Fit Class Cover Catch Digraph Classification models that can be used in machine learning. Pure and proper and random walk approaches are available. Methods are explained in Priebe et al. (2001) <doi:10.1016/S0167-7152(01)00129-8>, Priebe et al. (2003) <doi:10.1007/s00357-003-0003-7>, and Manukyan and Ceyhan (2016) <doi:10.48550/arXiv.1904.04564>.
Version: | 0.3.2 |
Depends: | R (≥ 4.2) |
Imports: | Rcpp, RANN, Rfast, proxy |
LinkingTo: | Rcpp, RcppArmadillo |
Published: | 2023-04-24 |
DOI: | 10.32614/CRAN.package.rcccd |
Author: | Fatih Saglam [aut, cre] |
Maintainer: | Fatih Saglam <saglamf89 at gmail.com> |
License: | MIT + file LICENSE |
NeedsCompilation: | yes |
Materials: | README |
CRAN checks: | rcccd results |
Reference manual: | rcccd.pdf |
Package source: | rcccd_0.3.2.tar.gz |
Windows binaries: | r-devel: rcccd_0.3.2.zip, r-release: rcccd_0.3.2.zip, r-oldrel: rcccd_0.3.2.zip |
macOS binaries: | r-release (arm64): rcccd_0.3.2.tgz, r-oldrel (arm64): rcccd_0.3.2.tgz, r-release (x86_64): rcccd_0.3.2.tgz, r-oldrel (x86_64): rcccd_0.3.2.tgz |
Reverse depends: | imbalanceDatRel |
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