Hitachi High-Tech Europe GmbH is a market-leading European provider of high-tech lab solutions for industry and academia, covering materials science, life sciences, biotechnology, industrial automation, and nanotechnology.
Since it began manufacturing microscopes in 1947, the company has driven innovation in global scientific research with a diverse product lineup, including SEM systems, TEM systems, and ion beam milling systems. In 1969 it began developing field emission electron beam source technology before going on to create the breakthrough FE-SEM. Its groundbreaking imaging technology has been used to reveal answers that have changed the world, and the simplicity, robustness, and advanced capabilities of its products have earned it global popularity. Hitachi High-Tech Europe's state-of-the-art equipment supports analytical and R&D scientists in multiple industries, empowering them to prepare specimens, examine complex scientific interactions, and understand structures and materials down to the nanoscale.
In addition to its core focus on lab solutions, Hitachi High-Tech Europe GmbH engages in activities in a broad range of fields, including manufacturing and sales of clinical analysers, biotechnology products, radiation therapy systems, semiconductor manufacturing equipment, analytical instruments, and analysis equipment. The company also provides high value-added solutions in industrial fields such as mobility, connectivity, environment, and energy. Through business based on its core Observation, Measurement, and Analysis technologies, Hitachi High-Tech Europe GmbH is committed to contributing to the realisation of a sustainable society by solving social issues.
Our comprehensive product range and expertise make us the brand of choice for scientists in the European market.
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Branche
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Nanotechnologieforschung
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Größe
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51–200 Beschäftigte
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Hauptsitz
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Krefeld
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Spezialgebiete
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Sample Preparation, Electron Microscopy, TEM, SEM, FIB, Scanning Electron Microscopy, Transmission Electron Microscopy, Focused Ion Beam Systems, FIB-SEM, Ion Milling Systems, Broad Ion Beam Milling, STEM, Scanning Transmission Electron Microscopy, Field Emission Scanning Electron Microscopy und FE SEM