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2020 – today
- 2024
[j52]Juan Suzano
, Fady Abouzeid, Giorgio Di Natale, Anthony Philippe, Philippe Roche:
On Hardware Security and Trust for Chiplet-Based 2.5D and 3D ICs: Challenges and Innovations. IEEE Access 12: 29778-29794 (2024)- [j51]Pietro Inglese, Elena-Ioana Vatajelu, Giorgio Di Natale:
Side Channel and Fault Analyses on Memristor-Based Logic In-Memory. IEEE Des. Test 41(3): 29-35 (2024) - [j50]Vasilii Kulagin, Sergio Vinagrero Gutierrez, Tobias Kilian, Daniel Tille, Ulf Schlichtmann, Giorgio Di Natale, Elena-Ioana Vatajelu:
On the Relation Between Reliability and Entropy in Physical Unclonable Functions. IEEE Des. Test 41(6): 46-53 (2024) - [c146]Fabio Pavanello, Cédric Marchand, Paul Jiménez, Xavier Letartre, Ricardo Chaves, Niccolò Marastoni, Alberto Lovato, Mariano Ceccato, George Papadimitriou, Vasileios Karakostas, Dimitris Gizopoulos, Roberta Bardini, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino, Laurence Lerch, Ulrich Rührmair, Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu:
Security Layers and Related Services within the Horizon Europe NEUROPULS Project. DATE 2024: 1-6 - [c145]Aghiles Douadi, Elena-Ioana Vatajelu, Paolo Maistri, David Hély, Vincent Beroulle, Giorgio Di Natale:
Modeling Thermal Effects For Biasing PUFs. ETS 2024: 1-4 - [c144]Juan Suzano, Antoine Chastand, Emanuele Valea, Giorgio Di Natale, Anthony Philippe, Fady Abouzeid, Philippe Roche:
IEEE 1838 compliant scan encryption and integrity for 2.5/3D ICs. ETS 2024: 1-6 - [c143]Nasr-Eddine Ouldei Tebina, Aghiles Douadi, Luc Salvo, Vincent Beroulle, Nacer-Eddine Zergainoh, Guillaume Hubert, Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Maistri:
Non-Invasive Attack on Ring Oscillator-Based PUFs Through Localized X-Ray Irradiation. HOST 2024: 1-11 - [c142]Roua Boulifa, Giorgio Di Natale, Paolo Maistri:
Internal State Monitoring in RISC-V Microarchitectures for Security Purpose. LATS 2024: 1-5 - 2023
- [j49]Honorio Martín, Sophie Dupuis, Giorgio Di Natale, Luis Entrena:
Using Approximate Circuits Against Hardware Trojans. IEEE Des. Test 40(3): 8-16 (2023) - [j48]Farimah Farahmandi, Ankur Srivastava, Giorgio Di Natale, Mark M. Tehranipoor:
Introduction to the Special Issue on CAD for Security: Pre-silicon Security Sign-off Solutions Through Design Cycle. ACM J. Emerg. Technol. Comput. Syst. 19(1): 4:1-4:4 (2023) - [c141]Sergio Vinagrero Gutierrez, Pietro Inglese, Giorgio Di Natale, Elena-Ioana Vatajelu:
Open Automation Framework for Complex Parametric Electrical Simulations. DDECS 2023: 132-135 - [c140]Fabio Pavanello, Cédric Marchand, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena-Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira, Mariano Ceccato, Dimitris Gizopoulos, George Papadimitriou, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino:
EUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS. ETS 2023: 1-6 - [c139]Aghiles Douadi, Giorgio Di Natale, Paolo Maistri, Elena-Ioana Vatajelu, Vincent Beroulle:
A Study of High Temperature Effects on Ring Oscillator Based Physical Unclonable Functions. IOLTS 2023: 1-7 - [c138]Maryam Esmaeilian, Aghiles Douadi, Zahra Kazemi, Vincent Beroulle, Amir-Pasha Mirbaha, Mahdi Fazeli, Elena-Ioana Vatajelu, Paolo Maistri, Giorgio Di Natale:
Experimental Evaluation of Delayed-Based Detectors Against Power-off Attack. IOLTS 2023: 1-3 - [c137]Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu:
On-Line Method to Limit Unreliability and Bit-Aliasing in RO-PUF. IOLTS 2023: 1-6 - [i4]Fabio Pavanello, Cédric Marchand, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena-Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira, Mariano Ceccato, Dimitris Gizopoulos, George Papadimitriou, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino:
NEUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS. CoRR abs/2305.03139 (2023) - [i3]Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu:
Python Framework for Modular and Parametric SPICE Netlists Generation. CoRR abs/2306.12224 (2023) - [i2]Fabio Pavanello, Cédric Marchand, Paul Jiménez, Xavier Letartre, Ricardo Chaves, Niccolò Marastoni, Alberto Lovato, Mariano Ceccato, George Papadimitriou, Vasileios Karakostas, Dimitris Gizopoulos, Roberta Bardini, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino, Laurence Lerch, Ulrich Rührmair, Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu:
Security layers and related services within the Horizon Europe NEUROPULS project. CoRR abs/2312.09383 (2023) - 2022
- [j47]Amir Ali Pour, Fatemeh Afghah, David Hély, Vincent Beroulle, Giorgio Di Natale, Ashwija Reddy Korenda, Bertrand Cambou:
Helper Data Masking for Physically Unclonable Function-Based Key Generation Algorithms. IEEE Access 10: 40150-40164 (2022) - [j46]Michele Portolan, Emanuele Valea, Paolo Maistri, Giorgio Di Natale:
Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 Extensions. IEEE Des. Test 39(3): 117-124 (2022) - [j45]Luca Cassano, Mattia Iamundo, Tomas Antonio Lopez, Alessandro Nazzari, Giorgio Di Natale:
DETON: DEfeating hardware Trojan horses in microprocessors through software ObfuscatioN. J. Syst. Archit. 129: 102592 (2022) - [j44]Gilad Dar, Giorgio Di Natale, Osnat Keren:
Nonlinear Code-Based Low-Overhead Fine-Grained Control Flow Checking. IEEE Trans. Computers 71(3): 658-669 (2022) - [j43]Mohamed Elshamy, Giorgio Di Natale, Alhassan Sayed, Antonios Pavlidis, Marie-Minerve Louërat, Hassan Aboushady, Haralampos-G. Stratigopoulos:
Digital-to-Analog Hardware Trojan Attacks. IEEE Trans. Circuits Syst. I Regul. Pap. 69(2): 573-586 (2022) - [c136]Amir Ali Pour, David Hély, Vincent Beroulle, Giorgio Di Natale:
Elaborating on Sub-Space Modeling as an Enrollment Solution for Strong PUF. DCOSS 2022: 394-399 - [c135]Cristiana Bolchini, Alberto Bosio, Luca Cassano, Bastien Deveautour, Giorgio Di Natale, Antonio Miele, Ian O'Connor, Elena-Ioana Vatajelu:
Dependability of Alternative Computing Paradigms for Machine Learning: hype or hope? DDECS 2022: 7-13 - [c134]Luca Cassano, Elia Lazzeri, Nikita Litovchenko, Giorgio Di Natale:
On the optimization of Software Obfuscation against Hardware Trojans in Microprocessors. DDECS 2022: 172-177 - [c133]Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu:
On-Line Reliability Estimation of Ring Oscillator PUF. ETS 2022: 1-2 - [c132]Tiziano Fiorucci, Giorgio Di Natale, Jean-Marc Daveau, Philippe Roche:
Software Product Reliability Based on Basic Block Metrics Recomposition. IOLTS 2022: 1-5 - [c131]Amir Ali Pour, David Hély, Vincent Beroulle, Giorgio Di Natale:
Sub-Space Modeling: An Enrollment Solution for XOR Arbiter PUF using Machine Learning. ISQED 2022: 1 - [c130]Amir Ali Pour, David Hély, Vincent Beroulle, Giorgio Di Natale:
An Efficient Approach to Model Strong PUF with Multi-Layer Perceptron using Transfer Learning. ISQED 2022: 1-6 - [c129]Amir Ali Pour, Fatemeh Afghah, David Hély, Vincent Beroulle, Giorgio Di Natale:
Secure PUF-based Authentication and Key Exchange Protocol using Machine Learning. ISVLSI 2022: 386-389 - [c128]Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos:
Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure. ITC 2022: 539-543 - 2021
- [c127]Amine Jaamoum, Thomas Hiscock, Giorgio Di Natale:
Scramble Cache: An Efficient Cache Architecture for Randomized Set Permutation. DATE 2021: 621-626 - [c126]Honorio Martín, Elena-Ioana Vatajelu, Giorgio Di Natale:
Identification of Hardware Devices based on Sensors and Switching Activity: a Preliminary Study. DATE 2021: 1496-1499 - [c125]Pietro Inglese, Elena-Ioana Vatajelu, Giorgio Di Natale:
On the Limitations of Concatenating Boolean Operations in Memristive-Based Logic-In-Memory Solutions. DTIS 2021: 1-5 - [c124]Antoine Linarès, David Hély, Frank Lhermet, Giorgio Di Natale:
Design Space Exploration Applied to Security. DTIS 2021: 1-4 - [c123]Tiziano Fiorucci, Jean-Marc Daveau, Giorgio Di Natale, Philippe Roche:
Automated Dysfunctional Model Extraction for Model Based Safety Assessment of Digital Systems. IOLTS 2021: 1-6 - [c122]Michele Portolan, Vincent Reynaud, Paolo Maistri, Régis Leveugle, Giorgio Di Natale:
Security EDA Extension through P1687.1 and 1687 Callbacks. ITC 2021: 344-353 - 2020
- [j42]Giorgio Di Natale, Cristiana Bolchini:
Holding Conferences Online due to COVID-19: The DATE Experience. IEEE Des. Test 37(3): 116-118 (2020) - [c121]Giorgio Di Natale, Francesco Regazzoni, Vincent Albanese, Frank Lhermet, Yann Loisel, Abderrahmane Sensaoui, Samuel Pagliarini:
Latest Trends in Hardware Security and Privacy. DFT 2020: 1-4 - [c120]Amir Alipour, Vincent Beroulle, Bertrand Cambou, Jean-Luc Danger, Giorgio Di Natale, David Hély, Sylvain Guilley, Naghmeh Karimi:
PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. ETS 2020: 1-10 - [c119]Mohamed Elshamy, Giorgio Di Natale, Antonios Pavlidis, Marie-Minerve Louërat, Haralampos-G. D. Stratigopoulos:
Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism. ETS 2020: 1-6 - [c118]Giorgio Di Natale, Osnat Keren:
Nonlinear Codes for Control Flow Checking. ETS 2020: 1-6 - [c117]Francesco Regazzoni, Shivam Bhasin, Amir Alipour, Ihab Alshaer, Furkan Aydin, Aydin Aysu, Vincent Beroulle, Giorgio Di Natale, Paul D. Franzon, David Hély, Naofumi Homma, Akira Ito, Dirmanto Jap, Priyank Kashyap, Ilia Polian, Seetal Potluri, Rei Ueno, Elena-Ioana Vatajelu, Ville Yli-Mäyry:
Machine Learning and Hardware security: Challenges and Opportunities -Invited Talk-. ICCAD 2020: 141:1-141:6
2010 – 2019
- 2019
- [j41]Emanuele Valea, Mathieu Da Silva, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A Survey on Security Threats and Countermeasures in IEEE Test Standards. IEEE Des. Test 36(3): 95-116 (2019) - [j40]Maha Kooli, Giorgio Di Natale, Alberto Bosio:
Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems. J. Electron. Test. 35(2): 145-162 (2019) - [j39]Emanuele Valea, Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Stream vs block ciphers for scan encryption. Microelectron. J. 86: 65-76 (2019) - [j38]Alessandro Vallero, Alessandro Savino, Athanasios Chatzidimitriou, Manolis Kaliorakis, Maha Kooli, Marc Riera, Martí Anglada, Giorgio Di Natale, Alberto Bosio, Ramon Canal, Antonio González, Dimitris Gizopoulos, Riccardo Mariani, Stefano Di Carlo:
SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems. IEEE Trans. Computers 68(5): 765-783 (2019) - [j37]Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Preventing Scan Attacks on Secure Circuits Through Scan Chain Encryption. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 538-550 (2019) - [j36]Elena-Ioana Vatajelu, Giorgio Di Natale:
High-Entropy STT-MTJ-Based TRNG. IEEE Trans. Very Large Scale Integr. Syst. 27(2): 491-495 (2019) - [c116]Giorgio Di Natale, Elena-Ioana Vatajelu, Kalpana Senthamarai Kannan, Lorena Anghel:
Hidden-Delay-Fault Sensor for Test, Reliability and Security. DATE 2019: 316-319 - [c115]Emanuele Valea, Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Encryption-Based Secure JTAG. DDECS 2019: 1-6 - [c114]Alberto Bosio, Ian O'Connor, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Elena I. Vatajelu, Giorgio Di Natale, Lorena Anghel, Surya Nagarajan, Moritz Fieback, Said Hamdioui:
Rebooting Computing: The Challenges for Test and Reliability. DFT 2019: 8138-8143 - [c113]Emanuele Valea, Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Sophie Dupuis, Bruno Rouzeyre:
Providing Confidentiality and Integrity in Ultra Low Power IoT Devices. DTIS 2019: 1-6 - [c112]Michele Portolan, Alessandro Savino, Régis Leveugle, Stefano Di Carlo, Alberto Bosio, Giorgio Di Natale:
Alternatives to Fault Injections for Early Safety/Security Evaluations. ETS 2019: 1-10 - [c111]Cristiana Bolchini, Luca Cassano, Ivan Montalbano, Giampiero Repole, Andrea Zanetti, Giorgio Di Natale:
HATE: a HArdware Trojan Emulation Environment for Microprocessor-based Systems. IOLTS 2019: 109-114 - [c110]Elena-Ioana Vatajelu, Giorgio Di Natale, Mohd Syafiq Mispan, Basel Halak:
On the Encryption of the Challenge in Physically Unclonable Functions. IOLTS 2019: 115-120 - [c109]Honorio Martín, Elena-Ioana Vatajelu, Giorgio Di Natale, Osnat Keren:
On the Reliability of the Ring Oscillator Physically Unclonable Functions. IVSW 2019: 25-30 - [c108]Marc Merandat, Vincent Reynaud, Emanuele Valea, Jérôme Quévremont, Nicolas Valette, Paolo Maistri, Régis Leveugle, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre, Giorgio Di Natale:
A Comprehensive Approach to a Trusted Test Infrastructure. IVSW 2019: 43-48 - [c107]Elena-Ioana Vatajelu, Giorgio Di Natale, Lorena Anghel:
Special Session: Reliability of Hardware-Implemented Spiking Neural Networks (SNN). VTS 2019: 1-8 - [i1]Emanuele Valea, Mathieu Da Silva, Giorgio Di Natale, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre:
SECCS: SECure Context Saving for IoT Devices. CoRR abs/1903.04314 (2019) - 2018
- [j35]Sophie Dupuis, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Protection Against Hardware Trojans With Logic Testing: Proposed Solutions and Challenges Ahead. IEEE Des. Test 35(2): 73-90 (2018) - [j34]Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, Bruno Rouzeyre, Rodrigo Possamai Bastos:
Assessing body built-in current sensors for detection of multiple transient faults. Microelectron. Reliab. 88-90: 128-134 (2018) - [j33]Honorio Martín, Giorgio Di Natale, Luis Entrena:
Towards a Dependable True Random Number Generator With Self-Repair Capabilities. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(1): 247-256 (2018) - [j32]Mario Barbareschi, Giorgio Di Natale, Lionel Torres, Antonino Mazzeo:
A Ring Oscillator-Based Identification Mechanism Immune to Aging and External Working Conditions. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(2): 700-711 (2018) - [j31]Giorgio Di Natale, Marco Ottavi:
Guest Editorial: IEEE Transactions on Emerging Topics in Computing Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era. IEEE Trans. Emerg. Top. Comput. 6(2): 170-171 (2018) - [c106]Emanuele Valea, Mathieu Da Silva, Giorgio Di Natale, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre:
SI ECCS: SECure context saving for IoT devices. DTIS 2018: 1-2 - [c105]Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. FDTC 2018: 1-6 - [c104]Honorio Martín, Luis Entrena, Sophie Dupuis, Giorgio Di Natale:
A Novel Use of Approximate Circuits to Thwart Hardware Trojan Insertion and Provide Obfuscation. IOLTS 2018: 41-42 - [c103]Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. IOLTS 2018: 214-219 - [c102]Mathieu Da Silva, Emanuele Valea, Marie-Lise Flottes, Sophie Dupuis, Giorgio Di Natale, Bruno Rouzeyre:
A New Secure Stream Cipher for Scan Chain Encryption. IVSW 2018: 68-73 - [c101]Mathieu Da Silva, Emanuele Valea, Marie-Lise Flottes, Sophie Dupuis, Giorgio Di Natale, Bruno Rouzeyre:
Encryption of test data: which cipher is better? PRIME 2018: 85-88 - [c100]Lorena Anghel, Denys Ly, Giorgio Di Natale, Benoît Miramond, Elena-Ioana Vatajelu, Elisa Vianello:
Neuromorphic Computing - From Robust Hardware Architectures to Testing Strategies. VLSI-SoC 2018: 176-179 - 2017
- [j30]David Atienza, Giorgio Di Natale:
Report on DATE 2017 in Lausanne. IEEE Des. Test 34(4): 76-77 (2017) - [j29]Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio, Pascal Benoit, Lionel Torres:
Computing reliability: On the differences between software testing and software fault injection techniques. Microprocess. Microsystems 50: 102-112 (2017) - [c99]Mauro Conti, Giorgio Di Natale, Annelie Heuser, Thomas Pöppelmann, Nele Mentens:
Do we need a holistic approach for the design of secure IoT systems? Conf. Computing Frontiers 2017: 425-430 - [c98]Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo:
Scan chain encryption for the test, diagnosis and debug of secure circuits. ETS 2017: 1-6 - [c97]Giorgio Di Natale, Maha Kooli, Alberto Bosio, Michele Portolan, Régis Leveugle:
Reliability of computing systems: From flip flops to variables. IOLTS 2017: 196-198 - [c96]Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Experimentations on scan chain encryption with PRESENT. IVSW 2017: 45-50 - [c95]Giorgio Di Natale, Marie-Lise Flottes, Sophie Dupuis, Bruno Rouzeyre:
Hacking the Control Flow error detection mechanism. IVSW 2017: 51-56 - [c94]Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Prinetto:
Zero bit-error-rate weak PUF based on Spin-Transfer-Torque MRAM memories. IVSW 2017: 128-133 - [e2]David Atienza, Giorgio Di Natale:
Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. IEEE 2017, ISBN 978-3-9815370-8-6 [contents] - 2016
- [j28]Elena-Ioana Vatajelu, Giorgio Di Natale, Mario Barbareschi, Lionel Torres, Marco Indaco, Paolo Prinetto:
STT-MRAM-Based PUF Architecture Exploiting Magnetic Tunnel Junction Fabrication-Induced Variability. ACM J. Emerg. Technol. Comput. Syst. 13(1): 5:1-5:21 (2016) - [j27]Stephan De Castro, Jean-Max Dutertre, Bruno Rouzeyre, Giorgio Di Natale, Marie-Lise Flottes:
Frontside Versus Backside Laser Injection: A Comparative Study. ACM J. Emerg. Technol. Comput. Syst. 13(1): 6:1-6:15 (2016) - [j26]Lilian Bossuet, Giorgio Di Natale, Paris Kitsos:
Introduction to Special Issue on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE). Microprocess. Microsystems 47: 1-2 (2016) - [j25]Mario Barbareschi, Giorgio Di Natale, Lionel Torres:
Ring oscillators analysis for security purposes in Spartan-6 FPGAs. Microprocess. Microsystems 47: 3-10 (2016) - [j24]Giorgio Di Natale, Stefano Zanero:
Editorial. IEEE Trans. Emerg. Top. Comput. 4(1): 33-34 (2016) - [c93]Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Prinetto:
Towards a highly reliable SRAM-based PUFs. DATE 2016: 273-276 - [c92]Firas Kaddachi, Maha Kooli, Giorgio Di Natale, Alberto Bosio, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
System-level reliability evaluation through cache-aware software-based fault injection. DDECS 2016: 9-14 - [c91]Antonio Varriale, Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Prinetto, Pascal Trotta, Tiziana Margaria:
SEcube™: An open-source security platform in a single SoC. DTIS 2016: 1-6 - [c90]Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos:
ETS 2016 foreword. ETS 2016: 1 - [c89]Maha Kooli, Giorgio Di Natale, Alberto Bosio:
Cache-aware reliability evaluation through LLVM-based analysis and fault injection. IOLTS 2016: 19-22 - [c88]Mojtaba Ebrahimi, Maryam Rashvand, Firas Kaddachi, Mehdi Baradaran Tahoori, Giorgio Di Natale:
Revisiting software-based soft error mitigation techniques via accurate error generation and propagation models. IOLTS 2016: 66-71 - [c87]Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Prinetto:
STT-MTJ-based TRNG with on-the-fly temperature/current variation compensation. IOLTS 2016: 179-184 - [c86]Papa-Sidi Ba, Sophie Dupuis, Palanichamy Manikandan, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Hardware Trust through Layout Filling: A Hardware Trojan Prevention Technique. ISVLSI 2016: 254-259 - [c85]Alessandro Vallero, Alessandro Savino, Gianfranco Politano, Stefano Di Carlo, Athanasios Chatzidimitriou, Sotiris Tselonis, Manolis Kaliorakis, Dimitris Gizopoulos, Marc Riera, Ramon Canal, Antonio González, Maha Kooli, Alberto Bosio, Giorgio Di Natale:
Cross-layer system reliability assessment framework for hardware faults. ITC 2016: 1-10 - [c84]Papa-Sidy Ba, Sophie Dupuis, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Using outliers to detect stealthy hardware trojan triggering? IVSW 2016: 1-6 - [c83]Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Federico Venini:
Faster-than-at-speed execution of functional programs: An experimental analysis. VLSI-SoC 2016: 1-6 - [c82]Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Ernesto Sánchez, Federico Venini:
Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs. VLSI-SoC (Selected Papers) 2016: 130-151 - [c81]Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio:
Cache- and register-aware system reliability evaluation based on data lifetime analysis. VTS 2016: 1-6 - [c80]Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Prinetto:
Security primitives (PUF and TRNG) with STT-MRAM. VTS 2016: 1-4 - 2015
- [j23]Alessandro Vallero, Sotiris Tselonis, Nikos Foutris, Manolis Kaliorakis, Maha Kooli, Alessandro Savino, Gianfranco Politano, Alberto Bosio, Giorgio Di Natale, Dimitris Gizopoulos, Stefano Di Carlo:
Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview. Microprocess. Microsystems 39(8): 1204-1214 (2015) - [c79]Sophie Dupuis, Papa-Sidi Ba, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
New testing procedure for finding insertion sites of stealthy hardware trojans. DATE 2015: 776-781 - [c78]Elena-Ioana Vatajelu, Giorgio Di Natale, Marco Indaco, Paolo Prinetto:
STT MRAM-Based PUFs. DATE 2015: 872-875 - [c77]Paolo Prinetto, Giorgio Di Natale:
DTIS 2015 foreword. DTIS 2015: 1 - [c76]Papa-Sidi Ba, Palanichamy Manikandan, Sophie Dupuis, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
Hardware Trojan prevention using layout-level design approach. ECCTD 2015: 1-4 - [c75]Marie-Lise Flottes, Joao Azevedo, Giorgio Di Natale, Bruno Rouzeyre:
Session-less based thermal-aware 3D-SIC test scheduling. ETS 2015: 1-2 - [c74]Ricardo Chaves, Giorgio Di Natale, Lejla Batina, Shivam Bhasin, Baris Ege, Apostolos P. Fournaris, Nele Mentens, Stjepan Picek, Francesco Regazzoni, Vladimir Rozic, Nicolas Sklavos, Bohan Yang:
Challenges in designing trustworthy cryptographic co-processors. ISCAS 2015: 2009-2012 - [c73]Jérôme Rampon, Renaud Perillat, Lionel Torres, Pascal Benoit, Giorgio Di Natale, Mario Barbareschi:
Digital Right Management for IP Protection. ISVLSI 2015: 200-203 - [c72]Stephan De Castro, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Jean-Max Dutertre:
Figure of Merits of 28nm Si Technologies for Implementing Laser Attack Resistant Security Dedicated Circuits. ISVLSI 2015: 362-367 - [c71]Elena-Ioana Vatajelu, Giorgio Di Natale, Lionel Torres, Paolo Prinetto:
STT-MRAM-Based Strong PUF Architecture. ISVLSI 2015: 467-472 - [c70]Yassine Fkih, Pascal Vivet, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Juergen Schloeffel:
3D DFT Challenges and Solutions. ISVLSI 2015: 603-608 - 2014
- [j22]Mafalda Cortez, Gijs Roelofs, Said Hamdioui, Giorgio Di Natale:
Testing Methods for PUF-Based Secure Key Storage Circuits. J. Electron. Test. 30(5): 581-594 (2014) - [j21]Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos:
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. Microelectron. Reliab. 54(9-10): 2289-2294 (2014) - [j20]Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
Test Versus Security: Past and Present. IEEE Trans. Emerg. Top. Comput. 2(1): 50-62 (2014) - [j19]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Thwarting Scan-Based Attacks on Secure-ICs With On-Chip Comparison. IEEE Trans. Very Large Scale Integr. Syst. 22(4): 947-951 (2014) - [c69]Mafalda Cortez, Gijs Roelofs, Said Hamdioui, Giorgio Di Natale:
Testing PUF-based secure key storage circuits. DATE 2014: 1-6 - [c68]Said Hamdioui, Jean-Luc Danger, Giorgio Di Natale, Fethulah Smailbegovic, Gerard van Battum, Mark M. Tehranipoor:
Hacking and protecting IC hardware. DATE 2014: 1-7 - [c67]Stefano Di Carlo, Alessandro Vallero, Dimitris Gizopoulos, Giorgio Di Natale, Arnaud Grasset, Riccardo Mariani, Frank Reichenbach:
Cross-Layer Early Reliability Evaluation for the Computing cOntinuum. DSD 2014: 199-205 - [c66]Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale:
Laser attacks on integrated circuits: From CMOS to FD-SOI. DTIS 2014: 1-6 - [c65]Maha Kooli, Giorgio Di Natale:
A survey on simulation-based fault injection tools for complex systems. DTIS 2014: 1-6 - [c64]Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Guillaume Hubert:
Layout-aware laser fault injection simulation and modeling: From physical level to gate level. DTIS 2014: 1-6 - [c63]Ioannis Voyiatzis, Michel Renovell, Mohamed Masmoudi, Paolo Prinetto, Giorgio Di Natale:
DTIS 2014 foreword. DTIS 2014: 1 - [c62]Luca Cassano, Alberto Bosio, Giorgio Di Natale:
A novel adaptive fault tolerant flip-flop architecture based on TMR. ETS 2014: 1-2 - [c61]Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Customized cell detector for laser-induced-fault detection. IOLTS 2014: 37-42 - [c60]Sophie Dupuis, Papa-Sidi Ba, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A novel hardware logic encryption technique for thwarting illegal overproduction and Hardware Trojans. IOLTS 2014: 49-54 - [c59]Stefano Di Carlo, Alessandro Vallero, Dimitris Gizopoulos, Giorgio Di Natale, Antonio González, Ramon Canal, Riccardo Mariani, M. Pipponzi, Arnaud Grasset, Philippe Bonnot, Frank Reichenbach, Gulzaib Rafiq, Trond Loekstad:
Cross-layer early reliability evaluation: Challenges and promises. IOLTS 2014: 228-233 - [c58]Yassine Fkih, Pascal Vivet, Bruno Rouzeyre, Marie-Lise Flottes, Giorgio Di Natale, Juergen Schloeffel:
2D to 3D Test Pattern Retargeting Using IEEE P1687 Based 3D DFT Architectures. ISVLSI 2014: 386-391 - [c57]Maha Kooli, Pascal Benoit, Giorgio Di Natale, Lionel Torres, Volkmar Sieh:
Fault injection tools based on Virtual Machines. ReCoSoC 2014: 1-6 - [c56]Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier:
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC 2014: 1-6 - [c55]Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert:
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) 2014: 220-240 - [c54]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Hakim Zimouche:
Built-in self-test for manufacturing TSV defects before bonding. VTS 2014: 1-6 - [e1]Giorgio Di Natale:
19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. IEEE 2014, ISBN 978-1-4799-3415-7 [contents] - 2013
- [j18]Amitabh Das, Jean DaRolt, Santosh Ghosh, Stefaan Seys, Sophie Dupuis, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
Secure JTAG Implementation Using Schnorr Protocol. J. Electron. Test. 29(2): 193-209 (2013) - [j17]Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Feng Lu, Bruno Rouzeyre:
A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic. J. Electron. Test. 29(3): 331-340 (2013) - [j16]Giorgio Di Natale:
TRUDEVICE: A COST Action on Trustworthy Manufacturing and Utilization of Secure Devices. Inf. Secur. J. A Glob. Perspect. 22(5-6): 205-207 (2013) - [j15]Sophie Dupuis, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
On the Effectiveness of Hardware Trojan Horse Detection via Side-Channel Analysis. Inf. Secur. J. A Glob. Perspect. 22(5-6): 226-236 (2013) - [j14]Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Multilevel Ionizing-Induced Transient Fault Simulator. Inf. Secur. J. A Glob. Perspect. 22(5-6): 251-264 (2013) - [j13]Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale:
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. Microelectron. Reliab. 53(9-11): 1320-1324 (2013) - [j12]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A novel differential scan attack on advanced DFT structures. ACM Trans. Design Autom. Electr. Syst. 18(4): 58:1-58:22 (2013) - [c53]Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Laser-Induced Fault Simulation. DSD 2013: 609-614 - [c52]Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
A bulk built-in sensor for detection of fault attacks. HOST 2013: 51-54 - [c51]Hakim Zimouche, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A BIST method for TSVs pre-bond test. IDT 2013: 1-6 - [c50]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A smart test controller for scan chains in secure circuits. IOLTS 2013: 228-229 - [c49]Yassine Fkih, Pascal Vivet, Bruno Rouzeyre, Marie-Lise Flottes, Giorgio Di Natale:
A 3D IC BIST for pre-bond test of TSVs using ring oscillators. NEWCAS 2013: 1-4 - [c48]Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre:
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. PATMOS 2013: 157-163 - 2012
- [j11]Jean DaRolt, Amitabh Das, Santosh Ghosh, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
Scan attacks on side-channel and fault attack resistant public-key implementations. J. Cryptogr. Eng. 2(4): 207-219 (2012) - [j10]Rodrigo Possamai Bastos, Frank Sill Torres, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode. Microelectron. Reliab. 52(9-10): 1781-1786 (2012) - [j9]Alessandro Savino, Stefano Di Carlo, Gianfranco Politano, Alfredo Benso, Alberto Bosio, Giorgio Di Natale:
Statistical Reliability Estimation of Microprocessor-Based Systems. IEEE Trans. Computers 61(11): 1521-1534 (2012) - [c47]Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
A New Scan Attack on RSA in Presence of Industrial Countermeasures. COSADE 2012: 89-104 - [c46]Jean DaRolt, Amitabh Das, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede:
A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures. DFT 2012: 43-48 - [c45]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
On-chip test comparison for protecting confidential data in secure ICs. ETS 2012: 1 - [c44]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Are advanced DfT structures sufficient for preventing scan-attacks? VTS 2012: 246-251 - [p1]Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
On Countermeasures Against Fault Attacks on the Advanced Encryption Standard. Fault Analysis in Cryptography 2012: 89-108 - 2011
- [c43]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Miroslav Valka, Denis Réal:
Power consumption traces realignment to improve differential power analysis. DDECS 2011: 201-206 - [c42]Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies. DFT 2011: 302-308 - [c41]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Scan Attacks and Countermeasures in Presence of Scan Response Compactors. ETS 2011: 19-24 - [c40]Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
New security threats against chips containing scan chain structures. HOST 2011: 110 - [c39]Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Timing issues for an efficient use of concurrent error detection codes. LATW 2011: 1-6 - 2010
- [j8]Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
Self-Test Techniques for Crypto-Devices. IEEE Trans. Very Large Scale Integr. Syst. 18(2): 329-333 (2010) - [c38]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Ensuring high testability without degrading security: Embedded tutorial on "test and security". DDECS 2010: 6 - [c37]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Evaluation of Resistance to Differential Power Analysis: Execution Time Optimizations for Designers. DELTA 2010: 256-261 - [c36]Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Evaluation of concurrent error detection techniques on the Advanced Encryption Standard. ETS 2010: 252 - [c35]Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Evaluation of concurrent error detection techniques on the advanced encryption standard. IOLTS 2010: 223-228
2000 – 2009
- 2009
- [j7]Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard. J. Electron. Test. 25(4-5): 269-278 (2009) - [c34]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Execution time reduction of Differential Power Analysis experiments. LATW 2009: 1-5 - 2008
- [j6]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
March Test Generation Revealed. IEEE Trans. Computers 57(12): 1704-1713 (2008) - [c33]Alberto Bosio, Giorgio Di Natale:
LIFTING: A Flexible Open-Source Fault Simulator. ATS 2008: 35-40 - [c32]Stefano Di Carlo, Giorgio Di Natale, Riccardo Mariani:
On-Line Instruction-Checking in Pipelined Microprocessors. ATS 2008: 377-382 - [c31]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
An Integrated Validation Environment for Differential Power Analysis. DELTA 2008: 527-532 - [c30]Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
A Reliable Architecture for the Advanced Encryption Standard. ETS 2008: 13-18 - [c29]Philipp Öhler, Alberto Bosio, Giorgio Di Natale, Sybille Hellebrand:
A Modular Memory BIST for Optimized Memory Repair. IOLTS 2008: 171-172 - 2007
- [j5]Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
March AB, a state-of-the-art march test for realistic static linked faults and dynamic faults in SRAMs. IET Comput. Digit. Tech. 1(3): 237-245 (2007) - [c28]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A Novel Parity Bit Scheme for SBox in AES Circuits. DDECS 2007: 267-271 - [c27]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
An On-Line Fault Detection Scheme for SBoxes in Secure Circuits. IOLTS 2007: 57-62 - [c26]Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale:
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC. IOLTS 2007: 205-206 - [c25]Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A Dependable Parallel Architecture for SBoxes. ReCoSoC 2007: 132-137 - 2006
- [c24]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Memory Fault Simulator for Static-Linked Faults. ATS 2006: 31-36 - [c23]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
ATPG for Dynamic Burn-In Test in Full-Scan Circuits. ATS 2006: 75-82 - [c22]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Automatic march tests generations for static linked faults in SRAMs. DATE 2006: 1258-1263 - [c21]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. DDECS 2006: 157-158 - [c20]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Automatic March Tests Generation for Multi-Port SRAMs. DELTA 2006: 385-392 - [c19]Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto:
Single-Event Upset Analysis and Protection in High Speed Circuits. ETS 2006: 29-34 - [c18]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A 22n March Test for Realistic Static Linked Faults in SRAMs. ETS 2006: 49-54 - 2005
- [c17]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Automatic March tests generation for static and dynamic faults in SRAMs. ETS 2005: 122-127 - [c16]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
March AB, March AB1: new March tests for unlinked dynamic memory faults. ITC 2005: 8 - 2003
- [b1]Giorgio Di Natale:
Software-implemented system dependability for safety critical applications. Polytechnic University of Turin, Italy, 2003 - [j4]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures. IEEE Commun. Mag. 41(9): 90-97 (2003) - [j3]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Online Self-Repair of FIR Filters. IEEE Des. Test Comput. 20(3): 50-57 (2003) - [c15]Fabrizio Bertuccelli, Franco Bigongiari, Andrea S. Brogna, Giorgio Di Natale, Paolo Prinetto, Roberto Saletti:
Exhaustive Test of Several Dependable Memory Architectures Designed by GRAAL Tool. Asian Test Symposium 2003: 32-37 - [c14]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A Watchdog Processor to Detect Data and Control Flow Errors. IOLTS 2003: 144-148 - [c13]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, I. Solcia, Luca Tagliaferri:
FAUST: FAUlt-injection Script-based Tool. IOLTS 2003: 160 - [c12]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri:
Data Critically Estimation In Software Applications. ITC 2003: 802-810 - 2002
- [j2]Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto:
An on-line BIST RAM architecture with self-repair capabilities. IEEE Trans. Reliab. 51(1): 123-128 (2002) - [c11]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Specification and Design of a New Memory Fault Simulator. Asian Test Symposium 2002: 92-97 - [c10]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
An Optimal Algorithm for the Automatic Generation of March Tests. DATE 2002: 938-943 - [c9]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Static Analysis of SEU Effects on Software Applications. ITC 2002: 500-508 - 2001
- [j1]Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
Online and Offline BIST in IP-Core Design. IEEE Des. Test Comput. 18(5): 92-99 (2001) - [c8]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Memory Read Faults: Taxonomy and Automatic Test Generation. Asian Test Symposium 2001: 157-163 - [c7]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri:
Control-Flow Checking via Regular Expressions. Asian Test Symposium 2001: 299-303 - [c6]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
SEU effect analysis in an open-source router via a distributed fault injection environment. DATE 2001: 219-225 - [c5]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Luca Tagliaferri, Paolo Prinetto:
Validation of a Software Dependability Tool via Fault Injection Experiments. IOLTW 2001: 3-8 - [c4]Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Franco Bigongiari:
GRAAL: a tool for highly dependable SRAMs generation. ITC 2001: 250-257 - 2000
- [c3]Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
An effective distributed BIST architecture for RAMs. ETW 2000: 119-124 - [c2]Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
A Family of Self-Repair SRAM Cores. IOLTW 2000: 214-218 - [c1]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
A programmable BIST architecture for clusters of multiple-port SRAMs. ITC 2000: 557-566
Coauthor Index
[j41] [j39] [j37] [c115] [c113] [c108] [i1] [j35] [j34] [c106] [c105] [c103] [c102] [c101] [c98] [c96] [c95] [j27] [c86] [c84] [c79] [c76] [c75] [c72] [c70] [j21] [j20] [j19] [c66] [c64] [c61] [c60] [c58] [c56] [c55] [c54] [j18] [j17] [j15] [j14] [j13] [j12] [c53] [c52] [c51] [c50] [c49] [c48] [j11] [j10] [c47] [c46] [c45] [c44] [p1] [c43] [c42] [c41] [c40] [c39] [j8] [c38] [c37] [c36] [c35] [j7] [c34] [c31] [c30] [c28] [c27] [c25]
[j41] [j39] [j37] [c115] [c113] [c108] [i1] [j35] [j34] [c106] [c105] [c103] [c102] [c101] [c98] [c96] [c95] [j27] [c86] [c84] [c79] [c76] [c75] [c72] [c70] [j21] [j20] [j19] [c66] [c64] [c61] [c60] [c58] [c56] [c55] [c54] [j18] [j17] [j15] [j14] [j13] [j12] [c53] [c52] [c51] [c50] [c49] [c48] [j11] [j10] [c47] [c46] [c45] [c44] [p1] [c43] [c42] [c41] [c40] [c39] [j8] [c38] [c37] [c36] [c35] [j7] [c34] [c31] [c30] [c28] [c27] [c25]
Elena I. Vatajelu
aka: Elena-Ioana Vatajelu
aka: Elena-Ioana Vatajelu
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