam shape on the results.
Beam Width Clip (1/e²): This is the value specified in ISO
standard 11146-3. If a different clip level was used for normal
Beam Profiler operation this will be overwritten by the M² meas-
urement initialization.
Correct Beam Width: This option should be activated by de-
fault. Due to the finite slit width so called convolution errors
(blurred beam shape) appear, particularly at small beam diamet-
ers, that results in an artificial increase of the beam width. Since
this convolution error is systematic it can be calculated and elim-
inated. This feature increases the measurement accuracy, par-
ticularly when measuring narrow beams.
Measurement Parameters
Setting the wavelength is mandat-
ory for a correct M² measurement.
If the lasing wavelength is un-
known, measure the wavelength using a spectrometer.
Attention
Do not use the nominal wavelength of the laser, use the ac-
tual (measured) value! Accuracy of this input significantly
impacts the measurement accuracy.
Measurement Range
The Measurement Range determines the distance between the Start and Stop position, in
other words, the travel distance of the sleigh during the measurement. The travel distance can
range from 5 mm to the full length of the stage.
Min. Data Points is the (minimum) number of Z positions at which measurements will be
made.. The actual number depends also on the Scan Method.
Timeout is the waiting time until valid data can be retrieved from the Beam Profiler (e.g. in case
of slow travel speed).
Scan Method
The software provides two different kinds of scan
methods, the Normal Scan and the Coarse
Scan.
The Coarse Scan just moves the translation
stage from Start to Stop positions (or vice versa
depending on the position prior to start the measurement). The number of recorded beam
widths equates exactly to the entered number of Data Points.
The Normal Scan pursues an ISO compliant measurements. The ISO standard requires that
"... at least 10 measurements shall be taken. Approximately half of the measurements
shall be distributed within one Rayleigh Length on either side of the beam waist, and ap-
proximately half of them shall be distributed beyond two Rayleigh Lengths from the
beam waist."
The first run of the Normal Scan is executed with respect to the entered number of Data
Points, in other words, like a coarse scan. A preliminary Rayleigh Length is calculated in order
to evaluate if the number of measured data points is sufficient to fulfill the ISO standard require-
ments. If so, a hyperbolic fit is applied. If not, a second run adds additional measurements
within the Rayleigh Length on both sides and/or beyond twice the Rayleigh Length.
For a M2 measurement, running the Normal Scan is highly advised. The coarse scan is suitable
for a first estimate of the beam waist position or other preliminary measurements.
Reset
Select Enable to activate the automatic export. The toolbar icon changes to and the status
bar on the bottom of the GUI appears as
The Data Export remains active until Disable is checked. If the data shall be saved only once,
please check the boxes
Select Disable after next measurement to stop the automatic export after the first run of the
M² measurement.
prefix with date, time and manual index "Data" stands for Beam Profile Calculation Results
Device Data
prefix with date, time and manual index "Device" stands for Exported Device Data (here:intensity values of the
beam). Followed by individual time stamp and automatic index of the
appropriate stage position
M² / Divergence Measurement Results
prefix with date, time and manual index "Results" stands for M² test results
The green bulb indicates that the measurement was successful and fulfills the ISO 11146
standards:
In the case that a different from the ISO standard beam width criteria was used (see M² Set-
tings 107 ), a successful measurement is shown without the ISO indication:
In general, the X' and Y' axes do not coincide with the lab system (described by the X and Y
axes). Furthermore, the M² value for X' is independent from the one for Y'. For highly elliptical
beams, such as those from semiconductor lasers, M2X' and M2Y' will differ much more than in
this example.
Diagram Legend
Beam Diameter X'
Beam Diameter Y'
Hyperbolic Fit X'
Hyperbolic Fit Y'
These values can also be found in the listing of the complete results next to the diagram:
Waist Asymmetry stands for the ellipticity at the waist position and is calculated by taking the
ratio of the waist diameters in both X' and Y' directions. A waist asymmetry of 1.0 indicates a
round beam spot.
Divergence Asymmetry is the ratio of the divergence angles in Y and X axes. Values differing
from 1.0 indicate that the beam ellipticity is changing with Z position, for instance when an el-
liptical beam is focussed to a round spot.
Astigmatism is known as the effect that the beam waist in X and Y scan direction is not at the
same z position. So there is a difference between the positions of minimal spot diameters z0y
and z0y.
M² X' and M² Y' are the M² value for X' / Y' axis, calculated from the hyperbolic fit of the meas-
ured data points.
Rayleigh Length X' (Y') is the calculated distance [mm] from the beam waist position X' (Y') to
the position, where the beam diameter of the appropriate axis is Ö2 times larger than the waist
diameter. See also section M2 Theory 134 .
Waist Position X' (Y') Z position of the beam waist (smallest beam diameter). This is the calcu-
lated beam waist position in mm derived from the curve fit. This value may differ from the posi-
tion where the smallest beam width was measured.
Waist Diameter X' (Y') is the beam diameter in the X' (Y') direction at the focal point. This is
the calculated minimum beam diameter [µm], derived from the curve fit. This value may differ
from the smallest measured beam width.
Full Divergence Angle is explained in section M2 Theory 134 .
Note
All results are calculated from the applied fit!
As soon as the mouse pointer hits a measurement point, its shape changes to . Click this
point. The position and calculated values corresponding to the clicked point will appear in the
Calculations Results of the Selected Point panel:
Note
In contrast to the Results pane, the results shown here are calculated from the measured data
point without a hyperbolic fit. Therefore, the diameter value displayed at the actual waist may
differ from the X' (Y') waist diameters.
Reference Measurement
After a M² measurement is completed, the results can be saved and afterwards used as a refer-
ence. To do this just click the button, the active results become the reference. Further, the
reference data are added to the diagram in a different color.
7.8.7 M² Troubleshooting
Below are examples of typical problems that may occur and appropriate recommendations for
resolving them.
q The beam does not hit the sensor at all positions of the stage.
Perform a proper Beam Alignment 96 .
q A timeout occurs during a measurement.
A timeout always occurs when the Beam Profiler does not deliver a valid image within the set
time-out interval. This may be caused by:
· Saturation of the photo diode. To resolve, decrease incident optical power, or alternatively
use a lens with larger focal length if possible; this will increase the diameter of the focal
spot and in this way lower the focal power density.
· The beam power is too low.
· The beam size is too small and no ellipse could be calculated (if Clip Level Ellipse is se-
lected as beam width). Use a lens with a longer focal length to increase focal beam size.
· The beam is outside the aperture. Align the beam, see section Beam Alignment 96 .
4
waist and a too small M² (even below 1).
If the selected Clip Level is too low, the Calculation Area and the measurement captures
the beam plus noise around the beam. The measured beam width is then larger than
the actual beam width. This leads to an increased M².
q The beam profile looks distorted (particularly, at the end positions of the stage).
Even if a laser is expected to produce a Gaussian beam with M² = 1.0, the beam still can be in-
fluenced by every optical element between laser and Beam Profiler. For instance, a focusing
lens could be mounted with a tilt or could produce a height distortion which results in optical ab-
errations and reduced beam quality.
Filters and mirrors may impact on the beam profile as well in the case that surfaces are con-
taminated. Clean surfaces according to manufacturer's instructions.
q Error message
"The M2 Measurement has been aborted: Insufficient beam diameter variation over the selec-
ted scan range."
The software could not locate sufficient measurement points within the doubled Rayleigh
Length.
· Extend the Measurement Range 107 .
· Select a focusing lens with a shorter focal length.
· Rule of the thumb: the beam diameter variation within the scan range should not underrun
a ratio of 1:2.5 at least at one side of the beam waist - see the example below.
q Error message
"The measurement is not ISO compliant, because there are not enough data points inside the
Rayleigh Length X (Y)(xx mm) or beyond twice the Rayleigh Length"
· The software could not measure with the required resolution.
· Increase the minimum number of data points (see M² Settings 107 ).
· If the error message persists, increase the scan range as well.
q Error message
q Error message
"Waist position outside the scan range. Extend the scan range or switch to divergence meas-
urement."
· The calculation of the hyperbolic fit from the measured data points resulted in a beam
waist position outside the scan range. Usually this happens if the beam waist is close to
one of the scan end positions. Extend the scan range.
· Reset the M² Settings to default - that sets the scan range to its maximum
· Remove the Beam Profiler together with its mounting adapter from the M2MS base.
· Install the adjustment laser in place of the Beam Profiler and connect its 3.5 mm plug to
the Alignment Laser output (2) 94 .
· Make sure the M2MS is switched on and connected to the control PC, the Beam software
is started and the stage has been initialized.
· Remove the focal lens from the magnetic holder.
· Switch on the alignment laser.
· Align your optical system so that the spot of the alignment laser hits the center of your
light source.
Z [mm] This box shows the actual stage position; after initialization = 200 mm.
Position 1 (2) [mm] Here the left and right positions for the stage movement can be entered
numerically.
Markers for left and right positions. Instead of numerical entry of the
markers' positions, the markers can be move by drag-and-drop.
Clicking these capture buttons, the stage moves to the related position,
if not there yet, and captures the beam centroid position (amber
crosshair). This snapshot will remain until the stage comes back to the
appropriate position.
This button starts the stage loop movement mode and the stage moves
continuously between positions 1 and 2. A dwell time at the end positions
can be entered. During the loop mode, the software automatically cap-
tures the beam centroids (yellow cross hair) at the left and right stop.
Dwell Time Enter the desired time [sec]. The dwelling can be disabled by clicking to
the icon.
Centroid crosshair of the actual beam position.
Beam Displacement is the centroid shift in X (Y) direction between position 2 and 1 [mm]. The
box is first time filled after the 2nd capture.
Pointing Angle is the angle [°] in X (Y) direction between the beam axis and the stage
movement direction. The box is first time filled after the 2nd capture.
Alignment not successful
Alignment Success Alignment sufficient for correct Beam Quality Measurement (dis-
Indicator placement < 0.65 mm, angle < 0.35°)
Good alignment (displacement < 0.35 mm, angle < 0.15°)
AD Saturation Displays the current saturation of the Beam Profiler's AD converter. For
proper beam alignment function the value must be 40 to 95 % (BP209) /
20 to 95 % (BP10x). The green bulb to the right of the numeric field indic-
ates the "GOOD" range.
· For a successful alignment, the optical power level must be adjusted in such way that the AD
Saturation is between 40 to 95 %. The green bulb to the right of the numeric field indicates
the "GOOD" range. During alignment this condition must not change!
· After initialization, the stage is at Position 2 (200 mm). Click the capture button of Position
2 - the centroid is captured, and its crosshair color changes to amber. As the actual beam
centroid that is marked by a blue crosshair, is located at the same position, the resulting
color is white:
· Click to the Position 1 capture button (0 mm). The stage moves to Position 1 and captures
the second centroid position:
· Now, the beam displacement and the pointing angle are displayed numerically.
· Align the beam position using the controls of your laser source. Subsequently click the cap-
ture button of position 1 and 2, observe the alignment, and improve it until all four alignment
criteria are fulfilled (bulbs must be at least yellow):
· The movement of the stage between the two stop positions can be controlled automati-
cally by the software. Just push the loop button and enter a convenient dwell time value.
The stage starts a loop move, dwelling at the stop position for the given time. During the
dwelling a realignment can be made. Please keep in mind, that the numeric alignment in-
dicators are being updated only after the next move.
M² Switches to M² measurement
PDF Test Protocol Saves the results of a Divergence measurement into a PDF file
2. Divergence Diagram
The measured data are plotted in the diagram. The 4 buttons above the diagram allow the dis-
play to be configured: The buttons Beam Diameter X' (Y') enable / disable the display of the
measured data at the individual positions, while the buttons Divergence Fit X' (Y') enable / dis-
able the curve fit to the measured data points.
After the measurement is finished, below the diagram the Divergence results for the X and Y
axes are displayed. To the left, an indicator shows if the measurement was successful.
The red marked button between the toolbar and the diagram expands the diagram over the
entire Divergence window.
3. Numeric Results
In this area, the beam quality measurement results are displayed in detail. Please see section
Divergence Measurement Results 133 for more details.
4. Position Bar
The Position Bar below the Divergence Diagram shows the actual position of the translation
stage as seen before in the Alignment 98 tab.
5. Individual Data Points
Select in the header of this sub-panel the Number of the desired measured data point. For this
selected point, the position of stage and the X and the Y profile of the beam are displayed. The
table Calculation Results of the Selected Point to the right contains the following information:
6. Status Bar
· Measurement progress bar
· Total number of measured data points
· Beam width setting for divergence measurement
· Delay Line: Measurement range (difference between Start and Stop positions)
· Wavelength setting (not relevant for divergence calculation)
These values can also be found in the listing of the complete Results.
Negative values indicate a converging beam, while positive values indicate a diverging beam.
Note
All results are calculated from the applied linear fit!
Full Divergence Angle X' (Y') is explained in chapter M² Theory 134 .
Divergence Asymmetry Asymmetry is the quotient of divergence angles in Y and X scan direc-
tions. Values differing from 1.0 indicate that the beam ellipticity is changing with z position, for
instance an elliptical beam is focused to a round spot.
Reference Measurement
The actual measurement results can be saved and used as reference afterwards, same as for
M² Measurement Results 117 .
7.10 M² Theory
The diameter d(z) of a focused laser beam increases with distance z from its waist position and
can be calculated as follows:
with
d0 Waist Diameter
zR Rayleigh Length
l Wavelength
In this equation it was assumed that the waist location is at zero. Otherwise z has to be re-
placed with (z-z0)
The Rayleigh Length zR determines the distance from the beam waist to the position where the
beam diameter has increased by a factor of Ö2 = 1.41 compared to the minimum diameter at
the waist.
From the equation for d(z) it can be seen that the beam diameter increases linearly with z in the
far field (z >>zR ). The full divergence angle Θ can be calculated by
For laser beams with fundamental mode TEM00 (Gaussian Beam shape) it can be theoretically
shown that the Rayleigh Length is given by
Thus the product of the minimum diameter of a Gaussian beam (at waist) and the divergence
angle (AKA 'Beam Parameter Product', BPP) is constant for a given wavelength:
For mode mixture (MM) beams, i.e. beams which feature higher order modes than just the fun-
damental mode TEM00, the product of beam diameter and divergence increases by a factor of
M².
The reciprocal of the times-diffraction-limit factor M2 is called the beam propagation factor or
beam quality K.
The following table illustrates the differences between a perfect Gaussian beam and non-per-
fect beam.
Parameter Gaussian Beam Mode Mixture Beam
Times-diffraction-limit factor M2 1 >1
Beam propagation factor = Beam quality K 1 <1
Beam waist for given lens minimal larger
Divergence angle q at given beam waist d0 narrow wider
Reasons for Non-Ideal Gaussian Beam with M2 > 1
Using a Gaussian beam is preferred because of its minimum divergence angle and the ability to
achieve the minimal focus diameter. Differences to Gaussian shape can be due to
· existence of higher order modes
· amplitude and phase distortions due to inhomogeneous gain medium in lasers
· presence of extraordinary beams
These distortions lead to a larger beam waist compared to Gaussian beams when the same fo-
cal lens is used. This results in a lower maximum achievable power density in the focal point.
Comparison of Propagation Between Fundamental Mode TEM00 (Ideal Gaussian beam)
and Mode Mixture Beams
With a given divergence angle (i.e. knowing the focal length of the lens), the fundamental mode
alone produces the theoretically smallest possible beam waist (green curve). If beam quality
worsens (red curve), the beam waist increases. If divergence is fixed, beam waist increases lin-
early by the factor M2 compared to the underlying Gaussian.
The appropriate power density at z0 is reduced by a factor (M²)². Also the Rayleigh Length in-
creases by a factor of M².
Note
All above environments require also the NI VISA instrument driver dll !
During NI-VISA Runtime installation, a system environment variable VXIPNPPATH for including
files is created. It stores information where the drivers are installed, usually to C:\Program
Files\IVI Foundation\VISA\WinNT\.
This is the reason why a system reboot is required after the installation of a NI-VISA Runtime:
This environment variable is necessary for installation of the application software components.
In the next sections the location of above files for all hardware, supported by Beam software
drivers, is described in detail.
Example for C#
Solution file:
C:\Program Files\IVI Foundation\VISA\WinNT\TLBP2\Examples…
…\MS VS 2012 CSharp Demo\DotNet_Sample\Thorlabs.BP2_CSharpDemo…
…\Thorlabs.BP2_CSharpDemo.sln
Project file:
C:\Program Files\IVI Foundation\VISA\WinNT\TLBP2\Examples …
…\MS VS 2012 CSharp Demo\DotNet_Sample\Thorlabs.BP2_CSharpDemo…
…\Thorlabs.BP2_CSharpDemo.csproj
Executable sample demo:
C:\Program Files\IVI Foundation\VISA\WinNT\TLBP2\Examples …
…\MS VS 2012 CSharp Demo\DotNet_Sample\Thorlabs.BP2_CSharpDemo…
…\output\Thorlabs.BP2_CSharpDemo.exe
Example for LabView
C:\Program Files\National Instruments\LabVIEW xxxx\Instr.lib\TLBP2…
…\TLBP2.llb
(LabVIEW container file with driver vi's and an example. "LabVIEW xxxx" stands for actual
LabVIEW installation folder.)
In case of a support request, please submit the software version of the application. This will
help to locate the error.
9.2 Cleaning
The Beam Profiler has parts (slits) mounted to the drum that are sensitive to mechanical im-
pacts. Do not attempt to clean the slits using tissue, cotton buds or compressed air - the slit
might be damaged. In case a visible contaminant is found, please contact us. A list of our
worldwide branches can be found at the end of this manual.
The outer surfaces of the instrument may be cleaned using a wet lint-free cloth.
9.3 Troubleshooting
q Software Installation failed
In order to install the Beam software on your PC, you need administrator privileges. Other-
wise, an installation is impossible. If you have trouble with software installation, please con-
tact your system administrator.
q No Beam Profiler recognized
If after starting of Beam software no instrument was recognized, the Device Settings button
in the Menu bar is crossed out ( ).
· Check if you have connected a BP209 instrument.
· Check the USB cable. Make sure you are using the supplied with instrument cable.
· Check proper driver installation
· Check if the green LED lights up - LED off indicates that the Beam Profiler's firmware was
not loaded.
See section Connection to the PC 17 for details.
You may unplug and reconnect the Beam Profiler to a different USB port or use a different
USB cable. Wait a few seconds, until the green LED lights up. Then click 'Refresh Device
List' within the Device Selection panel. See chapter Start the Application 18 for a detailed
description.
q An older external VT-80 stage is connected, but not recognized
· If the M² translation stage was not initialized after Beam software start,
· Check if the stage is powered up (red LED blinking)
· Check the connection of the stage to the PC
· If the USB-to-Serial converter is used, check for proper driver installation used.
· Press the Refresh button
10 Application Note
This chapter contains some background information about the measurement methods of beam
profiles.
Beam profiles can be characterized by a number of different parameters. We aim to offer a
software that allows to measure all usual beam parameters based on ISO11146-1 standard.
In the following sections detailed explanations are given to the measured parameters.
4s Beam Width is the width of a beam in X and Y axes (centroids), derived from the second
moment calculation:
where sx and sy are the standard deviation of the horizontal or vertical marginal distribution, re-
spectively:
and
Note
The 4s Beam Width measurement is not in conformity with ISO11146! Displayed results are
for information only!
In accordance with ISO11146-3, beam diameters shall be defined at a 1/e² clip level for Slit
Beam Profilers, while for Camera Beam Profilers the 4sX' and 4sY' beam widths apply.
Peak Position
X, Y: position of the pixel with highest intensity (AD value) which is found first with respect to
reference position.
is the dial distance of peak position's pixel from the reference position (= sensor center).
Centroid Position
X, Y and R position (first moment), calculated over all pixels with respect to the above reference
position.
X= SUM [x * p(x,y)] / I Y= SUM [y * p(x,y)] / I
where:
p(x,y) intensity at location (x,y);
I total intensity;
SUM of pixels taken over the entire area
AD Saturation
Saturation level of the instrument's AD converter. For a good SNR (signal-to-noise ratio) the
saturation level should be not below 40% and not be above 95%.
Total Power
Total power measured through the ND filter 21 in the drum (photo diode current with respect to
the typical wavelength-dependent responsivity).
Diameter (clip level) is given for the minor axis (min), major axis (max) and their arithmetic
mean value.
Ellipticity and Eccentricity of the beam are defined in ISO 11146-1 as
with dmin = minor axis and dmax = major axes of the approximated beam ellipse.
Orientation denotes the angle q between the major ellipse axis and the horizontal X axis.
Range: -90° < q
Gaussian Intensity is the intensity distribution of the Gaussian fitted beam profile.
Gaussian Diameter is the width of the Gaussian fitted profile at a 1/e² intensity clip level.
11 Appendix
11.1 Technical Data Beam Profiler
Model BP209-VIS BP209-IR BP209-IR2
BP209-VIS/M BP209-IR/M BP209-IR2/M
Wavelength Range 200 - 1100 nm 900 - 1700 nm 900 - 2700 nm
Detector Type Si, UV enhanced InGaAs Extended InGaAs
Aperture Diameter 9 mm
Scan Method Scanning Slits, Knife Edge
Slit Size 5 µm and 25 µm
Minimum Beam Diameter 2.5 µm
Maximum Beam Diameter 9 mm 1)
Sampling Resolution 0.12 to 1.24 µm (Depending on Scan Rate)
Scan Rate 2.0 to 20.0 s-1 (Continuously Variable)
Optical Power Range 1 µW to 10 W (Depending on Beam Diameter and Model)
Amplifier Bandwidth 16 to 1000 kHz in 11 steps (@ -1dB)
Sample Frequency 0.2872 to 2.0 MHz
Dynamic Range 78 dB (Amplifier Switchable)
Photodiode Bias Voltage 0 / -1.5 V (Switchable) 0V
Signal Digitization 15 bit
Head Dimensions Ø 79.5 mm x 60 mm (Including Rotation Mount)
Minimum Pulse Rate 10 Hz 2)
Software
X-Y-Profile, Centroid Position, Peak Position, Pseudo 3D Profile,
Displayed Parameters and
Features Beam Width Clip Level / Second Moment (4s), Gaussian Fit Applicable,
Colored Pass/Fail Test
ISO 11146
Compliance with Standards
(Beam Widths, Divergence Angle and Beam Propagation Factor)
General System Requirements Windows® 7 or later, USB 2.0 High Speed Port
M² Analysis System
Compatible M² Options M2MS M² Measurement Systems
Compliance with Standards ISO 11146
M², Waist Width, Waist Position, Rayleigh Length, Divergence,
Measured Parameters 3)
Beam Pointing, Waist Asymmetry, Astigmatism
General
Operating Temperature +5 ... +35 °C
Storage Temperature -40 ... +70 °C
Warm-up time for rated accuracy 15 min
All technical data are valid at 23 ± 5°C and 45 ± 15% rel. humidity
Note
Please note that these operating power ranges apply to measurements made using the slits in
scanning-slit or knife-edge mode; these limits may be reduced when measuring total power.
Scanning-slit mode transmits a fraction of the beam power to the photodetector, and during
knife-edge mode the un-attenuated, <Ø20 µm, full beam is transmitted to the photodetector. In
addition to the two pairs of slits, the rotating drum contains an aperture fitted with a neutral
density (ND) filter that, once per rotation, allows the full attenuated beam to reach the photode-
tector. The power in the attenuated full beam may fall outside of the operating range of the de-
tector. In this case, an error message will be displayed in the status box. However, beam shape
measurements using the slits can still be made, assuming the power transmitted by the slits
falls within the limits plotted in the diagram.
BP209-IR and BP209-IR2 use an aspheric collimating lens between the slit and the photodiode:
Electrical connections, particularly of the used older VT-80 linear translation stages, and mech-
anical setup should be carried out as described in the appropriate documentation to this hard-
ware, while operation is described in the manual on hand.
Older documentation can be downloaded from the Thorlabs Manual Archive at www.thor-
labs.com/manuals.cfm. Open this page and enter the desired item number; be careful about
correct spelling (e.g., "BP104-IR2/M" or "M2SET-VIS").
2D 2 Dimensional
3D 3 Dimensional
ADC Analog to Digital Converter
AL Aluminum
AR Anti Reflection
BC Beam Profiler Camera
CA Calculation Area
cw Continuous Wave (constant power source)
GUI Graphical User Interface
ND Neutral Density
PC Personal Computer
FPS Frames Per Second
ROI Region Of Interest
USB Universal Serial Bus
UV Ultra Violet (wavelength range)
VIS VISible (wavelength range)
As the WEEE directive applies to self contained operational electrical and electronic products,
this “end of life” take back service does not refer to other Thorlabs products, such as
· pure OEM products, that means assemblies to be built into a unit by the user (e. g. OEM
laser driver cards)
· components
· mechanics and optics
· left over parts of units disassembled by the user (PCB’s, housings etc.).
Ecological background
It is well known that waste treatment pollutes the environment by releasing toxic products dur-
ing decomposition. The aim of the European RoHS Directive is to reduce the content of toxic
substances in electronic products in the future.
The intent of the WEEE Directive is to enforce the recycling of WEEE. A controlled recycling of
end-of-life products will thereby avoid negative impacts on the environment.
Crossed out
"Wheelie Bin" symbol
Symbol Meaning
Universal Serial Bus (USB), a serial bus standard to interface devices to a
host computer.
The CE mark is a mandatory conformity mark on many products placed
on the single market in the European Economic Area (EEA). By affixing
the CE marking, the manufacturer asserts that the item meets all the es-
sential requirements of the relevant European Directive(s). It does not cer-
tify that a product has met EU consumer safety, health or environmental
requirements.
Crossed out "Wheelie Bin" symbol. Waste Electrical and Electronic Equip-
ment (WEEE) is a loose description of surplus, obsolete, broken or dis-
carded electrical or electronic devices. See Thorlabs 'End of Life' Policy
(WEEE) 164 .
11.16 Warranty
Thorlabs warrants material and production of the BP209 for a period of 24 months starting with
the date of shipment. During this warranty period Thorlabs will see to defaults by repair or by
exchange if these are entitled to warranty.
For warranty repairs or service the unit must be sent back to Thorlabs. The customer will carry
the shipping costs to Thorlabs, in case of warranty repairs Thorlabs will carry the shipping costs
back to the customer.
If no warranty repair is applicable the customer also has to carry the costs for back shipment.
In case of shipment from outside EU duties, taxes etc. which should arise have to be carried by
the customer.
Thorlabs warrants the hard- and/or software determined by Thorlabs for this unit to operate
fault-free provided that they are handled according to our requirements. However, Thorlabs
does not warrant a fault free and uninterrupted operation of the unit, of the software or firmware
for special applications nor this instruction manual to be error free. Thorlabs is not liable for
consequential damages.
Restriction of Warranty
The warranty mentioned before does not cover errors and defects being the result of improper
treatment, software or interface not supplied by us, modification, misuse or operation outside
the defined ambient stated by us or unauthorized maintenance.
Further claims will not be consented to and will not be acknowledged. Thorlabs does explicitly
not warrant the usability or the economical use for certain cases of application.
Thorlabs reserves the right to change this instruction manual or the technical data of the de-
scribed unit at any time.
Europe Scandinavia
Thorlabs GmbH Thorlabs Sweden AB
[email protected] [email protected]
France Brazil
Thorlabs SAS Thorlabs Vendas de Fotônicos Ltda.
[email protected] [email protected]
Japan China
Thorlabs Japan, Inc. Thorlabs China
[email protected] [email protected]
B G
BC106 Selection 17 Gaussian beam 134
BC106 Settings 69 Gaussian Diameter 148
Beam Diameter 146 Gaussian Intensity 148
Beam Overlapping 60 General Information 6
Beam quality measurement 84 Guidelines for Operation 69
Beam Waist 114
Beam Width 146 I
Beam Width Clip 148
Image Export 73
C
K
Calculation Results 52
K factor 134
Cannot Connect 143
Knife Edge Mode 81
Centroid Position 146
Certifications and 166
Compilances
L
Child Windows 45 Lab System 146
Cleaning 142 List of Acronyms 163
Connection to the PC 17
Coordinate systems 146 M
M² Display 105
D M² Error Messages 118
Data Export 73 M² Measurement 96, 105, 113
Default Value 69 M² Measurement Results 114
Device Selection 17, 69 M² Settings 107
Device Settings 36 M² Theory 134
Divergence Angle 114 Maintenance and Repair 142
Divergence Assymetry 114 Manual Vergence 56
Divergence Display 129 Measurement
Divergence Measurement 121, 132 MaxHold function 79
R W
Raw Data Measurements 146 Waist Assymetry 114
Rayleigh length 114, 134 Waist diameter 134
Region of Interest 69 Warnings 144
Requirements 10 Wavelength 69, 134
ROI 69 Wavelength Response 153
Rotation mount 19
RS232 94
X
X / Y Profile 50
S X and Y axis 19
Safety 6
Save Measurement Results 73
Save Settings 31